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    • 1. 发明专利
    • Rail stress detecting system
    • 铁路应力检测系统
    • JPS58216924A
    • 1983-12-16
    • JP9917082
    • 1982-06-11
    • Hitachi Electronics Eng Co LtdHitachi LtdJapanese National Railways
    • KAMIYA MAKIOSAEGUSA OSAOFUKAZAWA YOSHIROUYAMAMOTO YOUICHIIWATANI FUKUOTAKAHASHI KENSAKUUENO YOSHIKATSU
    • G01L1/00G01L5/00
    • G01L5/0047
    • PURPOSE:To measure the axial tension of a rail by a magnetic anisotropic detection sensor, by averaging four peak output values accompanied by magnetic anisotropy yielded by stress, based on the output of the magnetic anisotropic sensor, and performing correction based on the temperature. CONSTITUTION:A rail axial tension detecting sensor 17 is attached to a rail. When an anisotropic sensor 8 is rotated, signals are obtained for 0 deg.-360 deg.. Four peak values are detected by a peak value detecting circuit 26. Said peak value data are sequentially added, and an average value is computed by an average value circuit 30. The corresponding rail axial tension is read from said average value by a converter 31 and displayed on a display device 32. The value of the rail axial tension is corrected by the temperature data from a thermometer 18 in a temperature correcting circuit 33 so as to obtain the value of the standard temperature. The value is compared with upper and lower limit values in a comparator 34. When the value exceeds the limit value, a signal is outputted and displayed on the display circuit 32.
    • 目的:通过磁性各向异性检测传感器测量轨道的轴向张力,通过平均四个由应力产生的磁各向异性的峰值输出值,基于磁各向异性传感器的输出,并根据温度进行校正。 构成:轨道轴向张力检测传感器17附接到轨道。 当各向异性传感器8旋转时,获得0度-360度的信号。峰值检测电路26检测四个峰值。所述峰值数据被依次相加,平均值由平均值 相应的导轨轴向张力由转换器31从所述平均值读取并显示在显示装置32上。轨道轴向张力的值由温度校正电路33中的温度计18的温度数据进行校正 以获得标准温度的值。 该值与比较器34中的上限值和下限值进行比较。当该值超过限制值时,输出信号并将其显示在显示电路32上。
    • 2. 发明专利
    • Nozzle of fine particle detector
    • 细颗粒探测器喷嘴
    • JPS60190834A
    • 1985-09-28
    • JP3267985
    • 1985-02-22
    • Hitachi Electronics Eng Co LtdHitachi Ltd
    • IWATANI FUKUOYAMADA KUNIOTSUKADA KAZUYATAKAMI KATSUMISUDA TADASHITAKAHASHI KENSAKU
    • G01N21/53G01N1/22G01N15/00
    • G01N1/2202G01N2001/2223
    • PURPOSE:To obtain a high-speed, stable laminar air of aerosol, by providing a nozzle so that the outer screen of the aerosol comprises two or more layers having different speeds. CONSTITUTION:At the outside of an original pipe, a pipe 10, which can be slidden in the axial direction, is further provided. Second clean air 11 is introduced into this pipe, and the second layer screen is formed. In order to make aerosol 3 into a stable laminar air, speeds V1 and V2 are made approximately equal and an appropriate intermediate value between the speed V2 and the zero speed is imparted to a speed V3. It is necessary to determine the speed V3 empirically. In present invention, the speed V3 is adjusted by providing a sliding mechanism in the pipe 10, moving the pipe 10 in the axial direction, and changing the interval between tips 12' and 12'' of a nozzle 12. Thus the high-speed, stable laminar air of the aerosol can be obtained.
