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1. 发明专利

JPH08105722A ILLUMINATOR FOR INSPECTING DEVICE EXTERNAL APPEARANCE AND DEVICE EXTERNAL APPEARANCE AUTOMATIC INSPECTING APPARATUS USING THE ILLUMINATOR 失效
公开(公告)号：JPH08105722A
公开(公告)日：1996-04-23
申请号：JP26822994
申请日：1994-10-06
申请人： ADVANTEST CORP
发明人： KIKUCHI ARITOMO , HAYAMA HISAO
IPC分类号： G01B11/24 , G01N21/84 , H01L21/66 , H05K13/08
摘要： PURPOSE: To eliminate the illuminance unevenness, to carefully illuminate an object to be inspected and to precisely inspect the external appearance of a microminiaturized device by arranging many light emitting elements in which luminance is adjustable at a CCD camera as a center, and controlling the luminance of the elements based on an observation result. CONSTITUTION: A window frame for a camera 9 is provided at the center of a rectangular illumination frame 10, and light emitting elements made of LEDs are regularly arranged with the frame as a center. An illumination controller initializes the illumination, and corrects the illumination from the measured result. In order to automatically inspect the external appearance by using this apparatus, a DUT 20 of a VLSI, etc., is fixedly placed on a rotary stage 21 on a measuring base 22, rotated at 90 degrees at each one side measurement, and measured at the four sides. The camera 9 and the illuminator are oppositely disposed at a predetermined distance, and pixel data from the camera 9 is sent to an image processor 12. The processor 12 strengthens the light and shade of the density, displays it in a window as image data on a display unit 18, and decides the propriety, etc., of a lead pin.

2. 发明专利

JP2007333697A Method of calibrating electronic component test apparatus 审中-公开
标题翻译：校准电子元件测试装置的方法
公开(公告)号：JP2007333697A
公开(公告)日：2007-12-27
申请号：JP2006169177
申请日：2006-06-19
申请人： Advantest Corp , 株式会社アドバンテスト
发明人： KIKUCHI ARITOMO , KIYOKAWA TOSHIYUKI , TOKITA HITOSHI , IKEDA KATSUHIKO
IPC分类号： G01R31/26
摘要： PROBLEM TO BE SOLVED: To provide a method of calibration capable of accurately calibrating the relative position of an imaging means to a socket.
SOLUTION: This method of calibration comprises the placing step of placing a tool 60 on the socket 71 while inserting contact pins 72 into insertion holes 62, the moving step of moving the tool 60 to an alignment device 43, the first imaging step of imaging the tool 60 positioned at the alignment device 43 by a device camera 434, the second imaging step of imaging the socket 71 by a socket camera 414, a first recognizing step of recognizing the relative position of the device camera 434 to the socket 71 according to the image information imaged in the first step, and the second recognizing step of recognizing the relative position of the socket camera 414 to the socket 71 according to the image information imaged in the second imaging step.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够精确校准成像装置相对于插座的位置的校准方法。解决方案：这种校准方法包括将工具60放置在插座71上的放置步骤，同时将接触针72插入到插入孔62中，将工具60移动到对准装置43的移动步骤，第一成像步骤通过装置照相机434对位于对准装置43的工具60进行成像，通过插座照相机414对插座71进行成像的第二成像步骤，识别装置照相机434相对于插座71的相对位置的第一识别步骤根据在第一步骤中成像的图像信息，以及第二识别步骤，根据在第二成像步骤中成像的图像信息，识别插座照相机414相对于插座71的相对位置。版权所有（C）2008，JPO＆INPIT

3. 发明专利

JP2007064991A Electronic component tester 审中-公开
标题翻译：电子元件测试仪
公开(公告)号：JP2007064991A
公开(公告)日：2007-03-15
申请号：JP2006336030
申请日：2006-12-13
申请人： Advantest Corp , 株式会社アドバンテスト
发明人： KIKUCHI ARITOMO , NAKAMURA HIROTO
IPC分类号： G01R31/26
摘要： PROBLEM TO BE SOLVED: To provide an electronic component tester capable of preventing contact mistake of an electronic component to be tested with a contact section of a test head. SOLUTION: The electronic component tester 1 comprises a contact arm 420 for holding an IC device, a moving device for moving the contact arm 420, a position recognizing means for recognizing a relative position of the IC device held by the contact arm 420 to a socket 50, a position correcting means for correcting a position of the contact arm 420 based on the relative position of the IC device recognized by the position recognizing means, and a positioning shaft 414 and engaging member 436 for restraining the contact arm 420 to a device base 11 when the relative position of the IC device is recognized by the position recognizing means. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够防止被测试的电子部件与测试头的接触部分的接触错误的电子部件测试器。电子部件测试器1包括用于保持IC器件的接触臂420，用于移动接触臂420的移动装置，用于识别由接触臂420保持的IC器件的相对位置的位置识别装置插座50，位置校正装置，用于根据由位置识别装置识别的IC器件的相对位置和定位轴414以及用于限制接触臂420的接合部件436来校正接触臂420的位置; 当通过位置识别装置识别IC装置的相对位置时，装置基座11。版权所有（C）2007，JPO＆INPIT

