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1. 发明公开

EP2463667A3 Flexible probe 审中-公开
标题翻译：柔性探头
公开(公告)号：EP2463667A3
公开(公告)日：2015-07-29
申请号：EP12154496.9
申请日：2005-06-21
申请人： Capres A/S
发明人： Nielsen, Folmer , Petersen, Peter R.E. , Hansen, Jesper Erdman
IPC分类号： G01R1/067 , G01R1/073 , G01R3/00 , G01R31/28 , G01C17/28
CPC分类号： G01R1/07392 , G01R1/06727 , G01R3/00 , G01R31/2887 , Y10T29/49204 , Y10T29/49222
摘要： A probe for testing electric properties on a specific location of a test sample, comprises a supporting body defining opposite first and second parts constituting a flexible cantilever part being flexible in one direction and a base part, respectively. The cantilever part defines an outer planar surface substantially perpendicular to the one direction, the base part being adapted for being fixated in a co-operating testing machine The probe further comprises at least one conductive probe arm in the cantilever part being positioned opposite the base part. The cantilever part defines opposite first and second regions, the second region being in contact with the base part, the first region defining first and second side surfaces, each of the first and second side surfaces defining a first angle with the outer planar surface, a first width defined between the first and the second side surfaces, the second region defining third and fourth side surfaces, each of the third and fourth side surfaces defining a second angle with the outer planar surface, a second width defined between the third and the fourth side surfaces, and the second width being equal to and/or smaller than the first width.

2. 发明授权

EP1018030B1 A METHOD OF CONTROLLING TEST PROBES IN A TESTING APPARATUS FOR ELECTRONIC PRINTED CIRCUIT BOARDS, AND AN APPARATUS FOR PERFORMING THE METHOD 有权
标题翻译：一种用于在试验装置电子用于执行过程检测传感器的规则，印刷电路和试验装置
公开(公告)号：EP1018030B1
公开(公告)日：2002-11-20
申请号：EP98942515.2
申请日：1998-09-14
申请人： TELLABS DENMARK A/S
发明人： HAUSCHULTZ, Mikael
IPC分类号： G01R31/28 , G01R1/073
CPC分类号： G01R31/2808 , G01R1/07328 , G01R1/07392

3. 发明公开

EP1141731A1 DUAL-PIN PROBE FOR TESTING CIRCUIT BOARDS 有权
标题翻译：仔细检查笔尖FOR电路板检测
公开(公告)号：EP1141731A1
公开(公告)日：2001-10-10
申请号：EP99967766.9
申请日：1999-12-30
申请人： Proteus Corporation
发明人： LUCAS, Brian K. , STOCKFORD, Brian
IPC分类号： G01R1/073
CPC分类号： G01R1/07392 , G01R1/07314
摘要： A dual-pin probe (100) has a probe body (104), a probe head (102), a signal pin (120), and a ground pin (122). The probe body couples to a robotic system configured to manipulate the dual-pin probe relative to a circuit board under test. The probe body is coupled to the probe head. The signal pin and the ground pin extend from a face of the probe head and are substantially parallel to one another. The ground pin is at a variable distance from the signal pin. The robotic system varies the distance between the ground pin and the signal pin, and positions the ground pin and the signal pin to contact nodes on the circuit board to automate the test.

4. 发明授权

EP0807258B1 TESTVORRICHTUNG FÜR ELEKTRONISCHE FLACHBAUGRUPPEN 失效
标题翻译：试验装置，电子印刷电路板
公开(公告)号：EP0807258B1
公开(公告)日：2000-01-19
申请号：EP96902914.9
申请日：1996-01-24
申请人： ITA INGENIEURBÜRO FÜR TESTAUFGABEN GmbH
发明人： BUKS, Manfred , SCHALLER, Peter , KRÜGER, Jens
IPC分类号： G01R1/067 , G01R1/073
CPC分类号： G01R1/06705 , G01R1/07392
摘要： The invention concerns a test device for electronic board assemblies, said device comprising at least one probe which can be positioned parallel to the surface within the total area of an assembly by drive devices. The test device is characterized in that the drive devices comprise a probe drive which, operating in all directions of movement independently of other probe drives, positions the probe on a sub-area of the total area.