    • 目的:通过提供喷嘴使得气溶胶的外屏幕具有不同速度的两层或多层,以获得高速稳定的气溶胶层流空气。 构成:在原管的外侧,进一步设置能够沿轴向切断的管道10。 将第二清洁空气11引入该管中,形成第二层筛。 为了使气溶胶3成为稳定的层流空气,速度V1和V2大致相等,将速度V2和零速度之间的适当中间值赋予速度V3。 有必要经验性地确定速度V3。 在本发明中,通过在管10中设置滑动机构,使管10沿轴向移动,并且改变喷嘴12的尖端12'和12“之间的间隔来调节速度V3。因此,高速 ,可以获得气溶胶的稳定层流空气。
    • 3. 发明专利
    • Light collector for inspecting surface plate defect
    • 用于检查表面板缺陷的集光器
    • JPS61105447A
    • 1986-05-23
    • JP23525885
    • 1985-10-23
    • Hitachi Electronics Eng Co LtdHitachi Ltd
    • TAKAHASHI KENSAKUHACHIKAKE YASUOIWATANI FUKUOITO MAKOTOTAKAMI KATSUMISUDA TADASHI
    • G01N21/88G01B11/30G01N21/89G01N21/956H01L21/66
    • G01N21/8901
    • PURPOSE:To eliminate the need to make a division scan over the entire surface plate and shorten the necessary time of inspection greatly by collecting scattered light which is generated over a wide scanning range with small sensitivity deviation. CONSTITUTION:A light source P emits light and a light beam within a range of an angle phi1 is reflected by flanks 9-1 and 9-2 to both reach a projection surface 9-4 and projected. A component exceeding an angle phi2, on the other hand, is reflected totally by the projection surface 9-4 to return to the inside, or returns when reflected by the flanks 9-1 and 9-2, so that the light is divided into a component transmitted through an incidence surface 9-3 and a component which is reflected totally and travels forward inside again. Namely, components of incident light which are within the range of the angle phi2 are collected efficiently. Even when the light source shifts to right or left from the center like a light source P' or P'', a light collector having small deviation is obtained. Further, incident light transmitted through the incidence surface 9-3 is all projected from the projection surface 9-4 through the refracting operation of the incidence surface 9-3 and the mirror surface reflecting operation of surfaces 9-5 and 9-6.
    • 目的:为了消除在整个平板上划分扫描的需要,通过收集在较小的灵敏度偏差的宽扫描范围内产生的散射光,可以大大缩短检查时间。 构成:光源P发光,并且在角度phi1的范围内的光束被侧面9-1和9-2反射,以到达投影面9-4并投影。 另一方面,超过角度phi2的分量被投影面9-4完全反射回到内部,或者当被侧面9-1,9-2反射时返回,使得光被分成 通过入射面9-3透射的分量和被全反射并再次向前行进的分量。 即,有效地收集在角度phi2的范围内的入射光的分量。 即使当光源像光源P'或P“一样从中心向右或向左移动时,获得具有小偏差的集光体。 此外,穿过入射表面9-3的入射光全部通过入射表面9-3的折射操作和表面9-5和9-6的镜面反射操作从突出表面9-4投影。
    • 4. 发明专利
    • Fine particle detector
    • 精细粒子检测器
    • JPS60190835A
    • 1985-09-28
    • JP3268085
    • 1985-02-22
    • Hitachi Electronics Eng Co LtdHitachi Ltd
    • YAMADA KUNIOIWATANI FUKUOTSUKADA KAZUYATAKAMI KATSUMISUDA TADASHITAKAHASHI KENSAKU
    • G01N21/53G01N15/00G01N15/14G01N21/47G01N21/49
    • G01N21/47
    • PURPOSE:To expand a light receiving angle, by providing a rotary elliptic mirror, which is arranged so that a converged light detecting means of scattered light occupies the first focal point in a detecting region, and providing a spherical mirror, which has a radius of curvature equal to the distance between the focal points of said rotary elliptic mirror. CONSTITUTION:A rotary elliptic mirror 19 is arranged so that a converged light detecting means of scattered light has the first focal point in a detecting region. A radius (v) of a spherical mirror 20 is made equal to the interval between two focal points S and R of the elliptic mirror 19. The center of the spherical mirror 20 is made to agree with the focal point S, i.e., the detecting region. At this time, the scattered light, which is reflected by an arbitrary point (m) of the elliptic mirror 19, is concentrated at the focal point R. Scattered light, which is reflected by an arbitrary point (n) of the spherical mirror 20, is reflected by a point (k) on the elliptic mirror 19 through the focal point S again and concentrated at the focal point R. When the gap at the connecting point of the elliptic mirror 19 and the spherical mirror 20 is eliminated, a total solid angle 4pisr can be made to be a light receiving solid angle. Thus the light receiving angle can be expanded to the limit.