4. 发明专利

JP2011226806A Electronic component handling device, electronic component testing device, and electronic component testing method 审中-公开
标题翻译：电子元件处理装置，电子元件测试装置和电子元件测试方法
公开(公告)号：JP2011226806A
公开(公告)日：2011-11-10
申请号：JP2010094158
申请日：2010-04-15
申请人： Advantest Corp , 株式会社アドバンテスト
发明人： KIKUCHI ARITOMO , NAKAMURA HIROTO
IPC分类号： G01R31/26
CPC分类号： G01R31/2893 , G01R31/2891
摘要： PROBLEM TO BE SOLVED: To provide an electronic component handling device for testing an electronic component to be tested having input/output terminals provided on both sides.SOLUTION: An electronic component handling device 10 for handling an electronic component to be tested 100 having a first principal surface provided with a first device terminal and a second principal surface provided with a second device terminal includes a contact arm 315 having a holding side contact arm 317 to which a first socket 319 is attached and a suction pad 317c that holds the electronic component to be tested 100, and an alignment device 320 for aligning the first socket 319 and the electronic component to be tested 100 and further aligning the electronic component to be tested 100 that is held by the suction pad 317c and are in contact with the first socket 319 with respect to a second socket 301. The contact arm 315 presses the second device terminal of the electronic component to be tested 100 against the second socket 301.
摘要翻译：要解决的问题：提供一种用于测试具有设置在两侧的输入/输出端子的待测电子部件的电子部件处理装置。解决方案：一种用于处理具有第一装置端子的第一主表面和设置有第二装置端子的第二主表面的待测试电子部件100的电子部件处理装置10包括：接触臂315，其具有保持连接有第一插座319的侧面接触臂317和保持要测试的电子部件100的吸盘317c以及用于对准第一插座319和待测试电子部件100的对准装置320，待被测试的电子部件100，其被吸盘317c保持并且相对于第二插座301与第一插座319接触。接触臂315将要测试的电子部件100的第二设备端子按压第二个插座301.版权所有（C）2012，JPO＆INPIT

5. 发明专利

JPH09185683A METHOD AND DEVICE FOR PROCESSING IMAGE FOR CHARACTER CHECKING DEVICE 失效
公开(公告)号：JPH09185683A
公开(公告)日：1997-07-15
申请号：JP34329095
申请日：1995-12-28
申请人： ADVANTEST CORP
发明人： KIKUCHI ARITOMO
IPC分类号： G06K9/68 , G06K9/36 , G06K9/40
摘要： PROBLEM TO BE SOLVED: To surely prepare standard character data even when the row or column of characters of a device to be tested (DUT) to be defined as a reference is inclined. SOLUTION: The description plane of DUT, where the characters to be defined as a standard are described, is photographed, provided picture element values (the luminance of picture elements) are stored in an image memory M1, these data are converted into binary data by performing threshold processing and stored in an image memory M2, noises are reduced by thinning these data, these data are stored in an image memory M3, and these data are returned into original thickness by reforming thickening processing and stored in an image memory M4. A circumscribed rectangle is found for each character from these data, its coordinate positions are stored in a circumscribed rectangle memory M6, the image data in the image memory M1 are punched out by these circumscribed rectangle data, and the image data for each character are segmented and stored in an image memory M5 as standard character data. Further, the inclining angle of row line/column line is found and the inclination corrected standard character data can be provided as well.

6. 发明专利

JP2019028044A 磁気センサ試験装置审中-公开
公开(公告)号：JP2019028044A
公开(公告)日：2019-02-21
申请号：JP2017151260
申请日：2017-08-04
申请人： ADVANTEST CORP
发明人： ENDO YUKI , KIKUCHI ARITOMO , NAKAMURA SHIGEO
IPC分类号： G01R33/12 , H01L43/08
摘要：【課題】磁気センサに対して加わる熱により、電磁石の性能が大きく変化することを防止できる磁気センサ試験装置を提供する。【解決手段】磁気センサ試験装置において、磁気センサに対して磁場を印加する電磁石5、60と、磁気センサに対して局所的に熱を加えて磁気センサの温度を調整する温調器30、40と、電磁石50、60及び温調器30、40を制御する制御部とを備え、制御部は、温調器30、40により磁気センサに熱を加えつつ、電磁石50、60により磁場を磁気センサに印加した状態で、磁気センサを試験する。【選択図】図3

