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    • 6. 发明专利
    • Power sensing circuit, power supply system, and integrated circuit
    • 电力感应电路,电源系统和集成电路
    • JP2007303874A
    • 2007-11-22
    • JP2006130395
    • 2006-05-09
    • Fujitsu Ltd富士通株式会社
    • OKAMOTO KOJI
    • G01R31/28G01R19/00H01L21/822H01L27/04
    • G01R19/16552G01R31/3004
    • PROBLEM TO BE SOLVED: To reliably detect a supply voltage at a plurality of locations in an integrated circuit by a simple configuration and improve setting accuracy of a supply voltage for the integrated circuit regardless of the locations in the integrated circuit.
      SOLUTION: The inside of the integrated circuit 20 includes a plurality of voltage sensing locations 22-1 to 22-7; a selection circuit 24 connected to the plurality of voltage sensing locations 22-1 to 22-7 for selecting one voltage sensing location among the plurality of voltage sensing locations 22-1 to 22-7 on the basis of input signals; and a voltage sensing terminal 25 connected to the selection circuit 24 for outputting a voltage of the one voltage sensing location selected by the selection circuit 24 to the outside of the integrated circuit 20.
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:通过简单的配置可靠地检测集成电路中的多个位置处的电源电压,并且提高集成电路的电源电压的设置精度,而与集成电路中的位置无关。 解决方案:集成电路20的内部包括多个电压感测位置22-1至22-7; 连接到多个电压感测位置22-1至22-7的选择电路24,用于基于输入信号选择多个电压感测位置22-1至22-7中的一个电压感测位置; 以及连接到选择电路24的电压感测端子25,用于将由选择电路24选择的一个电压感测位置的电压输出到集成电路20的外部。版权所有(C)2008,JPO&INPIT
    • 7. 发明专利
    • Low voltage detection circuit
    • 低电压检测电路
    • JP2007121088A
    • 2007-05-17
    • JP2005313041
    • 2005-10-27
    • Sanyo Electric Co Ltd三洋電機株式会社
    • SUGANO TAKASHI
    • G01R19/165
    • G01R19/16552G06F11/0757
    • PROBLEM TO BE SOLVED: To provide an accurate low voltage detection circuit having high reliability in turning on power and during normal operation.
      SOLUTION: This low voltage detection circuit comprises: a reference voltage generation circuit 10; a voltage dividing circuit 20; a comparator 30 as a comparison circuit; and a second constant-current transistor M2 series-connected to the dividing circuit 20. An auxiliary current transistor Ma is series-connected to a load element 40 in the same way as a first constant-current transistor M1. This current transistor Ma is controlled by a drain voltage A of the constant-current transistor M2. Further, the gate of the constant-current transistor M2 and the gate of the constant-current transistor M1 are connected to each other to form a current mirror. The size of the constant-current transistor M2 is adjusted so as to allow a second constant current I2 to pass therethrough, with the constant current I2 being several times as large as a first constant current I1 flowing through the constant-current transistor M1.
      COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:提供一种在打开电源和正常操作时具有高可靠性的精确低电压检测电路。 解决方案:该低电压检测电路包括:参考电压产生电路10; 分压电路20; 作为比较电路的比较器30; 以及与分频电路20串联连接的第二恒流晶体管M2。辅助电流晶体管Ma以与第一恒流晶体管M1相同的方式与负载元件40串联连接。 该电流晶体管Ma由恒流晶体管M2的漏极电压A控制。 此外,恒流晶体管M2的栅极和恒流晶体管M1的栅极彼此连接以形成电流镜。 调整恒流晶体管M2的尺寸,以便允许第二恒定电流I2通过,其中恒定电流I2是流过恒流晶体管M1的第一恒定电流I1的数倍。 版权所有(C)2007,JPO&INPIT
    • 9. 发明专利
    • Power supply system
    • 电源系统
    • JP2006250788A
    • 2006-09-21
    • JP2005069127
    • 2005-03-11
    • Elpida Memory IncSyswave Corpエルピーダメモリ株式会社株式会社シスウェーブ
    • TANIGUCHI JUNYAKANEKO AKIFUMI
    • G01R31/26
    • G01R1/36G01R19/16552G01R31/28
    • PROBLEM TO BE SOLVED: To solve a problem wherein there is a mistake of reversely inserting an evaluated device (DUT) to a socket, the reverse insertion causes excessive current to flow in the DUT, a soldering ball of a BGA package melts, the DUT is damaged, and the device itself is broken.
      SOLUTION: This power supply system has a determination circuit for determining an overload state by monitoring the power source voltage applied to the DUT. The power supply system detects the overload just after turning on the DUT power source as the reverse insertion of the device, and can interrupt the power source to the DUT in a short time substantially equal to the start-up time of the DUT power source.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题为了解决将评估装置(DUT)反向插入插座的错误的问题,反向插入导致DUT中过大的电流流动,BGA封装的焊球熔化 ,DUT被损坏,设备本身损坏。

      解决方案:该电源系统具有通过监视施加到DUT的电源电压来确定过载状态的确定电路。 电源系统在接通DUT电源后才会检测到过载,因为器件的反向插入,并且可以在短时间内将DUT的电源中断到与DUT电源的启动时间相当的短时间内。 版权所有(C)2006,JPO&NCIPI