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    • 8. 发明专利
    • THREAD GROOVE VACUUM PUMP
    • JPH08270599A
    • 1996-10-15
    • JP9966695
    • 1995-03-31
    • JAPAN ATOMIC ENERGY RES INSTOSAKA SHINKU KIKI SEISAKUSHO
    • HIROKI SEIJIABE TETSUYAMURAKAMI YOSHIONAKAMURA JUNICHIIGUCHI MASASHI
    • F04D19/04
    • PURPOSE: To keep the gap between a rotor and a stator always constant by forming a part of the whole of the periphery of the rotor in the shape of one or two cones, and setting the position of intersecting point of the extensions of the generating lines at the conical periphery to the specified position from the reference point of the center axis. CONSTITUTION: In a thread groove pump where a rotor 2 rotates within a stator 3, a part or the whole of the periphery of the rotor 2 is made in the shape of one or two cones, and also the cone 2a is made so that the position of the intersecting point of the extensions of the generating lines at the conical periphery may be -β.Ys from the reference point position at the bottom of lower bearing on the center line of the shaft 4 of the rotor 2. But, β is expressed by the expression of (αs /αr )f-1, and αs is the coefficient of thermal expansion, and αr is the coefficient of thermal expansion of rotor material. Further, f is expressed by the expression of ΔTs/ΔTr, and ΔTs is the temperature rise from normal temperature of the shaft 4, and ΔTr is the temperature rise from normal temperature of the rotor 2, and Ys is the position of Y coordinate of the coupling point between the shaft 4 and the rotor 2.
    • 10. 发明专利
    • CRYSTAL OSCILLATOR FOR MONITOR AND FILM THICKNESS CONTROLLER USING THE SAME
    • JPH03218411A
    • 1991-09-26
    • JP1394390
    • 1990-01-24
    • NIHON DEMPA KOGYO COJAPAN ATOMIC ENERGY RES INST
    • HIROKI SEIJIABE TETSUYAMURAKAMI YOSHIOCHIBA AKIO
    • G01B17/02H03H9/00H03H9/19
    • PURPOSE:To make frequency stability satisfactory to the temperature of an oscillator for monitor and to control film thickness with high accuracy by selecting the cutting angle of the oscillator for monitor at a specified angle and making the operating temperature of a thin film forming device coincident with the minimum value of the frequency temperature characteristic of the oscillator for monitor. CONSTITUTION:At the thin film forming device, a crystal oscillator 2 for monitor setting a frequency reduction amount is provided parallelly at an oscillator 1 to be deposited and a comparator 5 compares the oscillation frequency of the oscillator 2 to be detected by a counter 3 with a target frequency from a reference signal source 4. When the both frequencies are coincident, a shutter 7 of a deposition source is closed. The operating temperature of the thin film forming device is selected to 100-250 deg.C and the cutting angle of the oscillator 2 is selected to the angle inclining a Y cut board from a (y) axis to a (z) axis direction by 36 deg.00'-38 deg.50'. Thus, the minimum value of the frequency temperature characteristic of the oscillator 2 is set in the range of about 120-250 deg.C and even when the operating temperature of a depositing device is slightly changed, the oscillation frequency of the oscillator 2 is made stable. Then, the film thickness can be controlled with high accuracy.