专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明公开

EP1739719A3 Increased depth of field for high resolution imaging for a matrix-based ion source 有权
标题翻译：增大的景深为高分辨率图像用于基于矩阵的离子源
公开(公告)号：EP1739719A3
公开(公告)日：2010-03-17
申请号：EP05023180.2
申请日：2005-10-24
申请人： Agilent Technologies, Inc.
发明人： Truche, Jean-Luc , Overney, Gregor
IPC分类号： H01J49/04 , G03B3/10 , G03B13/34 , G06T5/50
CPC分类号： H01J49/0418 , G03B3/10 , G03B13/34 , G06T5/50 , G06T7/571 , G06T2207/10148 , G06T2207/30108 , H01J49/0004
摘要： The invention provides a method of producing an in-focus image of an area on a sample plate for an ion source, e.g., a matrix-based ion source or any other type of ion source that employs a sample plate onto which samples are deposited. The method generally includes: a) positioning an area of the sample plate in the field of view of an imaging device; b) producing a plurality of images of the area having different in-focus regions; and c) generating an in-focus image of the area using the plurality of images. The in-focus image may be two-dimensional or three-dimensional. Systems and programming for performing the methods are also provided.

2. 发明公开

EP1672675A3 Apparatus and method for ion production enhancement 审中-公开
标题翻译：装置和方法用于提高离子产生
公开(公告)号：EP1672675A3
公开(公告)日：2008-07-09
申请号：EP05009726.0
申请日：2005-05-03
申请人： Agilent Technologies, Inc.
发明人： Truche, Jean-Luc , Bai, Jian , Joyce, Timothy
IPC分类号： H01J49/16
CPC分类号： H01J49/164 , H01J49/0477
摘要： The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.

3. 发明授权

EP1739719B1 Increased depth of field for high resolution imaging for a matrix-based ion source 有权
标题翻译：基督教徒爱en qu elle elle elle elle elle elle elle elle elle elle elle elle elle elle elle elle elle elle
公开(公告)号：EP1739719B1
公开(公告)日：2013-07-10
申请号：EP05023180.2
申请日：2005-10-24
申请人： Agilent Technologies, Inc.
发明人： Truche, Jean-Luc , Overney, Gregor
IPC分类号： H01J49/04 , G03B3/10 , G03B13/34 , G06T5/50
CPC分类号： H01J49/0418 , G03B3/10 , G03B13/34 , G06T5/50 , G06T7/571 , G06T2207/10148 , G06T2207/30108 , H01J49/0004

4. 发明公开

EP1739721A3 Apparatus and method for ion capture and production 审中-公开
标题翻译：装置和方法，用于离子俘获和生产
公开(公告)号：EP1739721A3
公开(公告)日：2010-05-05
申请号：EP05018945.5
申请日：2005-08-31
申请人： Agilent Technologies, Inc.
发明人： Goodley, Paul C. , Truche, Jean-Luc , Dowell, Jerry T. , Joyce, Timothy Herbert
IPC分类号： H01J49/16
CPC分类号： H01J49/0418
摘要： The present invention relates to an apparatus and method for producing ions. The apparatus may be used separately as an ion source or in combination with a mass spectrometry system. The ion source of the present invention provides an ionization device for producing ions, a substrate for capturing, storing and releasing ions produced by the ionization device, a conductive material in contact with the substrate for receiving an electrical pulse, and a voltage source electrically connected to the conductive material for applying an electrical pulse to the conductive material and substrate to release the ions captured by the substrate. Also disclosed is a method for storing and releasing ions using the disclosed apparatus.

5. 发明公开

EP1672675A2 Apparatus and method for ion production enhancement 审中-公开
标题翻译： Vorrichtung und Verfahren zur Verbesserung der Ionenerzeugung
公开(公告)号：EP1672675A2
公开(公告)日：2006-06-21
申请号：EP05009726.0
申请日：2005-05-03
申请人： Agilent Technologies Inc. (a Delaware Corporation)
发明人： Truche, Jean-Luc , Bai, Jian , Joyce, Timothy
IPC分类号： H01J49/16
CPC分类号： H01J49/164 , H01J49/0477
摘要： The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.
摘要翻译：本发明涉及一种与质谱仪一起使用的装置和方法。本发明的离子增强系统用于将加热的气体引导到由基于基质的离子源产生的离子并由检测器检测。离子增强系统介于离子源和检测器之间。接触被加热气体的分析物离子增强，并且检测器更容易检测到增加的离子数。本发明的方法包括从基于基质的离子源产生分析物离子，用离子增强系统增强分析物离子，并用检测器检测增强的分析物离子。

6. 发明公开

EP1732103A3 Ion source sample plate illumination system 审中-公开
标题翻译：离子源样品板照明系统
公开(公告)号：EP1732103A3
公开(公告)日：2010-03-17
申请号：EP05024149.6
申请日：2005-11-04
申请人： Agilent Technologies, Inc.
发明人： Truche, Jean-Luc , Overney, Gregor T. , Fisher, William D. , Tella, Richard P.
IPC分类号： H01J49/04 , G03B15/07
CPC分类号： H01J49/0418 , G03B15/07 , H01J49/0004
摘要： The invention provides a mass spectrometry system ion source containing a sample plate and an illumination device that is configured to produce a light beam that contacts the sample plate surface to define a grazing angle between the light beam and the sample plate surface. The ion source may also contain an imaging device, e.g., a CCD or CMOS camera or the like, for viewing the area. In one embodiment, the imaging device may be connected to a display, e.g., a video monitor. Methods and mass spectrometry systems employing the ion source are also provided.

