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51. 发明公开

EP2834846A1 PHOTOVOLTAIC SENSOR ARRAYS 有权转让
标题翻译：光伏传感器
公开(公告)号：EP2834846A1
公开(公告)日：2015-02-11
申请号：EP13721989.5
申请日：2013-04-04
申请人： Bio AMD Holdings Limited
发明人： DJENNATI, Nasr-Eddine , MITCHELL, Andrew
IPC分类号： H01L27/142 , G01N21/00 , G01N33/53 , G01N33/76
CPC分类号： G01J1/42 , G01N21/8483 , G01R31/26 , G01R31/40 , H01L31/042 , H01L31/046 , H01L31/10 , H02S50/10 , Y02E10/50
摘要： A photovoltaic sensor array for detecting variations in light intensity is disclosed. The array has a plurality of photo voltaic cells which are electrically independent from one another and formed on a common substrate. Each cell has corresponding positive and negative electrical connections and each cell is arranged to detect light intensity so that variations in light intensity between the cells can be obtained.

52. 发明公开

EP1427014A2 Integrated circuit identification 审中-公开
标题翻译：识别器
公开(公告)号：EP1427014A2
公开(公告)日：2004-06-09
申请号：EP03104531.3
申请日：2003-12-03
申请人： Texas Instruments Inc.
发明人： Matsunami, Akira
IPC分类号： H01L23/544
CPC分类号： G01N21/86 , G01R31/26 , G03F1/38 , G03F7/70291 , G03F7/70383 , G03F7/70541 , H01L23/544 , H01L2223/54406 , H01L2223/54433 , H01L2223/54473 , H01L2223/5448 , H01L2924/0002 , H01L2924/00
摘要： A method for marking a semiconductor wafer 302 includes the steps of: providing a reticle 300 including liquid crystal pixels; positioning the semiconductor wafer in proximity to the reticle; directing radiation through a first plurality of the pixels onto a first location on the wafer; changing the relative positions of the semiconductor wafer and the reticle; and directing radiation through a second plurality of the pixels onto a second location on the wafer. The first plurality of pixels can be used to form a first mark and the second plurality of pixels can be used to form a second mark, wherein the second mark is different from the first mark. The marks can be made of a pattern of dots in order to save space. The pixels can be selected to form certain marks by using a computer 304 to turn on or off a transistor that may be associated with each pixel. Also described is a system for marking a semiconductor wafer. The system includes a wafer mount 301; a radiation source 306 in proximity to the wafer mount; a reticle 300 which includes liquid crystal pixels and that is positionable between the radiation source and the wafer mount; and a mechanism 303 for changing the relative positions of the reticle and the wafer mount. The radiation source can be non-coherent far-ultraviolet, near-ultraviolet, or visible sources, or a laser.
摘要翻译：标记半导体晶片302的方法包括以下步骤：提供包括液晶像素的掩模版300; 将所述半导体晶片定位在所述掩模版附近; 将辐射通过第一多个像素引导到晶片上的第一位置; 改变半导体晶片和掩模版的相对位置; 以及将辐射通过第二多个像素引导到晶片上的第二位置。可以使用第一多个像素来形成第一标记，并且第二多个像素可用于形成第二标记，其中第二标记不同于第一标记。标记可以由点的图案形成，以节省空间。可以通过使用计算机304来打开或关闭可以与每个像素相关联的晶体管来选择像素以形成某些标记。还描述了一种用于标记半导体晶片的系统。该系统包括晶片安装件301; 接近晶片安装座的辐射源306; 标线片300，其包括液晶像素并且可定位在所述辐射源和所述晶片安装件之间; 以及用于改变标线片和晶片安装座的相对位置的机构303。辐射源可以是非相干的远紫外线，近紫外线或可见光源或激光。

53. 发明授权

EP3267212B1 METHOD FOR PRODUCING SOLAR POWERED SCREENING DEVICES FOR WINDOWS 有权
公开(公告)号：EP3267212B1
公开(公告)日：2018-12-12
申请号：EP16178653.8
申请日：2016-07-08
申请人： VKR Holding A/S
发明人： THOMSEN, Jan
IPC分类号： G01R31/26 , H02S50/10 , E06B5/00 , E06B9/08 , E06B9/24 , E04D13/035
CPC分类号： H02S50/10 , E04D13/0354 , E06B9/08 , E06B2009/2476 , G01R31/26
摘要： The invention relates to a method for producing solar powered screening devices (192) or windows (191) which comprise a motor for operating the device. The motor is powered via a battery and the battery is charged by a solar panel (104). In order to ensure that the solar panel is capable of producing sufficient energy, particularly when the screening device or window is installed at a location where the available solar energy is low, the solar panel is selected according to a test procedure. According to the test procedure at test voltage is applied to the solar panel and the resulting current is compared with the reference in order to find solar panels having sufficient conversion efficiency. The amplitude of the measured current depends on the efficiency, particularly in low light conditions.