7. 发明专利

JP2014085230A Electronic component handling device, electronic component testing device, and method for testing electronic component 审中-公开
标题翻译：电子元件处理装置，电子元件测试装置和测试电子元件的方法
公开(公告)号：JP2014085230A
公开(公告)日：2014-05-12
申请号：JP2012234440
申请日：2012-10-24
申请人： Advantest Corp , 株式会社アドバンテスト
发明人： KIKUCHI ARITOMO
IPC分类号： G01R31/26
CPC分类号： G01R1/02 , G01R31/2891 , G01R31/2893
摘要： PROBLEM TO BE SOLVED: To provide an electronic component handling device capable of achieving miniaturization and improving throughput when the number of contact arms increases.SOLUTION: A handler 100 is provided with a plurality of contact arms 300, each of which has a holding section 380 for holding a DUT 10 and is arranged along a first direction. Each of the contact arms 300 has an adjustment unit 330 that causes the holding section 380 to relatively move with respect to a base 310 of the contact arms 300. The handler 100 includes: an imaging unit 220 that can image the DUT 10 and the holding section 380; an operation unit 230 that operates the adjustment unit 330; and a moving unit 210 that causes the imaging unit 220 and operation unit 230 to move along the X direction. The adjustment unit 330 adjusts the relative position of the holding section 380 according to the operation of the operation unit 230.
摘要翻译：要解决的问题：提供一种当接触臂数量增加时能够实现小型化和提高生产量的电子部件处理装置。解决方案：处理器100设置有多个接触臂300，每个接触臂300具有保持部380 用于保持DUT 10并且沿着第一方向布置。接触臂300中的每一个具有使保持部380相对于接触臂300的基部310相对移动的调节单元330.处理器100包括：成像单元220，其可以对DUT 10进行成像和保持第380条; 操作调整单元330的操作单元230; 以及移动单元210，其使得成像单元220和操作单元230沿X方向移动。调整单元330根据操作单元230的操作来调整保持部380的相对位置。

8. 发明专利

JPH08105937A AUTOMATIC HANDLER FOR DEVICE TESTER, AND DEVICE MEASURING METHOD THEREOF 失效
公开(公告)号：JPH08105937A
公开(公告)日：1996-04-23
申请号：JP26823094
申请日：1994-10-06
申请人： ADVANTEST CORP
发明人： GOTO TOSHIO , KIKUCHI ARITOMO , HAYAMA HISAO
IPC分类号： G01R31/26 , G01R31/308 , H01L21/66
摘要： PURPOSE: To inspect outer appearance at high speed, high precision, and high efficiency by controlling brightness of each light emitting element in a luminaire in which a number of the brightness-controllable light emitting elements are disposed around a camera. CONSTITUTION: Tens of trays each having a number of subject devices (DUT) 10 to be measured are stacked and contained in a loader part 14 of a loader/ unloader part. The DUT 10 is carried from the loader part 14 by a movable body 13 to a buffer stage 16. At a measuring part, the DUT 10 is handled by a movable body 19, and at a contact part, an electric test of the DUT 10 is conducted. After completion of the electric test, it is handled to a buffer stage 22 to be sent to the loader/unloader part. An appearance inspection part 27 comprises a camera 28, and a luminaire 29 having a number of brightness-- controllable light emitting elements and an appearance measuring base 30 disposed around it. As the light-emitting elements are brightness-controlled, proper illumination is applied to parts of the DUT 10 to be appearance-inspected to clarify shading, and image data after conversion through the camera 28 are processed at an operation processing part for measurement at high resolution.

9. 发明专利

JPH07324918A CALIBRATION METHOD OF IMAGE PROCESSOR 失效
公开(公告)号：JPH07324918A
公开(公告)日：1995-12-12
申请号：JP11696794
申请日：1994-05-30
申请人： ADVANTEST CORP
发明人： KIKUCHI ARITOMO
IPC分类号： G01B11/24 , G06T1/00 , G06T7/00 , H05K13/08
摘要： PURPOSE:To provide a method which calibrates an image processor without being affected by illuminance. CONSTITUTION:In the calibration method of an image processor, an object to be measured is placed on a criterion plane 22 on a base stand, the base stand and the object to be measured are imaged from a side part, and image information is taken into so as to be measured. In a block 1, for calibration, a thin film, having a uniform film thickness, whose side face in the thickness direction is formed as a white part 12, is bonded to the rear surface of a rectangular parallelepiped whose side face is formed as a black part 11. The block 1 for calibration is placed on the criterion plane 22, a two equally dividing straight line on an image, which divides the white part 12 into two upper and lower equal parts, is measured, and the image is processed.

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