专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

61. 发明专利

JP4802740B2 Timer circuit and charging control device 有权
公开(公告)号：JP4802740B2
公开(公告)日：2011-10-26
申请号：JP2006023601
申请日：2006-01-31
申请人：ミツミ電機株式会社
发明人：康一郎坂本 , 貴志武田 , 順司竹下
IPC分类号： H03K17/28 , H02J7/10 , H03K17/00
CPC分类号： G01R31/3004

62. 发明专利

JP4624944B2 Pin electronics to be used in the automatic test equipment for testing integrated circuit 有权
公开(公告)号：JP4624944B2
公开(公告)日：2011-02-02
申请号：JP2006067886
申请日：2006-03-13
申请人：ヴェリジー(シンガポール) プライベートリミテッドVerigy(Singapore)Pte.Ltd.
发明人：ロルフ・ハルユンク
IPC分类号： G01R31/28
CPC分类号： G01R31/31924 , G01R31/3004 , G01R31/31813

63. 发明专利

JP2010166110A Voltage detection circuit 审中-公开
标题翻译：电压检测电路
公开(公告)号：JP2010166110A
公开(公告)日：2010-07-29
申请号：JP2009004273
申请日：2009-01-13
申请人： Seiko Instruments Inc , セイコーインスツル株式会社
发明人： SUGIURA SHOICHI , IGARASHI ATSUSHI , KAWASHIMA KUSU
IPC分类号： H03K17/22 , G06F1/28
CPC分类号： H03K17/223 , G01R19/16519 , G01R31/3004
摘要： PROBLEM TO BE SOLVED: To provide a voltage detection circuit having a small circuit scale. SOLUTION: A PMOS (P-type Metal Oxide Semiconductor) 11 having an absolute value Vtp of its threshold voltage equal to a minimum operating supply voltage has its gate connected to a ground terminal, its source connected to a power supply terminal, and its drain connected to the source of a PMOS 12. The PMOS 12 has its gate connected to a reference voltage input terminal and its drain connected to the output terminal of the voltage detection circuit. A capacitor 15 is provided between the output terminal of the voltage detection circuit and the ground terminal. An inverter 41 has its input terminal connected to the output terminal of the voltage detection circuit. COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供具有小电路规模的电压检测电路。解决方案：其阈值电压的绝对值Vtp等于最小工作电源电压的PMOS（P型金属氧化物半导体）11的栅极连接到接地端子，其源极连接到电源端子，其漏极连接到PMOS12的源极。PMOS12的栅极连接到参考电压输入端，其漏极连接到电压检测电路的输出端。在电压检测电路的输出端子和接地端子之间设置电容器15。反相器41的输入端连接到电压检测电路的输出端。版权所有（C）2010，JPO＆INPIT

64. 发明专利

JP4323804B2 Improvement of loop-back testing of serial devices 有权
公开(公告)号：JP4323804B2
公开(公告)日：2009-09-02
申请号：JP2002554870
申请日：2001-12-03
申请人：テラダイン・インコーポレーテッドTeradyne Incorporated
发明人：パニズ，マイケル・シー , ロビンズ，ブラッドフォード・ビー
IPC分类号： G01R31/28 , H04L25/02 , G01R31/30 , G01R31/317 , G06F11/22 , H04L1/24
CPC分类号： G01R31/31716 , G01R31/3004 , G01R31/3016 , H04L1/243

65. 发明专利

JP2007327804A Voltage drop measuring circuit 审中-公开
标题翻译：电压降测量电路
公开(公告)号：JP2007327804A
公开(公告)日：2007-12-20
申请号：JP2006158071
申请日：2006-06-07
申请人： Nec Electronics Corp , Necエレクトロニクス株式会社
发明人： MATSUNAGA TOSHIYUKI
IPC分类号： G01R31/28 , G01R19/00 , H01L21/822 , H01L27/04
CPC分类号： G01R31/31721 , G01R19/16528 , G01R19/16552 , G01R31/3004 , G01R31/31701
摘要： PROBLEM TO BE SOLVED: To solve a problem wherein a drop amount of an electric power source potential is difficult to be measured in every one cycle of a clock signal in a conventional voltage drop measuring circuit.
SOLUTION: This voltage drop measuring circuit of the present invention has a voltage drop circuit 11 for generating an output voltage VOUT with the electric power source potential dropped preliminarily by a prescribed amount, and for changing the output voltage VOUT in response to fluctuation of the electric power source potential, and a flip-flop FF2 for holding a flag indicating the drop of the electric power source potential, based on the output voltage VOUT.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：为了解决在常规电压降测量电路中在时钟信号的每一个周期中难以测量电力电位的下降量的问题。解决方案：本发明的该电压降测量电路具有用于产生输出电压VOUT的电压降电路11，其中电源电位预先下降预定量，并且响应于波动来改变输出电压VOUT 和用于保持指示电源电位下降的标志的触发器FF2，基于输出电压VOUT。版权所有（C）2008，JPO＆INPIT

