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1. 发明公开

EP3413038A1 PRESSED POWDER SAMPLE MEASUREMENTS USING X-RAY FLUORESCENCE 有权
公开(公告)号：EP3413038A1
公开(公告)日：2018-12-12
申请号：EP18175053.0
申请日：2018-05-30
申请人： Malvern Panalytical B.V.
发明人： VREBOS, Bruno Alfred Robert , KUIPER, Dick , BEERKENS, Saskia Maria Angela
IPC分类号： G01N23/223 , G01N33/38
CPC分类号： G01N23/223 , G01N23/207 , G01N23/2202 , G01N33/383 , G01N2223/07 , G01N2223/076 , G01N2223/312 , G01N2223/62
摘要： A method of quantitative X-ray analysis includes capturing X-ray fluorescence data from a pressed powder sample including a binder. A quantity and/or distribution of binder is assumed and the concentration of various components of the sample is calculated from the measured data and the assumed quantity of binder. Then, the concentration of binder is adjusted and the calculation step repeated until the method converges. The method is allowed to take widely different values of quantity of binder, which may be the concentration of the binder in the sample or alternatively the thickness of an assumed thin layer at the surface of a model used for calculation.

2. 发明公开

EP3368888A1 PROCEDE DE DETERMINATION PREDICTIVE DU COMPORTEMENT D'UN MELANGE REACTIF DESTINE A L'OBTENTION D'UN GEOPOLYMERE, PROCEDE D'OPTIMISATION DUDIT GEOPOLYMERE 审中-公开
公开(公告)号：EP3368888A1
公开(公告)日：2018-09-05
申请号：EP16797468.2
申请日：2016-10-27
申请人： Université de Limoges , CNRS
发明人： GHARZOUNI, Ameni , VIDAL, Laëticia , ROSSIGNOL, Sylvie , PRUD'HOMME, Elodie , AUTEF, Alexandre , JOUSSEIN, Emmanuel
IPC分类号： G01N23/207 , C04B28/00 , G01N13/00 , G01N33/24
CPC分类号： G01N33/24 , C04B12/005 , C04B28/006 , C04B40/0032 , C04B2111/00206 , G01N13/02 , G01N23/207 , G01N23/2076 , Y02P40/165 , C04B14/106 , C04B22/062
摘要： The invention relates to a method for determining the behaviour of a reactive mixture intended for obtaining a geopolymer, said reactive mixture including at least one aluminosilicate material, characterised in that it includes the following steps: determining the amorphous phase content of the at least one aluminosilicate material; determining the wettability rate of the at least one aluminosilicate material, and if the amorphous content range is higher than 45% and if the wettability rate is in a range from 300 µg/l to 1400 µg/l, then the reactive mixture formed by the reaction of the at least one aluminosilicate material with an alkaline solution is a geopolymer.

3. 发明公开

EP3365099A1 DIATOMITE PRODUCTS 有权
公开(公告)号：EP3365099A1
公开(公告)日：2018-08-29
申请号：EP16857918.3
申请日：2016-06-16
申请人： EP Minerals, LLC
发明人： LENZ, Peter E. , PALM, Scott K. , NYAMEKYE, George A. , HUMPHREYS, Bradley S. , WANG, Qun
IPC分类号： B01J6/00 , B01J20/14 , C04B14/08 , G01N23/20
CPC分类号： B01J20/14 , G01N23/207 , G01N2223/605 , G01N2223/616
摘要： A method of determining opal-C and cristobalite contents of a product that comprises diatomite is disclosed. The method may comprise performing thermal processing to determine a loss on ignition for a representative first portion of a sample of the product; identifying and quantifying primary and secondary peaks present in a first diffraction pattern that results from bulk powder X-ray Diffraction on a representative second portion of the sample; and using a known standard sample of cristobalite to determine whether the primary and secondary peaks present in the first diffraction pattern indicate the presence of opal-C or cristobalite in the product.

4. 发明授权

EP2775296B1 An X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus 有权转让
$An X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus$
标题翻译：映射晶体材料样品中的晶粒结构的X射线衍射方法和X射线衍射装置
公开(公告)号：EP2775296B1
公开(公告)日：2018-05-16
申请号：EP14157972.2
申请日：2014-03-05
申请人： Xnovo Technology ApS , Carl Zeiss X-Ray Microscopy, Inc.
发明人： Lauridsen, Erik , Poulsen, Stefan Othmar , Reischig, Péter
IPC分类号： G01N23/207
CPC分类号： G01N23/207
摘要： An X-ray diffraction method of mapping grain structures in a polycrystalline material sample (3), where an X-ray detector detects (12) spots or substantially line-shaped segments (13a-f) from beams diffracted from at least some of the grains. A processing device analyses values received from the X-ray detector (12) and identifies at least the position of spots or the line-shaped segments to generate a 3D model of the polycrystalline material. The line-shaped segments are paired as originating from diffractions from the same grain and the positions of the paired line-shaped segments are used in determining the crystallographic grain position of this grain within in the polycrystalline material sample. The length of the paired line-shaped segments is used in determining a width of this grain.

