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    • 25. 发明公开
    • 반도체 집적회로 및 그의 구동방법
    • 半导体集成电路及其驱动方法
    • KR1020130072060A
    • 2013-07-01
    • KR1020110139607
    • 2011-12-21
    • 에스케이하이닉스 주식회사
    • 정부호이준호김현석조선기김양희김영원
    • H01L27/00H01L21/768
    • H01L27/0611H01L23/5286H01L27/0207
    • PURPOSE: A semiconductor integrated circuit and a method for driving the same are provided to minimize the influence of inductance by electrically short-circuiting a power line for supplying the source voltage for a specific purpose and a power line for supplying the source voltage for a general purpose. CONSTITUTION: A first power voltage (VDD) is applied to a first power voltage pad (110_0-110_n). A first power line (120) is connected to the first power voltage pad. A second power voltage (VDDQ) is applied to a second power voltage pad (130_0-130_k). A second power line (140) is parallel to the first power line. A switching part (150) selectively connects the first and the second power line in response to a test mode signal (TM,TMB).
    • 目的:提供一种半导体集成电路及其驱动方法,以通过电气短路用于为特定用途提供源极电压的电力线和用于为一般的电源供应源电压的电力线来最小化电感的影响 目的。 构成:将第一电源电压(VDD)施加到第一电源电压垫(110_0-110_n)。 第一电源线(120)连接到第一电源电压垫。 第二电源电压(VDDQ)被施加到第二电源电压焊盘(130_0-130_k)。 第二电力线(140)平行于第一电力线。 开关部分(150)响应于测试模式信号(TM,TMB)选择性地连接第一和第二电力线。
    • 26. 发明公开
    • 전자파 차폐 회로 및 이를 포함하는 반도체 집적 장치
    • EMI屏蔽电路和半导体集成装置,包括它们
    • KR1020130055991A
    • 2013-05-29
    • KR1020110121702
    • 2011-11-21
    • 에스케이하이닉스 주식회사
    • 이준호
    • G11C7/10G11C7/22
    • H03K19/00361
    • PURPOSE: An EMI shielding circuit and a semiconductor integrated device including the same are provided to reduce malfunction due to EMI by shielding the EMI from a semiconductor integrated circuit. CONSTITUTION: A data level comparing unit(200) generates a data comparison signal by comparing the number of low level data with the number of high level data transmitted to a plurality of data lines. A control signal generating unit(300) generates a driving control signal in response to the data comparison signal. A driver(400) for offsetting EMI outputs an EMI offset signal in response to the driving control signal. [Reference numerals] (110) First data driver; (120) Second data driver; (130) Third data driver; (200) Data level comparing unit; (300) Control signal generating unit; (400) Driver for offsetting EMI
    • 目的:提供EMI屏蔽电路和包括该EMI屏蔽电路的半导体集成器件,以通过屏蔽来自半导体集成电路的EMI来减少EMI引起的故障。 构成:数据电平比较单元(200)通过将低电平数据的数量与发送到多个数据线的高电平数据的数量进行比较来生成数据比较信号。 控制信号生成单元(300)响应于数据比较信号产生驱动控制信号。 用于抵消EMI的驱动器(400)响应于驱动控制信号输出EMI偏移信号。 (附图标记)(110)第一数据驱动器; (120)第二数据驱动器; (130)第三数据驱动程序; (200)数据级比较单元; (300)控制信号发生单元; (400)用于抵消EMI的驱动器