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1. 发明公开

EP3376245A1 SCANNING SENSOR COMPRISING A SPIN DEFECT 审中-公开
公开(公告)号：EP3376245A1
公开(公告)日：2018-09-19
申请号：EP17161281.5
申请日：2017-03-16
申请人： ETH Zurich
发明人： DEGEN, Christian , BOSS, Jens , CHANG, Kevin , RHENSIUS, Jan
IPC分类号： G01R33/32 , G01N24/10 , G01R33/12 , G01Q60/52 , G01N21/64 , B82Y35/00
CPC分类号： G01R33/323 , G01N21/64 , G01N24/10 , G01Q20/04 , G01Q60/52 , G01Q70/14 , G01R33/1284
摘要： A sensor device comprises a carrier (10), a force feedback sensor (20), and a probe (40) containing a spin defect (46), the probe being connected to the force feedback sensor either directly or indirectly via a handle structure (30). In order to couple the spin defect to a microwave field in an efficient and robust manner, the sensor device comprises an integrated microwave antenna (50) arranged at a distance of less than 500 micrometers from the spin defect. The sensor device can be configured as a self-contained exchangeable cartridge that can easily be mounted in a sensor mount of a scanning probe microscope.

2. 发明公开

EP3254132A1 METHOD AND SYSTEM FOR MAGNETIC RESONANCE IMAGING 审中-公开
标题翻译：用于磁共振成像的方法和系统
公开(公告)号：EP3254132A1
公开(公告)日：2017-12-13
申请号：EP16746009.6
申请日：2016-02-05
申请人： The University of Melbourne
发明人： ORDIDGE, Roger John
IPC分类号： G01R33/565 , G01R33/20 , G01R33/32
CPC分类号： G01R33/4833 , G01N24/12 , G01Q60/52 , G01R33/24 , G01R33/32 , G01R33/5659
摘要： An MRI pulse sequence is disclosed. The pulse sequence involves a plurality of slice selective pulses (51,55) which each individually have a desired rotation that is less than or equal to the total desired rotation. The slice selective pulses each cause a rotation about respective axes, which may be different to each other. Optionally phase correction (re-phasing) gradients (53, 56) can also be included in the pulse sequence.

3. 发明公开

EP2380279A2 MECHANICAL OSCILLATOR WITH ELECTRONIC FEED-BACK INCLUDING NON-LINEAR CONTROL 审中-公开
标题翻译：带背光非线性控制的电子耦合机械摆
公开(公告)号：EP2380279A2
公开(公告)日：2011-10-26
申请号：EP10700890.6
申请日：2010-01-18
申请人： ISIS Innovation Limited
发明人： GREGG, John, Francis , KARENOWSKA, Alexy, Davison
IPC分类号： H03K17/95 , H03B5/12 , G01N3/38
CPC分类号： G01N3/32 , G01N2203/0008 , G01N2203/0051 , G01N2203/0688 , G01Q60/52 , H03K17/95
摘要： A mechanical oscillator arrangement includes a mechanical structure (30) having at least one transmission path through it, and at least one mode. A controller (40) is provided with an amplifier (70) and a feedback network (80, 90) which together provide a positive feedback oscillator for exciting a mode of the mechanical structure (30). The feedback network (80, 90) comprises a non linear amplitude control element (N-LACE) (90), a frequency dependent gain element with an electronic transfer function, and a phase compensator (80). The mechanical oscillator arrangement also includes an actuator (606) which excites the mechanical structure (30) based upon an output from the controller (40), and a sensor (60a) which senses vibrations in the mechanical structure (30) and then outputs a signal to the controller (40) based upon the sensed vibrations. Such a stabilized positive feedback arrangement is self exciting at the effective resonance frequency of the mechanical structure and avoids the need for an external fixed or variable frequency driver.

4. 发明授权

EP0862046B1 Scanning probe microscope 失效
标题翻译： Rastersondemikroskop
公开(公告)号：EP0862046B1
公开(公告)日：2004-04-28
申请号：EP98301473.9
申请日：1998-02-27
申请人： Jeol Ltd.
发明人： Kitamura, Shinichi , Sueyoshi, Takashi
IPC分类号： G01B7/34 , G01R33/038
CPC分类号： G01Q60/08 , G01B7/00 , G01Q60/32 , G01Q60/52 , G01R33/0385 , Y10S977/865