66. 发明专利

JP2007208524A Timer circuit 有权
标题翻译：定时器电路
公开(公告)号：JP2007208524A
公开(公告)日：2007-08-16
申请号：JP2006023601
申请日：2006-01-31
申请人： Mitsumi Electric Co Ltd , ミツミ電機株式会社
发明人： SAKAMOTO KOICHIRO , TAKESHITA JUNJI , TAKEDA TAKASHI
IPC分类号： H03K17/28 , H02J7/10
CPC分类号： G01R31/3004
摘要： PROBLEM TO BE SOLVED: To provide a timer circuit which can shorten the time required for confirming the operation of a charge controller without providing an external terminal for that purpose.
SOLUTION: The timer circuit comprising an oscillator 12, and sections 13, 16 and 17 performing frequency division of an oscillation signal outputted from the oscillator and clocking a predetermined time is further provided with a means 23 for comparing the voltage at an external terminal 21 externally supplied with a voltage signal within a predetermined voltage range or a time shortening mode designation voltage of different voltage level with a predetermined voltage 24 and for judging whether a time shortening mode is designated or not, and a first switch means SW1 for switching such that the oscillation signal outputted from the oscillator bypasses a portion 13 of the frequency dividing section if a time shortening mode is designated.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供一种定时器电路，其可以缩短确认充电控制器的操作所需的时间，而不需要为此提供外部端子。解决方案：包括振荡器12和执行从振荡器输出的振荡信号的分频并计时预定时间的部分13,16和17的定时器电路还设置有用于比较外部电压的装置23 端子21外部提供预定电压范围内的电压信号或具有预定电压24的不同电压电平的时间缩短模式指定电压，并且用于判断是否指定了缩短模式;以及用于切换的第一开关装置SW1 使得如果指定时间缩短模式，则从振荡器输出的振荡信号绕过分频部分的一部分13。版权所有（C）2007，JPO＆INPIT

67. 发明专利

JP3942765B2 Semiconductor device simulating apparatus, and semiconductor test program debug device using the same 有权
公开(公告)号：JP3942765B2
公开(公告)日：2007-07-11
申请号：JP6761899
申请日：1999-03-15
申请人：株式会社アドバンテスト
发明人：清福島
IPC分类号： G06F11/22 , G01R31/28 , G01R31/30 , G01R31/317 , G01R31/3183 , G06F11/26 , G06F17/50 , H01L29/00
CPC分类号： G01R31/31705 , G01R31/2846 , G01R31/3004 , G01R31/31704 , G01R31/318307

68. 发明专利

JP2006288046A Power supply circuit and testing apparatus 有权
标题翻译：电源电路和测试装置
公开(公告)号：JP2006288046A
公开(公告)日：2006-10-19
申请号：JP2005103403
申请日：2005-03-31
申请人： Advantest Corp , 株式会社アドバンテスト
发明人： KODERA SATOSHI
IPC分类号： H02M3/155
CPC分类号： H02M3/158 , G01R31/3004 , H02M2001/007
摘要： PROBLEM TO BE SOLVED: To freely select a positive voltage and a negative voltage to be supplied to a load using a single power supply, and to expand a range of the voltage supplied to the load.
SOLUTION: This power supply circuit, supplying a voltage to a load, has a power supply for generating a power supply voltage, a positive voltage terminal for outputting a positive voltage on the basis of the power supply voltage, and a negative voltage terminal which is generated on the basis of the power supply voltage, outputs the negative voltage whose polarity is different from the positive voltage, and which includes an inversion output circuit for outputting the positive voltage and the negative voltage while a current between the positive voltage terminal and an outside, and a current between the negative voltage terminal and the outside flow in the same direction; a step-down voltage output circuit for outputting a predetermined step-down output voltage to the outside by switching the positive voltage terminal and the negative voltage terminal at a predetermined duty ratio so as to be connected to the outside; and a booster output circuit for supplying a booster output voltage larger in an absolute value than the step-down output voltage to the load by switching connection of the step-down voltage output circuit to the load, at the predetermined duty ratio.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：使用单个电源自由选择要提供给负载的正电压和负电压，并扩大提供给负载的电压的范围。解决方案：向负载提供电压的该电源电路具有用于产生电源电压的电源，用于基于电源电压输出正电压的正电压端子和负电压基于电源电压产生的端子，输出极性与正电压不同的负电压，并且包括用于输出正电压和负电压的反相输出电路，同时正电压端子外侧，负电压端子和外部电流之间的电流沿相同方向; 降压电压输出电路，用于以预定的占空比切换正电压端子和负电压端子以向外部输出预定的降压输出电压以连接到外部; 以及升压器输出电路，用于以预定占空比切换降压电压输出电路与负载的连接，将比绝对值大的降压输出电压的升压器输出电压提供给负载。版权所有（C）2007，JPO＆INPIT