5. 发明公开

EP0758454A1 TEST SYSTEM FOR EQUIPPED AND UNEQUIPPED PRINTED CIRCUIT BOARDS 失效
标题翻译：试验系统的库存和电路板无人居住
公开(公告)号：EP0758454A1
公开(公告)日：1997-02-19
申请号：EP95918606.0
申请日：1995-04-25
申请人： Driller, Hubert , Mang, Paul
发明人： Driller, Hubert , Mang, Paul
IPC分类号： G01R31 , G01R1
CPC分类号： G01R1/07392 , G01R1/06733 , G01R1/06738 , G01R31/2805
摘要： A device for testing substantially flat circuit carriers or printed circuit boards which are unequipped or which are equipped with electronic components comprises a contact connection device having a plurality of test needles, each test needle being provided in accordance with the invention with its own motor drive for setting the position of the tip of the test needle at any points of a three-dimensional portion of space at the contact connection device ('dancing needles'). For this purpose each test needle is disposed in a currently preferred embodiment on its own platform which is in the form of a wobble plate and the position of which can be adjusted in space by motor.

6. 发明授权

EP0468153B1 Kontaktierungsvorrichtung für Prüfzwecke 失效
标题翻译：用于测试目的接触设备。
公开(公告)号：EP0468153B1
公开(公告)日：1995-10-11
申请号：EP91107673.5
申请日：1991-05-11
申请人： atg test systems GmbH , Adaptronic Prüftechnik GmbH
发明人： Prokopp, Manfred
IPC分类号： G01R31/28 , G01R1/073
CPC分类号： G01R1/07392 , G01R31/2805

7. 发明授权

EP0293497B1 Kontaktsonden-Anordnung mit Feinpositionier-Vorrichtung 失效
标题翻译：用于精确定位的装置的探测装置
公开(公告)号：EP0293497B1
公开(公告)日：1993-03-10
申请号：EP87107669.1
申请日：1987-05-26
申请人： IBM DEUTSCHLAND GMBH , International Business Machines Corporation
发明人： Stoehr, Roland R.
IPC分类号： G01R31/28 , G01R1/067
CPC分类号： G01R1/07314 , G01R1/07392

8. 发明公开

EP0468153A1 Kontaktierungsvorrichtung für Prüfzwecke 失效
标题翻译： KontaktierungsvorrichtungfürPrüfzwecke。
公开(公告)号：EP0468153A1
公开(公告)日：1992-01-29
申请号：EP91107673.5
申请日：1991-05-11
申请人： atg test systems GmbH , Adaptronic Prüftechnik GmbH
发明人： Prokopp, Manfred
IPC分类号： G01R31/28 , G01R1/073
CPC分类号： G01R1/07392 , G01R31/2805
摘要： Die Erfindung betrifft eine Kontaktierungsvorrichtung, insbesondere für Prüfzwecke, mit mehren in einem Prüffeld entlang von zwei quer, insbesondere senkrecht, zueinander verlaufenden Koordinaten verfahrbaren Positioniergliedern, die je einen auf eine gewünschte Kontaktstelle eines Prüflings aufsetzbaren Kontaktfinger aufweisen, wobei zwei Kontaktfinger ein Sondenpaar bilden, das Bestandteil eines Prüfstromkreises ist. Insbesondere zur Beschleunigung des Prüfvorgangs wird vorgeschlagen, mehrere Sondenpaare (12) auszubilden, deren Positionierglieder (5) unabhängig voneinander entlang der Koordinaten (x,y) verfahrbar sind.
摘要翻译：本发明涉及一种用于接触元件的装置，特别是用于测试的装置，该装置具有多个定位构件，该定位构件可以沿着相对于彼此横向地，特别垂直地延伸的两个坐标在测试场中移动，接触指，其可以放置在测试样本的期望接触点上，两个接触指形成探针对，其是测试电路的一部分。特别是为了加速测试过程，提出了形成几个探针对（12），定位构件（5）可以沿坐标（x，y）彼此独立地移动。