54. 发明公开

EP3355345A1 STAGE DEVICE AND PROBE DEVICE 审中-公开
公开(公告)号：EP3355345A1
公开(公告)日：2018-08-01
申请号：EP16848414.5
申请日：2016-08-05
申请人： Tokyo Electron Limited
发明人： ENDO Tomoya
IPC分类号： H01L21/68 , G01R31/26 , H01L21/66 , H02K41/02
CPC分类号： G01R31/2831 , G01R1/067 , G01R31/26 , G01R31/2601 , H01L21/68 , H02K41/02
摘要： A drive unit of a stage device includes a boxy body having a rectangular shape in a plan view, a base, a pair of X-axis linear motors, and a pair of Y-axis linear motors. An X-axis stator is disposed on each of two mutually opposing X-axis-direction side walls of the boxy body, wherein magnetic attractions that draw respective X-axis rotors toward the X-axis stator side (Y-axis direction) cancel out each other between the pair of X-axis linear motors. A Y-axis stator is disposed on the inside of each of two mutually opposing Y-axis wall members, wherein magnetic attractions that draw respective Y-axis movers toward the Y-axis stator side (X-axis direction) cancel out each other between the pair of Y-axis linear motors.

55. 发明公开

EP3343704A1 ELECTRICAL CONTACT AND SOCKET FOR ELECTRICAL COMPONENT 审中-公开
公开(公告)号：EP3343704A1
公开(公告)日：2018-07-04
申请号：EP16839142.3
申请日：2016-08-16
申请人： Enplas Corporation
发明人： ODA, Takahiro
IPC分类号： H01R13/03 , G01R1/073 , G01R31/26
CPC分类号： H01R13/03 , G01R1/0458 , G01R1/073 , G01R31/26 , G01R31/2875 , H01R2201/20
摘要： Contact pins are provided to a socket main body for accommodating an IC package so as to be in contact with connection terminals of the IC package accommodated in the socket main body. Each contact pin includes a conductive substrate and multiple layers laminated on the surface of the substrate, including: an underlying layer formed on the substrate by Ni plating; a first surface layer formed on the underlying layer by Pd-Ni alloy plating; a second surface layer formed on the first surface layer by Ni plating, thus allowing Sn from the corresponding connection terminal to diffuse into the second surface layer at a rate lower than into a conventional plated Ag layer; and an outermost surface layer formed on the second surface layer by Au plating to serve as an electrical contact layer.

56. 发明公开

EP3267212A1 METHOD FOR PRODUCING SOLAR POWERED SCREENING DEVICES FOR WINDOWS 有权
标题翻译：生产用于WINDOWS的太阳能供电屏蔽设备的方法
公开(公告)号：EP3267212A1
公开(公告)日：2018-01-10
申请号：EP16178653.8
申请日：2016-07-08
申请人： VKR Holding A/S
发明人： THOMSEN, Jan
IPC分类号： G01R31/26 , H02S50/10 , E06B5/00
CPC分类号： H02S50/10 , E04D13/0354 , E06B9/08 , E06B2009/2476 , G01R31/26
摘要： The invention relates to a method for producing solar powered screening devices (192) or windows (191) which comprise a motor for operating the device. The motor is powered via a battery and the battery is charged by a solar panel (104). In order to ensure that the solar panel is capable of producing sufficient energy, particularly when the screening device or window is installed at a location where the available solar energy is low, the solar panel is selected according to a test procedure. According to the test procedure at test voltage is applied to the solar panel and the resulting current is compared with the reference in order to find solar panels having sufficient conversion efficiency. The amplitude of the measured current depends on the efficiency, particularly in low light conditions.
摘要翻译：本发明涉及一种用于生产太阳能屏蔽装置（192）或窗口（191）的方法，所述屏蔽装置或窗口（191）包括用于操作所述装置的电机。电动机通过电池供电并且电池由太阳能电池板（104）充电。为了确保太阳能电池板能够产生足够的能量，特别是当屏蔽装置或窗口安装在可用太阳能低的位置时，根据测试程序来选择太阳能电池板。根据测试过程中的测试电压施加到太阳能电池板上，并将所得到的电流与参考值进行比较，以便找到具有足够转换效率的太阳能电池板。测量电流的幅度取决于效率，特别是在低光照条件下。

