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    • 3. 发明专利
    • Random number generator
    • 随机数发电机
    • JP2010055205A
    • 2010-03-11
    • JP2008217143
    • 2008-08-26
    • Toshiba Corp株式会社東芝
    • MATSUMOTO MARITANAMOTO TETSUSHIYASUDA SHINICHI
    • G06F7/58G09C1/00H03K3/84
    • G06F7/588
    • PROBLEM TO BE SOLVED: To hold a noise signal which is necessary for generation of random numbers regardless of the number of times of use or the frequency of use even by using a random noise generation element using a trap. SOLUTION: A random number generator includes: a voltage supply circuit 20; a random noise generation element 10 having source/drain regions formed on a semiconductor substrate, a tunnel insulating film as a channel between the source and drain, a gate electrode to which a voltage from a voltage supply circuit on the tunnel insulating film is applied; and a charge trap part installed between the tunnel insulating film and the gate electrode for generating a random noise in drain currents flowing between the source and source based on the charge caught by the charge trap part; a random number conversion circuit 30 for converting a random noise generated from the random noise generation element into a random number, and for outputting it; a verification circuit 50 for verifying the random number to be output from the random number conversion circuit; and an initialization circuit 70 for pulling out the charge in the charge trap part to the semiconductor substrate, and for initializing the charge trap part. COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:即使使用使用陷阱的随机噪声产生元件,也可以保持生成随机数所需的噪声信号,而不管使用次数或使用频率。 解决方案:随机数发生器包括:电压供应电路20; 具有形成在半导体衬底上的源/漏区的随机噪声生成元件10,作为源极和漏极之间的沟道的隧道绝缘膜,施加来自隧道绝缘膜上的电压供应电路的电压的栅电极; 以及电荷陷阱部分,其安装在所述隧道绝缘膜和所述栅电极之间,用于基于由所述电荷捕获部分捕获的电荷产生在所述源极和源极之间流动的漏极电流中的随机噪声; 随机数转换电路30,用于将从随机噪声生成元件生成的随机噪声转换为随机数,并将其输出; 验证电路50,用于验证从随机数转换电路输出的随机数; 以及用于将电荷陷阱部分中的电荷拉出到半导体衬底并用于初始化电荷陷阱部分的初始化电路70。 版权所有(C)2010,JPO&INPIT
    • 4. 发明专利
    • Random number inspection circuit, random number generation circuit, semiconductor integrated device, ic card, and information terminal device
    • 随机数检查电路,随机数生成电路,半导体集成器件,IC卡和信息终端器件
    • JP2005249969A
    • 2005-09-15
    • JP2004058199
    • 2004-03-02
    • Toshiba Corp株式会社東芝
    • YASUDA SHINICHIFUJITA SHINOBUFUJISAKI KOICHITANAMOTO TETSUSHIABE KEIKO
    • G06F7/58G01R31/28G06F11/00G09C1/00H03K3/84
    • G06F7/58G01R31/3181
    • PROBLEM TO BE SOLVED: To provide a random number inspection circuit for easily inspecting periodicity of random number output, a random number generation circuit equipped with the same, a semiconductor integrated device, an IC card, and an information device terminal using the random number generation circuit. SOLUTION: By focusing on how many types of series of "1" and "0" exist in random number output and counting the series in a random number sequence to check the type of the series, the periodicity of the random number sequence is inspected abnormality is determined. That is, the random number inspection circuit comprises: a first means to count the number of times where the same value continues in the random number sequence; a second means to check, based on the output of the first means, the type of the number of times where the same value continues in the random number sequence; and the third means to determine, based on the output of the second means, the abnormality of the random number sequence. COPYRIGHT: (C)2005,JPO&NCIPI