9. 发明公开

EP2533055A1 Dual probing tip system 审中-公开
标题翻译： Duales Sondenspitzensystem
公开(公告)号：EP2533055A1
公开(公告)日：2012-12-12
申请号：EP12171512.2
申请日：2012-06-11
申请人： TEKTRONIX, INC.
发明人： Spinar, James E. , Lynn, Richard R.
IPC分类号： G01R1/067
CPC分类号： G01R1/06788 , G01R1/06705 , G01R1/07364 , G01R1/07392
摘要： A dual probing tip system uses a slot and rail system to provide variable spacing and lateral and axial compliance of the probing tips mounted on first and second support members. A movable base member is secured on a frame with the base member having a rack of linear teeth and a pair of rails angled toward the front. First and second intermediate carriers each have a slot that engages one of the angled rails. Each of the carriers has stanchions that receive a thumb wheel pinion gear mounted on a shaft. The pinion gear mates with the teeth on the base member for movement of the carriers. Each support member has an axial slot that mated with an axial slot on each one of the carriers. Each support member has a compression spring which allows axial compliance of the support members.
摘要翻译：双探测尖端系统使用槽和轨道系统来提供安装在第一和第二支撑构件上的探测头的可变间隔和横向和轴向顺应性。可移动基座部件固定在框架上，基座部件具有线状齿条和一对朝向前方成角度的导轨。第一和第二中间载体各自具有接合一个倾斜轨道的槽。每个载体具有接收安装在轴上的拇指轮小齿轮的支柱。小齿轮与基座部件上的齿匹配，用于支架的移动。每个支撑构件具有与每个载体上的轴向狭槽配合的轴向槽。每个支撑构件具有允许支撑构件的轴向顺应的压缩弹簧。

10. 发明公开

EP2463668A2 A method and an apparatus for testing electrical properties 审中-公开
标题翻译： Verfahren und Vorrichtung zum Testen elektrischer Eigenschaften
公开(公告)号：EP2463668A2
公开(公告)日：2012-06-13
申请号：EP12154515.6
申请日：2005-06-21
申请人： Capres A/S
发明人： Nielsen, Peter Folmer , Petersen, Peter R.E. , Hansen, Jesper Erdman
IPC分类号： G01R1/067
CPC分类号： G01R1/07392 , G01R1/06727 , G01R3/00 , G01R31/2887
摘要： A method for testing electrical properties comprises providing a test sample defining a first surface, an area defined on the first surface, providing a first test probe comprising a first plurality of probe arms each including at least one electrode for contacting a respective location on the test sample and a second test probe comprising at least one probe arm including at least one electrode for contacting a location on the test sample. The method further comprises providing a test apparatus including a first and a second holder for receiving the first and the second test probes respectively, each of the holders comprising positioning devices for positioning and/or relocating each of the holders in three dimensions, the test apparatus being electrically connected to each of the electrodes of the first test probe and to the at least one electrode of the second test probe, the test apparatus further comprising a sample holder for receiving and holding the test sample in a specific orientation relative to the first and the second test probe. Still further the method comprises positioning the electrodes of the probe arms of the first test probe in contact with the area, positioning the at least one electrode of the at least one probe arm of the second test probe in contact with the area at a location remote from the first test probe, transmitting a test signal from at least one of the electrodes of the first test probe, or, in the alternative from the at least one electrode of the second test probe, and detecting the test signal transmission between the first and the second test probe.
摘要翻译：一种用于测试电气特性的方法包括提供限定第一表面的测试样品，在第一表面上限定的区域，提供包括第一多个探针臂的第一测试探针，每个探针臂包括用于接触测试中相应位置的至少一个电极样品和第二测试探针，其包括至少一个探针臂，所述探针臂包括用于接触测试样品上的位置的至少一个电极。该方法还包括提供一种测试装置，包括分别用于接收第一和第二测试探针的第一和第二保持器，每个保持器包括用于在三个维度上定位和/或重新定位每个保持器的定位装置，测试装置电连接到第一测试探针的每个电极和第二测试探针的至少一个电极，测试装置还包括用于相对于第一测试探针以特定取向接收和保持测试样本的样本保持器，第二个测试探针。此外，该方法包括将第一测试探针的探针臂的电极定位成与该区域接触，将第二测试探针的至少一个探针臂的至少一个电极定位在远程位置处的区域从所述第一测试探针传输来自所述第一测试探针的至少一个电极的测试信号，或者可选地，从所述第二测试探针的所述至少一个电极中检测所述第一和第二测试探针之间的测试信号传输，第二个测试探针。

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