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1. 发明公开

EP2488918A1 MARKING PAPER PRODUCTS 失效转让
标题翻译：纸制品打标
公开(公告)号：EP2488918A1
公开(公告)日：2012-08-22
申请号：EP10823969.0
申请日：2010-10-12
申请人： Xyleco, Inc.
发明人： MEDOFF, Marshall
IPC分类号： G03C1/00 , G03C5/00
CPC分类号： G06K5/02 , B32B29/002 , B32B2262/0276 , B32B2554/00 , C08B15/00 , C08J7/123 , C12M45/00 , C12M45/06 , C12P19/00 , D21H21/48 , D21H25/04 , G01N33/346 , G01N2223/1013 , G01N2223/102 , G03C11/02 , G06K5/00 , G21K5/00 , H01J3/02 , H01J3/04
摘要： Methods of marking paper products and marked paper products are provided. Some methods include irradiating the paper product to alter the functionalization of the paper.

2. 发明公开

EP2402976A1 Method of electron diffraction tomography 审中-公开
$Method of electron diffraction tomography$
标题翻译：电子衍射断层摄影术的方法
公开(公告)号：EP2402976A1
公开(公告)日：2012-01-04
申请号：EP10167891.0
申请日：2010-06-30
申请人： FEI COMPANY
发明人： He, Haifeng , Voigt, Andreas
IPC分类号： H01J37/02 , H01J37/252 , H01J37/26 , H01J37/295 , G01N23/04 , G06K9/00 , G01N23/20
CPC分类号： H01J37/295 , G01N23/20058 , G01N2223/102 , G01N2223/309 , G01N2223/32 , G01N2223/3306 , G01N2223/418 , G01N2223/419 , G01N2223/612 , H01J37/265 , H01J2237/20207 , H01J2237/26 , H01J2237/2611
摘要： The invention describes a method for electron diffraction tomography in a Transmission Electron Microscope. Known methods involve using Scanning Transmission Electron Microscope, and use the scanned beam for STEM diffraction. The invention proposes to form the diffraction patterns with a stationary beam (200) with a diameter slightly larger than the crystal (202), as a result of which a TEM without STEM unit can be used. Finding the crystal (202) is done in TEM mode. Advantages of the method according to the invention are: a TEM without scanning unit can be used, and the diffraction volume is not depending on the orientation of the crystal (202), as the whole crystal (202) is illuminated while obtaining the diffraction pattern.
摘要翻译：本发明描述了一种用于透射电子显微镜中的电子衍射层析成像的方法。已知的方法涉及使用扫描透射电子显微镜，并使用扫描束进行STEM衍射。本发明提出用直径稍大于晶体（202）的固定梁（200）形成衍射图案，由此可以使用不含STEM单元的TEM。寻找晶体（202）在TEM模式下完成。根据本发明的方法的优点是：可以使用没有扫描单元的TEM，并且衍射体积不取决于晶体（202）的取向，因为在获得衍射图案的同时照亮整个晶体（202）。

3. 发明公开

EP0512620A2 X-ray analysis apparatus 失效
标题翻译： Röntgenanalyseapparat。
公开(公告)号：EP0512620A2
公开(公告)日：1992-11-11
申请号：EP92201211.7
申请日：1992-05-04
申请人： Philips Electronics N.V.
发明人： Timmers, Jacob , Delhez, Robbert , Tuinstra, Fokke
IPC分类号： G01N23/207 , G01J3/02 , G21K1/04
CPC分类号： G01N23/20008 , G01J3/02 , G01J3/0237 , G01J3/0289 , G01N23/207 , G01N2223/056 , G01N2223/1016 , G01N2223/102 , G01N2223/305 , G01N2223/306 , G01N2223/316
摘要： An X-ray analysis apparatus comprises a central control device which includes means for recording simulated beam paths in the apparatus, thus enabling correction for the effects of radiation-optical deviations as well as of other deviations in the apparatus or a specimen on detection signals. Such a correction facility allows for construction of an apparatus having a large number of freedoms and hence a universal application.
摘要翻译： X射线分析装置包括中央控制装置，其包括用于在装置中记录模拟光束路径的装置，从而能够校正放射 - 光学偏差的影响以及装置或样本中检测信号上的其它偏差。这种校正装置允许构造具有大量自由度的装置，因此可以通用。

