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    • 2. 发明专利
    • Light-emitting element and manufacturing method of the same
    • 发光元件及其制造方法
    • JP2013074001A
    • 2013-04-22
    • JP2011210354
    • 2011-09-27
    • Sony Corpソニー株式会社
    • KURAMOTO MASARUKODA RINTAROWATANABE HIDEKI
    • H01S5/223
    • H01S5/22B82Y20/00H01S5/141H01S5/2009H01S5/2031H01S5/209H01S5/305H01S5/3063H01S5/309H01S5/3211H01S5/3213H01S5/34333H01S5/50H01S2301/166H01S2301/176
    • PROBLEM TO BE SOLVED: To provide a light-emitting element having a high output, which can radiate light beams having a single mode.SOLUTION: The light-emitting element comprises: (a) a laminated structure 20 including a first compound semiconductor layer 21, an active layer 23 and a second compound semiconductor layer 22 sequentially laminated on a base substance 20'; (b) a second electrode 32; and (c) a first electrode 31. The first compound semiconductor layer 21 has a lamination structure of a first clad layer 121A and a first optical guide layer 121B laminated from a base substance side. The laminated structure has a ridge stripe structure 20A including a part 121B' in a thickness direction of the second compound semiconductor layer 22, the active layer 23 and the first optical guide layer. When assuming that a thickness of the first optical guide layer 121B is tand a thickness of the part 121B of the first optical guide layer, which is included in the ridge stripe structure 20A is t', the following relational expressions are satisfied: 6×10m
    • 要解决的问题:提供具有高输出的发光元件,其可以辐射具有单一模式的光束。 解决方案:发光元件包括:(a)包括依次层压在基体20'上的第一化合物半导体层21,有源层23和第二化合物半导体层22的层叠结构20; (b)第二电极32; 和(c)第一电极31.第一化合物半导体层21具有从基体侧层叠的第一包层121A和第一导光层121B的层叠结构。 层叠结构具有在第二化合物半导体层22的厚度方向上具有部分121B'的脊条状结构20A,有源层23和第一导光层。 当假设第一光导层121B的厚度为t 1 时,包括在脊条结构20A中的第一导光层的部分121B的厚度 是t 1 ',满足以下关系式:6×10 - 7 m 1 ,0(m) 1 '≤0.5* t 1 。 版权所有(C)2013,JPO&INPIT
    • 4. 发明专利
    • Surface-emitting semiconductor laser
    • 表面发射半导体激光器
    • JP2010050412A
    • 2010-03-04
    • JP2008215775
    • 2008-08-25
    • Sony Corpソニー株式会社
    • MASUI TAKESHIARAKIDA TAKAHIROKODA RINTAROMAEDA OSAMUOKI TOMOYUKISHIROKISHI NAOTERU
    • H01S5/183
    • H01S5/18336H01S5/0655H01S5/18311H01S5/18316H01S5/18358H01S2301/166
    • PROBLEM TO BE SOLVED: To provide a surface-emitting semiconductor laser that can make high output in a fundamental transverse mode while preventing oscillation in a high-order transverse mode.
      SOLUTION: In the surface-emitting semiconductor laser, a transverse mode adjusting layer 20 is provided on a side of a substrate 10, that is, on a side opposite to a side where the laser is emitted. In the transverse mode adjusting layer 20, a reflectivity in an oscillating wavelength λ on a region opposite to a center region of a light-emitting region 13A is higher than that in the oscillating wavelength λ on a region opposite to an outer peripheral region of the light-emitting region 13A. Accordingly, light output in the fundamental transverse mode is not likely to be prevented by the transverse mode adjusting layer 20, thereby highly maintaining slope efficiency of the fundamental transverse mode.
      COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:提供一种能够在高横向模式下防止振荡的情况下能够实现基本横向模式的高输出的表面发射半导体激光器。 解决方案:在表面发射半导体激光器中,横向模式调节层20设置在基板10的一侧,即在与激光发射侧相反的一侧。 在横模式调整层20中,在与发光区域13A的中心区域相反的区域上的振荡波长λ的反射率高于在与发光区域13A的外周区域相反的区域的振荡波长λ的反射率 发光区域13A。 因此,横向模式调节层20不可能防止基本横模的光输出,从而高度保持基本横模的斜率效率。 版权所有(C)2010,JPO&INPIT
    • 5. 发明专利
    • Semiconductor light-emitting element
    • 半导体发光元件
    • JP2010034408A
    • 2010-02-12
    • JP2008196642
    • 2008-07-30
    • Sony Corpソニー株式会社
    • KODA RINTAROWATABE YOSHIAKI
    • H01S5/22H01S5/343
    • PROBLEM TO BE SOLVED: To provide a light-emitting element capable of defining a horizontal optical confinement property without depending physical property values too much.
      SOLUTION: On a substrate 10, a lower clad layer 21, an active layer 22, an upper clad layer 23 and a contact layer 24 are formed in this order, and the upper part of the upper clad layer 23 and the contact layer 24 serve as a ridge waveguide 25. A multilayer reflection film 30 is formed by laminating sequentially a first thin film 31 and a second thin film 32 on both sides of the ridge waveguide 25 from the side surface side of the ridge waveguide 25.
      COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:提供一种能够在不依赖物理性能值的情况下限定水平光限制特性的发光元件。 解决方案:在基板10上,依次形成下包层21,有源层22,上覆层23和接触层24,并且上覆层23的上部和触点 层24用作脊状波导25.多个反射膜30通过从脊状波导25的侧面侧依次层叠脊状波导25的两侧的第一薄膜31和第二薄膜32而形成。 P>版权所有(C)2010,JPO&INPIT
    • 6. 发明专利
    • Semiconductor light-emitting device
    • 半导体发光器件
    • JP2007324313A
    • 2007-12-13
    • JP2006151772
    • 2006-05-31
    • Sony Corpソニー株式会社
    • KODA RINTAROARAKIDA TAKAHIROYAMAUCHI YOSHINORIMASUI TAKESHIYAMAGUCHI NORIHIKO
    • H01L31/12H01L31/09H01S5/183
    • H01S5/0264H01S5/0683H01S5/1078H01S5/18311H01S2301/18
    • PROBLEM TO BE SOLVED: To provide a semiconductor light-emitting device, capable of reducing a detection level of amplified spontaneous emission light by a semiconductor photodetector, by selectively reflecting the amplified spontaneous emission light, thereby improving the light detection accuracy. SOLUTION: The semiconductor light emitting device includes a surface-emitting semiconductor laser 1, a filter 3, and the semiconductor photodetector 2. The surface-emitting semiconductor laser 1 includes an n-type DBR layer 12 to a p-type contact layer 17, stacked in this order, on a substrate 11. The filter 3 has transmittance characteristics where the transmissivity in a direction parallel to the optical axis of stimulated emission light (laminating direction) is higher than the transmissivity in a direction different from the optical axis of the light output from the laser 1. The semiconductor photodetector 2 has a light-absorbing layer 21 for absorbing part of the light which has transmitted through the filter 3. The filter 3 and the semiconductor photodetector 2 are formed superimposed with the surface-emitting semiconductor laser 1, in this order, on the surface of the p-type contact layer 17. COPYRIGHT: (C)2008,JPO&INPIT
    • 解决的问题:为了提供能够通过选择性地反射放大的自发发射光来降低半导体光电检测器放大的自发发射光的检测水平的半导体发光装置,从而提高光检测精度。 解决方案:半导体发光器件包括表面发射半导体激光器1,滤光器3和半导体光电检测器2.表面发射半导体激光器1包括n型DBR层12到p型接触 层17依次层叠在基板11上。滤光器3具有透射率特性,其中沿与受激发光的光轴平行的方向的透射率(层叠方向)高于与光学方向不同的方向的透射率 半导体光电检测器2具有用于吸收已经透射过滤器3的部分光的光吸收层21.滤光器3和半导体光电检测器2与表面 - 发光半导体激光器1依次形成在p型接触层17的表面上。(C)2008,JPO&INPIT
    • 7. 发明专利
    • Semiconductor light emitting device
    • 半导体发光器件
    • JP2007207845A
    • 2007-08-16
    • JP2006022428
    • 2006-01-31
    • Sony Corpソニー株式会社
    • YAMAUCHI YOSHINORIARAKIDA TAKAHIROKODA RINTAROYAMAGUCHI NORIHIKOMASUI TAKESHI
    • H01S5/026H01S5/18
    • PROBLEM TO BE SOLVED: To provide a semiconductor light emitting device where a detection level of natural radiated light by a semiconductor photodetector is reduced by reflecting natural radiated light at a high reflectivity, and optical detection precision can be more improved.
      SOLUTION: The semiconductor light emitting device includes a surface light emitting semiconductor laser 1, a semiconductor photodetector 2, and an optical control layer 3. The surface light emitting semiconductor laser 1 has a substrate 10 and a semiconductor laminated structure 11 comprising a light emitting region 14A. The semiconductor photodetector 2 has a substrate 20 having a hole 20A in a region corresponding to a region comprising the light emitting region 14A, and a semiconductor laminated structure 21 having a light absorbing layer 22 absorbing part of light which is made incident. The optical control layer 3 is formed in a region corresponding to the peripheral region of the light emitting region 14A in the semiconductor laminated structure 11, and has an opening 3A in the region corresponding to the light emitting region 14A. The optical control layer 3 and the semiconductor photodetector 2 are overlapped on a semiconductor laminated structure 11 side of the surface emitting semiconductor layer 1 in this order, and are integrally formed with the surface emitting semiconductor laser 1.
      COPYRIGHT: (C)2007,JPO&INPIT
    • 解决的问题:提供一种半导体发光器件,其中半导体光电探测器的自然辐射光的检测水平通过反射高反射率的自然辐射光而降低,并且可以更好地提高光学检测精度。 解决方案:半导体发光器件包括表面发光半导体激光器1,半导体光电检测器2和光学控制层3.面发光半导体激光器1具有基板10和半导体层叠结构11, 发光区域14A。 半导体光检测器2具有在与包含发光区域14A的区域对应的区域中具有孔20A的基板20和具有吸收部分入射光的光吸收层22的半导体层叠结构21。 光控制层3形成在与半导体叠层结构体11中的发光区域14A的周边区域对应的区域中,并且在对应于发光区域14A的区域中具有开口3A。 光控制层3和半导体光检测器2依次重叠在表面发射半导体层1的半导体叠层结构11侧上,并与表面发射半导体激光器1一体地形成。(C) 2007年,日本特许厅和INPIT