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1. 发明专利

KR20210034906A KR20210034906A - Optical apparatus for inspecting probe card needle 审中-公开
公开(公告)号：KR20210034906A
公开(公告)日：2021-03-31
申请号：KR1020190116843A
申请日：2019-09-23
申请人： 최민영
发明人： 최민영 , 윤정렬
IPC分类号： G01N21/956 , G01N21/17 , G01N21/88 , G01R1/067
CPC分类号： G01N21/95607 , G01N21/1717 , G01N21/8806 , G01N21/8851 , G01R1/06711
摘要： 본 발명은 프로브 카드 니들 검사용 광학장치에 관한 것으로, 검사 대상인 프로브 카드의 니들 상태를 관찰하기 위한 광을 조사하는 비전 검사용 광원유닛; 광축정렬을 위한 기준이 되는 마스크 이미지를 결상시키기 위한 광을 조사하는 광축정렬용 광원유닛; 상기 비전 검사용 광원유닛으로부터 조사된 광이 투과되어 상기 검사 대상인 프로브 카드의 니들을 비추거나, 상기 광축정렬용 광원유닛으로부터 조사된 광이 투과되어 상기 마스크 이미지가 광축정렬 기준 위치에 형성되도록 하는 대물렌즈부; 상기 비전 검사용 광원유닛 또는 광축 정렬용 광원유닛으로부터 조사된 광은 반사시켜 일 방향을 따라 상기 대물렌즈부에 투과되게 하고, 상기 일 방향과 반대한 타 방향으로 상기 대물렌즈부를 투과한 광은 통과시키는 제1빔 스플리터(Beam Splitter)부; 및 상기 제1빔 스플리터로부터 통과되어 인식되는 상기 검사 대상인 프로브 카드의 니들 이미지 혹은 상기 마스크 이미지를 획득하는 촬상유닛;을 포함하며, 상기 대물렌즈부는 25mm 이상의 작업거리(Working Distance) 및 1um 이하의 광학 분해능(Optical Resolution)을 갖추도록 마련된다.

2. 实用新型

JP3215716U 蛍光ナノダイヤモンドを使用した撮像システムおよびその方法有权
公开(公告)号：JP3215716U
公开(公告)日：2018-04-12
申请号：JP2018600010
申请日：2016-04-08
申请人：ビカンタコーポレイション , ザユナイテッドステイツオブアメリカ, アズリプレゼンテッドバイザセクレタリー, デパートメントオブヘルスアンドヒューマンサービシーズ
发明人：バム,アンビカ , ニューマン,ケールカジャル
IPC分类号： G01Q70/14 , G01N21/64
CPC分类号： G01N21/1717 , C12Q1/6825 , G01N21/6408 , G01N21/6428 , G01N21/6458 , G01N21/648 , G01N21/6489 , G01N33/54346 , G01N33/54366 , G01N33/551 , G01N2021/1727 , G01N2201/0221 , G01N2201/06113 , G01Q30/02 , G02B21/16
摘要：【課題】天然由来の蛍光生体分子および固定剤からの不要なバックグラウンド蛍光から有用な信号を確実かつ正確に分離することができる撮像システムを提供する。【解決手段】標本を載置するための撮像ステージと、蛍光ダイヤモンドを励起するように構成され、かつ標本に指向される放射線源と、ダイヤモンドの蛍光を検出するように構成され、かつ標本からの蛍光を検出するように構成された蛍光検出器と、標本に時変磁場を印加するように構成された装置と、を備える。放射線源は、レーザおよびキセノンアークランプからなる群から選択され、蛍光ダイヤモンドは、蛍光ナノダイヤモンドであり、シリカ被覆蛍光ダイヤモンドまたは機能化シリカ被覆蛍光ダイヤモンド、または機能化シリカ被覆蛍光ナノダイヤモンドを含む、本撮像システムは、様々な磁場下で得られる標本の蛍光比較画像を提供する。【選択図】図1

3. 发明专利

JP6306696B2 端末及び電子防水方法有权
公开(公告)号：JP6306696B2
公开(公告)日：2018-04-04
申请号：JP2016521689
申请日：2014-06-09
申请人：ゼットティーイーコーポレーション , ZTE CORPORATION
发明人：リー,シャオタン
IPC分类号： H04M1/02 , H04M1/00
CPC分类号： H02J7/0031 , G01N21/1717 , G01N21/552 , G01N2021/1723 , G01N2021/555 , G06F1/16 , H01M2010/4271 , H04B1/3833 , H04B2001/3894 , H04M1/026 , H04M1/18

4. 发明专利

JP6298654B2 過渡吸収応答検出装置および過渡吸収応答検出方法有权
公开(公告)号：JP6298654B2
公开(公告)日：2018-03-20
申请号：JP2014039995
申请日：2014-02-28
申请人：国立大学法人埼玉大学
发明人：塩田達俊
IPC分类号： G02F2/02 , G02F1/11 , G01N21/27 , G01J9/04
CPC分类号： G01N21/1717 , G01N2021/1725 , G01N2021/1789 , G01N2201/0697