5. 发明公开

EP1540378A4 NANOTUBE CANTILEVER PROBES FOR NANOSCALE MAGNETIC MICROSCOPY 审中-公开
标题翻译：纳米管，KRAGTRÄGERSONDEN磁铁观察纳米尺度
公开(公告)号：EP1540378A4
公开(公告)日：2008-09-10
申请号：EP03799825
申请日：2003-09-18
申请人： TRUSTEES OF BOSTON COLLEGE LOW
发明人： NAUGHTON MICHAEL J
IPC分类号： G01Q60/50 , G01Q60/52 , G01Q70/12 , G01R33/038 , G01V3/00
CPC分类号： G01Q60/52 , G01Q70/12 , G01R33/0385
摘要： The present invention provides an MFM or MRFM analytical device comprising a micro-dimensional probe that is capable of detecting single proton and single electron spin. Furthermore, it provides an MFM or MRFM device comprising a micro-dimensional probe, that is capable of detecting magnetic structures of size of order one nanometer. In particular, the present invention provides a micro-dimensional probe for an MFM or MRFM device that comprises a CNT cantilever (1) that comprises a nanoscale ferromagnetic material (2). The CNT cantilever (1) can be attached to an electrode (3) as a component of a microscopic probe which is coupled with an electrical circuit as a component of a device for nanoscale MFM or MRFM micro-dimensional probes. The device comprising the probe and electrical circuit can be incorporated into an existing scanning probe microscope (SPM) apparatus having accommodation for electrical readout.

6. 发明公开

EP1830172A2 Magnetic resonance force microscope 审中-公开
标题翻译： Magnetresonanzmikroskop
公开(公告)号：EP1830172A2
公开(公告)日：2007-09-05
申请号：EP07250815.3
申请日：2007-02-27
申请人： JEOL Ltd. , Kyoto University , Yokohama City University
发明人： Tsuji, Shigenori , Yoshinari, Yohsuke , Shirakawa, Masahiro c/o Kyoto University , Kokubo, Tetsuro c/o Yokohama City University
IPC分类号： G01N13/22 , G12B21/10
CPC分类号： G01Q60/08 , G01Q60/52
摘要： A magnetic resonance force microscope (MRFM) permitting deeper understanding of an MRI image. The microscope has an RF magnetic field generator (31) for producing an RF magnetic field uniformly over the whole of a sample (21). A cantilever self-excitation loop portion self-excites the cantilever (23). Spins in the sample are thus controlled to produce a magnetic resonance force. A frequency demodulator (26) measures the resonant frequency of the cantilever from the output detection signal from a cantilever displacement-measuring instrument (29) based on the magnetic resonance force. The shift of the resonant frequencyof the cantilever is measured. A scanner (22) is controlled to keep constant the DC component of the amount of shift in the cantilever resonant frequency. The distance from the sample surface to the probe tip (24a) is adjusted. A controlled signal of a scanner driver power supply (25) creates an AFM image of the sample. A phase detector (34) creates an MRFM image according to the AC component of the amount of shift in the cantilever resonant frequency in the frequency demodulator.
摘要翻译：磁共振力显微镜（MRFM）允许更深入地了解MRI图像。显微镜具有用于在整个样品（21）上均匀地产生RF磁场的RF磁场发生器（31）。悬臂自激环部分自激励悬臂（23）。因此控制样品中的自旋以产生磁共振力。频率解调器（26）基于磁共振力从悬臂位移测量仪（29）的输出检测信号测量悬臂的谐振频率。测量悬臂共振频率的偏移。控制扫描器（22）以使悬臂共振频率中的偏移量的直流分量保持恒定。从样品表面到探针尖端（24a）的距离被调节。扫描仪驱动器电源（25）的受控信号产生样品的AFM图像。相位检测器（34）根据频率解调器中的悬臂谐振频率的偏移量的交流分量来产生MRFM图像。

7. 发明公开

EP0726444A1 Magnetic resonance method and apparatus for detecting an atomic structure of a sample along a surface thereof 失效
标题翻译：用于感测所述Atomarstruktur沿着表面的样品磁共振的方法和装置
公开(公告)号：EP0726444A1
公开(公告)日：1996-08-14
申请号：EP95101802.7
申请日：1995-02-10
申请人： Bruker Analytische Messtechnik GmbH
发明人： Holczer, Karoly , Schmalbein, Dieter , Hoefer, Peter
IPC分类号： G01B7/00 , G01B7/34 , G01N24/08 , G01N24/10 , G01R33/60
CPC分类号： G01Q60/08 , G01Q60/52 , G01R33/5604 , G01R33/60 , Y10S977/838 , Y10S977/84 , Y10S977/863 , Y10S977/865 , Y10S977/88 , Y10S977/96
摘要： A method and an apparatus are disclosed for detecting an atomic structure of a sample (16) along a surface thereof. The method comprises arranging the sample (16) in a constant magnetic field (B 0 ) of predetermined field strength and high homogeneity and irradiating a high-frequency magnetic field (B 1 ) of a predetermined frequency on the sample (16), wherein the fields (B 0 ) and (B 1 ) are oriented perpendicularly to each other. The method further comprises providing a force-sensitive sensor (24) having a paramagnetic tip (26) comprising a paramagnetic material. The sensor (24) is placed in close vicinity to the sample (16) such that the paramagnetic tip (26) is in atomic interaction with the sample surface which means that the distance between the tip (26) and the surface is in the order of between 1 and 10 Å. The predetermined field strength and the predetermined frequency are set such that electron paramagnetic resonance (EPR) is excited within the tip paramagnetic material. The paramagnetic tip (26) is then displaced parallel to the sample surface for mapping predetermined points (x, y) on the sample surface. During displacing the tip (26) the force exerted on the tip (26) by a local inhomogeneous magnetic field (B loc ) caused by atomic magnetic moments (m e,k ) of the sample (16) is measured.
摘要翻译：的方法和装置是在为游离缺失沿其表面的样品（16）的原子结构的检测盘。该方法包括布置在预定的场强度和高均匀性的恒定磁场（B 0）的样品（16）和在样品（16）照射的预定频率的高频磁场（B1），worin字段（ B0）和（B1）被定向垂直于海誓山盟。该方法还包括提供力敏感的传感器（24），其具有顺磁性尖端（26），包括顺磁材料。所述传感器（24）在靠近附近被放置到（16）检测并顺磁性尖端（26）与所述样品表面bedeutet原子的相互作用，DASS尖端（26）和所述表面之间的距离中，样品是在顺序在1和10之间的。预定场强度和频率被设定预定搜索做电子顺磁共振（EPR）是尖端顺磁材料内激发。顺磁性尖端（26）随后被用于平行样品表面上的映射的预定点（X，Y）移位到样品表面。期间移动所述尖端（26）的力施加在所述尖端（26）通过由样品的原子磁矩（我，K）引起的局部非均匀磁场（阵营）（16）被测量。

