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    • 9. 发明公开
    • Method of forming a Ti and a TiN layer on a semiconductor body by a sputtering process, comprising an additional step of cleaning the target
    • 通过溅射法在半导体本体形成Ti和TiN层,与目标的纯化的附加步骤的方法。
    • EP0598422A1
    • 1994-05-25
    • EP93202840.0
    • 1993-10-06
    • Philips Electronics N.V.
    • Wolters, Robertus A.M., c/o INT. OCTROOIBUREAU BVSwart, Edwin Tijibbe, c/o INT. OCTROOIBUREAU BV
    • H01L21/3205C23C14/34C23C14/00C23C14/54H01J37/34
    • H01L21/76843C23C14/0073C23C14/022C23C14/0641C23C14/165H01L21/76841
    • A method of manufacturing semiconductor devices whereby first a Ti layer (8) and then a TiN layer (9) are deposited on slices of semiconductor material (20). The slices are placed on a support (30) one after the other in a deposition chamber (22), the support being positioned opposite a target of Ti (32) surrounded by an annular anode (31). Material is then sputtered off the target by means of a plasma (35) generated near the target. The plasma is generated in Ar during deposition of the Ti layer and in a gas mixture of Ar and N₂ during deposition of the TiN layer. After the deposition of the TiN layer, before a next slice is placed in the chamber each time, the target is cleaned during an additional process step in that material is sputtered off the target by means of a plasma generated in Ar. The additional process step is ended the moment the target has regained a clean Ti surface again. It is achieved by this that an extra Ti layer comprising nitrogen is indeed deposited on the TiN layer during this additional process step, but that this is as thin as possible and accordingly contains as little free Ti as possible. Undesirable chemical reactions between free Ti and the conductive layers deposited on the layer comprising nitrogen are suppressed as much as possible thereby.
    • 制造半导体器件,其中第一Ti层(8),然后TiN层(9)上的半导体材料(20)的切片沉积的方法。 在切片上的支撑(30),一个接一个地在沉积室(22)后放置,支承由在环形设计的阳极(31)所包围的Ti靶(32)相对地定位。 然后材料被溅射下来通过等离子体(35)的装置中的目标靶附近产生。 等离子体是在Ar中的Ti层的沉积过程中和TiN层的沉积期间Ar和N 2的气体混合物生成。 TiN层的沉积之后,下一个切片在腔室的每个时间放置之前,目标被期间在额外的工艺步骤清洗,DASS材料是通过在Ar中产生的等离子体的溅射手段关闭目标。 额外的工序结束的那一刻目标已再次恢复干净的钛表面。 它是由thisthat额外Ti层包含氮在该额外的处理步骤中的TiN层上确实沉积来实现的,但这样做是尽可能地薄,并且因此含有作为少量的自由Ti作为可能的。 自由Ti和沉积包含氮的层上的导电层之间的不希望的化学反应得到抑制尽可能从而。