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    • 2. 发明公开
    • Planar optical waveguide apparatus
    • Planare optische Wellenleitervorrichtung
    • EP1291692A1
    • 2003-03-12
    • EP02010067.3
    • 2002-05-06
    • Agilent Technologies Inc
    • Lemoff, Brian ElliotGong, WilliamTella, Richard P.Ranganath, Tirumala R.
    • G02B6/42G02B6/30G02B6/12
    • G02B6/4224G02B6/13G02B6/136G02B6/30
    • Planar optical waveguide apparatus and methods for fabricating planar optical waveguide apparatus. The apparatus has a core layer and a cladding layer, the core layer having at least one optical waveguide, and an alignment structure or marker spaced from and positioned with respect to the at least one optical waveguide to facilitate measuring a position of the at least one optical waveguide. The alignment structure has a first alignment structure, such as a reflecting member, to facilitate measuring a height of the at least one optical waveguide; and a second alignment structure, such as alignment marks, to facilitate measuring positions of the at least one optical waveguide in a plane of the at least one optical waveguide. The method includes forming both the optical waveguide and at least a portion of the alignment structure simultaneously in a single processing step, preferably by etching, to ensure that the optical waveguide and the alignment structure are in perfect registration.
    • 平面光波导装置及其制造方法。 所述装置具有芯层和包覆层,所述芯层具有至少一个光波导,以及与所述至少一个光波导隔开并相对于所述至少一个光波导定位的对准结构或标记,以便于测量所述至少一个光波导的位置 光波导。 对准结构具有第一对准结构,例如反射构件,以便于测量至少一个光波导的高度; 以及诸如对准标记的第二对准结构,以便于在至少一个光波导的平面中测量至少一个光波导的位置。 该方法包括在单个处理步骤中优选通过蚀刻同时形成光波导和对准结构的至少一部分,以确保光波导和对准结构完全配准。
    • 4. 发明公开
    • INFRARED IMAGING SYSTEM WITH AUTOMATIC REFERENCING
    • 智能手机自动化系统
    • EP3112844A1
    • 2017-01-04
    • EP16176083.0
    • 2016-06-24
    • Agilent Technologies, Inc.
    • Ghetler, AndrewKleczewski, AdamTella, Richard P.
    • G01N21/27G01J3/42G01N21/3563G01N21/47G01N21/55
    • G01J3/0297G01J3/10G01J3/108G01J3/2823G01J3/42G01N21/274G01N21/276G01N21/3563G01N21/4785G01N21/55G01N2201/101G01N2201/1042G01N2201/127
    • A method and apparatus for obtaining reference samples, i.e. measuring reference targets (62) on a reference stage (61) during the generation of a mid-infrared (MIR) image without requiring that a sample specimen (16), being placed on a specimen stage (57) and imaged, be removed is disclosed. A tunable MIR laser (11) generates a light beam (18) that is focused onto the sample specimen on the specimen stage that moves the specimen in a first direction (33). An optical assembly includes a scanning assembly (31) having a focusing lens (55) and a mirror (56) that moves in a second direction (32), different from the first direction, relative to the specimen stage. A light detector (13) measures an intensity of light leaving the point on the specimen. A controller (39) forms an image from the measured intensity. The reference stage (61) is positioned such that the scanning assembly moves over the reference stage in response to a command so that the controller can also make a reference measurement.
    • 一种用于获得参考样本的方法和装置,即在产生中红外(MIR)图像期间在参考台(61)上测量参考目标(62),而不需要将样本(16)放置在样本 公开了阶段(57)并被成像。 可调谐MIR激光器(11)产生聚焦在样品台上的样品样本上的光束(18),样品台沿第一方向(33)移动样本。 光学组件包括具有聚焦透镜(55)的扫描组件(31)和相对于样品台沿与第一方向不同的第二方向(32)移动的反射镜(56)。 光检测器(13)测量离开样品点的光的强度。 控制器(39)根据测量的强度形成图像。 基准台(61)被定位成使得扫描组件响应于命令移动到参考台上,使得控制器也可进行参考测量。
    • 6. 发明公开
    • MALDI sample plate imaging workstation
    • MALDI Probenhalter Bildgebungsarbeitsstation
    • EP1763061A2
    • 2007-03-14
    • EP06254631.2
    • 2006-09-06
    • Agilent Technologies, Inc.
    • Truche, Jean-LucOverney, Gregor T.Fisher, William D.Tella, Richard P.
    • H01J49/16
    • H01J49/0418G03B15/07
    • The invention provide an apparatus for producing an image of a global surface of an ion source sample plate (4) that is exterior to an ion source. In general terms, the apparatus contains a sample plate for an ion source, an imaging device (8) (e.g., a CCD or CMOS camera) and an illumination device (6) that is configured to produce a light beam (10) that contacts the sample plate surface to define a grazing angle (12) between the light beam and the sample plate surface. The light beam (10) may be reflected, diffracted or scattered as a light beam (14), at an angle (16) to the surface of the sample plate (4). The imaging device 8 may be at an angle (16) to the surface of the sample plate. The apparatus may be present at a location that is remote to the ion source.
    • 本发明提供了一种用于制造离子源样品板(4)的全局表面的图像的装置,其在离子源外部。 一般来说,该装置包括用于离子源的样品板,成像装置(8)(例如,CCD或CMOS照相机)和照明装置(6),其被配置为产生接触的光束(10) 样品板表面以限定光束和样品板表面之间的掠射角(12)。 光束(10)可以作为光束(14)以与样品板(4)的表面成角度(16)被反射,衍射或散射。 成像装置8可以与样品板的表面成角度(16)。 该装置可以存在于远离离子源的位置处。