    • 要解决的问题:为了提供一种用于容易地检查随机数输出的周期性的随机数检查电路,配备有随机数输出的随机数生成电路,半导体集成器件,IC卡和信息器件端子,其使用 随机数生成电路。 解决方案:通过关注随机数输出中存在多少种类型的“1”和“0”,并以随机数序列对序列进行计数,以检查序列的类型,随机数序列的周期性 被检查异常确定。 也就是说,随机数检查电路包括:对随机数序列中持续相同值的次数进行计数的第一装置; 第二装置,基于第一装置的输出,检查在随机数序列中持续相同值的次数的类型; 以及基于第二装置的输出来确定随机数序列的异常的第三装置。 版权所有(C)2005,JPO&NCIPI
    • 5. 发明专利
    • Programmable logic circuit
    • 可编程逻辑电路
    • JP2010081172A
    • 2010-04-08
    • JP2008245532
    • 2008-09-25
    • Toshiba Corp株式会社東芝
    • TANAMOTO TETSUSHISUGIYAMA HIDEYUKIIKEGAMI KAZUTAKASAITO YOSHIAKI
    • H03K19/177H01L21/8246H01L27/10H01L27/105H01L29/82H03K19/18
    • H03K19/1776G11C13/0002H03K19/17764H03K19/1778H03K19/17784H03K19/18
    • PROBLEM TO BE SOLVED: To restrain influence on writing and retaining characteristics as much as possible even in the case of microfabricating a storage device and to restrain a software error from occurring. SOLUTION: A programmable logic circuit is provided with: an input section 100 receiving a plurality of input signals; and a programmable cell array 200 in which a plurality of unit programmable cells are arranged in matrix, the cells being connected in parallel with a first resistance variation type programmable storing circuit including a first transistor and a second resistance variation type programmable storing circuit including a second transistor. In the array, each gate of the first transistors of the unit programmable cells on the same row receives one input signal selected from a plurality of input signals and each gate of the second transistors receives an inverted signal of the selected input signal, and output terminals of the respective, first and second storing circuits of the unit programmable cells on the same column are connected to a common output line. COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:即使在对微存储装置进行微加工并且抑制软件错误发生的情况下,也尽可能地限制对写入和保持特性的影响。 解决方案:可编程逻辑电路具有:输入部分100,其接收多个输入信号; 以及多个单元可编程单元以矩阵形式布置的可编程单元阵列200,所述单元与包括第一晶体管和第二电阻变化型可编程存储电路的第一电阻变化型可编程存储电路并联连接,所述第一电阻变化型可编程存储电路包括第二 晶体管。 在阵列中,同一行上的单元可编程单元的第一晶体管的每个栅极接收从多个输入信号中选择的一个输入信号,并且第二晶体管的每个栅极接收所选输入信号的反相信号,并且输出端 在同一列上的单元可编程单元的相应的第一和第二存储电路连接到公共输出线。 版权所有(C)2010,JPO&INPIT
    • 6. 发明专利
    • スピンMOSFET
    • 基于旋转的MOSFET
    • JP2015061045A
    • 2015-03-30
    • JP2013195731
    • 2013-09-20
    • 株式会社東芝Toshiba Corp
    • ISHIKAWA MIZUEIGUCHI TOMOAKISUGIYAMA HIDEYUKITANAMOTO TETSUSHISAITO YOSHIAKI
    • H01L29/82H01L29/66
    • H01L29/45G11C11/161H01L29/0847H01L29/0895H01L29/41725H01L29/66227H01L29/66984H01L29/82
    • 【課題】高いMC比を実現することのできるスピンMOSFETを提供する。【解決手段】半導体層と、半導体層上に設けられた強磁性層を有するソース電極およびドレイン電極と、チャネルとなる半導体層上に設けられたゲート絶縁膜とゲート電極と、を備えたスピンMOSFETであって、ソース電極側の接合抵抗が前記ドレイン電極側の接合抵抗より大きく、スピンMOSFETがnチャネル型の場合は、ソース電極およびドレイン電極は、フェルミ面70と価電子帯90の上端とのギャップエネルギーEvの大きさが伝導帯80の下端とフェルミ面70とのギャップエネルギーEcの大きさより大きい強磁性体を含み、スピンMOSFETがpチャネル型の場合は、ソース電極およびドレイン電極は、フェルミ面70と価電子帯90の上端とのギャップエネルギーEvの大きさが伝導帯80の下端とフェルミ面とのギャップエネルギーEcの大きさより小さい強磁性体を含む。【選択図】図1
    • 要解决的问题:提供可以实现高MC(MagnetoCurrent)比率的自旋基MOSFET。解决方案:在包括半导体层,源电极和漏电极的自旋基MOSFET中,其具有铁磁层 半导体层以及设置在作为沟道的半导体层上的栅极绝缘膜和栅电极,源极侧的结合电阻大于漏极侧的结合电阻。 在n沟道自旋基MOSFET的情况下,源电极和漏极包括铁磁体,其中费米面70与价带90的上限之间的间隙能量Ev的量大于 在导带80的下限与费米面70之间的间隙能量Ec的量。在p型自旋基MOSFET的情况下,源电极和漏电极包括铁磁体,其中间隙量 费米表面70与价带90的上限之间的能量Ev小于导带80的下限与费米面之间的间隙能量Ec的量。
    • 7. 发明专利
