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    • 2. 发明授权
    • Row decoding circuit for semiconductor non-volatile electrically
programmable memory and corresponding method
    • 半导体非易失性电可编程存储器的行解码电路及相应的方法
    • US5848013A
    • 1998-12-08
    • US824616
    • 1997-03-27
    • Fabio Tassan CaserMauro SaliMarcello Cane
    • Fabio Tassan CaserMauro SaliMarcello Cane
    • G11C8/10G11C16/08G11C8/00
    • G11C8/10G11C16/08
    • The invention relates to a row decoding circuit for an electrically programmable and erasable semiconductor non-volatile storage device of the type which includes a matrix of memory cells laid out as cell rows and columns and is divided into sectors, said circuit being input row decode signals and supply voltages in order to drive an output stage incorporating a complementary pair of high-voltage MOS transistors of the pull-up and pull-down type, respectively, which are connected to form an output terminal connected to the rows of one sector of the matrix, characterized in that a MOS transistor of the P-channel depletion type with enhanced gate oxide is provided between the output terminal and the pull-down transistor. The control terminal of the depletion transistor forms a further input of the circuit.
    • 本发明涉及一种用于电可编程和可擦除的半导体非易失性存储装置的行解码电路,该电路可编程和可擦除半导体非易失性存储装置包括布置为单元行和列的存储单元的矩阵,并被划分为扇区,所述电路是输入行解码信号 和电源电压,以分别驱动并入一对互补的上拉和下拉型高压MOS晶体管的输出级,所述高压MOS晶体管被连接以形成连接到所述上拉和下拉的一个扇区的行的输出端子 矩阵,其特征在于,在输出端和下拉晶体管之间提供具有增强的栅极氧化物的P沟道耗尽型的MOS晶体管。 耗尽晶体管的控制端构成电路的另一输入。
    • 3. 发明授权
    • Row decoding circuit for a semiconductor non-volatile electrically programmable memory and corresponding method
    • 半导体非易失性电可编程存储器的行解码电路及相应的方法
    • US06320792B1
    • 2001-11-20
    • US09633334
    • 2000-08-07
    • Fabio Tassan CaserMauro SaliMarcello Cane
    • Fabio Tassan CaserMauro SaliMarcello Cane
    • G11C1606
    • G11C8/10G11C16/08
    • The invention relates to a row decoding circuit for an electrically programmable and erasable semiconductor non-volatile storage device of the type which includes a matrix of memory cells laid out as cell rows and columns and is divided into sectors, said circuit being input row decode signals and supply voltages in order to drive an output stage incorporating a complementary pair of high-voltage MOS transistors of the pull-up and pull-down type, respectively, which are connected to form an output terminal connected to the rows of one sector of the matrix, characterized in that a MOS transistor of the P-channel depletion type with enhanced gate oxide is provided between the output terminal and the pull-down transistor. The control terminal of the depletion transistor forms a further input of the circuit.
    • 本发明涉及一种用于电可编程和可擦除的半导体非易失性存储装置的行解码电路,该电路可编程和可擦除半导体非易失性存储装置包括布置为单元行和列的存储单元的矩阵,并被划分为扇区,所述电路是输入行解码信号 和电源电压,以分别驱动并入一对互补的上拉和下拉型高压MOS晶体管的输出级,所述高压MOS晶体管被连接以形成连接到所述上拉和下拉的一个扇区的行的输出端子 矩阵,其特征在于,在输出端和下拉晶体管之间提供具有增强的栅极氧化物的P沟道耗尽型的MOS晶体管。 耗尽晶体管的控制端构成电路的另一输入。
    • 4. 发明授权
    • Row decoding circuit for a semiconductor non-volatile electrically
programmable memory and corresponding method
    • 半导体非易失性电可编程存储器的行解码电路及相应的方法
    • US6137725A
    • 2000-10-24
    • US203937
    • 1998-12-02
    • Fabio Tassan CaserMauro SaliMarcello Cane
    • Fabio Tassan CaserMauro SaliMarcello Cane
    • G11C8/10G11C16/08G11C16/06
    • G11C8/10G11C16/08
    • The invention relates to a row decoding circuit for an electrically programmable and erasable semiconductor non-volatile storage device of the type which includes a matrix of memory cells laid out as cell rows and columns and is divided into sectors, said circuit being input row decode signals and supply voltages in order to drive an output stage incorporating a complementary pair of high-voltage MOS transistors of the pull-up and pull-down type, respectively, which are connected to form an output terminal connected to the rows of one sector of the matrix, characterized in that a MOS transistor of the P-channel depletion type with enhanced gate oxide is provided between the output terminal and the pull-down transistor. The control terminal of the depletion transistor forms a further input of the circuit.
    • 本发明涉及一种用于电可编程和可擦除的半导体非易失性存储装置的行解码电路,该电路可编程和可擦除半导体非易失性存储装置包括布置为单元行和列的存储单元的矩阵,并被划分为扇区,所述电路是输入行解码信号 和电源电压,以分别驱动并入一对互补的上拉和下拉型高压MOS晶体管的输出级,所述高压MOS晶体管被连接以形成连接到所述上拉和下拉的一个扇区的行的输出端子 矩阵,其特征在于,在输出端和下拉晶体管之间提供具有增强的栅极氧化物的P沟道耗尽型的MOS晶体管。 耗尽晶体管的控制端构成电路的另一输入。
    • 8. 发明授权
    • Column decoding architecture for flash memories
    • 闪存的列解码架构
    • US07333389B2
    • 2008-02-19
    • US11126441
    • 2005-05-11
    • Stefano SiveroSimone BartoliFabio Tassan CaserRiccardo Riva Reggiori
    • Stefano SiveroSimone BartoliFabio Tassan CaserRiccardo Riva Reggiori
    • G11C8/00
    • G11C8/10G11C16/26
    • An improved method and device for column decoding for flash memory devices utilizes a burst page with a length greater than the length of a logical page. When a misalignment of an initial address occurs, valid reads across logical page boundaries are possible. The memory device enters the wait state only when a read crosses a burst page boundary. This minimizes the amount of time in which the memory device enters the wait state. In the preferred embodiment, this is achieved with a different management of the control signals that feed the third level of a three-level decoding stage column decoder. Changes to the architecture or in the number of column decoder selectors are not required. The memory access time during synchronous reads is thus improved.
    • 用于闪存器件的列解码的改进方法和装置利用长度大于逻辑页长度的突发页。 当发生初始地址的错位时,跨逻辑页面边界的有效读取是可能的。 只有当读取跨越突发页面边界时,存储器件才进入等待状态。 这使存储器件进入等待状态的时间量最小化。 在优选实施例中,这通过对馈送三电平解码级列解码器的第三电平的控制信号的不同管理来实现。 不需要对架构或列解码器选择器的数量进行更改。 因此,同步读取期间的存储器访问时间得到改善。