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    • 1. 发明公开
    • 마이크로파 생성기 및 합성 다이아몬드 물질의 제조
    • 微波发生器和人造金刚石材料的制造
    • KR20180031755A
    • 2018-03-28
    • KR20187005280
    • 2016-08-22
    • ELEMENT SIX TECH LIMITED
    • BRANDON JOHN ROBERTPERKINS NEIL
    • H01J37/32H05H1/46
    • H01J37/32192H01J37/32266H01J37/32935H01J37/32944H05H2001/4607H05H2001/4622
    • 마이크로파플라즈마강화화학기상증착(MPECVD) 시스템에서사용할마이크로파생성기시스템이제공되며, 이마이크로파생성기시스템은, 화학기상증착처리를통해서합성다이아몬드물질을제조하기에적합한동작파워출력으로마이크로파를생성하도록구성된마이크로파생성기유닛과, 동작파워출력의감소혹은주파수변경을유발하는마이크로파생성기의오류를검출하도록구성된오류검출시스템과, 오류가검출된것에응답해서마이크로파생성기유닛을재시작하고, 동작파워출력의감소혹은주파수변경을유발한마이크로파생성기유닛의오류이후에 10초미만의시간이내에동작파워출력혹은주파수를복구하도록구성된재시작시스템을포함한다.
    • 微波等离子体增强,提供了一种化学气相沉积(MPECVD)微波发生器系统在系统中使用,所述微波发生器系统包括一个微波发生器单元,被配置hagie产生通过化学气相沉积工艺的合成金刚石材料以产生一个合适的操作功率输出的微波 并且,由被配置为检测所述微波发生器的故障引起的频率变化的功率输出减少或误差检测系统的操作中,响应于微波发生器单元的重新启动中检测到错误时,其导致降低操作功率输出的或频率变化 并且重启系统被配置为在一个微波发生器单元的错误之后小于10秒的时间段内恢复操作功率输出或频率。
    • 5. 发明公开
    • 플라즈마 모니터링 시스템
    • 监测等离子体系统
    • KR1020120127350A
    • 2012-11-21
    • KR1020120095061
    • 2012-08-29
    • (주)쎄미시스코
    • 이순종우봉주정재훈김학권강지호
    • H01L21/66
    • H01J37/32944
    • PURPOSE: A system for monitoring plasma is provided to accurately detect a processing state and abnormalities of a plasma process by detecting arcs as well as an end point of an etching process. CONSTITUTION: A spectroscope(108) is used in order to monitor the state of plasma. The spectroscope is connected to a viewport(120) of a chamber(100) through a first optical fiber(122). An arc detection sensor(110) is connected to the viewport through a second optical fiber(124). The arc detection sensor senses arc light due to an arc. A detection and control module(112) detects an end point by analyzing data provided from the spectroscope. [Reference numerals] (108) Spectroscope; (110) Arc sensor; (112) Detection/control module
    • 目的:提供一种用于监测等离子体的系统,以通过检测电弧以及蚀刻工艺的终点来精确地检测等离子体工艺的处理状态和异常。 构成:使用分光镜(108)来监视等离子体的状态。 分光器通过第一光纤(122)连接到腔室(100)的视口(120)。 电弧检测传感器(110)通过第二光纤(124)连接到视口。 电弧检测传感器由于电弧感测电弧光。 检测和控制模块(112)通过分析从分光镜提供的数据来检测终点。 (附图标记)(108)分光镜; (110)电弧传感器; (112)检测/控制模块
    • 6. 发明公开
    • 이온원 전극과 이온원 전극보호회로의 이상을 동시에 검출하기 위한 원격검출장치
    • 与离子源相关的电极和电路的故障保护装置
    • KR1020090010639A
    • 2009-01-30
    • KR1020070073909
    • 2007-07-24
    • 한국원자력연구원
    • 오병훈김민석정기석
    • H05H1/34
    • H01J37/32935G01N27/283G01R31/16H01C7/12H01J37/32559H01J37/32944
    • An apparatus for detecting failure of an electrode and an electrode protecting device related to ion sources is provided to protect ion sources by replacing the electrode protecting device with the trouble by including a plurality of electrode protecting devices. A remote detecting apparatus(1) includes an electrode protecting unit(10), a test power supply unit(60), an insulation detecting unit(80), a switching unit and a controller. The electrode protecting unit protects the ion source by absorbing a surge voltage that is a failure voltage induced to a transmission line as a transient voltage which is changed for a short time. The insulation detection unit detects damage between electrodes connected to ion sources to output the beam by using arc plasma. The test power supply unit verifies the ion source electrode and the electrode protecting unit for protecting the electrode. The switching unit is selectively connected to each component. The controller controls each component and transmits the detected data remotely.
    • 提供一种用于检测与离子源相关的电极故障和电极保护装置的装置,通过包括多个电极保护装置来替代电极保护装置来保护离子源。 远程检测装置(1)包括电极保护单元(10),测试电源单元(60),绝缘检测单元(80),开关单元和控制器。 电极保护单元通过吸收浪涌电压来保护离子源,该浪涌电压是作为短时间改变的瞬时电压而被传输到传输线的故障电压。 绝缘检测单元检测连接到离子源的电极之间的损坏,以通过使用电弧等离子体输出光束。 测试电源单元验证离子源电极和电极保护单元以保护电极。 切换单元选择性地连接到每个组件。 控制器控制每个组件并远程发送检测到的数据。
    • 7. 发明公开
    • 반도체 소자 제조용 플라즈마 장치
    • 用于制造半导体器件的等离子体设备
    • KR1020080048310A
    • 2008-06-02
    • KR1020060118552
    • 2006-11-28
    • 삼성전자주식회사
    • 금경수홍형식허노현박진성한재현이용철
    • H01L21/3065
    • H01J37/32944H01L21/67288
    • A plasma apparatus for manufacturing a semiconductor device is provided to prevent the generation of an arc and to prevent damage of a wafer by using a digital signal processor. A power supply unit(110) supplies electric power to a plasma chamber(100). An electrical signal measurement unit(120) measures an electrical signal supplied to the plasma chamber and outputs a measured value. A control unit(130) receives the measured value outputted from the electrical signal measurement unit, compares the measured value with a predetermined range, and controls an operation of the power supply unit. The control unit includes an analog/digital converter(132) for converting the measured value to a digital signal, a digital signal processor(134) for comparing the digital signal with the predetermined range, and an interlock part(136) for controlling the operation of the power supply unit.
    • 提供一种用于制造半导体器件的等离子体装置,以防止产生电弧并且通过使用数字信号处理器来防止晶片的损坏。 电源单元(110)向等离子体室(100)供电。 电信号测量单元(120)测量提供给等离子体室的电信号并输出​​测量值。 控制单元(130)接收从电信号测量单元输出的测量值,将测量值与预定范围进行比较,并控制电源单元的操作。 控制单元包括用于将测量值转换为数字信号的模拟/数字转换器(132),用于将数字信号与预定范围进行比较的数字信号处理器(134),以及用于控制操作的互锁部分(136) 的电源单元。