5. 发明公开

EP3147654A4 X-RAY DIFFRACTOMETER 有权
公开(公告)号：EP3147654A4
公开(公告)日：2017-12-20
申请号：EP15802969
申请日：2015-01-14
申请人： RIGAKU DENKI CO LTD
发明人： OSAKABE TAKESHI , OZAWA TETSUYA , OMOTE KAZUHIKO , JIANG LICAI , VERMAN BORIS , PLATONOV YURIY
IPC分类号： G21K1/06 , G01N23/20 , G01N23/205 , G01N23/207
CPC分类号： G01N23/20008 , G01N23/205 , G01N23/207 , G01N2223/056
摘要： Only X-rays having a specific wavelength out of focusing X-rays 2 diffracted from a sample S is reflected from a monochromator 60 based on a Bragg's condition, passed through a receiving slit 30 and detected by an X-ray detector 20. The monochromator 60 is configured to be freely removable, and arranged between the sample S and a focal point 2a at which the focusing X-rays 2 diffracted from the sample S are directly focused. At this time, the monochromator 60 is approached to the focal point 2a as closely as possible. The monochromator 60 comprises a multilayer mirror having an internal interplanar spacing which varies continuously from one end to the other end.

6. 发明公开

EP3133388A4 RESIDUAL-STRESS MEASUREMENT DEVICE AND RESIDUAL-STRESS MEASUREMENT METHOD 有权
公开(公告)号：EP3133388A4
公开(公告)日：2017-12-13
申请号：EP15841035
申请日：2015-11-30
申请人： SINTOKOGIO LTD
发明人： KOBAYASHI YUJI , MATSUI AKINORI
IPC分类号： G01N23/207
CPC分类号： G01N23/207
摘要： An apparatus includes an X-ray generating source adapted to radiate X-rays toward a measuring object; a first detecting element adapted to detect intensity of diffracted X-rays of the measuring object at a first detecting position; a second detecting element adapted to detect intensity of the diffracted X-rays of the measuring object at a second detecting position different from the first detecting position; a moving mechanism adapted to move each of the first detecting element and the second detecting element along a straight line extending in a direction orthogonal to a direction of incidence of the X-rays; a movement control unit adapted to control respective detecting positions of the first detecting element and the second detecting element by driving the moving mechanism; and a stress calculation unit adapted to calculate residual stress of the measuring object based on intensity peaks of the diffracted X-rays detected, respectively, by the first detecting element and the second detecting element each moved by the moving mechanism.

7. 发明公开

EP3098595A4 METHOD FOR DETERMINING THE COMPOSITION AND CRYOLITE RATIO OF SOLID SAMPLES OF POTASSIUM-CONTAINING ELECTROLYTE IN ALUMINIUM PRODUCTION BY XRD 有权转让
公开(公告)号：EP3098595A4
公开(公告)日：2017-11-08
申请号：EP15740819
申请日：2015-02-04
申请人： (OBSHCHESTVO S OGRANICHENNOY OTVETSTVENNOST'YU OBEDINENNAYA KOMPANIYA RUSAL INZHEN-ERNO- TEKH TSENTR
发明人： ZAYTSEVA YULIYA NIKOLAEVNA , KIRIK SERGEY DMITRIEVICH , YAKIMOV IGOR' STEPANOVICH , DUBININ PETR SERGEEVICH , PIKSINA OKSANA EVGEN'EVNA , SIMAKOV DMITRIY ALEKSANDROVICH , GUSEV ALEKSANDR OLEGOVICH , RUZHNIKOV SERGEY GRIGOR'EVICH
IPC分类号： G01N23/207
CPC分类号： G01N23/207 , G01N2223/637
摘要： The invention relates to a method for determining the composition and cryolite ratio of a potassium-containing electrolyte, and can be used in nonferrous metallurgy and, more specifically, during in-process monitoring of the composition of an electrolyte by means of quantitative phase analysis by X-ray diffraction. The method involves taking a sample of electrolyte from a bath, grinding the sample, and adding sodium fluoride to the powdered sample in a ratio of 1:2 relative to the mass of the sample. The sample is sintered a temperature 650-750°C for 20-40 minutes. After sintering, the sample is subjected to additional heat treatment at 420-450°C for 15-30 minutes until equilibrium is reached between the crystalline phases resulting from the sintering the sample with sodium fluoride: Na 3 AlF 6 , K 2 NaAlF 6 , CaF 2 , NaF. Analysis of the phase composition of the resultant sample is carried out using quantitative phase analysis by X-ray diffraction and the cryolite ratio and the concentration of fluorides in the initial sample is determined.

