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    • 3. 发明授权
    • 리드프레임 제조 방법
    • 用于制作引线框架的方法
    • KR101362395B1
    • 2014-02-13
    • KR1020120135459
    • 2012-11-27
    • 앰코 테크놀로지 코리아 주식회사
    • 배재민김병진김기정
    • H01L23/495
    • H01L2224/48091H01L2224/48247H01L2924/00014
    • The present invention is to prevent the generation of a foreign material in the dimple of a lead frame. In a method for fabricating a lead frame, the dimple in the lead frame on a substrate where semiconductor packages are arranged is gap-filled with a filling material. A first sawing process is performed along a sawing line between the gap-filled lead frames filled with the filling material in the sawing process of the semiconductor package in order to partly remove the filling material gap-filled between the lead frames. The residual filling material gap-filled in the dimple of the lead frame are completely removed by a physical or chemical method. A second sawing process is performed along the sawing line between the frames to separate the semiconductor package. Therefore, the generation of the foreign material in the dimple of the lead frame can be prevented.
    • 本发明是为了防止在引线框架的凹坑中产生异物。 在制造引线框架的方法中,布置有半导体封装的基板上的引线框架中的凹坑用填充材料填充。 在半导体封装的锯切工艺中填充有填充材料的间隙填充引线框架之间的锯切线上进行第一锯切工艺,以便部分去除间隙填充在引线框架之间的填充材料。 间隙填充在引线框的凹坑中的残留填充材料通过物理或化学方法被完全去除。 沿着框架之间的锯线执行第二锯切工艺以分离半导体封装。 因此,可以防止在引线框的凹坑中产生异物。
    • 10. 发明公开
    • 반도체 디바이스 및 그 제조 방법
    • 半导体器件及其制造方法
    • KR1020120131985A
    • 2012-12-05
    • KR1020110050524
    • 2011-05-27
    • 앰코 테크놀로지 코리아 주식회사
    • 이경연김병진전형일김기정
    • H01L23/48H01L21/60
    • H01L2224/48091H01L2224/73265H01L2924/15311H01L2924/00014
    • PURPOSE: A semiconductor device and a manufacturing method thereof are provided to prevent the rotation and tilt of a semiconductor die by coating a wire pattern with solder resist and attaching the semiconductor die to a solder resist layer. CONSTITUTION: A solder resist layer(110) has a first surface and a second surface which is opposite to the first surface. A semiconductor die(140) is attached to the first surface of the solder resist layer. A wire pattern(120) is formed in the solder resist layer. The wire pattern includes a first wire pattern(121) and a second wire pattern(122). The first wire pattern is exposed to the first surface and the second surface of the solder resist layer. An encapsulant(160) encapsulates the semiconductor die.
    • 目的:提供一种半导体器件及其制造方法,以通过用阻焊剂涂覆线图案并将半导体管芯附着到阻焊层来防止半导体管芯的旋转和倾斜。 构成:阻焊层(110)具有与第一表面相对的第一表面和第二表面。 半导体管芯(140)附着到阻焊层的第一表面。 在阻焊层中形成有线图案(120)。 线图案包括第一线图案(121)和第二线图案(122)。 第一线图案暴露于阻焊层的第一表面和第二表面。 密封剂(160)封装半导体管芯。