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    • 51. 发明专利
    • SEMICONDUCTOR LASER ELEMENT
    • JPH01109786A
    • 1989-04-26
    • JP26767587
    • 1987-10-22
    • SHARP KK
    • KONDO MASAFUMIHAYAKAWA TOSHIROSUYAMA NAOHIROTAKAHASHI HISATOSHI
    • H01S5/00H01S5/223H01S5/30
    • PURPOSE:To obtain a semiconductor laser element with one successive MBE growth by providing a forward mesa section having a plane (n11) A (n>=1) formed on a substrate as an oblique surface, and using a group IV amphoteric element as a dopant for a growing layer to be stacked on an activated layer. CONSTITUTION:A layer 19 doped with a group IV amphoteric element comprises a forward mesa based on a forward mesa 17a with a plane (n11) A (n>=1) formed on a substrate 17 as an oblique surface. On the oblique surface 19a of the forward mesa, where adhesion coefficients of group V elements are small, and therefore, a IV group amphoteric element which normally behaves as a doper for a plane (100) infiltrates into a location of the group V element, whereby a first conduction type region 19b is formed. As a result, the first conduction type region 19b of a second conduction type layer 19 acts as a current constricting region. Further, a laser oscillating region 18a in an activated layer 18 is interposed also widthwise by the layer 19 into which the group V amphoteric element is doped, an index waveguide being formed. According to the constitution, a semiconductor laser element having current constriction and index waveguide mechanisms can easily be obtained by a MBE method.
    • 53. 发明专利
    • MANUFACTURE OF SEMICONDUCTOR LASER ELEMENT
    • JPS63287081A
    • 1988-11-24
    • JP12166787
    • 1987-05-19
    • SHARP KK
    • TAKAHASHI KOUSEISUYAMA NAOHIROKONDO MASAFUMIHAYAKAWA TOSHIRO
    • H01S5/00
    • PURPOSE:To obtain an element having a low threshold value of current, excellent in temperature characteristics and transient characteristics, having a long life, by providing a substrate with groove parts or projection parts at the intervals equal to the length of a resonator of the element and making each layer grow by a molecular beam epitaxial (MBE) method. CONSTITUTION:One surface of a substrate 1 provided with plurality of groove parts 2 at the intervals L1 equal to the length of a resonator. The surface provided with the grooves 2 is stuck to a substrate holder with In. Then, a clad layer 11, an active layer 12, a clad layer 13 and a cap layer 4 are made to grow by turns on the surface on the opposite side by an MBE method. At this time, the parts of the grooves 2 are filled with In so as to have large thermal conductivity and the growth is performed at a higher temperature than the set substrate temperature. Accordingly, the growth layer of some part of the groove parts 2 becomes thinner than the other parts so as to have a window structure. An element, which cleaves perpendicularly to the grown surface at the central part of these grooves 2, and has a window structure on an end surface together with a high output and a long life, is obtained.
    • 54. 发明专利
    • SEMICONDUCTOR LASER ELEMENT
    • JPS63271992A
    • 1988-11-09
    • JP10561287
    • 1987-04-28
    • SHARP KK
    • SUYAMA NAOHIROTAKAHASHI KOUSEIKONDO MASAFUMIHAYAKAWA TOSHIRO
    • H01S5/00H01S5/20H01S5/34H01S5/343
    • PURPOSE:To make a clad layer of a semiconductor laser thinner without deterioration of laser characteristics and to improve the productivity and yield by making the structure near the active layer of the semiconductor laser a structure wherein the exudation of light from the active layer to the clad layer is very little. CONSTITUTION:Light guide layers 4, 6 which are made a junction with both adjacent layers are interposed between an active layer 5 and clad layers 3, 7 by gradually changing a mixed crystal ratio in the range between the active layer 5 and the clad layers 3, 7 and the thickness of the clad layers 3, 7 is set 0.5 mum or less. Since the exudation of light to the clad layers 3, 7 is made very little by the graded refractive index distribution type light guide layers 4, 6, the absorption loss by a substrate or a cap layer is very little even if the thickness of the clad layer is made thinner and characteristics are not deteriorated even if the thickness is made 0.5 mum or less. This enables obtaining the improvement of productivity without the deterioration of the characteristics of a laser element and simultaneously, the improvement of the characteristics according to the reduction of the density of detects can also be expected.
    • 56. 发明专利
    • SEMICONDUCTOR LASER
    • JPS63169094A
    • 1988-07-13
    • JP85387
    • 1987-01-06
    • SHARP KK
    • SUYAMA NAOHIROTAKAHASHI KOUSEIKONDO MASAFUMIHAYAKAWA TOSHIRO
    • H01S5/00H01S5/20
    • PURPOSE:To make a reactive current small and attain a low threshold electrification by preparing a prevention measure for diffusion of an electric current through the second clad layer in a ridge guide structure. CONSTITUTION:A ridge guide part 11 is formed by etching from the surface of a cap layer 9 to the second clad layer 8. A diffusion region 10 extending to the first clad layer 3 is formed by using Si as a source of diffusion. At the diffusion region 10, a quantum well of an active layer 4 is destroyed and a mixed crystal having an average composition is formed. Then in the case of the diffusion region where the quantum well is destroyed, its forbidden band is wider than that in the region where the quantum well below the ridge part is maintained and its region 10 functions as a block layer where an electric current flowing in both sides of the ridge part 11 through the clad layer 8 is blocked. As a reactive current extending over the whole plane of a laser chip is lessened, a low threshold electrification is available.
    • 60. 发明专利
    • SEMICONDUCTOR LASER
    • JPS62188295A
    • 1987-08-17
    • JP3164786
    • 1986-02-13
    • SHARP KK
    • HAYAKAWA TOSHIROTAKAHASHI KOUSEISUYAMA NAOHIROKONDO MASAFUMIYAMAMOTO SABURO
    • H01S5/00H01S5/343
    • PURPOSE:To obtain a visible semiconductor laser having a low threshold value by a method wherein a superlattice quantum well structure, wherein an AlGaAs layer, a GaAs layer and so on, each consisting of a thin layer of 5mol layers or less, are each laminated alternately, is formed into a superlattice quantum well structure in the optimum width by a molecular beam epitaxy (MBE) method and so on. CONSTITUTION:These diagrams are explanatory drawings to illustrate in a typical manner the distribution of an ASl mixed crystal ratio (a) on the section of a single superlattice quantum well structure made for finding the optimum quantum well width (thickness) Lz from the measurement of a photo luminescence, and a superlattice quantum well layer 22 and an Al0.5Ga0.5As barrier layer 23 (thickness =0.15mum) are formed by growth on an Al0.5Ga0.5As barrier layer 21 (thickness =0.5mum) by an MBE method. The structure of the superlattice quantum well layer 22 is a structure, wherein a GaAs layer (thickness; nX1mol layer =nX2.88Angstrom ) and an Al0.5Ga0.5As layer (thickness; nX1mol layer =nX2.83Angstrom ) are each laminated alternately in (m) layers and (m-1) layers, and the total quantum well width Lz is Lz=nX(2m-1)X2.83Angstrom . For a total half-value width (mev) (b), the minimum value in the range of 100Angstrom