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1. 发明专利

JP2009274129A Roll gap measuring device 有权
标题翻译：辊隙测量装置
公开(公告)号：JP2009274129A
公开(公告)日：2009-11-26
申请号：JP2008130461
申请日：2008-05-19
申请人： Nippon Steel Corp , Power Mnc Co Ltd , 新日本製鐵株式会社 , 株式会社パワーエムエヌシー
发明人： MARUKI YASUO , SANJO SATORU , IWASAKI JUNYA , YANO TAKAYUKI , NISHIHARA TAKASHI , SHIRAGAMI TAKAYUKI , JEON JAE YOUNG , HERR JEE-HAING , PARK KYU-CHOL
IPC分类号： B22D11/16
CPC分类号： B22D11/08
摘要： PROBLEM TO BE SOLVED: To measure a roll gap with high accuracy for a long time by suppressing a phenomenon in which a foreign substance is stuck while ensuring the safety of a sensor head without changing the length of protrusion of the sensor head from a sensor housing. SOLUTION: A sensor head 11 is constituted of a body 11a and a head portion 11b conically continuing to the end of the body 11a and having a shape in which a top of the head portion is bent like convex for a roll 4 side, and an annular step portion 11e is provided between the lower end of the head portion 11b and the upper end of the body 11a. In the device, the sensor head 11 which has contacted the roll 4 is pressed downward, and when the lower end of the head portion 11b enters the sensor housing 12, a receiving portion A having an annular band-like bottom surface is formed, and a foreign substance x is received in the step difference 11e. When the sensor head 11 moves back to the original position, the foreign substance x is pushed out as it is by the step difference 11e, thereby preventing sticking of the foreign substance. COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：为了在不改变传感器头的突出长度的同时确保传感器头的安全性，通过抑制异物粘附的现象来长时间地高精度地测量辊间隙传感器外壳。解决方案：传感器头11由主体11a和头部11b构成，头部11b圆锥形连续到主体11a的端部，并且具有头部的顶部弯曲成为辊4侧的凸起的形状并且在头部11b的下端和主体11a的上端之间设置有环状台阶部11e。在该装置中，已经接触到辊4的传感器头11被向下按压，并且当头部11b的下端进入传感器壳体12时，形成具有环形带状底表面的容纳部分A，并且在步差11e中接收到异物x。当传感器头11移回到初始位置时，异物x按步骤差11e被推出，从而防止异物粘附。版权所有（C）2010，JPO＆INPIT

2. 发明专利

JP2006231350A Method and instrument for measuring interval of rolls for continuous caster 有权
标题翻译：用于测量连续铸造辊的间距的方法和仪器
公开(公告)号：JP2006231350A
公开(公告)日：2006-09-07
申请号：JP2005046895
申请日：2005-02-23
申请人： Nippon Steel Corp , 新日本製鐵株式会社
发明人： NISHIHARA TAKASHI , SHIRAGAMI TAKAYUKI , YANO TAKAYUKI
IPC分类号： B22D11/16
摘要： PROBLEM TO BE SOLVED: To provide a method and an instrument for measuring the interval of rolls for a continuous caster, wherein the abnormality of bearing for receiving the roll shaft can be detected at early time by measuring the interval of the rolls only at one time.
SOLUTION: The method for measuring the interval of the rolls for the continuous caster, is characterized in that in the method for measuring roll interval, that is for measuring the interval of the faced roll pair 2 by passing the roll interval measuring instrument 1 through in a cast slab passage of the continuous caster, at least at two positions in the width direction of the cast slab and two positions in the casting direction, the interval D of the roll pair, is measured, the interval D of roll pair is divided into a factor W having a fixed value independently of roll-rotation and a factor variable in a sinusoidal state depending on the roll-rotation, and the factor variable in the sinusoidal state is varied in phase at two positions in the width direction of the cast slab and also, this amplitude of vibration (a) is kept to have a fixed ratio at two positions in the width direction of the cast slab, and based on the measured result of the interval of the roll pair 2, the factor W having the fixed value is calculated.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供一种用于测量连续脚轮的辊间隔的方法和仪器，其中通过仅测量辊的间隔可以在早期检测用于接收辊轴的轴承的异常一次解决方案：连续铸造辊的间隔测量方法的特征在于，在辊间隔测量方法中，即通过辊间隔测量仪测量面对辊对2的间隔的方法在连续铸造机的铸坯通道中，至少在铸坯的宽度方向上的两个位置和铸造方向上的两个位置测量轧辊对的间隔D，轧辊对的间隔D 被分为具有与滚动旋转无关的固定值的因子W和根据滚动旋转的正弦状态的因子变量，并且正弦状态中的因子变量在宽度方向上的两个位置处相位变化铸造板坯，并且振幅（a）的振幅在铸坯的宽度方向上的两个位置处保持固定比例，并且基于辊对2的间隔的测量结果，因子计算具有固定值的W。版权所有（C）2006，JPO＆NCIPI