57. 发明公开

EP3200341A1 METHOD AND DEVICE FOR INSPECTING PHOTOVOLTAIC POWER GENERATION SYSTEM 失效
标题翻译：检测光伏发电系统的方法和装置
公开(公告)号：EP3200341A1
公开(公告)日：2017-08-02
申请号：EP15857665.2
申请日：2015-10-16
申请人： Omron Corporation
发明人： TAKEUCHI, Tsuyoshi , MISUMI, Shuichi , SANO, Akihiko , MORITA, Kosuke
IPC分类号： H02S50/00 , G01R31/02 , G01R31/26
CPC分类号： H02S50/10 , G01R31/02 , G01R31/26 , G01R31/28 , H01L31/02021 , H01L31/042 , H02S30/10 , H02S50/00 , Y02E10/50
摘要： A failure inspection is performed easily and with high accuracy. A solar photovoltaic system inspection apparatus sequentially applies AC inspection signals to a positive electrode and a negative electrode of a solar cell string (3), and is provided with: an impedance calculation unit (46) configured to measure an indicator value when the signal is applied to the positive electrode, and an indicator value when the signal is applied to the negative electrode, the indicator values varying depending on the number of solar cell modules (2) from the terminal to which the inspection signal was applied to a failure position; and a control unit (47) configured to obtain the failure position based on the ratio of the indicator value measured when the inspection signal was applied to the positive electrode, to the indicator value measured when the inspection signal was applied to the negative electrode.
摘要翻译：故障检查容易且高精度地进行。本发明提供一种太阳能发电系统检查装置，其对太阳能电池串（3）的正极和负极依次施加交流检查信号，具备：阻抗计算部（46），其在信号为施加到正极上的指示值以及当信号施加到负极时的指示值，指示值根据太阳能电池模块（2）的数量从施加了检查信号的端子到故障位置而变化; 以及控制部（47），其基于向所述正极施加所述检查信号时所测定的所述指标值与对所述负极施加所述检查信号时所测量的所述指标值的比率，求出所述故障位置。

58. 发明公开

EP3164723A1 APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION IN WORK PIECES 有权
标题翻译：用于工件中缺陷检测的装置，方法和计算机程序产品
公开(公告)号：EP3164723A1
公开(公告)日：2017-05-10
申请号：EP15865251.1
申请日：2015-12-04
申请人： Kla-Tencor Corporation
发明人： MARIVOET, Tom , TRUYENS, Carl , WOUTERS, Christophe
IPC分类号： G01R31/01 , G01R31/26 , G01N21/88 , G01R31/28 , G01N21/95
CPC分类号： G01N21/9501 , G01N21/8806 , G01N21/95 , G01N21/9505 , G01N21/95684 , G01R31/01 , G01R31/26 , G01R31/28
摘要： An apparatus, a method and a computer program product for defect detection in work pieces is disclosed. At least one light source is provided and the light source generates an illumination light of a wavelength range at which the work piece is transparent. A camera images the light from at least one face of the work piece on a detector of the camera by means of a lens. A stage is used for moving the work piece and for imaging the at least one face of the semiconductor device completely with the camera. The computer program product is disposed on a non-transitory, computer readable medium for defect detection in work pieces. A computer is used to execute the various process steps and to control the various means of the apparatus.
摘要翻译：公开了用于工件中的缺陷检测的设备，方法和计算机程序产品。提供至少一个光源，并且光源产生工件透明的波长范围的照明光。照相机通过镜头将来自照相机检测器上的工件的至少一个面的光成像。使用工作台移动工件并用照相机完全成像半导体器件的至少一个面。该计算机程序产品被布置在用于工件中的缺陷检测的非临时性计算机可读介质上。计算机用于执行各种处理步骤并控制设备的各种装置。