4. 发明公开

EP2511937A4 ELECTRON MICROSCOPE 有权
标题翻译：电子显微镜
公开(公告)号：EP2511937A4
公开(公告)日：2015-03-04
申请号：EP10835635
申请日：2010-10-25
申请人： HITACHI HIGH TECH CORP
发明人： KAJI KAZUTOSHI
IPC分类号： H01J37/244 , G01N23/04 , G01N23/225 , H01J37/22 , H01J37/24 , H01J37/26 , H01J37/28
CPC分类号： H01J37/244 , G01N23/04 , G01N2223/102 , G01N2223/3037 , H01J37/26 , H01J2237/24415 , H01J2237/24485 , H01J2237/24495 , H01J2237/28
摘要： An object of the present invention relates to measurement of a quantitative element image with a high S/N ratio and measurement of an electron energy loss spectrum with high energy precision and energy resolution. The present invention relates to measurement of a characteristic X-ray spectrum obtained by correcting dead time due to excessive X rays and measurement of an electron energy loss spectrum obtained by correcting energy based on a zero loss peak in the case where the characteristic X-ray spectrum and the electron energy loss spectrum are measured by irradiating one irradiation position on a sample with an electron beam for a predetermined time while scanning the surface of the sample to observe a Z-contrast image. According to the present invention, it becomes possible to measure a quantitative element image with a high S/N ratio by a characteristic X ray, an element image with a high S/N ratio by an electron energy loss spectrum and a high energy resolution spectrum.

5. 发明公开

EP2402977A1 Method of electron diffraction tomography 审中-公开
$Method of electron diffraction tomography$
标题翻译：电子衍射断层摄影术的方法
公开(公告)号：EP2402977A1
公开(公告)日：2012-01-04
申请号：EP11171821.9
申请日：2011-06-29
申请人： FEI COMPANY
发明人： Voigt, Andreas , He, Haifeng
IPC分类号： H01J37/02 , H01J37/252 , H01J37/26 , H01J37/295 , G01N23/04 , G06K9/00 , G01N23/20
CPC分类号： H01J37/295 , G01N23/20058 , G01N2223/102 , G01N2223/309 , G01N2223/32 , G01N2223/3306 , G01N2223/418 , G01N2223/419 , G01N2223/612 , H01J37/265 , H01J2237/20207 , H01J2237/26 , H01J2237/2611
摘要： The invention describes a method for electron diffraction tomography in a Transmission Electron Microscope. Known methods involve using Scanning Transmission Electron Microscope, and use the scanned beam for STEM diffraction. The invention proposes to form the diffraction patterns with a stationary beam (200) with a diameter slightly larger than the crystal, as a result of which a TEM without STEM unit can be used. Finding the crystal is done in TEM mode. Advantages of the method according to the invention are: a TEM without scanning unit can be used, and the diffraction volume is not depending on the orientation of the crystal, as the whole crystal is illuminated while obtaining the diffraction pattern.
摘要翻译：本发明描述了一种用于透射电子显微镜中的电子衍射层析成像的方法。已知的方法涉及使用扫描透射电子显微镜，并使用扫描束进行STEM衍射。本发明提出用直径稍大于晶体的固定梁（200）形成衍射图案，由此可以使用不含STEM单元的TEM。寻找晶体是在TEM模式下完成的。根据本发明的方法的优点是：可以使用没有扫描单元的TEM，并且衍射体积不依赖于晶体的取向，因为在获得衍射图案的同时照亮整个晶体。