3. 发明专利

JP2008246494A Instrument and method for detecting roll-rotation abnormality in continuous-casting facility 有权
标题翻译：用于检测连续铸造设备中的滚动不正常性的仪器和方法
公开(公告)号：JP2008246494A
公开(公告)日：2008-10-16
申请号：JP2007087704
申请日：2007-03-29
申请人： Nippon Steel Corp , 新日本製鐵株式会社
发明人： YANO TAKAYUKI
IPC分类号： B22D11/16 , B22D11/08
摘要： PROBLEM TO BE SOLVED: To accurately detect the rotation abnormality of the roll arranged in a continuous-casting facility.
SOLUTION: The roll-rotation abnormality detecting instrument 30 for detecting the rotation abnormality of the rolls 14 in the continuous-casting facility is provided with: a first roll abutting surface 71 for abutting on the roll 13; a second roll abutting surface 72 for abutting on the roll 14; an abutting surface energizing member 45 for energizing so as to mutually separate the first roll abutting surface 71 and the second roll abutting surface 72; and a friction force detecting mechanism 51 for detecting the friction force loaded in the direction along the passing-through direction D
1 to the second roll abutting surface 72. The first roll abutting surface 71 can simultaneously be abutted to the two rolls 13 set side by side, and the second roll abutting surface 72 can simultaneously be abutted to two rolls 14 set side by side.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：精确地检测连续铸造设备中布置的辊的旋转异常。解决方案：用于检测连续铸造设备中的辊14的旋转异常的滚动转动异常检测装置30设置有：抵靠辊13的第一辊抵接面71; 用于抵接在辊14上的第二辊抵接表面72; 用于激励以相互分离第一辊抵接表面71和第二辊抵靠表面72的邻接表面激励构件45; 以及摩擦力检测机构51，用于检测沿着通过方向D 1 的方向加载到第二辊抵接面72的摩擦力。第一辊抵接面71可以同时抵靠并列设置的两个辊13，并且第二辊抵接面72可以同时与两个并排设置的辊14抵接。版权所有（C）2009，JPO＆INPIT

4. 发明专利

JP2006247687A Apparatus and method for detecting abnormality of bearing for roll in continuous casting machine 有权
标题翻译：检测连续铸造机滚子轴承异常的装置及方法
公开(公告)号：JP2006247687A
公开(公告)日：2006-09-21
申请号：JP2005066189
申请日：2005-03-09
申请人： Nippon Steel Corp , 新日本製鐵株式会社
发明人： YANO TAKAYUKI
IPC分类号： B22D11/16 , B22D11/128 , G01B21/16
摘要： PROBLEM TO BE SOLVED: To quickly and accurately detect the abnormality of a bearing for a roll in a continuous casting machine. SOLUTION: In a continuous casting machine having a pair of rolls 2, 3 arranged at a specified interval in the casting direction so as to catch a cast slab, the abnormality of the bearings 4a, 4a, 5a, 5b for rotatably supporting both end portions of the respective rolls 2, 3 is detected by the present apparatus and method. Distances L1, L2 between a pair of the rolls 2, 3 in at least two opposite positions are measured, and then the difference (L1-L2) of the measured distances in the at least two positions is calculated, and also the differences (ΔL1, ΔL2) between the distances L1, L2 and the measured distances before the measurement in the respective measuring positions are calculated. When the respective calculated distances exceed preset threshold values, it is judged that the bearings for the rolls shifted so as to exceed the preset threshold value are abnormal. COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：快速准确地检测连续铸造机中的辊的轴承的异常。解决方案：在具有在铸造方向上以规定间隔布置以便卡住铸坯的一对辊2,3的连续铸造机中，用于可旋转地支撑的轴承4a，4a，5a，5b的异常通过本装置和方法检测各辊2,3的两端部。测量至少两个相对位置的一对辊2,3之间的距离L1，L2，然后计算至少两个位置中的测量距离的差（L1-L2），并且还计算差值（ΔL1 ，ΔL2）和各测量位置之间的测量距离之间的关系。当相应的计算出的距离超过预设的阈值时，判断为使超过预设阈值的辊移动的轴承是异常的。版权所有（C）2006，JPO＆NCIPI

