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1. 发明专利

JP2004147132A Network management system and address information management method 审中-公开
公开(公告)号：JP2004147132A
公开(公告)日：2004-05-20
申请号：JP2002310421
申请日：2002-10-25
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： KOBAYASHI TORU , KAWAKAMI TAKASHI
IPC分类号： G06F13/00 , H04L12/46
摘要： PROBLEM TO BE SOLVED: To maintain consistency of address information between a network on the monitor side and a network on the monitor object side in a network management system in NAT environments.
SOLUTION: An address information monitor agent monitors a DNS on the monitor object side in order to maintain consistency of address information between the network on the monitor side and the network on the monitor object side and informs an address information monitor manager of change of set contents in the case of the change. The address information monitor manager sets address conversion definition of an address conversion device and monitor information of a DNS on the monitor side and a monitor device in order to reflect change contents of the network on the monitor object side, on the network on the monitor side.
COPYRIGHT: (C)2004,JPO

2. 发明专利

JP2002115953A REFRIGERATOR 失效
公开(公告)号：JP2002115953A
公开(公告)日：2002-04-19
申请号：JP2000311687
申请日：2000-10-05
申请人： HITACHI LTD
发明人： KANEKO TAKEHIRO , SATO SHINICHI , ICHIMOTO KAZUHISA , KOBAYASHI TORU
IPC分类号： F25D19/00 , F25B1/00 , F25B41/00 , F25D29/00
摘要： PROBLEM TO BE SOLVED: To solve the problem of a conventional refrigerator such that in case that a combustible HC(hydrocarbon) refrigerant leaks, if there is an ignition source such as a contact or the like under a pipe having caused a leakage, the HC refrigerant falls upon the ignition source, and it bursts, and it leads to an serious accident. SOLUTION: This refrigerator is made in such structure that a refrigerant does not fall upon an ignition source even in case that an ignition source such as a contact or the like is arranged above a pipe and it causes a leakage of refrigerant.

3. 发明专利

JP2001337134A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE 失效
公开(公告)号：JP2001337134A
公开(公告)日：2001-12-07
申请号：JP2000154821
申请日：2000-05-25
申请人： HITACHI LTD
发明人： SAKAKIBARA HIDEKI , NAKAYAMA MICHIAKI , KOBAYASHI TORU
IPC分类号： G01R31/26 , G01R31/28 , G11C29/00 , G11C29/06
摘要： PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device, having a simple structure allowing an effective acceleration test. SOLUTION: This integrated circuit device is provided with burn-in signal terminals and signal terminals for general operation, such that the burn-in signal terminals are separated electrically from the signal terminals for the general operation. Since parasitic capacitance or the like to be added to the signal terminals will not be added to the signal terminals, the operation speed will not be reduced. Accordingly, a burn-in signal can be supplied using a simple connection jig, to effectively execute the acceleration test.

4. 发明专利

JPH09264659A REFRIGERATOR 失效
公开(公告)号：JPH09264659A
公开(公告)日：1997-10-07
申请号：JP7360996
申请日：1996-03-28
申请人： HITACHI LTD
发明人： AOKI YOSHIHISA , TAKEMOTO AKINOBU , KOBAYASHI TORU
IPC分类号： F25D23/00 , F25D29/00
摘要： PROBLEM TO BE SOLVED: To prevent a malfunction such as a breaking of a cord and simplify a door structure of a refrigerator by providing input means for setting an indoor temperature, means for displaying the set temperature condition, and display on-off means for making an on-off control of this displaying in a control circuit for controlling the indoor temperature to a desired temperature. SOLUTION: In this refrigerator, an operating panel 5 comprises one or a plurality of indoor temperature setting switches 4 and a display device 6. The operating panel 5 is disposed within a storing space defined in a refrigerator body. When a door is closed and a door closed signal is inputted to a microcomputer 7 from a door switch 9, a display switch 11 is turned off and the display device 6 stops its displaying. When the door 2 is opened and a door opened signal is inputted to the microcomputer 7 from the door switch 9, the display switch 9 is turned on and a temperature set by an indoor temperature setting switch 4 is detected and the display device 6 carries out its displaying in response to the set indoor temperature. In this manner, since the display device 6 is turned off when the door 2 is closed, the unnecessary electric power consumption can be prevented.

5. 发明专利

JPH08110145A REFRIGERATOR 失效
公开(公告)号：JPH08110145A
公开(公告)日：1996-04-30
申请号：JP24750294
申请日：1994-10-13
申请人： HITACHI LTD
发明人： KOBAYASHI TORU
IPC分类号： F25D11/02 , F25D21/06 , G05D23/19
摘要： PURPOSE: To treat much amount of water, produced by defrosting and discharged upon overload operation caused by the existence of very slight gap and the like which can not be noticed by a customer, without causing overflow from an evaporation pan. CONSTITUTION: When an operation pattern for starting defrosting operation is repeated (n)-times without operating a compressor 2 intermittently by a refrigerating chamber temperature sensor 6 even once, the defrosting operation is prohibited for a period of time set arbitrarily by a microcomputer 8.

6. 发明专利

JPH0777561A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND INTERNAL CIRCUIT INSPECTION METHOD THEREFOR 失效
公开(公告)号：JPH0777561A
公开(公告)日：1995-03-20
申请号：JP22309193
申请日：1993-09-08
申请人： HITACHI LTD
发明人： HANABUSA YOSHIAKI , KOBAYASHI TORU , KAWAJI MOTONORI
IPC分类号： G01R31/28 , H01L21/66
摘要： PURPOSE:To make it possible to inspect characteristics of other gate circuit on the prestage or poststage of an abnormal gate circuit upon occurrence of abnormality in any one of a plurality of gate circuits in an LSI. CONSTITUTION:An auxiliary circuit 10 is provided with an output buffer circuit 11 and an input protective circuit 12 and a plurality of the auxiliary circuits 10 are provided on an LSI chip without being connected with main internal logic circuits. When an input terminal n1 of the output buffer circuit 11 is connected with an output terminal of a specific logic gate circuit in an LSI, for example, an output signal can be delivered stably even if the gate is abnormal on the output side. When an output terminal n2 of the input protective circuit 12 is connected with an input terminal of a specific logic gate circuit, for example, an inspection signal of constant level can be applied to the input terminal even if the gate is abnormal on the input side.