6. 发明公开

EP0150384A3 Thermal wave imaging 失效
标题翻译：热波成像
公开(公告)号：EP0150384A3
公开(公告)日：1988-01-27
申请号：EP84115241
申请日：1984-12-14
申请人： International Business Machines Corporation
发明人： Baumann, Thomas , Dacol, Frank Hubert , Melcher, Robert Lee
IPC分类号： G01N25/00 , G01N21/17 , G01N23/225 , G01J05/08
CPC分类号： G01N25/72 , G01N23/22 , G01N2223/07 , G01N2223/073 , G01N2223/102 , G01N2223/306 , G01N2223/3302 , G01N2223/348 , G01N2223/40 , G01N2223/401 , G01N2223/418 , G01N2223/427 , G01N2223/509 , G01N2223/629 , G01N2223/651
摘要： An electron energy beam (28) discontinuously scans a sample (32) and at each scan position produces a thermal wave in the sample, there being infrared radiation emitted from the thermal wave. All of the infrared radiation emitted from the heated areas of the sample is collected by an ellipsoidal collector (34) and directed by reflection to an infrared detector (44), the sample and detector being at the foci of the collector (34), to give a two-dimensional image of the sample. A computer system (52) is used to control data acquisition, storage, processing and image display, and also modulation and scanning of the beam (28). Surface, on the surface, and sub-surface structure of the sample can be detected, for example to reveal defects, or surface particles.

7. 发明公开

EP0053620A1 METHOD AND APPARATUS FOR MATERIAL ANALYSIS 失效
标题翻译：方法和设备材料分析。
公开(公告)号：EP0053620A1
公开(公告)日：1982-06-16
申请号：EP81901515.0
申请日：1981-06-10
申请人： COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
发明人： REID, Alan Forrest , ZUIDERWIJK, Martin Anthony Mario
IPC分类号： G01N23 , H01J37
CPC分类号： H01J37/244 , G01N23/22 , G01N23/2252 , G01N2223/053 , G01N2223/071 , G01N2223/079 , G01N2223/102 , G01N2223/402 , G01N2223/418 , G01N2223/605 , G01N2223/606 , H01J37/256 , H01J37/28 , H01J2237/2445 , H01J2237/24495
摘要： Procede et appareil d'analyse de materiaux ou des rayons X engendres par l'incidence de rayons cathodiques sur le materiau sont detectes par un detecteur (24) qui produit des signaux representant l'intensite des rayons X. Un premier analyseur a simple canal (FCA-1) est connecte pour recevoir les signaux provenant du detecteur (24) et pour envoyer a un premier compteur associe (CTR-1) un signal de comptage a chaque fois que le signal applique sur le premier analyseur a simple canal represente une energie des rayons X se situant dans une plage relativement etroite de telles energies. Un second analyseur a simple canal (BG-1) est aussi connecte pour recevoir les signaux provenant du detecteur (24) et pour faire passer a un second compteur associe (B-1) un signal de comptage a chaque fois que le signal applique au second analyseur (BG-1) represente une energie de rayons X se situant dans une plage beaucoup plus large de telles energies que la plage mentionnee en premier. Le premier et le second compteurs (CTR-1 et B-1) accumulent les signaux de comptage qui leur sont appliques. Le comptage dans le second compteur (B-1) est compare par un comparateur (C-1) a un comptage preetabli dans un troisieme compteur (A-1), et lorsque le comptage du second compteur (B-1) a la meme valeur que le comptage du troisieme compteur (A-1) les comptages dans le premier et dans le second compteurs (CTR-1 et B-1) sont maintenus. Le comptage ainsi conserve du premier compteur (CTR-1) represente alors lui-meme un rapport normalise de l'energie des rayons X dans la plage etroite par rapport a l'energie des rayons X pour le spectre d'energie represente par la grande plage d'energies. De ce rapport normalise on peut en deduire des informations quant a la composition du materiau.

8. 发明授权

EP2511937B1 ELECTRON MICROSCOPE 有权
公开(公告)号：EP2511937B1
公开(公告)日：2018-04-11
申请号：EP10835635.3
申请日：2010-10-25
申请人： Hitachi High-Technologies Corporation
发明人： KAJI, Kazutoshi
IPC分类号： H01J37/244 , G01N23/225 , H01J37/22 , H01J37/24 , H01J37/28 , G01N23/04 , H01J37/26
CPC分类号： H01J37/244 , G01N23/04 , G01N2223/102 , G01N2223/3037 , H01J37/26 , H01J2237/24415 , H01J2237/24485 , H01J2237/24495 , H01J2237/28
摘要： An object of the present invention relates to measurement of a quantitative element image with a high S/N ratio and measurement of an electron energy loss spectrum with high energy precision and energy resolution. The present invention relates to measurement of a characteristic X-ray spectrum obtained by correcting dead time due to excessive X rays and measurement of an electron energy loss spectrum obtained by correcting energy based on a zero loss peak in the case where the characteristic X-ray spectrum and the electron energy loss spectrum are measured by irradiating one irradiation position on a sample with an electron beam for a predetermined time while scanning the surface of the sample to observe a Z-contrast image. According to the present invention, it becomes possible to measure a quantitative element image with a high S/N ratio by a characteristic X ray, an element image with a high S/N ratio by an electron energy loss spectrum and a high energy resolution spectrum.

