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    • 1. 发明专利
    • Dram chips
    • DRAM芯片
    • JP2007280606A
    • 2007-10-25
    • JP2007183074
    • 2007-07-12
    • Hitachi Ltd株式会社日立製作所
    • HORIGUCHI SHINJINAKAMURA MASAYUKIOKUMA YOSHIYUKIKAJITANI KAZUHIKONAKAGOME YOSHINOBU
    • G11C11/4074G11C11/401
    • PROBLEM TO BE SOLVED: To especially reduce an active standby current by achieving low power consumption of a power supply circuit of a semiconductor memory. SOLUTION: A DRAM chip is provided with a first voltage supply means for supplying a first voltage to a plurality of sense amplifiers and a second voltage supply means for supplying a second voltage to a column decoder. The first voltage supply means includes a plurality of first voltage limiter circuits arranged in the number same as the number of plurality of memory banks correspondingly to each of the memory banks and a second voltage limiter circuit whose current supply capability is smaller than that of the first voltage limiter circuit. The second voltage supply means includes: a third voltage limiter circuit; a fourth voltage limiter circuit whose current supply capability is smaller than that of the third voltage limiter circuit and whose output node is connected to the output node of the third voltage limiter circuit; and a fifth voltage limiter circuit whose current supply capability is smaller than that of the third voltage limiter circuit and whose output node is connected to the output nodes of the third and fourth voltage limiter circuits. COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:通过实现半导体存储器的电源电路的低功耗来特别地降低主动待机电流。 解决方案:DRAM芯片设置有用于向多个读出放大器提供第一电压的第一电压供应装置和用于向列解码器提供第二电压的第二电压供应装置。 第一电压供给装置包括多个与每个存储体相对应的多个存储体的数量相同的第一限压器电路;以及第二限压器电路,其电流供应能力小于第一 限压电路。 第二电压供给装置包括:第三限压器电路; 第四限压电路,其电流供给能力小于第三限压电路,其输出节点连接到第三限压电路的输出节点; 以及电流供给能力小于第三限压电路的第五限压电路,其输出节点连接到第三和第四限压器电路的输出节点。 版权所有(C)2008,JPO&INPIT
    • 5. 发明专利
    • SEMICONDUCTOR DEVICE
    • JP2003179483A
    • 2003-06-27
    • JP2002229399
    • 2002-08-07
    • HITACHI LTD
    • NAKAGOME YOSHINOBUITO KIYOO
    • G11C11/413G11C11/407G11C11/408H01L21/822H01L27/04H03K19/00H03K19/0175H03K19/0185
    • PROBLEM TO BE SOLVED: To realize high-speed operation of a semiconductor device operating on a low voltage and low power consumption at the same time. SOLUTION: The semiconductor device comprises a first circuit block having a PMOS (T 35 in Fig. 28) and a first operating state, and a second circuit block having an NMOS (T116 in Fig. 40). The PMOS has the characteristics in which when a first board bias potential is applied in the first operating state and a voltage between the gate and the source (GS) is set to 0 V, a first current larger than a current regarded as to be substantially zero in the circuit operation flows to the source and drain (SD) route and the characteristics, in which when a second board bias potential is applied in the second operating state and a voltage between the G and S is set to 0 V, the current flowing to the SD route becomes smaller than the first current. The NMOS constitutes the semiconductor device, in which its threshold value voltage is larger than that of the PNMOS, and the potential of the source is applied as the board bias potential in the first and second operating states. Accordingly, high-speed operation of the semiconductor device operated at the low voltage and the low power consumption are made compatible. COPYRIGHT: (C)2003,JPO