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    • 8. 发明专利
    • Electronic component handling device, electronic component testing device, and method for testing electronic component
    • 电子元件处理装置,电子元件测试装置和测试电子元件的方法
    • JP2014085230A
    • 2014-05-12
    • JP2012234440
    • 2012-10-24
    • Advantest Corp株式会社アドバンテスト
    • KIKUCHI ARITOMO
    • G01R31/26
    • G01R1/02G01R31/2891G01R31/2893
    • PROBLEM TO BE SOLVED: To provide an electronic component handling device capable of achieving miniaturization and improving throughput when the number of contact arms increases.SOLUTION: A handler 100 is provided with a plurality of contact arms 300, each of which has a holding section 380 for holding a DUT 10 and is arranged along a first direction. Each of the contact arms 300 has an adjustment unit 330 that causes the holding section 380 to relatively move with respect to a base 310 of the contact arms 300. The handler 100 includes: an imaging unit 220 that can image the DUT 10 and the holding section 380; an operation unit 230 that operates the adjustment unit 330; and a moving unit 210 that causes the imaging unit 220 and operation unit 230 to move along the X direction. The adjustment unit 330 adjusts the relative position of the holding section 380 according to the operation of the operation unit 230.
    • 要解决的问题:提供一种当接触臂数量增加时能够实现小型化和提高生产量的电子部件处理装置。解决方案:处理器100设置有多个接触臂300,每个接触臂300具有保持部380 用于保持DUT 10并且沿着第一方向布置。 接触臂300中的每一个具有使保持部380相对于接触臂300的基部310相对移动的调节单元330.处理器100包括:成像单元220,其可以对DUT 10进行成像和保持 第380条; 操作调整单元330的操作单元230; 以及移动单元210,其使得成像单元220和操作单元230沿X方向移动。 调整单元330根据操作单元230的操作来调整保持部380的相对位置。