7. 发明公开

EP1783816A3 Apparatus for combined laser focusing and spot imaging 审中-公开
标题翻译：一种用于组合的激光聚焦和斑点接收装置
公开(公告)号：EP1783816A3
公开(公告)日：2009-02-25
申请号：EP06255678.2
申请日：2006-11-03
申请人： Agilent Technologies, Inc.
发明人： Overney, Gregor , Truche, Jean-Luc
IPC分类号： H01J49/16
CPC分类号： H01J49/164 , H01J49/0004
摘要： A MALDI ion source includes a sample plate for receiving a sample, a laser (30) for producing laser radiation to ionize the sample, a first optical element (32) arranged so as to direct the laser radiation along a first optical path towards the target area, and a second optical element (38) arranged along the first optical path to focus the laser radiation onto the target area. The first and second optical elements (32, 38) are arranged that light that is reflected from the target area travels along the first optical path through the first and second optical elements (32, 38), the first optical element (32) reflecting the laser radiation along a first direction and transmitting the light reflected from the target area that has traversed the first optical path in a second direction. An imaging device (40) for viewing the plate surface may be arranged to receive the light that has been reflected from the target area and has traversed the first optical path through the first and second optical elements (32, 38).

8. 发明公开

EP1672676A3 Apparatus and method for ion production enhancement 审中-公开
标题翻译：装置和方法用于提高离子产生
公开(公告)号：EP1672676A3
公开(公告)日：2008-07-09
申请号：EP05020143.3
申请日：2005-09-15
申请人： Agilent Technologies, Inc.
发明人： Truche, Jean-Luc , Bai, Jian , Joyce, Timothy
IPC分类号： H01J49/16
CPC分类号： H01J49/164 , H01J49/0477
摘要： The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.

9. 发明公开

EP1783816A2 Apparatus for combined laser focusing and spot imaging 审中-公开
标题翻译： Vorrichtung zur kombinierten Laserfokussierung und Fleckaufnahme
公开(公告)号：EP1783816A2
公开(公告)日：2007-05-09
申请号：EP06255678.2
申请日：2006-11-03
申请人： Agilent Technologies, Inc.
发明人： Overney, Gregor , Truche, Jean-Luc
IPC分类号： H01J49/16
CPC分类号： H01J49/164 , H01J49/0004
摘要： A MALDI ion source includes a sample plate for receiving a sample, a laser (30) for producing laser radiation to ionize the sample, a first optical element (32) arranged so as to direct the laser radiation along a first optical path towards the target area, and a second optical element (38) arranged along the first optical path to focus the laser radiation onto the target area. The first and second optical elements (32, 38) are arranged that light that is reflected from the target area travels along the first optical path through the first and second optical elements (32, 38), the first optical element (32) reflecting the laser radiation along a first direction and transmitting the light reflected from the target area that has traversed the first optical path in a second direction. An imaging device (40) for viewing the plate surface may be arranged to receive the light that has been reflected from the target area and has traversed the first optical path through the first and second optical elements (32, 38).
摘要翻译： MALDI离子源包括用于接收样品的样品板，用于产生激光辐射以使样品电离的激光器（30），布置成将激光辐射沿着第一光学路径引向靶的第一光学元件（32）以及沿着第一光路布置的将激光辐射聚焦到目标区域上的第二光学元件（38）。第一和第二光学元件（32,38）被布置成使得从目标区域反射的光通过第一和第二光学元件（32,38）沿着第一光路行进，第一光学元件（32）反射沿着第一方向的激光辐射，并且沿着第二方向透射从已经穿过第一光路的目标区域反射的光。用于观察板表面的成像装置（40）可以布置成接收已经从目标区域反射并已经穿过第一和第二光学元件（32,38）的第一光路的光。

10. 发明公开

EP1672676A2 Apparatus and method for ion production enhancement 审中-公开
标题翻译：提高离子产量的设备和方法
公开(公告)号：EP1672676A2
公开(公告)日：2006-06-21
申请号：EP05020143.3
申请日：2005-09-15
申请人： Agilent Technologies Inc. (a Delaware Corporation)
发明人： Truche, Jean-Luc , Bai, Jian , Joyce, Timothy
IPC分类号： H01J49/16
CPC分类号： H01J49/164 , H01J49/0477
摘要： The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.
摘要翻译：本发明涉及与质谱仪一起使用的设备和方法。本发明的离子增强系统用于将加热的气体导向由基于基质的离子源产生并由检测器检测的离子。离子增强系统介于离子源和检测器之间。与加热的气体接触的分析物离子被增强并且更多的离子更容易被检测器检测到。本发明的方法包括从基于基质的离子源产生分析物离子，用离子增强系统增强分析物离子并用检测器检测增强的分析物离子。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式