9. 发明公开

EP2511937A1 ELECTRON MICROSCOPE 有权
标题翻译： ELEKTRONENMIKROSKOP
公开(公告)号：EP2511937A1
公开(公告)日：2012-10-17
申请号：EP10835635.3
申请日：2010-10-25
申请人： Hitachi High-Technologies Corporation
发明人： KAJI, Kazutoshi
IPC分类号： H01J37/244 , G01N23/225 , H01J37/22 , H01J37/24 , H01J37/28
CPC分类号： H01J37/244 , G01N23/04 , G01N2223/102 , G01N2223/3037 , H01J37/26 , H01J2237/24415 , H01J2237/24485 , H01J2237/24495 , H01J2237/28
摘要： An object of the present invention relates to measurement of a quantitative element image with a high S/N ratio and measurement of an electron energy loss spectrum with high energy precision and energy resolution. The present invention relates to measurement of a characteristic X-ray spectrum obtained by correcting dead time due to excessive X rays and measurement of an electron energy loss spectrum obtained by correcting energy based on a zero loss peak in the case where the characteristic X-ray spectrum and the electron energy loss spectrum are measured by irradiating one irradiation position on a sample with an electron beam for a predetermined time while scanning the surface of the sample to observe a Z-contrast image. According to the present invention, it becomes possible to measure a quantitative element image with a high S/N ratio by a characteristic X ray, an element image with a high S/N ratio by an electron energy loss spectrum and a high energy resolution spectrum.
摘要翻译：本发明的目的是测量具有高S / N比的定量元素图像，并以高能量精度和能量分辨率测量电子能量损失谱。本发明涉及通过校正由于过量的X射线引起的死区时间而获得的特征X射线光谱的测量，以及在特征X射线的情况下基于零损耗峰值校正能量而获得的电子能量损失谱的测量光谱和电子能量损失谱是通过在扫描样品的表面以观察Z对比度图像的同时用电子束照射一个照射位置一定时间来测量的。根据本发明，可以通过特征X射线，通过电子能量损失谱和高能量分辨光谱具有高S / N比的元素图像来测量具有高S / N比的定量元素图像。

10. 发明公开

EP0569215A3 Clinical chemistry analyser 失效
标题翻译：临床化学分析仪。
公开(公告)号：EP0569215A3
公开(公告)日：1995-05-24
申请号：EP93303456.3
申请日：1993-05-04
申请人： WALLAC OY
发明人： Ostrup, Jan , Korpi, Jarmo
IPC分类号： G01N35/02
CPC分类号： G01N35/028 , G01N21/6408 , G01N2035/00524 , G01N2035/00752 , G01N2035/0463 , G01N2223/1013 , G01N2223/102
摘要： A clinical chemistry analyses (10) comprises a sample dispensing unit (20) with sample vials (23), pipettes (17,21,41), washing unit (13) reagent cassette (24), shakes-incubator (30), bar code reades (40), and measuring unit (50). Under control of the computer (70), samples are transferred to the microtitration plate (11), reagents (19,45) are added and the plate (11) conveyed to the shaker/incubator (30) by means of the conveyor (12) and elevator (31). After incubation the sample plate (11) is then transferred to the measuring unit (50). Because the measuring unit (50) contains several measuring heads e.g. flaorimeter (52), photometer (53), luminometer (54), Beta (55) and Gamma (56) counters, several different types of assay can be performed such as fluoro-immuno and enzyme-immuno assays.

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