5. 发明专利

JP2014032193A Analysis device and method for photothermal analysis of sample 有权
标题翻译：分析装置和方法用于样品的光热分析
公开(公告)号：JP2014032193A
公开(公告)日：2014-02-20
申请号：JP2013158026
申请日：2013-07-30
申请人： Netzsch-Geraetebau Gmbh , ネッチュゲレーテバウゲゼルシャフトミットベシュレンクテルハフツング
发明人： BRUNNER MARTIN , JUERGEN BLUMM , DENNER THOMAS , CAMPBELL ROBERT , HILPERT THILO , GEBHARDT MICHAEL , LAUTERBACH STEFAN , ANDREAS STROBEL , TSCHOEPEL JUERGEN , SCHOEDEL MATTHIAS , ANDRE LINDEMANN , ANDREAS HARTINGER
IPC分类号： G01N25/18
CPC分类号： G01N21/1717 , G01N25/18
摘要： PROBLEM TO BE SOLVED: To provide an analysis device and method which is superior in measurement accuracy and reproducibility and can execute photothermal analysis of a sample at a higher temperature.SOLUTION: A photothermal analysis device 10 includes: excitation sources 14, 20, and 22 for generating an electromagnetic excitation beam 18 directed to the excitation side of a sample 12; a detector 28 for detecting heat radiation 26 from the detection side of the sample 12; and a sample chamber 36 in which a sample holder 13 for temperature adjustment, to which the sample 12 is set, is housed. A detection optical system is provided between the sample holder 13 and the detector 28 and can be displaced to adjust a field of view of the detector 28 on a sample surface.
摘要翻译：要解决的问题：提供测量精度和再现性优异并且可以在较高温度下进行样品的光热分析的分析装置和方法。解决方案：光热分析装置10包括：激发源14,20和22 用于产生指向样品12的激发侧的电磁激发光束18; 用于从样品12的检测侧检测热辐射26的检测器28; 和容纳有样品12的温度调节用样品架13的样品室36。检测光学系统设置在样品保持器13和检测器28之间，并且可移位以调节检测器28在样品表面上的视场。

6. 发明专利

JP5340648B2 Subject information calculating device and subject information calculation method 有权
公开(公告)号：JP5340648B2
公开(公告)日：2013-11-13
申请号：JP2008154432
申请日：2008-06-12
申请人：オリンパスメディカルシステムズ株式会社
发明人：誠五十嵐
IPC分类号： A61B10/00 , A61B8/00 , G01N21/17
CPC分类号： G01N21/1717 , A61B5/0068 , A61B5/0073 , A61B5/0095 , A61B8/08 , G01N21/1702 , G01N21/4795 , G01N29/0672 , G01N29/2418 , G01N2021/1787
摘要： A biological observation apparatus according to an aspect of the present invention includes a sound wave radiating unit that radiates a sound wave into an object to be examined, a light radiating unit that radiates first light having a predetermined wavelength and second light different from the first light into a portion of the object influenced by the sound wave, a detector that detects reflected light of the first light and reflected light of the second light, and a calculation unit that calculates characteristic information of the object based on the reflected light of the first light and the reflected light of the second light.

7. 发明专利

JP5317449B2 measuring device 有权
公开(公告)号：JP5317449B2
公开(公告)日：2013-10-16
申请号：JP2007237320
申请日：2007-09-12
申请人：キヤノン株式会社
发明人：裕西原
IPC分类号： G01N21/17
CPC分类号： A61B5/0059 , A61B5/0097 , G01N21/1717 , G01N21/4795 , G01N2021/1727
摘要： A measurement apparatus is configured to measure a spectroscopic characteristic of a specimen. The measurement apparatus includes a light source (100) configured to generate light to be irradiated onto the specimen, an ultrasound generating unit (5b) configured to generate an ultrasound, an ultrasound focusing unit (5b) configured to focus the ultrasound generated by the ultrasound generating unit on a measurement area of the specimen, alightdetectingunit (400) configuredtodetect modulated light derived from the light by an acoustooptical effect on the measurement area of the specimen, and a control unit (600) configured to control, based on an output of the light detecting unit, at least one of an intensity and a frequency of the ultrasound generated by the ultrasound generating unit, an ultrasound focusing size (Dl, D2) made by the ultrasound focusing unit, and an intensity of the light generated from the light source.

8. 发明专利

JP5307155B2 Non-destructive inspection using a laser ultrasonic and infrared thermography 有权
公开(公告)号：JP5307155B2
公开(公告)日：2013-10-02
申请号：JP2010536898
申请日：2007-12-06
申请人：ロッキードマーティンコーポレイションLockheed Martin Corporation
发明人：ロレーヌ、ピーター、ウィリアム , ハワード、ドナルド、ロバート , リンガーマチュール、ヘンリー、イスラエル , デュボイス、マルク , ドレイク、トーマス、イー．ジュニア
IPC分类号： G01N29/00 , G01N25/72
CPC分类号： G01N21/1717 , G01N21/1702 , G01N21/718 , G01N21/8851 , G01N25/72 , G01N29/228 , G01N29/2418 , G01N2021/1706 , G01N2021/8472 , G01N2201/0697 , G01N2291/0231
摘要： An inspection system (200) is provided to examine internal structures of a target material (216). This inspection system includes a generation laser (210), an ultrasonic detection system (220, 226, 228, 230), a thermal imaging system (234), and a processor/control module (232). The generation laser (210) produces a pulsed laser beam (212) that is operable to induce ultrasonic displacements and thermal transients at the target material (216). The ultrasonic detection system detects ultrasonic surface displacements at the target material (216). The thermal imaging system (234) detects thermal transients at the target material (216). The processor (232) analyzes both detected ultrasonic displacements and thermal imagery of the target material (216) to yield information about the target material's internal structure. The target material (216) preferably comprises composite material.

10. 发明专利

JP5006331B2 Light reflection characterization method of strain and active dopant in the semiconductor structure 有权
公开(公告)号：JP5006331B2
公开(公告)日：2012-08-22
申请号：JP2008537865
申请日：2006-10-25
申请人：ザイトロニクス・コーポレーション
发明人：チスム，ウィリアム・ダブリュー，ザ・セカンド
IPC分类号： H01L21/66 , G01N21/00 , G01N21/27 , G01N21/39 , G01N21/47
CPC分类号： G01N21/1717 , H01L22/14

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