7. 发明专利

JPH06303139A A/D CONVERTER 失效
公开(公告)号：JPH06303139A
公开(公告)日：1994-10-28
申请号：JP11226693
申请日：1993-04-15
申请人： HITACHI LTD , HITACHI MICOM SYST KK
发明人： KOBAYASHI TORU , YANAGI YUJI , TAKEGAWA YOSHIHIKO
IPC分类号： G01R19/257 , H03M1/12 , H03M1/38
摘要： PURPOSE:To attain high speed overflow detection processing by providing an overflow detection section identifying it that an absolute value of an input analog signal exceeds the conversion range. CONSTITUTION:A successive approximation A/D converter is provided with a voltage comparator circuit CMP 2. An input analog signal Vin is applied to a noninverting input terminal + of the CMP 2 and a reference voltage Vr being a maximum value of the internal analog signal Vc is fed to an inverting input terminal (-). A clock signal Cc2 is fed to the CMP 2 from a conversion control circuit CCTL and its output signal Co2 is fed to the CCTL. The CMP 2 is operated by the Cc2 to compare the voltages Vin, Vr and sets the Co2 to 'H' when the voltage Vin is higher than the voltage Vr. The Co2 is given to the CCTL, for which an overflow signal Of is outputted. Thus, the conversion processing by the A/D converter section is immediately stopped and output signals D7-D0 of a successive approximation register CREG are set to '1' for all the bits and the processing is quickened.

8. 发明专利

JPH05299525A 失效
公开(公告)号：JPH05299525A
公开(公告)日：1993-11-12
申请号：JP10678492
申请日：1992-04-24
申请人： HITACHI LTD
发明人： NISHIZAWA HIROTAKA , TANAKA TAMOTSU , TOKUDA MASAHIDE , KOBAYASHI TORU
IPC分类号： H01L23/02
摘要： PURPOSE:To enable the cracking of bump electrodes due to the temperature cycle in a sealing part structure to be avoided by a method wherein the sealing part of the title device is hermetically sealed with the anisotropical bellows absorbing or relieving the thermal stress displacement or strain of a semiconductor chip. CONSTITUTION:A semiconductor chip 12 is surface mounted on a base substrate 11 using a hermetically sealing device between this base substrate 11 and a sealing cap 14. At this time, the sealing parts 16, 17 of this device are hermetically sealed with anisotropical bellows 15 absorbing or relieving the thermal stress displacement or strain. Accordingly, the deformation of the bump electrodes 13 on the semiconductor chip 12 thermally expanding and contracting in the longitudinal direction can make the stress balance by the elastic deformation of the anisotropical bellows not only in the thermal equilibrium state but also in the thermal non-equilibrium state. Through these procedures, the cracking of bump electrodes 13 can be avoided.

9. 发明专利

JPH05102262A SEMICONDUCTOR DEVICE AND MOUNTING DEVICE MOUNTED THEREWITH 失效
公开(公告)号：JPH05102262A
公开(公告)日：1993-04-23
申请号：JP25635691
申请日：1991-10-03
申请人： HITACHI LTD
发明人： YAMADA TAKEO , ISOMURA SATORU , SHIMIZU ATSUSHI , ITO YUKO , KOBAYASHI TORU , KAWAJI MOTONORI
IPC分类号： H01L21/66 , G01R1/04 , H01L23/053 , H01L23/057 , H01L23/473 , H01L23/498 , H01L25/065
摘要： PURPOSE:To enable a screening test or the like to be executed coping with the enhancement of mounting terminals in number and the micronization of them in size in a semiconductor device of MCC structure which is mounted with a semiconductor pellet on the surface of a substrate and a mounting terminal on the rear connected to the external terminal of a semiconductor pellet. CONSTITUTION:In a semiconductor device 1 of MCC structure, test terminals 24 electrically connected to outer terminals arranged on the element forming surface of a semiconductor pellet 3 are provided to the side faces of a substrate 2.

10. 发明专利

JPH0338043A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE 失效
公开(公告)号：JPH0338043A
公开(公告)日：1991-02-19
申请号：JP17372789
申请日：1989-07-05
申请人： HITACHI LTD
发明人： OWADA NOBUO , OOGAYA KAORU , KOBAYASHI TORU , KAWAJI MOTONORI
IPC分类号： H01L21/3205 , H01L21/321 , H01L21/60 , H01L21/82 , H01L23/52
摘要： PURPOSE:To improve the connection reliability of a solder bump, by arranging dummy patterns in the region positioned almost below the solder bump in the residual region of a wiring layer below the uppermost layer wiring. CONSTITUTION:In the residual region of the same wiring layer as third layer Al wirings 7a-7d, dummy patterns 8 are arranged at specified intervals in the region below a solder bump 2. The patterns are constituted of the same material as, e.g. the third layer Al wirings 7a-7d, and have the same line width. As a result, the wiring density in the region where the dummy patterns 8 are formed becomes high, so that the surface of an interlayer insulating film formed on the patterns 8 is flattened. That is, step-difference is not generated in a substratum of the uppermost wiring layer of the region positioned nearly below the solder bump 2, so that a flat electrode pad can be formed. Thereby connection reliability of the solder bump 2 can be improved.

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