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    • 4. 发明公开
    • 묘화 장치 및 묘화 방법
    • 绘图装置和绘图方法
    • KR1020120033950A
    • 2012-04-09
    • KR1020110036816
    • 2011-04-20
    • 가부시키가이샤 스크린 홀딩스
    • 나카자와요시유키후루야요시오이토료스케나카니시켄지타니구치카즈타카야마다료
    • H01L21/027G03F7/20
    • G03B27/32G03B27/50G03B27/52G03F7/70291G03F7/70308G03F7/70508H01L21/0275
    • PURPOSE: An image drawing device and a method thereof are provided to shift a spatially modulated light path with higher accuracy compared to the accuracy of a space modulation unit, thereby controlling a drawing position of a pattern with respect to a target object with high accuracy. CONSTITUTION: A space modulation unit(44) spatially modulates light projected through a miller from an illumination optical system based on pattern data. A light path correction part(45) corrects a light path by shifting a spatially modulated path of light emitted from the space modulation unit. A projection optical system(46) forms an image on a corresponding surface by controlling the light path to the surface of a substrate(W). A auto focus unit is comprised of a position detection unit and a driving part for controlling the location of a focusing lens(465). The position detection unit detects the height of the substrate.
    • 目的:提供一种图像绘制装置及其方法,用于与空间调制单元的精度相比更高精度地移动空间调制光路,从而以高精度控制图案相对于目标物体的绘制位置。 构成:空间调制单元(44)基于图案数据从照明光学系统空间调制通过铣刀投影的光。 光路校正部(45)通过移动从空间调制单元发射的光的空间调制路径来校正光路。 投影光学系统(46)通过控制到基板(W)的表面的光路来在对应的表面上形成图像。 自动对焦单元由位置检测单元和用于控制聚焦透镜(465)的位置的驱动部分组成。 位置检测单元检测基板的高度。
    • 5. 发明公开
    • 레이저 조사 장치 및 그를 이용한 유기전계발광표시장치의 제조 방법
    • 使用其的有机发光二极管装置的激光照射装置和制造方法
    • KR1020100022265A
    • 2010-03-02
    • KR1020080080860
    • 2008-08-19
    • 삼성모바일디스플레이주식회사
    • 이승묵강태민김도영김범준
    • H05B33/10H01L51/56
    • G03B27/32
    • PURPOSE: A laser irradiation device and a method for manufacturing an organic electroluminescent display device using the same are provided to prevent a laser beam from being irradiated to an unwanted region of a donor substrate by preventing a noise laser beam on a non-transmissive region of a mask pattern. CONSTITUTION: A laser source(110) generates a laser beam. A projection lens(140) is arranged under a laser source. A mask pattern(130) is arranged between the laser source and the projection lens. The mask pattern includes a transmissive region and a non-transmissive region. A reflective layer(132) is formed on one side of the mask pattern to face the laser source. An anti-reflective layer(134) is formed on the other side of the mask pattern to face the projection lens.
    • 目的:提供一种激光照射装置及其制造使用该激光照射装置的有机电致发光显示装置的方法,以防止激光束照射到施主基板的不需要的区域, 一个掩模图案。 构成:激光源(110)产生激光束。 投影透镜(140)布置在激光源下方。 在激光源和投影透镜之间布置有掩模图案(130)。 掩模图案包括透射区域和非透射区域。 反射层(132)形成在掩模图案的一侧面对激光源。 在掩模图案的另一侧上形成有抗反射层(134),以面对投影透镜。
    • 6. 发明公开
    • 노광 장치, 보정 방법 및 디바이스 제조 방법
    • 曝光装置,校正方法和装置制造方法
    • KR1020090118004A
    • 2009-11-17
    • KR1020090041200
    • 2009-05-12
    • 캐논 가부시끼가이샤
    • 마쯔다히데끼
    • H01L21/027G03F7/20
    • G03B27/32G03F7/706G03F7/70525G03F7/70533G03F7/70625G03F7/70641G03F7/70716
    • PURPOSE: An exposure device, a correcting method and a method for manufacturing a device are provided to preform accuracy of measurement by removing an error due to a measurement algorithm, a kind of measurement devices, the thickness of a resist film, the kind of resists, and an oblique incidence angle. CONSTITUTION: An exposure apparatus includes a projection optical system and a controller. The projection optical system projects the pattern of a disc to a substrate. The controller obtains the line width on a first mark and a position on a second mark. The controller is formed at each position of the substrate while the first mark and the second mark change the position of a substrate stage to an optical axial direction by stages. The misalignment on the second mark formed in the substrate maintained by the substrate stage is produced in the optical axial direction to measure the limit value of the change of the line width on the first mark.
    • 目的:提供一种曝光装置,校正方法和装置的制造方法,通过消除由于测量算法,测量装置的种类,抗蚀剂膜的厚度,抗蚀剂的种类等引起的误差来预测测量精度 ,和倾斜入射角。 构成:曝光装置包括投影光学系统和控制器。 投影光学系统将光盘的图案投影到基板。 控制器获得第一标记上的线宽和第二标记上的位置。 控制器形成在基板的每个位置处,同时第一标记和第二标记将基板台的位置逐级地改变到光轴向。 在光轴方向上产生在由基板台保持的基板上形成的第二标记上的未对准,以测量第一标记上的线宽的变化的极限值。