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1. 发明公开

EP4280232A3 RESISTOR WITH TEMPERATURE COEFFICIENT OF RESISTANCE (TCR) COMPENSATION 审中-实审转让
公开(公告)号：EP4280232A3
公开(公告)日：2024-06-05
申请号：EP23201364.9
申请日：2010-09-02
申请人： Vishay Dale Electronics, LLC
发明人： BERTSCH, Thomas L. , WYATT, Todd L. , VEIK, Thomas L. , SMITH, Clark L.
IPC分类号： H01C7/06 , H01C17/232 , H01C1/148 , G01R1/20 , G01R19/00 , G01R19/32 , H01C1/00 , H01C17/28
CPC分类号： H01C1/148 , H01C17/232 , H01C7/06 , Y10T29/49101 , Y10T29/49082
摘要： A current sense resistor and a method of manufacturing a current sensing resistor with temperature coefficient of resistance (TCR) compensation is disclosed. The resistor has a resistive strip disposed between two conductive strips. A pair of main terminals and a pair of voltage sense terminals are formed in the conductive strips. A pair of rough TCR calibration slots are located between the main terminals and the voltage sense terminals, each of the rough TCR calibration slots have a depth selected to obtain a negative starting TCR value observed at the voltage sense terminals. A fine TCR calibration slot is formed between the pair of voltage sense terminals. The fine TCR calibration slot has a depth selected to obtain a TCR value observed at the voltage sense terminals that approaches zero. The resistance calibration slot has a depth selected to calibrate a resistance value of the resistor.

2. 发明公开

EP4375687A1 APPARATUS FOR INSPECTING INSULATION OF CYLINDRICAL BATTERY 审中-公开
公开(公告)号：EP4375687A1
公开(公告)日：2024-05-29
申请号：EP23181952.5
申请日：2023-06-28
申请人： Sejong Technology Co.,Ltd
发明人： KIM, Deok Ho , SEO, Kyung Yong , KIM, Jin Saeng
IPC分类号： G01R31/385 , G01R31/52 , G01R1/067 , G01R31/389
CPC分类号： G01R31/385 , G01R31/36 , G01R31/52 , G01R1/04 , G01R1/067 , G01R31/389
摘要： According to one embodiment of the present invention, an apparatus for inspecting insulation of a cylindrical battery includes: a main frame forming an exterior; a lift module provided on the main frame, and on which the cylindrical battery having an outer circumferential surface attached with an insulating tape is seated; a probe module provided on the main frame, and making contact with a top surface of the cylindrical battery to apply a current to the cylindrical battery; and an outer circumferential surface module provided on the main frame, making contact with the outer circumferential surface of the cylindrical battery, and configured to detect a current conducted through the outer circumferential surface of the cylindrical battery when the probe module applies the current to the cylindrical battery.

3. 发明授权

EP3891516B1 TOOL AND ASSEMBLY FOR CARRYING OUT TESTS ON ELECTRICAL AND/OR ELECTRONIC CIRCUITS 有权
公开(公告)号：EP3891516B1
公开(公告)日：2024-05-29
申请号：EP19786394.7
申请日：2019-09-11
IPC分类号： G01R1/073
CPC分类号： G01R1/073 , G01R1/07314

4. 发明公开

EP4372389A1 TEST DEVICE 失效
公开(公告)号：EP4372389A1
公开(公告)日：2024-05-22
申请号：EP23734891.7
申请日：2023-03-09
申请人： Contemporary Amperex Technology Co., Limited
发明人： RUAN, Keyu , REN, Shaoteng , GUO, Lixin , ZHENG, Hongyu , YANG, Fan
IPC分类号： G01R1/04 , G01R31/385 , A62C3/16 , E06B5/16
CPC分类号： Y02E60/10
摘要： Embodiments of this application provide a testing apparatus, configured to test a battery and including a test body and a first door body. The test body includes an accommodating cavity for accommodating the battery, and an opening. The opening communicates with the accommodating cavity, and the first door body is connected to the opening and capable of moving relative to the opening. The first door body has a first state and a second state; in the first state, the first door body blocks a part of the opening; and in the second state, the first door body seals the opening. The first door body is disposed, so that a partial region of the opening can be blocked, thereby effectively improving structural strength of the testing apparatus and further improving safety of the testing apparatus during use.

5. 发明公开

EP4372388A1 A TEST SOCKET FOR AND METHOD OF TESTING ELECTRONIC COMPONENTS, IN PARTICULAR HIGH-POWER SEMICONDUCTOR COMPONENTS 审中-公开
公开(公告)号：EP4372388A1
公开(公告)日：2024-05-22
申请号：EP22208362.8
申请日：2022-11-18
申请人： Cohu GmbH
发明人： ENGELBRECHT, Stefan , PÖTZINGER, Johann , MEDERER, Christoph , WAGNER, Markus
IPC分类号： G01R1/04 , G01R1/073
CPC分类号： G01R1/0441 , G01R1/0458 , G01R1/07357
摘要： A test socket (100) for and a method of testing electronic components (190), in particular high-power semiconductor components comprise: a plurality of contact elements (110, 120, 130, 140), being adapted to contact to the electronic component; a holder block (150) for holding and arranging the plurality of contact elements, wherein each contact element of the plurality of contact elements comprises at least one conductive surface portion (112, 132); wherein the holder block comprises a plurality of electrically conductive support sections (156, 157), for supporting the conductive surface portions of the plurality of contact elements, wherein the plurality of support sections, makes electrical contact to the plurality of conductive surface portions by supporting the conductive surface portions, and wherein the holder block at least partially transmits a test signal.