5. 发明专利

JP2009274130A Roll diagnostic method 有权
标题翻译：滚动诊断方法
公开(公告)号：JP2009274130A
公开(公告)日：2009-11-26
申请号：JP2008130466
申请日：2008-05-19
申请人： Nippon Steel Corp , 新日本製鐵株式会社
发明人： MARUKI YASUO , IWASAKI JUNYA , SANJO SATORU , YANO TAKAYUKI , NISHIHARA TAKASHI , SHIRAGAMI TAKAYUKI
IPC分类号： B22D11/128 , B22D11/08
CPC分类号： B22D11/20
摘要： PROBLEM TO BE SOLVED: To predict the time when a roll is broken due to a bearing of the roll in a continuous casting apparatus. SOLUTION: A roll gap measurement device installed on a dummy bar 1 passing through a cast piece passage of the continuous casting apparatus previously measures the gap between oppositely provided rolls 4 and 5 at a plurality of times with time interval. The time-series tendency of the difference between the measured result and a reference value is checked, and the time period when the difference becomes not less than a predetermined value is estimated based on the time-series tendency of last time, and the time period is determined to be the time of breakage of the roll. Thus, the rolls can each be replaced before breakage of a bearing. COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：预测由于连续铸造设备中的辊的轴承而导致辊破裂的时间。解决方案：安装在通过连续铸造设备的铸件通道的虚拟棒1上的辊隙测量装置预先以时间间隔多次测量相对设置的辊4和5之间的间隙。检查测量结果与参考值之间的差异的时间序列趋势，并且基于上次的时间序列趋势来估计该差变为不小于预定值的时间段，并且时间段被确定为卷的破损时间。因此，在轴承断裂之前可以更换辊。版权所有（C）2010，JPO＆INPIT

6. 发明专利

JP2000306541A WAFER TEMPERATURE DETECTING DEVICE FOR ION IMPLANTER 失效
公开(公告)号：JP2000306541A
公开(公告)日：2000-11-02
申请号：JP11000599
申请日：1999-04-16
申请人： NIPPON STEEL CORP , HITACHI LTD
发明人： TAKAYAMA SEIJI , YANO TAKAYUKI , SUZUKI SATOSHI , MERA KAZUO , TOMITA HIROYUKI
IPC分类号： H01J37/317 , G01K7/42 , H01L21/265
摘要： PROBLEM TO BE SOLVED: To provide a wafer temperature detecting device capable of accurately detecting the temperature of a wafer placed in an ion implanter by in situ. SOLUTION: This wafer temperature detecting device is provided with a dummy material 1 placed on a rotary disk 10 to be mounted with wafers to be ion-implanted 20 in an ion implanter and made of an approximately same material as the wafers to be ion-implanted 20, and a thermocouple 2 provided on the back surface of the dummy material 1. The dummy material 1 has the same shape as the wafers to be ion-implanted 20 and placed on the rotary disk 10 so that the mirror-finished surface of the dummy wafer may be exposed to ion beams.

7. 发明专利

JP2000306540A BEAM CURRENT MEASURING DEVICE IN ION IMPLANTER 失效
公开(公告)号：JP2000306540A
公开(公告)日：2000-11-02
申请号：JP11000699
申请日：1999-04-16
申请人： NIPPON STEEL CORP , HITACHI LTD
发明人： TAKAYAMA SEIJI , YANO TAKAYUKI , SUZUKI SATOSHI , MERA KAZUO , TOMITA HIROYUKI
IPC分类号： H01J37/317 , C23C14/48 , H01L21/265
摘要： PROBLEM TO BE SOLVED: To further accurately measure the beam current by improving the S/N ratio, in measurement of the beam current in an ion implanter. SOLUTION: In this beam current measuring device, one small hole 30 through which ion beams pass is provided on a rotary disk 10 to be mounted with wafers to be ion-implanted, the ion beams which have passed through the small hole 30 are detected by a Faraday cup 50, and the ion beam current is measured. In this case, the Faraday cup 50 has such the size as to cover the irradiation range of ion beams on a moving locus of the small hole 30, formed by the rotation of the rotary disc.