8. 发明授权

EP2233918B1 X-ray diffraction method and X-ray diffraction apparatus 有权
$X-ray diffraction method and X-ray diffraction apparatus$
标题翻译： X射线衍射法和X射线衍射装置
公开(公告)号：EP2233918B1
公开(公告)日：2017-08-30
申请号：EP10003230.9
申请日：2010-03-25
申请人： Rigaku Corporation
发明人： Toraya, Hideo , Konaka, Hisashi
IPC分类号： G01N23/207 , G21K1/06
CPC分类号： G01N23/207 , B82Y10/00 , G21K2201/061 , G21K2201/062

9. 发明公开

EP3185005A1 METHOD FOR COLLECTING ACCURATE X-RAY DIFFRACTION DATA WITH A SCANNING TWO-DIMENSIONAL DETECTOR 有权
标题翻译：用扫描二维探测器收集准确的X射线衍射数据的方法
公开(公告)号：EP3185005A1
公开(公告)日：2017-06-28
申请号：EP16205335.9
申请日：2016-12-20
申请人： Bruker AXS, Inc.
发明人： He, Bob Boaping , Meding, Olaf , Maurer, Christian , Ollinger, Christoph
IPC分类号： G01N23/207
CPC分类号： G01N23/207 , G01N23/20016 , G01N2223/051 , G01N2223/0566 , G01N2223/1016 , G01N2223/33 , G01N2223/401 , G06T5/001 , G06T5/50 , G06T2207/10116
摘要： An X-ray diffraction system uses a two-dimensional detector to detect diffracted X-ray energy at a plurality of radial positions surrounding a sample location, the results at each position being combined to form a final diffraction image. To minimize smearing in the final image, the detector pixel intensities at each position are reapportioned among the pixel locations prior to being combined with the intensities collected at other positions. A two-dimensional pixel array space of the detector is projected onto a cylinder to form a projected pixel array space, and a virtual cylindrical detection surface representative of an ideal cylindrical detector is determined. An overlap between the pixels of the projected pixel array space and the pixels of the virtual cylindrical detection surface is determined, and pixel intensities are reapportioned accordingly. The reapportionment may include dividing each pixel space into subpixels and redistributing the subpixels among adjacent pixels.
摘要翻译： X射线衍射系统使用二维检测器来检测围绕样品位置的多个径向位置处的衍射X射线能量，每个位置处的结果被组合以形成最终衍射图像。为了使最终图像中的污点最小化，每个位置处的检测器像素强度在与其他位置收集的强度相结合之前在像素位置之间重新分配。将检测器的二维像素阵列空间投影到圆柱体上以形成投影像素阵列空间，并且确定代表理想柱面检测器的虚拟柱面检测表面。投影像素阵列空间的像素与虚拟柱面检测表面的像素之间的重叠被确定，并且像素强度被相应地重新分配。重新分配可以包括将每个像素空间分成子像素并在相邻像素之间重新分配子像素。

10. 发明公开

EP3182104A1 SIMULTANEOUS X-RAY DIFFRACTION AND COMPUTED TOMOGRAPHY SYSTEM AND METHOD 审中-实审
标题翻译：同时进行的X射线衍射和计算机断层摄影系统和方法
公开(公告)号：EP3182104A1
公开(公告)日：2017-06-21
申请号：EP16185367.6
申请日：2016-08-23
申请人： Tsinghua University , Nuctech Company Limited
发明人： Chen, Zhiqiang , Zhang, Li , Yang Dai, Tianyi , Huang, Qingping , Sun, Yunda , Jin, Xin
IPC分类号： G01N23/20 , G01N23/04 , G01V5/00
CPC分类号： G01N23/046 , G01N23/083 , G01N23/20083 , G01N23/207 , G01N2223/056 , G01N2223/316 , G01N2223/419 , G01N2223/643 , G01V5/005 , G21K1/02
摘要： The present disclosure relates to a multi-modality detection method and system. The multi-modality detection system includes: a distributed radiation source (101) configured to irradiate an object under detection; a primary collimator (102) configured to separate rays of the distributed radiation source into two parts, wherein one part is for CT detection and the other part is for XRD detection; a CT detection device (103) configured to perform a CT detection to acquire a CT image of the object under detection; and an XRD detection device (104) configured to perform an XRD detection to acquire an XRD image of the object under detection, wherein the CT detection and the XRD detection are performed simultaneously.
摘要翻译：本公开涉及一种多模式检测方法和系统。该多模式检测系统包括：分布式辐射源（101），配置为照射被检测物体; 主要准直器（102），配置为将分布式辐射源的射线分成两部分，其中一部分用于CT检测，另一部分用于XRD检测; CT检测装置（103），被配置为执行CT检测以获取检测对象的CT图像; 以及XRD检测装置（104），被配置为执行XRD检测以获取检测对象的XRD图像，其中CT检测和XRD检测同时进行。

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