6. 发明授权

EP3220154B1 FLEXIBLE RESISTIVE TIP CABLE ASSEMBLY FOR DIFFERENTIAL PROBING 有权
公开(公告)号：EP3220154B1
公开(公告)日：2024-05-08
申请号：EP17161687.3
申请日：2017-03-17
IPC分类号： G01R1/067 , G01R1/18
CPC分类号： G01R1/18 , G01R1/06772

7. 发明公开

EP4362331A1 CURRENT SENSING CIRCUIT, CORRESPONDING SYSTEM AND VEHICLE 审中-公开
公开(公告)号：EP4362331A1
公开(公告)日：2024-05-01
申请号：EP23202746.6
申请日：2023-10-10
申请人： STMicroelectronics International N.V.
发明人： BIANCHI, Simone , POLETTO, Vanni
IPC分类号： H03F3/45 , G01R1/20 , G01R19/00 , H02J7/34
CPC分类号： H02J7/342 , G01R1/203 , G01R19/0092 , H03F2200/45320130101 , H03F2200/29720130101 , H03F2200/4520130101
摘要： A circuit (200') for use, e.g., as current sense amplifier in a DC-DC converter in a hybrid vehicle comprises:
a first input node (INP) and a second input node (INM), configured to have an input voltage signal (IHSEN, ILSEN) applied therebetween,
a floating-ground input stage (IS) configured to operate between a first supply voltage (VLOW+5V) and a second non-zero supply voltage (VLOW) and to convert into a current signal the input voltage signal applied between the first input node (INP) and the second input node (INM), and
an output stage (OS) configured to receive the current signal from the floating-ground input stage (IS) and to convert the current signal back to an output voltage signal (AMPoutP, AMPoutM) referred to ground (GND).
The output voltage referred to ground is a replica of the input voltage signal applied between the first input node (INP) and the second input node (INM).

8. 发明公开

EP4361646A1 SOCKET 审中-实审
公开(公告)号：EP4361646A1
公开(公告)日：2024-05-01
申请号：EP22828228.1
申请日：2022-06-08
申请人： Yokowo Co., Ltd.
发明人： HOSOKAWA Daisuke
IPC分类号： G01R1/06 , G01R1/067 , G01R31/26 , H01R13/24 , H01R33/76
CPC分类号： G01R1/06 , H01R13/24 , G01R1/067 , H01R33/76 , G01R31/26
摘要： A socket (10) includes a probe (100) having a first tapered portion (102) and an insulating support (200) provided with a through-hole (230) having a second tapered portion (202) to receive the first tapered portion (102). A first tapered angle (α) of the first tapered portion (102) is less than a second tapered angle (β) of the second tapered portion (202).

9. 发明公开

EP4356149A1 PROBE HEAD WITH REPLACEABLE PROBE BOARD 审中-实审
公开(公告)号：EP4356149A1
公开(公告)日：2024-04-24
申请号：EP22741128.7
申请日：2022-06-06
申请人： Xallent Inc.
发明人： AMPONSAH, Kwame , OZDOGAN, Mehmet , KUMAR, Pardeep , D'SOUZA, Clive A.
IPC分类号： G01R1/067 , G01R1/073 , G01R31/28
CPC分类号： G01R1/07342 , G01R1/06744 , G01R31/2889

10. 发明公开

EP4340133A1 CONTACT ELEMENT FOR A SHUNT RESISTOR, SHUNT ASSEMBLY AND ELECTRICAL MEASUREMENT DEVICE 审中-公开
公开(公告)号：EP4340133A1
公开(公告)日：2024-03-20
申请号：EP22195251.8
申请日：2022-09-13
申请人： TE Connectivity Germany GmbH
发明人： Karabiyik, Hamdi , Mueller, Christoph , Eberle, Marcus
IPC分类号： H01R4/38 , G01R1/20 , H01R12/58 , H01R12/52
摘要： The object of the present invention is to improve the accuracy of electrical measurement devices (4) utilizing shunt resistors (8), in particular, by reducing the temperature influenceability of the measurement. The object is achieved by a contact element (1) for connecting an electrical sensor (6) to a shunt resistor (8) in an electrically conductive manner, wherein the contact element (1) comprises a first side (12) and a second side (14), the second side (14) facing away from the first side (12), wherein, on the first side (12), a terminal section (18) of the contact element (1) for connecting the contact element (1) to the electrical sensor (6) is arranged, wherein, on the second side (14), at least one contact surface (26) for abutting against a surface (28) of the shunt resistor (8) protrudes, wherein the contact element (1) comprises an attachment section (34) for fastening the contact element (1) to the shunt resistor (8), and wherein the at least one contact surface (26) is spaced apart from the attachment section (34) in a radial direction (60). Due to the at least one contact surface (26) being spaced apart from the attachment section (34), it is possible to electrically contact the shunt resistor (8) by means of the at least one contact surface (26) at a location as close as possible to temperature insensitive resistive elements (68) of the shunt resistor (8). Thereby, the influence that any other components of the shunt resistor (8) have on the resistance value of the conductive path between the contact element (1) and the resistive elements (68) of the shunt resistor (8) is eliminated or at least minimized. The object is further achieved by a shunt assembly (2) comprising the inventive contact element (1) as well as by an electrical measurement device (4) comprising the inventive shunt assembly (2).

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