    • Lookup table circuit and field-programmable gate array
    • LOOKUP表电路和现场可编程门阵列
    • JP2012074900A
    • 2012-04-12
    • JP2010217799
    • 2010-09-28
    • Toshiba Corp株式会社東芝
    • SUGIYAMA HIDEYUKITANAMOTO TETSUSHIMARUGAME TAKAOISHIKAWA MIZUEIGUCHI TOMOAKISAITO YOSHIAKI
    • H03K19/173H01L21/8246H01L27/105H01L29/66H01L29/82H03K5/08H03K17/693
    • H03K19/177
    • PROBLEM TO BE SOLVED: To provide a lookup table circuit and a field-programmable gate array which operate fast.SOLUTION: A lookup table circuit 1 includes: a variable resistance circuit 2 for selecting one from a plurality of variable resistance elements according to an input signal; a reference circuit 4 having a resistance value between a maximum resistance value and a minimum resistance value of the variable resistance circuit 2; a first n-channel MOSFET 6 having a source connected to an end of the variable resistance circuit 2; a second n-channel MOSFET 8 having a source connected to an end of the reference circuit; a first current supply circuit 10 for supplying a current to the variable resistance circuit 2 via a drain of the first n-channel MOSFET 6; a second current supply circuit 12 for supplying a current to the reference circuit 4 via a drain of the second n-channel MOSFET 8; and a comparator 14 for comparing a drain potential of the first n-channel MOSFET 6 and a drain potential of the second n-channel MOSFET 8.
    • 要解决的问题:提供快速操作的查找表电路和现场可编程门阵列。 解决方案:查找表电路1包括:可变电阻电路2,用于根据输入信号从多个可变电阻元件中选择一个; 具有可变电阻电路2的最大电阻值和最小电阻值之间的电阻值的参考电路4; 第一n沟道MOSFET 6,源极连接到可变电阻电路2的一端; 第二n沟道MOSFET 8,其源极连接到参考电路的一端; 用于经由第一n沟道MOSFET 6的漏极向可变电阻电路2提供电流的第一电流供应电路10; 第二电流供应电路12,用于经由第二n沟道MOSFET 8的漏极向参考电路4提供电流; 以及用于比较第一n沟道MOSFET 6的漏极电位和第二n沟道MOSFET 8的漏极电位的比较器14.权利要求:(C)2012,JPO和INPIT
    • 8. 发明专利
    • Switching box circuit, switching block circuit and fpga circuit
    • 开关盒电路,切换块电路和FPGA电路
    • JP2010199731A
    • 2010-09-09
    • JP2009039657
    • 2009-02-23
    • Toshiba Corp株式会社東芝
    • SUGIYAMA HIDEYUKITANAMOTO TETSUSHIMARUGAME TAKAOISHIKAWA MIZUEIGUCHI TOMOAKISAITO YOSHIAKI
    • H03K17/00H01L21/82H01L21/822H01L27/04H03K17/687H03K17/693H03K19/177
    • PROBLEM TO BE SOLVED: To provide a switching box circuit, a switching block circuit and an FPGA circuit, achieving high integration and low power consumption.
      SOLUTION: The switching box circuit includes: first to n-th (≥1) signal lines provided in first to fourth directions respectively; first to n-th input/output parts provided in the first to fourth directions respectively. The i-th (1≤i≤n) input/output part in each direction includes: first to fourth input/output part having one end connected to the i-th signal line in the corresponding direction; first to 2n-th connection terminals; and 2n
      2 spin MOSFETs which are provided in the first to fourth directions respectively and provided each between each of the first to n-th input/output parts and each of the first to 2n-th connection terminals in the directions in order to connect them, and receive clock signals at a gate.
      COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:提供开关盒电路,开关块电路和FPGA电路,实现高集成度和低功耗。 解决方案:开关盒电路包括:分别在第一至第四方向上提供的第一至第n(≥1)个信号线; 分别设置在第一至第四方向上的第一至第n输入/输出部。 每个方向上的第i(1≤i≤n)个输入/输出部分包括:第一至第四输入/输出部分,其一端在相应方向连接到第i信号线; 第一到第2n个连接端子; 和分别设置在第一至第四方向上的2n 2个自旋MOSFET,并且分别设置在第一〜第n输入输出部和第一〜第2n连接端子中的每一个之间 为了连接它们的方向,并在门口接收时钟信号。 版权所有(C)2010,JPO&INPIT