    • 目的:为了扩大受光角度,通过提供一种旋转椭圆镜,其被布置成使得散射光的会聚光检测装置在检测区域中占据第一焦点,并且提供球面镜,其具有半径 曲率等于所述旋转椭圆镜的焦点之间的距离。 构成:旋转椭圆镜19被布置成使得散射光的会聚光检测装置具有检测区域中的第一焦点。 使球面镜20的半径(v)等于椭圆镜19的两个焦点S和R之间的间隔。使球面镜20的中心与焦点S一致,即检测 地区。 此时,由椭圆镜19的任意点(m)反射的散射光集中在焦点R.由球面镜20的任意点(n)反射的散射光 ,再次通过焦点S被椭圆镜19上的点(k)反射并聚焦在焦点R.当消除了椭圆镜19和球面镜20的连接点处的间隙时,总共 立体角4pisr可以做成光接收立体角。 因此,光接收角度可以扩大到极限。
    • 5. 发明专利
    • Colony transplantation mechanism
    • 殖民运输机制
    • JPS5911173A
    • 1984-01-20
    • JP11973982
    • 1982-07-12
    • Hitachi Electronics Eng Co LtdHitachi Ltd
    • SHIBAYAMA KATSUJIROUIWATANI FUKUOTAKAHASHI KENSAKUIKUMI MASUZOUTSUJI TATSUTOOOKUMA MICHIOOTAHARA YOUJI
    • C12M1/26C12M1/00C12M1/34
    • C12M33/06
    • PURPOSE: To make the pickup part of a colony transfer apparatus to be reusable, and to obtain an apparatus suitable for the mass culture of single bacterial strain, by applying simple disinfection treatment to the pickup part.
      CONSTITUTION: The XY stage 5-1 supporting the culture petri dish 1 and the XY stage 5-2 supporting the test petri dish 2 are placed on a common table 4. A bacterial strain in a designated colony of the colonies in the culture dish 1 is transplanted to the designated position of the medium in the test dish 2 by operating the pickup 6 attached to the transfer means 7. In the above computer- controlled colony transfer apparatus, the transfer means 7 has an arm 7-2 stopped at four concyclic definite positions on the common table and movable vertically at the position. A loop 6-1 is attached to the end of the arm 7-2, and the XY stages 5-1, 5-2, a heating means for disinfection 12 and a cooling means 13 are placed at the four definite positions.
      COPYRIGHT: (C)1984,JPO&Japio
    • 目的:通过对拾取部件进行简单的消毒处理,使菌落转运装置的拾取部分可重复使用,并获得适合于单细菌菌群的大规模培养的装置。 构成:将支撑培养培养皿1的XY台5-1和支撑测试培养皿2的XY台5-2放置在共同的桌子4上。培养皿1中菌落的指定菌落中的菌株 通过操作附着在传送装置7上的拾取器6,移动到测试皿2中的介质的指定位置。在上述计算机控制的集落传送装置中,传送装置7具有在四个圆环上停止的臂7-2 普通台上的定位,并可垂直移动。 环6-1附接到臂7-2的端部,并且XY台5-1,5-2,用于消毒的加热装置12和冷却装置13放置在四个确定位置。
    • 6. 发明专利
    • Colony transfer device
    • 殖民地转移装置
    • JPS58201976A
    • 1983-11-25
    • JP8401182
    • 1982-05-20
    • Hitachi Electronics Eng Co LtdHitachi Ltd
    • SHIBAYAMA KATSUJIROUIWATANI FUKUOTAKAHASHI KENSAKUIKUMI MASUZOUTSUJI TATSUTOOOKUMA MICHIOOTAHARA YOUJI
    • C12M1/26C12M1/00
    • C12M33/06
    • PURPOSE: To transplant a colony in a laboratory dish for test, by selecting the colony in a laboratory dish for culture by a monitor part with an eye, operating a pickup part under control of a microcomputer equipped with a memory and an operation panel.
      CONSTITUTION: The laboratory dish for culture 11 and the laboratory dish for test 15 are placed on the X and Y stages 19-1 and 19-2 at both the ends of the common base 18, and a colony to be transplanted on the laboratory dish for culture 11 is selected by the monitor part 22. It is input to the microcomputer 23 equipped with the memory 24 and the operation panel 25 by the monitor part 22. The pickup part 10, the pickup treatment part 21 and the transfer part 20 are removed under control of the microcomputer 23, and the colony on the laboratory dish for culture 11 is transplanted in the laboratory dish for test 15.
      COPYRIGHT: (C)1983,JPO&Japio
    • 目的:将实验室中的菌落移植到实验室进行测试,通过用眼睛的监视器部分选择用于培养的实验室培养皿中的菌落,在装有存储器和操作面板的微型计算机的控制下操作拾取部件。 规定:用于培养的实验室11和用于测试15的实验室培养皿放置在共同基部18的两端的X和Y阶段19-1和19-2上,并将待移植到实验室皿上的菌落 用于培养物11由监视器部分22选择。通过监视器部分22输入到配有存储器24和操作面板25的微型计算机23.拾取部分10,拾取处理部分21和转印部分20是 在微型计算机23的控制下移除,并将用于培养的实验室皿11上的菌落移植到实验室中用于测试15。