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    • 1. 发明公开
    • 이중 통과 에탈론 분광계
    • 双通道ETONON SPECTROMETER
    • KR1020000057929A
    • 2000-09-25
    • KR1020000005502
    • 2000-02-03
    • 사이머 엘엘씨
    • 에르쇼브알렉산더아이.
    • G01J3/28
    • G01J3/26G01J3/02G01J3/0205G01J3/021G01J3/0224G01J3/0229G01J3/027
    • PURPOSE: A dual-pass etalon spectrometer is provided to generate a precise fringe data able to measure band widths having a precision required for microlithography with relation to delta lambda FWHM and delta lambda 95%. CONSTITUTION: In a dual-pass etalon spectrometer, an optical scattering system(34) makes laser beams(16) facing toward a plurality of directions for generating scattered beams, and spectrum components of the scattered beams are divided by an angle to be permeated via the etalon(25). A reverse reflection mirror(38) reflects the permeated light beam components reversely via the etalon. The twice permeated spectrum components is focused on an optical detector(44) formed of an optical diode array by a lens(42) to detect a fringe pattern(49). The reverse reflection mirror is to be a hollow reverse reflection mirror.
    • 目的:提供双通道标准光谱仪,以产生精确的条纹数据,能够测量与ΔλFWHM和Δλ95%相关的微光刻所需精度的带宽。 构成:在双通道标准光谱仪中,光散射系统(34)使得激光束(16)面向多个方向产生散射光束,并且散射光束的光谱分量被除以被透过的角度 标准具(25)。 逆反射镜(38)通过标准具反向透过光束成分。 两次渗透的光谱分量聚焦在由透镜(42)由光二极管阵列形成的光学检测器(44)上以检测条纹图案(49)。 反射反射镜为中空反射镜。