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1. 发明公开

EP4367756A1 KONTAKTVORRICHTUNG 审中-实审
公开(公告)号：EP4367756A1
公开(公告)日：2024-05-15
申请号：EP22750667.2
申请日：2022-07-08
申请人： Feinmetall GmbH
发明人： BENEDIX, Lutz , GAU , Lorenz , BÜSSE, Hans-Albert , FLIK, Mark Daniel
IPC分类号： H01R13/193 , G01R31/28 , H01R12/91 , H01R12/72
CPC分类号： H01R13/193 , H01R12/91 , G01R31/2808 , H01R12/721 , H01R2201/2020130101

2. 发明授权

EP2904633B1 MULTIDIMENSIONAL STRUCTURAL ACCESS 有权
公开(公告)号：EP2904633B1
公开(公告)日：2018-06-20
申请号：EP13843585.4
申请日：2013-10-04
申请人： FEI Company
发明人： BLACKWOOD, Jeffrey , LEE, Sang Hoon , SCHMIDT, Michael , STONE, Stacey , HOLLAND, Karey
IPC分类号： H01L21/66 , G01R31/307
CPC分类号： G01R31/2653 , G01N1/286 , G01N1/32 , G01R31/2808 , G01R31/2898 , G01R31/307 , G01R31/312 , H01J37/153 , H01J37/3005 , H01J2237/208 , H01J2237/24564 , H01J2237/2817 , H01J2237/31749 , H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： Multiple planes within the sample are exposed from a single perspective for contact by an electrical probe. The sample can be milled at a non-orthogonal angle to expose different layers as sloped surfaces. The sloped edges of multiple, parallel conductor planes provide access to the multiple levels from above. The planes can be accessed, for example, for contacting with an electrical probe for applying or sensing a voltage. The level of an exposed layer to be contacted can be identified, for example, by counting down the exposed layers from the sample surface, since the non-orthogonal mill makes all layers visible from above. Alternatively, the sample can be milled orthogonally to the surface, and then tilted and/or rotated to provide access to multiple levels of the device. The milling is preferably performed away from the region of interest, to provide electrical access to the region while minimizing damage to the region.

3. 发明授权

EP2473862B1 TESTING APPARATUS AND RELATIVE METHOD 有权
公开(公告)号：EP2473862B1
公开(公告)日：2018-06-20
申请号：EP10752540.4
申请日：2010-09-02
申请人： Applied Materials, Inc.
发明人： VAZZOLER, Michele
IPC分类号： G01R31/26 , H01L21/00 , H01L21/683 , H01L31/18
CPC分类号： H01L31/1876 , G01R31/2808 , G01R31/2893 , H01L21/67736 , H02S50/10 , Y02E10/50 , Y02P70/521
摘要： Embodiments of the invention may provide a testing apparatus that is used to test solar cells or other electronic devices. The testing apparatus may comprise a substantially flat support that is configured to support a substrate or other device that is to be electrically tested and a plurality of testing probes. The support comprises a plurality of through holes, each suitable for the insertion of a corresponding testing probe, to allow each probe to make contact with a testing area formed on the substrate. The testing apparatus may comprise a suction device that is associated or associable with the support, and is able to exert a holding force on the substrate that counteracts the thrusting force exerted by the testing probes.

4. 发明授权

EP2811304B1 Circuit board inspection method, circuit board inspection apparatus and circuit board inspection tool 有权
标题翻译： PCB测试方法，电路板检查和Leiterplattenprüfwerkzeug
公开(公告)号：EP2811304B1
公开(公告)日：2016-07-27
申请号：EP14170256.3
申请日：2014-05-28
申请人： Nidec-Read Corporation
发明人： Matsuoka, Shinji
IPC分类号： G01R1/067 , G01R31/28
CPC分类号： G01R31/2887 , G01R1/06705 , G01R31/2808 , G01R31/2812

