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    • 3. 发明专利
    • FIELD EMISSION TYPE ELECTRON SOURCE ELEMENT AND ITS MANUFACTURE
    • JPH09115429A
    • 1997-05-02
    • JP27235795
    • 1995-10-20
    • SHARP KK
    • URAYAMA MASAOTAKEGAWA YOSHIYUKIMORITA HIROKOYANO MORICHIKA
    • H01J9/02H01J1/30H01J1/304
    • PROBLEM TO BE SOLVED: To improve high reliability and element characteristics such as low voltage driving by shortening a distance between an electron emitting part and a gate electrode, and selecting various materials as a material of the electron emitting part. SOLUTION: This electron source element is formed by working a surface of a slicon substrate 3, and is composed of a silicon projecting part 1 being a cold cathode to emit an electron on the basis of the principle of electron emission and a gate electrode layer 5 arranged on the periphery of the silicon projecting part 1 through an insulating layer 4. An end part of the gate electrode layer 5 is formed in the shape of projecting so as to surround the tip of the silicon projecting part 1, and a space 6 is arranged so that a distance between the tip of the silicon projecting part 1 and an end part of the insulating layer 4 in the plane direction of the silicon substrate 3 becomes larger than a distance between the tip of the silicon projecting part 1 and an end part of the gate electrode layer 5 in the plane direction of the silicon substrate 3, and surface coat layers 2a and 2b are arranged on a surface in the tip vicinity of the silicon projecting part 1 and the gate electrode layer 5, and a field emission type electron source element is constituted.