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51. 发明公开

EP2511721A2 Monitoring the low cycle fatigue of ruggedized avionics electronics 有权转让
标题翻译： Überwachungder niederzyklischenErmüdungvon robuster Luftfahrtelektronik
公开(公告)号：EP2511721A2
公开(公告)日：2012-10-17
申请号：EP12162778.0
申请日：2012-03-30
申请人： Hamilton Sundstrand Corporation
发明人： Morgana, Edward R. , Roy, Kevin P.
IPC分类号： G01R31/28 , G01R31/00
CPC分类号： G01R31/2849 , G01R31/008 , G01R31/048 , G01R31/2856 , G01R31/2872
摘要： A health monitoring system (14) for monitoring the health of an electronic system (10). The health monitoring system includes an analog-to-digital converter (22), and a monitoring circuit (24) within the electronic system. The monitoring circuit includes fatigue life characterized electrical components (26, 28, 30) representative of electrical components (12) comprising the balance of the electronic system. The fatigue life characterized electrical components are employed solely to monitor the health of the electronic system. The monitoring circuit output (20) is electrically connected to the analog-to-digital converter (22).
摘要翻译：一种用于监测电子系统（10）的健康状况的健康监测系统（14）。所述健康监测系统包括所述电子系统内的模拟数字转换器（22）和监视电路（24）。监测电路包括代表包括电子系统的余量的电气部件（12）的疲劳寿命特征的电气部件（26,28,30）。电气部件的疲劳寿命仅用于监测电子系统的健康状况。监控电路输出（20）电连接到模数转换器（22）。

52. 发明授权

EP2090147B1 ELEKTRONISCHES GERÄT 有权
标题翻译：电子设备
公开(公告)号：EP2090147B1
公开(公告)日：2012-01-11
申请号：EP07821332.9
申请日：2007-10-15
申请人： Endress+Hauser GmbH+Co. KG
发明人： HAMMER, Manfred , SCHROTH, Herbert , SPANKE, Dietmar
IPC分类号： H05K10/00 , F16D66/00 , F16D66/02
CPC分类号： G01R31/2849
摘要： The invention relates to an electronic device (1) with electronics (9) comprising electronic and/or electromechanical components (11) arranged in an electronic chamber (7), the device being able to automatically detect and/or monitor wear of its electronic and/or electromechanical components (11), comprising a device (15) for the detection and/or monitoring of wear of the electronic and/or electromechanical components (11), the device having at least one part (17, 17a, 17b) that is arranged in the electronic chamber (7) and is independent from the electronics (9), wherein the part has at least one physical property that changes irreversibly as a function of the wear of the part (17, 17a, 17b). A circuit (31) for measuring said physical property is provided. The invention further comprises an evaluation unit (33), which detects and/or monitors wear of the part (17, 17a, 17b) based on the measured physical property and providing an output signal (S) that is dependent on the wear.

53. 发明授权

EP2185943B1 PROCEDE DE CARACTERISATION DE LA SENSIBILITE AUX INTERACTIONS ENERGETIQUES D'UN COMPOSANT ELECTRONIQUE 有权
标题翻译：为表征的灵敏度的电子元件的方法对于能量相互作用
公开(公告)号：EP2185943B1
公开(公告)日：2011-11-02
申请号：EP08836167.0
申请日：2008-09-05
申请人： European Aeronautic Defence and Space Company EADS France
发明人： BUARD, Nadine , MILLER, Florent , HEINS, Patrick , CARRIERE, Thierry
IPC分类号： G01R31/28 , G01R31/02 , G01R31/311 , G01R31/30
CPC分类号： G01R31/2881 , G01R31/002 , G01R31/2849 , G01R31/2853 , G01R31/30 , G01R31/311
摘要： The invention relates to a method for characterising operating conditions for an electronic component permitting the sensitivity thereof to energetic interactions to be limited. The behaviour of a component subjected to a pulsed laser radiation is measured. The values of polarisation frequency and temperature (or other operating conditions) to which the component is sensitive are determined by detecting a transitory or permanent fault in the operation of the component. If necessary, the parasite currents generated are prevented from destroying the tested component at the moment of testing. A susceptibility of the component to energetic interactions and the preferred operating conditions for the component are deduced.