5. 发明公开

EP2725369A2 Connector for selectively coupling an electrical load to a device under test 审中-公开
标题翻译：最后一个eu zuprüfendeVorrichtung
公开(公告)号：EP2725369A2
公开(公告)日：2014-04-30
申请号：EP13190368.4
申请日：2013-10-25
申请人： TEKTRONIX, INC.
发明人： Rinder, Karl , Clayton, Neil , Booman, Richard
IPC分类号： G01R31/28 , G01R1/04
CPC分类号： G01R31/04 , G01R1/0416 , G01R1/06772 , G01R1/07314 , G01R31/2808 , H01R12/716 , H01R13/635 , H01R13/6477 , H01R13/719 , H01R2201/20
摘要： A connector has a housing with an aperture formed therein having one portion larger than the other portion. The housing is mounted on the device under test with the housing positioned over a plurality of electrical contacts. An electrical load is positioned within the larger aperture of the housing and has a plurality of resistors disposed adjacent to an electrical contact assembly. A resilient member is positioned between the electrical load and the device under test such that a force directed on the electrical load compresses the resilient member to allow contact between a plurality of electrical contacts of the electrical contact assembly and the plurality of the electrical contacts on the device under test. Removing the force decompresses the resilient member and disconnects the plurality of contacts of the electrical contact assembly from the plurality of electrical contacts of the device under test.
摘要翻译：连接器具有其中形成有孔的外壳，其中一个部分大于另一部分。壳体安装在被测设备上，壳体位于多个电触头上。电负载位于壳体的较大孔内，并且具有邻近电接触组件设置的多个电阻器。弹性构件定位在电负载和被测器件之间，使得朝向电负载的力压缩弹性构件，以允许电接触组件的多个电触头与多个电触点之间的接触被测设备去除力使得弹性构件减压并且将电接触组件的多个触点与被测器件的多个电触头断开。

6. 发明公开

EP2508902A1 Testkontaktor für eine Leiterplatte, Verwendung und Verfahren zum Prüfen 有权转让
标题翻译： Testkontaktorfüreine Leiterplatte，Verwendung und Verfahren zumPrüfen
公开(公告)号：EP2508902A1
公开(公告)日：2012-10-10
申请号：EP12002417.9
申请日：2012-04-03
申请人： Yamaichi Electronics Deutschland GmbH
发明人： Serna, Yoan
IPC分类号： G01R31/28 , H01R13/15
CPC分类号： G01R31/2808 , H01R12/89 , H01R2201/20
摘要： Ein Aspekt der vorliegenden Erfindung betrifft einen Testkontaktor zum Kontaktieren einer Leiterplatte umfassend:
- ein erstes Andruckelement mit einer ersten Leiterplattenkontaktseite und zumindest einem ersten Kontaktelement;
- ein zweites Andruckelement mit einer zweiten Leiterplattenkontaktseite, wobei das zweite Andruckelement relativ zu dem ersten Andruckelement entlang einer Verlagerungsrichtung V verlagerbar ist,
wobei in einer Offenposition zwischen der ersten Leiterplattenkontaktseite im Bereich des zumindest einen ersten Kontaktelements und der zweiten Leiterplattenkontaktseite im Bereich des zumindest einen ersten Kontaktelements entlang der Verlagerungsrichtung V ein Abstand d O existiert, der ausgelegt ist, daß die Leiterplatte zwischen der ersten Leiterplattenkontaktseite und der zweiten Leiterplattenkontaktseite zumindest bereichsweise entlang einer Einführrichtung E kraftfrei einführbar ist,
wobei in einer Betriebsposition zwischen der ersten Leiterplattenkontaktseite im Bereich des zumindest einen ersten Kontaktelements und der zweiten Leiterplattenkontaktseite im Bereich des zumindest einen ersten Kontaktelements entlang der Verlagerungsrichtung V ein Abstand d B existiert, der kleiner als der Abstand d O ist, so daß das zumindest eine erste Kontaktelement mit zumindest einem zugeordneten ersten Platinenrandkontakt der Leiterplatte kontaktierbar ist und wobei der Testkontaktor durch eine relative Verlagerung der zwei Andruckelemente entlang der Verlagerungsrichtung V von der Offenposition in die Betriebsposition überführbar ist sowie eine Verwendung und ein Verfahren zum Prüfer der Leiterplatte.
摘要翻译：接触器（1）具有沿着移动方向（V）相对于另一个按压元件（13a）移位的按压元件（13b）。后一个按压元件的印刷电路板配合侧（15a）与前一个按压元件的另一个印刷电路板配合侧（15b）在沿着移位方向的接触元件（17a）的区域中以打开位置和操作位置。接触器通过按压元件沿换档方向相对移动而从打开位置移动到操作位置。还包括用于测试电路板的方法的独立权利要求。

7. 发明授权

EP2348324B1 Test apparatus, manufacturing method, and pallet for parallel RF testing of printed circuit boards 有权
标题翻译：测试装置，生产过程中，和范围为并行RF-测试印刷电路板
公开(公告)号：EP2348324B1
公开(公告)日：2012-09-26
申请号：EP10151063.4
申请日：2010-01-19
申请人： Research In Motion Limited
发明人： Kennedy, Marc Adam , Ivannikov, Arkady , Carney, Michael Andrew
IPC分类号： G01R1/073 , G01R29/08 , G01R31/28 , G01R31/319
CPC分类号： G01R31/2808 , G01R1/04 , G01R31/2822

