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    • 1. 发明专利
    • Portable apparatus
    • 便携式设备
    • JP2003058306A
    • 2003-02-28
    • JP2001250328
    • 2001-08-21
    • Hitachi LtdNec Corp日本電気株式会社株式会社日立製作所
    • OKUMA YOSHIYUKI
    • H03M11/08G06F3/023H04M1/02H04M1/247
    • PROBLEM TO BE SOLVED: To provide a portable apparatus including a portable telephone, a PDA (personal digital assistant), etc., capable of realizing reduction of key operations in Japanese input.
      SOLUTION: In a portable telephone having 15 keys and cursors, parts of the 15 keys are set by dividing them into vowel parts and consonant parts, the vowel keys 10 are set to each of five keys '3, 6, 9, #, C' and the consonant keys 20 are set to each of nine keys '1, 4, 7, *, 2, 5, 8, 0, B'. In addition, punctuation keys 30 are allocated to a key 'A'. Thus, key operations are basically performed by 'vowel keys' + 'consonant keys' by dividing vowels and consonants, only twice of key depressions are required through the operations are conventionally required for five times in stages of 'o' and the input frequencies are reduced.
      COPYRIGHT: (C)2003,JPO
    • 要解决的问题:提供一种能够实现日语输入中的键操作的减少的便携式电话,PDA(个人数字助理)等的便携式装置。 解决方案:在具有15个键和光标的便携式电话中,15个键的部分通过将它们分成元音部分和辅音部分来设置,元音键10设置为五个键3,6,9,#,C '和辅音键20被设置为9个键1,4,7,*,2,5,8,0,B'中的每一个。 此外,将标点符号键30分配给键“A”。 因此,按键操作基本上是通过划分元音和辅音进行“元音键”+“辅音键”,通过这些操作只需要两次按键,这些操作通常在'o'阶段需要五次,输入频率是 减少
    • 2. 发明专利
    • Dram chips
    • DRAM芯片
    • JP2007280606A
    • 2007-10-25
    • JP2007183074
    • 2007-07-12
    • Hitachi Ltd株式会社日立製作所
    • HORIGUCHI SHINJINAKAMURA MASAYUKIOKUMA YOSHIYUKIKAJITANI KAZUHIKONAKAGOME YOSHINOBU
    • G11C11/4074G11C11/401
    • PROBLEM TO BE SOLVED: To especially reduce an active standby current by achieving low power consumption of a power supply circuit of a semiconductor memory. SOLUTION: A DRAM chip is provided with a first voltage supply means for supplying a first voltage to a plurality of sense amplifiers and a second voltage supply means for supplying a second voltage to a column decoder. The first voltage supply means includes a plurality of first voltage limiter circuits arranged in the number same as the number of plurality of memory banks correspondingly to each of the memory banks and a second voltage limiter circuit whose current supply capability is smaller than that of the first voltage limiter circuit. The second voltage supply means includes: a third voltage limiter circuit; a fourth voltage limiter circuit whose current supply capability is smaller than that of the third voltage limiter circuit and whose output node is connected to the output node of the third voltage limiter circuit; and a fifth voltage limiter circuit whose current supply capability is smaller than that of the third voltage limiter circuit and whose output node is connected to the output nodes of the third and fourth voltage limiter circuits. COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:通过实现半导体存储器的电源电路的低功耗来特别地降低主动待机电流。 解决方案:DRAM芯片设置有用于向多个读出放大器提供第一电压的第一电压供应装置和用于向列解码器提供第二电压的第二电压供应装置。 第一电压供给装置包括多个与每个存储体相对应的多个存储体的数量相同的第一限压器电路;以及第二限压器电路,其电流供应能力小于第一 限压电路。 第二电压供给装置包括:第三限压器电路; 第四限压电路,其电流供给能力小于第三限压电路,其输出节点连接到第三限压电路的输出节点; 以及电流供给能力小于第三限压电路的第五限压电路,其输出节点连接到第三和第四限压器电路的输出节点。 版权所有(C)2008,JPO&INPIT
    • 9. 发明专利
    • SEMICONDUCTOR DEVICE
    • JPH02116159A
    • 1990-04-27
    • JP26802888
    • 1988-10-26
    • HITACHI LTD
    • OKUMA YOSHIYUKI
    • H01L27/10H01L27/108
    • PURPOSE:To improve the degree of integration of a wafer scale memory by forming in separately a memory cell section and peripheral circuit section in each wafer chip area, and making an address space of the peripheral circuit section larger than the capacity of the memory cell section. CONSTITUTION:Many chip areas 2 are disposed on the principal surface of a wafer 1 in the form of a lattice. In each area 2 six memory cell sections 3 and one peripheral circuit section 4 are formed in separation. In the chip area 2 there are electrically connected the memory cell 3, the circuit section 4, and the area 2 with each other, and the whole of the wafer 1 forms one memory circuit system. The memory cell section 3 comprises a MOS type DRAM for example and the peripheral circuit section 4 includes an address space several times the memory cell section 3. The one peripheral circuit section 4 can drive the maximum four memory cell sections 3.