8. 发明公开

EP4413382A1 METROLOGY DEVICE AND METHOD 审中-实审
公开(公告)号：EP4413382A1
公开(公告)日：2024-08-14
申请号：EP22789336.9
申请日：2022-10-07
申请人： Nederlandse Organisatie voor toegepast-natuurwetenschappelijk Onderzoek TNO
发明人： MOHTASHAMI, Abbas , OSORIO TAMAYO, Clara Inés , HATAKEYAMA, Kodai
IPC分类号： G01Q60/52 , G01N24/10 , G01Q60/54 , G01Q70/14 , G01R33/12 , G01R33/60
CPC分类号： G01Q70/14 , G01Q60/52 , G01Q60/54 , G01R33/1284 , G01R33/26 , G01R33/032 , G01R33/12 , G01R33/0029

9. 发明公开

EP2783231A1 AFM-COUPLED MICROSCALE RADIOFREQUENCY PROBE FOR MAGNETIC RESONANCE IMAGING AND SPECTROSCOPY 审中-公开
标题翻译： AFM耦合微型高频探头磁共振成像和光谱
公开(公告)号：EP2783231A1
公开(公告)日：2014-10-01
申请号：EP12840458.9
申请日：2012-10-10
申请人： Purdue Research Foundation
发明人： NEU, Corey, P. , ZIAIE, Babak , MALEKI-JAFARABADI, Teimour , MOUSOULIS, Charilaos
IPC分类号： G01R33/46
CPC分类号： G01R33/4808 , G01N24/08 , G01Q20/04 , G01Q30/02 , G01Q60/08 , G01Q60/52 , G01Q70/16 , G01R33/341 , G01R33/46
摘要： The present disclosure is discloses the development of a new device, system, and method that combines advantages of magnetic resonance and atomic force microscopy technologies, and the utility of the new device, system, and method for a wide range of biomedical and clinical researchers. According to one aspect of the present disclosure, a device for micro-scale spectroscopy is disclosed. The micro-scale spectroscopy device includes a beam having a distal end, a proximal end, a top surface and a bottom surface, where the beam is attached to an anchor at the proximal end and further includes a tip extending substantially perpendicular from the bottom surface at or near the distal end, and a coil having at least one turn mounted to the top surface of the beam at or near the distal end opposite the tip, where the coil is capable of both transmitting and sensing electromagnetic radiation.

10. 发明公开

EP1540378A2 NANOTUBE CANTILEVER PROBES FOR NANOSCALE MAGNETIC MICROSCOPY 审中-公开
标题翻译：纳米管，KRAGTRÄGERSONDEN磁铁观察纳米尺度
公开(公告)号：EP1540378A2
公开(公告)日：2005-06-15
申请号：EP03799825.9
申请日：2003-09-18
申请人： The Trustees of Boston College,Lower Campus Office Building,Room 559
发明人： NAUGHTON, Michael, J.
IPC分类号： G01V3/00
CPC分类号： G01Q60/52 , G01Q70/12 , G01R33/0385
摘要： The present invention provides an MFM or MRFM analytical device comprising a micro-dimensional probe that is capable of detecting single proton and single electron spin. Furthermore, it provides an MFM or MRFM device comprising a micro-dimensional probe, that is capable of detecting magnetic structures of size of order one nanometer. In particular, the present invention provides a micro-dimensional probe for an MFM or MRFM device that comprises a CNT cantilever (1) that comprises a nanoscale ferromagnetic material (2). The CNT cantilever (1) can be attached to an electrode (3) as a component of a microscopic probe which is coupled with an electrical circuit as a component of a device for nanoscale MFM or MRFM micro-dimensional probes. The device comprising the probe and electrical circuit can be incorporated into an existing scanning probe microscope (SPM) apparatus having accommodation for electrical readout.

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