8. 发明公开

EP2330428A1 Test fixture for printed circuit board 审中-公开
标题翻译： PrüfvorrichtungfürLeiterplatte
公开(公告)号：EP2330428A1
公开(公告)日：2011-06-08
申请号：EP09172726.3
申请日：2009-10-09
申请人： RESEARCH IN MOTION LIMITED
发明人： Jiang, Hongjun
IPC分类号： G01R1/073 , G01R31/28
CPC分类号： G01R31/2808
摘要： There is provided a printed circuit board ("PCB") test fixture comprising a support (20), an electrical tester, and a pusher (40). The support is for supporting a PCB (100) being tested in a PCB test position, The electrical tester is positioned with respect to the PCB test position such that, when a PCB is supported by the support in the PCB test position. the electrical tester is disposed in electrical contact with a circuit on the PCB supported by the support in the PCB test position during PCB testing. The pusher is configured for releasable coupling to a plurality of pusher members (50), such that each one of the plurality of pusher members is configured to co-operate with the pusher so as to become releasably coupled to and uncoupled from the pusher independently of the releasable coupling and uncoupling of at least another one of the plurality of pusher members, and such that an operative plurality of pusher members is provided when each one of the plurality of pusher members is releasably coupled to the pusher, wherein the operative plurality of pusher members is configured for translating, to a PCB which is supported by the PCB support and is disposed in the PCB test position, a force being applied by the pusher so as to effect pressing of a circuit of the PCB against the electrical tester when the PCB is supported on the PCB support and disposed in the PCB test position.
摘要翻译：提供了包括支撑件（20），电测试器和推动器（40）的印刷电路板（“PCB”）测试夹具。支持用于支持在PCB测试位置进行测试的PCB（100）。电气测试仪相对于PCB测试位置定位，使得PCB在PCB测试位置被支撑件支撑时。在PCB测试期间，电气测试仪与PCB上支撑的PCB上的电路电连接在PCB测试位置。推动器构造成用于可释放地联接到多个推动器构件（50），使得多个推动器构件中的每一个构造成与推动器协作，以便可独立于推动器而与推动器可释放地联接和离开推动器所述多个推动器构件中的至少另一个推动器构件的可释放的联接和分离，并且使得当所述多个推动器构件中的每一个可释放地联接到所述推动器时，提供可操作的多个推动器构件，其中所述操作的多个推动器构件被配置为将由PCB支撑件支撑并且被布置在PCB测试位置中的PCB转换成由推动器施加的力，以便当PCB处于PCB的电路时对着电测试器施加压力支撑在PCB支架上并放置在PCB测试位置。

9. 发明授权

EP2193382B1 PLUNGER MIT SCHNELLVERRIEGELUNGSSYSTEM 有权
标题翻译：可快装系统柱塞
公开(公告)号：EP2193382B1
公开(公告)日：2011-03-23
申请号：EP09734358.6
申请日：2009-04-09
申请人： Multitest elektronische Systeme GmbH
发明人： MURNAUER, Simon
IPC分类号： G01R31/28
CPC分类号： G01R31/2893 , G01R31/2808 , G01R31/2867 , Y10T29/4913 , Y10T29/53174 , Y10T29/53178
摘要： The invention relates to a plunger that is used to feed and withdraw an electronic component, in particular integrated circuits, to and/or from a contact device that is connected to a test device. The plunger head (23) can be secured to a base body (7) by means of a quick locking system. Said quick locking system comprises locking means (31, 33) that are designed such that they can be placed in a rear-engagement position when the plunger head is rotated (23) in relation to the base body (7), a position in which the plunger head (23) is axially coupled to the base body (7).

10. 发明公开

EP2238461A1 MODUL FÜR EINEN PARALLELTESTER ZUM PRÜFEN VON LEITERPLATTEN 有权
标题翻译：模块用于并行测试仪，电路板检测
公开(公告)号：EP2238461A1
公开(公告)日：2010-10-13
申请号：EP09704390.5
申请日：2009-01-19
申请人： ATG Luther & Maelzer Gmbh
发明人： DEHMEL, Rüdiger , GÜLZOW, Andreas , HOLZBRECHER, Michael , BRUCHWALD, Edward
IPC分类号： G01R1/073 , G01R31/28
CPC分类号： G01R31/2808 , G01R1/07378
摘要： The invention relates to a module (1) for a parallel tester for the testing of circuit boards and a parallel tester that comprises such modules. The module comprises circuit boards (3) standing perpendicular to the plane of the base grid of the parallel tester, with contact pins (9) arranged along one side edge (4) of said circuit boards. The peripheral surfaces of the contact pins (9) lie against flat sides (5) of the circuit boards (3) and extend a bit beyond the circuit board (3) at the side edge (4). The contact pins are electrically and mechanically connected to contact fields (6) configured on the circuit board. This arrangement of contact pins (9) can be manufactured cost-effectively, is mechanically stable, and allows the manufacture of modules with a high density of contact pins (9).

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