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    • 2. 发明专利
    • SINGLE CHIP MICROCOMPUTER INCORPORATED WITH SELF-TEST FUNCTION
    • JPH06162225A
    • 1994-06-10
    • JP30674792
    • 1992-11-17
    • HITACHI LTD
    • OSUGA HIROSHINOGUCHI YOSHIKIKATO KANJI
    • G06F11/22G06F13/00G06F15/78
    • PURPOSE:To automatically detect a fault of a built-in peripheral module by retaining a result obtained at the time when it is assumed that there is no fault at the time of test operation of the inside of the peripheral module, and comparing this expected value with the result of operation. CONSTITUTION:To a peripheral module 102, a test operation setting means 205, an expected value retaining means 206 and a comparing means 207 are added, and the expected value retaining means 206 retains a result obtained at the time when it is assumed that there is no fault at the time of test operation. In such a state, when the peripheral module 102 is in a test operation state, the test operation setting means 205 fetches a test operation set value sent from a CPU 100, a control means 201 generates a control signal of a data bus 200 based on this set value, and the data bus outputs the result of execution of a test. The comparing means 207 compares this result of execution and an expected value outputted from the expected value retaining means 206, and outputs a fault detecting signal to an interruption control circuit 103, in the case of noncoincidence. Accordingly, the fault of the peripheral module can be detected in the course of operation of a microcomputer.
    • 3. 发明专利
    • JPH05249194A
    • 1993-09-28
    • JP4823792
    • 1992-03-05
    • HITACHI LTD
    • OSUGA HIROSHINOGUCHI YOSHIKI
    • G01R31/28G06F11/22
    • PURPOSE:To reduce the number of executing steps at the time of writing the same value in a plurality of registers and to reduce the number of testing steps at the time of testing the registers by incorporating a signal line for controlling write signals from the outside and a little amount of hardware in the title logic LSI. CONSTITUTION:A high-level signal having one cycle length is sent to a register latch-write signal 20 from an instruction decoder 102a synchronously to the rise of a PHI2-signal line 204 in a state where a switch signal line 205 is at a low level. Since the outputs of OR gates 150, 151, and 152 become high levels and the output of an AND gate 140 becomes a low level, no collision occurs between writing and reading. The outputs of AND gates 130, 132, and 134 in a register block circuit 101 become high levels synchronously to the rise of a PHI1-signal line 203. Therefore, the data inputted from an external input 200 are simultaneously written in registers 110 and ill at the timing of the signal line 203. As a result, the number of executing steps can be reduced.