54. 发明公开

EP2203752A1 PROCEDE DE DETERMINATION DE LA SENSIBILITE DES COMPOSANTS ELECTRONIQUES VIS A VIS DES PARTICULES 有权转让
标题翻译：方法决定电子组件的颗粒灵敏度
公开(公告)号：EP2203752A1
公开(公告)日：2010-07-07
申请号：EP08843897.3
申请日：2008-10-23
申请人： European Aeronautic Defence And Space Company EADS , AIRBUS France , ASTRIUM SAS
发明人： MILLER, Florent , BUARD, Nadine , WEULERSSE, Cécile , CARRIERE, Thierry , HEINS, Patrick
IPC分类号： G01R31/302 , G01R31/28 , G01R31/308 , G01R31/3183
CPC分类号： G01R31/002 , G01R31/2849 , G01R31/2881 , G01R31/308 , G01R31/31816 , G01R31/318357
摘要： To analyse an electronic component, this component is exposed to a focused laser beam. The information provided by the laser mapping relating to the position and to the depth of the sensitivity zones of the component is used as input parameter in prediction codes for quantifying the sensitivity of the mapped component to ionizing particles in the natural radiative environment. The prediction codes are used to determine the occurrence of malfunctions in the electronic component. Determination of the risks associated with the radiative environment imposes two aspects: one, probabilistic, takes into account the particle/matter interaction and the other, electrical, takes into account the charge collection inside the electronic component.

55. 发明公开

EP2088440A1 Monitoring of capacitor 审中-公开
标题翻译： Kondensatorüberwachung
公开(公告)号：EP2088440A1
公开(公告)日：2009-08-12
申请号：EP08252845.6
申请日：2008-08-28
申请人： Pratt & Whitney Canada Corp. , Hamilton Sundstrand Corporation
发明人： Rozman, Gregory I. , Dooley, Kevin A.
IPC分类号： G01R31/01
CPC分类号： G01R31/028 , G01R31/2849
摘要： A capacitive element (20) is monitored to detect at least one of a degradation level, a capacitor life expectancy, and preferably servicing alarms are generated upon detection of a critical health state. The system allows, among other things, non-hermetically sealed capacitances to be safely and cost-effectively used in weight-sensitive applications, such as in aircraft electronic systems.
摘要翻译：监测电容元件（20）以检测劣化水平，电容器寿命中的至少一个，并且优选地，在检测到关键健康状态时产生服务警报。该系统允许非密封电容在诸如飞机电子系统的重量敏感应用中安全且经济地使用。

56. 发明公开

EP1583007A3 Method for evaluating semiconductor device error and system for supporting the same 审中-公开
标题翻译：一种用于在半导体装置的评价缺陷和对应的装置的方法
公开(公告)号：EP1583007A3
公开(公告)日：2005-10-26
申请号：EP05000924.0
申请日：2005-01-18
申请人： Renesas Technology Corp.
发明人： Ibe, Hidefumi Hitachi, Ltd. , Yahagi, Yasuo Hitachi, Ltd. , Kameyama, Hideaki Hitachi, Ltd.
IPC分类号： G06F17/50 , G11C11/412 , G06F17/18 , G01R31/30
CPC分类号： G01R31/31816 , G01R31/002 , G01R31/2849 , G01R31/2881 , G01R31/30
摘要： When resistivity against errors caused by cosmic ray neutrons in a semiconductor device is evaluated, the storage (120) in the evaluation apparatus stores multiple spectrum data of white neutrons having different spectrum shapes, and multiple SEE counts obtained by the white neutron method using this multiple spectrum data. A computing section (100) performs processing, with respect to each spectrum data, to read out the spectrum data from the storage, divide the data into multiple energy groups, calculates and stores a total flux of each energy group. Furthermore, the computing section reads out from the storage, the SEE counts with respect to each of the multiple spectrum data and the total flux of each energy group, substitutes the SEE counts and the total flux into a simultaneous equation, where a product of matrix elements indicating the total flux of each of the energy groups as to each of the multiple spectrum data and vectors indicating the SEE cross section of each of the energy groups represents the SEE count as to each of the multiple spectrum data, and calculates the SEE cross section for each of the energy groups. Subsequently, the computing section performs a calculation so that parameters are calculated, which determine a formula of the approximate function of the SEE cross section as a function of energy, so that computed values of error counts obtained by integration of multiple spectra and the approximate function sufficiently match the actual measured values thereof. With the processing as described above, there has been achieved an error evaluation in the semiconductor device using white neutrons independent from an accelerator.
摘要翻译：当针对通过在半导体器件中的宇宙射线的中子引起的错误的电阻率进行评价，在评价装置中的存储装置（120）存储具有不同的频谱形状通过使用该多个白色中子方法得到的白色中子的多个频谱数据和多个SEE计数光谱数据。一种计算部（100）执行处理，对于每个光谱数据，从存储读出的谱数据，将数据划分为多个能量组，计算和存储各能量组的总通量。进一步，运算部从存储中读出时，SEE相对于每个所述多个谱数据和每个能量组的总通量的计数，代入SEE计数和总光通量成的联立方程，矩阵的其中一个产品关于每个所述多个谱数据和向量元素指示每个能量组的总通量指示每个能量组的SEE截面darstellt的SEE数作为给每个所述多个谱数据，并且计算SEE横部针对每个能量组。接着，运算部进行运算所以没有参数被计算，其中确定性矿作为能量的函数的SEE截面的近似函数的公式，所以并计算由多个光谱的积分和近似函数而获得的错误计数的值充分匹配其实际测量值。通过如上所述的处理，存在一种使用白色中子从独立于加速器已经达到在误差评价的半导体装置。