69. 发明专利

JP2006500559A Iddq determination method and apparatus 审中-公开
公开(公告)号：JP2006500559A
公开(公告)日：2006-01-05
申请号：JP2004537366
申请日：2003-08-08
申请人：コーニンクレッカフィリップスエレクトロニクスエヌヴィKoninklijke Philips Electronics N.V.
发明人：ホセ、デ．ホタ．ピネダ、デ、ギベス , ホセプ、リウス、バスケス
IPC分类号： G01R31/26 , G01R31/30
CPC分类号： G01R31/3008 , G01R31/3004
摘要：欠陥を検出するため被試験装置（ＤＵＴ）を試験する試験装置は、測定回路（ＭＥ）、スレッショルド回路（ＴＨ）、および制御回路（ＣＧ）を具備する。測定回路（ＭＥ）は、クロックパルス（ＣＬＫ）のカウント数（Ｎ）を得るためカウント周期（ＴＣ）の間にクロックパルス（ＣＬＫ）を計数するカウンタ（Ｃ１）を具備する。カウント周期（ＴＣ）には、被試験装置（ＤＵＴ）の端子（ＩＮ）に接続されたスイッチ（Ｓ）が端子（ＩＮ）から電源電圧（ＶＤＤ）を取り出し、端子（ＩＮ）の電圧（ＶＤＤ'）が減衰を開始する時点に生じる試験サイクルの開始（ｔ１）によって決まる始まりがある。カウント周期（ＴＣ）の終わりは、比較器（ＣＯＭ１）によって端子（ＩＮ）の電圧（ＶＤＤ'）が基準値（ＶＲＥＦ）と交差することが検出される時点（ｔ２）によって決まる。制御回路（ＣＧ）は、被試験回路（ＣＵＴ）の製造プロセスの変動性を考慮してクロック信号（ＣＬＫ）および／または基準数（ＮＴＨ）を発生させる。スレッショルド回路（ＴＨ）は、カウント数（Ｎ）と基準数（ＮＴＨ）を比較することにより合格／不合格信号（ＰＦ）を発生させる。

70. 发明专利

JP2005301476A Power supply control system and storage device 审中-公开
标题翻译：电源控制系统和存储设备
公开(公告)号：JP2005301476A
公开(公告)日：2005-10-27
申请号：JP2004113829
申请日：2004-04-08
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： SASAKURA TAKAHIRO , ABE SEIICHI
IPC分类号： G06F1/28 , G01R31/30 , G01R31/317 , G05F1/00 , G05F1/10 , G06F1/20 , G06F1/26 , G06F1/30 , G06F3/06 , G06F11/00 , G06F11/20
CPC分类号： G06F1/26 , G01R31/3004 , G01R31/31721 , G06F1/206 , G06F11/2015 , Y10T307/50
摘要： PROBLEM TO BE SOLVED: To analyze the failure of the power source circuit part by storing the fluctuation history of voltage data before the power source circuit part is put into an abnormal state, when the power source circuit part is put into the abnormal state. SOLUTION: An arithmetic processing part controls a hot swap circuit 17, and DC/DC converters 3 to 13 on the basis of binary data from an ADC 25 and an interrupting signal in a predetermined logical level from each comparing part of a voltage detecting circuit 15. When the interruption signal in the predetermined logical level is inputted from any comparing part, reading of the binary data corresponding to the interruption signal is stopped. The binary data which are stored in an SRAM at that point of time and are related to the voltage detecting part corresponding to the interruption signal, are transferred to a non-volatile memory 23 so as to be stored. After the driving of this system stops, the binary data for analyzing the factor of abnormality are read from the non-volatile memory 23, and the cause of abnormality of the DC/DC converter whose output voltage shows abnormality is analyzed. COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：为了通过在电源电路部分处于异常状态之前存储电压数据的波动历史来分析电源电路部分的故障，当电源电路部分进入异常状态时州。解决方案：算术处理部分基于来自ADC 25的二进制数据和来自电压的每个比较部分的预定逻辑电平的中断信号来控制热插拔电路17和DC / DC转换器3至13 检测电路15.当从任何比较部分输入预定逻辑电平的中断信号时，停止与中断信号对应的二进制数据的读取。存储在该时刻的SRAM中并且与对应于中断信号的电压检测部相关的二进制数据被传送到非易失性存储器23以被存储。在该系统的驱动停止之后，从非易失性存储器23读出用于分析异常因子的二进制数据，分析其输出电压为异常的DC / DC转换器的异常的原因。版权所有（C）2006，JPO＆NCIPI

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式