8. 发明专利

JPH088436A INTEGRATED CIRCUIT OF THIN FILM SOI/MOS TRANSISTOR 失效
公开(公告)号：JPH088436A
公开(公告)日：1996-01-12
申请号：JP13757194
申请日：1994-06-20
申请人： NIPPON STEEL CORP
发明人： MASUI SHOICHI , NAKAJIMA TATSUO , KAWAMURA KEISUKE , YANO TAKAYUKI , HAMAGUCHI ISAO , TAKAYAMA SEIJI , KAJIYAMA KENJI , TACHIMORI OJI
IPC分类号： H01L21/74 , H01L21/02 , H01L27/12 , H01L29/78 , H01L29/786
摘要： PURPOSE:To realize the cost reduction of a thin film SOI/MOS integrated circuit while obtaining stable operation. CONSTITUTION:A low dosage SIMOX wafer of 110 nm or less in thickness is used, and an accumulation type thin film $01/PMOS transistor is constituted. In order to normally operate the transistor, it is necessary that a channel is not formed on the back of SOI by making the absolute value of the flat band voltage of a back gate larger than the power supply voltage to be used. The upper limit value is 1X10 thetacm ], so that the power supply voltage is set lower than or equal to 5V in the accumulation type film SOI/PMOS transistor formed in a wafer having a buried oxide film of 110nm or less in thickess, and the stable operation of a circuit is obtained.

9. 发明专利

JPH07193204A MANUFACTURE OF SEMICONDUCTOR SUBSTRATE 失效
公开(公告)号：JPH07193204A
公开(公告)日：1995-07-28
申请号：JP33244093
申请日：1993-12-27
申请人： NIPPON STEEL CORP
发明人： YANO TAKAYUKI , HAMAGUCHI ISAO , NAKAJIMA TATSUO , TACHIMORI OJI
IPC分类号： H01L21/76 , H01L21/02 , H01L21/265 , H01L21/304 , H01L27/12
摘要： PURPOSE:To decrease particles existing on an SIMOX wafer. CONSTITUTION:Prior to an ion implantation step, a protective film is formed on a silicon wafer, the material of an SIMOX wafer. Ions of O are implanted through this film 2 to form an ion implanted region 3 in the wafer, then the film 2 is dissolved to remove, together with this film, particles remaining on the wafer 1 which are difficult to remove by the usual washing method. In this film removing step, the once removed particles may deposit again on the surface of the wafer 1 and hence the particle removing washing follow.

10. 发明专利

JPH06338549A DETECTING METHOD FOR DEFECT OF INSULATING FILM BURIED IN SEMICONDUCTOR BOARD 失效
公开(公告)号：JPH06338549A
公开(公告)日：1994-12-06
申请号：JP12973893
申请日：1993-05-31
申请人： NIPPON STEEL CORP
发明人： HAMAGUCHI ISAO , YANO TAKAYUKI , FUJITA TETSUO , KAJIYAMA KENJI
IPC分类号： H01L21/66 , H01L21/76 , H01L21/762
摘要： PURPOSE:To accurately locate defects in a short time by a method wherein a semiconductor board is irradiated with an electron beam to generate carriers, and carriers are led out and checked in quantity change. CONSTITUTION:If no pipe defect 4 is present in a buried oxide film 2 irradiated with an electron beam 7, only carriers 8 generated inside a surface silicon layer 1 are able to reach a space-charge layer 6 by scattering. On the other hard, if a pipe defect 4 is located in a buried oxide film 2 irradiated with an electron beam 7, not only carriers 8 generated in the surface silicon layer 1 but also carriers generated even in a board 3 region are able to reach the space-charge layer 6 and led out as external signals. Therefore, a part of the oxide film 2 where carriers are relatively high in yield is detected as a spot, where a pipe defect 4 is located. The contrast signal of a scanning electron microscope is modulated with this carrier yield, whereby a pipe defect 4 can be easily defined as a microscopic image.

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