57. 发明公开

EP1019740A2 METHOD AND APPARATUS FOR TESTING ENCAPSULATED CIRCUITS 失效
标题翻译：设备和检验方法包囊值电路
公开(公告)号：EP1019740A2
公开(公告)日：2000-07-19
申请号：EP97954274.3
申请日：1997-12-22
申请人： McDonnell Douglas Corporation
发明人： BERRY, John, C., Jr. , FOGG, Larry, L.
IPC分类号： G01R31/26 , G01M3/04
CPC分类号： G01R31/2849
摘要： A method and apparatus (Fig. 3) for evaluating the suitability of an encapsulated electrical circuit (14) for use in a particular service environment provides for immersing the encapsulated circuit in a slightly conductive evaluating fluid (17) whose chemical composition approximates the environment into which the circuit will be placed in service. The thus-immersed circuit is then subjected to a reduced-pressure testing environment to draw air and other retained gases out of internal voids within the encapsulated circuit. The pressure of the testing environment is slowly increased to cause the encapsulated circuit to ingest a quantity of the evaluating fluid. An input signal (30) is then applied to the circuit and the circuit's response to the input signal is monitored (34) over a predetermined time period.

58. 发明公开

EP0733909A1 Method and apparatus for local temperature sensing for use in performing high resolution in-situ measurement 失效
标题翻译： Methode und Apparat zur lokalen Temperaturmessungfürhochauflösendein-situ Messung
公开(公告)号：EP0733909A1
公开(公告)日：1996-09-25
申请号：EP96200817.3
申请日：1996-03-25
申请人： INTERUNIVERSITAIR MICRO ELEKTRONICA CENTRUM VZW
发明人： De Ceuninck, Ward , Roggen, Jean , Stals, Lambert , De Schepper, Luc
IPC分类号： G01R31/00 , G01R19/32
CPC分类号： G01R31/2642 , G01R31/013 , G01R31/2817 , G01R31/2849
摘要： An apparatus and method for measuring a parameter of a sample or component at a measurement temperature, wherein the parameter and the measurement temperature are measured at substantially the same time. A temperature coefficient of the sample or component is also established by using temperature fluctuations measured at or near the sample at the time at which the parameter is measured.
摘要翻译：在测量温度下测量样品或组分的参数的装置和方法，其中在基本相同的时间测量参数和测量温度。样品或组分的温度系数也通过使用在测量参数时的样品处或附近测量的温度波动来建立。

59. 发明授权

EP0523735B1 Burn-in apparatus and method 失效
标题翻译：装置和烘焙法。
公开(公告)号：EP0523735B1
公开(公告)日：1995-04-05
申请号：EP92112264.4
申请日：1992-07-17
申请人： SUMITOMO ELECTRIC INDUSTRIES, LIMITED
发明人： Hashinaga, Tatsuya, c/o Yokohama Works of Sumitomo , Nishiguchi, Masanori, c/o Yokohama Works of Sumit.
IPC分类号： H01L21/00 , G01R31/28
CPC分类号： G01R31/2877 , G01R31/2849 , G01R31/2856 , G01R31/2862 , G01R31/2863 , G01R31/2884 , G01R31/309

60. 发明公开

EP2511721A3 Monitoring the low cycle fatigue of ruggedized avionics electronics 有权转让
标题翻译：监控耐用航空电子设备的低周疲劳
公开(公告)号：EP2511721A3
公开(公告)日：2017-10-18
申请号：EP12162778.0
申请日：2012-03-30
申请人： Hamilton Sundstrand Corporation
发明人： Morgana, Edward R. , Roy, Kevin P.
IPC分类号： G01R31/28 , G01R31/04 , G01R31/00
CPC分类号： G01R31/2849 , G01R31/008 , G01R31/048 , G01R31/2856 , G01R31/2872
摘要： A health monitoring system (14) for monitoring the health of an electronic system (10). The health monitoring system includes an analog-to-digital converter (22), and a monitoring circuit (24) within the electronic system. The monitoring circuit includes fatigue life characterized electrical components (26, 28, 30) representative of electrical components (12) comprising the balance of the electronic system. The fatigue life characterized electrical components are employed solely to monitor the health of the electronic system. The monitoring circuit output (20) is electrically connected to the analog-to-digital converter (22).
摘要翻译：一种用于监视电子系统（10）的健康的健康监视系统（14）。健康监测系统包括模数转换器（22）和电子系统内的监测电路（24）。监控电路包括表征包括电子系统的其余部分的电气部件（12）的疲劳寿命特征化电气部件（26,28,30）。以疲劳寿命为特征的电子元件仅用于监测电子系统的健康状况。监控电路输出（20）电连接到模数转换器（22）。

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