59. 发明公开

EP2473860A4 ADVANCE MANUFACTURING MONITORING AND DIAGNOSTIC TOOL 无效
标题翻译： VERBESSERTE HERSTELLUNG EINESÜBERWACHUNGS-UND DIAGNOSEWERKZEUGS
公开(公告)号：EP2473860A4
公开(公告)日：2016-12-14
申请号：EP10814343
申请日：2010-08-31
申请人： NOKOMIS INC , PAULY GERALD WILLIAM , KELLER WALTER J III
发明人： PAULY GERALD WILLIAM , KELLER III WALTER J
IPC分类号： G01R29/08 , G01S7/41
CPC分类号： G01S7/41 , G01R29/0871 , G01R31/01 , G01R31/26 , G01R31/2642 , G01R31/265 , G01R31/2851 , G01R31/2894 , G01R31/302 , G01R31/31703
摘要： The current invention relates to a monitoring and analysis device and a method for monitoring and analysis that utilizes the unintended electromagnetic emissions of electrically powered systems. The present invention monitors electrical devices by taking detailed measurements of the electromagnetic fields emitted by any component or system utilizing electricity. The measurements will be analyzed to both record a baseline score for future measurements and to be used in detailed analysis to determine the status of the analyzed system or component.
摘要翻译：本发明涉及一种监测和分析装置以及利用电力系统的非预期电磁辐射的监测和分析方法。本发明通过对利用电力的任何部件或系统发射的电磁场的详细测量来监视电气装置。将分析测量结果以记录未来测量的基线分数，并用于详细分析以确定分析的系统或组件的状态。

60. 发明公开

EP3040802A3 ADJUSTING PROXIMITY THRESHOLDS FOR ACTIVATING A DEVICE USER INTERFACE 无效转让
标题翻译：接近度限制激活用户界面的设备的设置
公开(公告)号：EP3040802A3
公开(公告)日：2016-11-30
申请号：EP16153172.8
申请日：2012-09-30
申请人： Google Inc.
发明人： RUFF, Joseph Adam , Solnit, Jonathan , Satterthwaite, Edwin H.
IPC分类号： G05D23/19 , F24F11/00 , H01H25/06
CPC分类号： G06F3/04847 , F24F11/00 , F24F11/30 , F24F11/46 , F24F11/47 , F24F11/50 , F24F11/52 , F24F11/56 , F24F11/58 , F24F11/62 , F24F11/63 , F24F11/70 , F24F11/89 , F24F2110/00 , F24F2110/10 , F24F2120/10 , F24F2120/12 , F24F2120/14 , F24F2140/60 , G01J5/0025 , G01J5/041 , G01K1/02 , G01R31/26 , G05B15/02 , G05D23/19 , G05D23/1902 , G05D23/1919 , G05D23/1932 , G05D23/24 , G05D23/2454 , G05D23/27 , G05D23/275 , G06F1/3231 , G06F1/3265 , G06F3/011 , G06F3/02 , G06F3/0304 , G06F3/0362 , G06F3/042 , G06F3/0482 , G06F3/04842 , G06F3/0487 , G06F3/167 , G06N99/005 , H01H25/06 , H04L67/10 , Y02D70/00 , Y02T10/88
摘要： Asmart-home device comprises a user interface including an electronic display having a first display mode and a second display mode, the first display mode generally requiring more power than said second display mode. The device further comprises a processing system coupled to the user interface. The processing system is configured to be in operative communication with one or more environmental sensors for determining at least one environmental condition, and in operative communication with one or more input devices including said user interface. The device further comprises at least one sensor configured to detect a physical closeness of a user to the at least one sensor. The at least one sensor is in operative communication with the processing system. The processing system is configured to cause the electronic display to be in the first display mode when a closeness threshold has been exceeded. The processing system is further configured to automatically adjust said closeness threshold based at least in part on a historical plurality of physical closeness events as detected by the at least one sensor.
摘要翻译： ASmart家庭设备包括用户接口，其包括在电子显示器具有第一显示模式和第二显示模式，所述第一显示模式基因反弹需要比所述第二显示模式更多的功率。该装置还包括耦合到所述用户接口的处理系统。该处理系统被配置为与一个或多个环境传感器，用于确定在采矿至少一个环境条件，以及与包括所述用户接口的一个或多个输入设备可操作地通信可操作地通信。该装置还包括被配置来检测用户向所述至少一个传感器的物理靠近至少一个传感器。所述至少一个传感器与所述处理系统可操作地通信。该处理系统被配置为使所述电子显示器是在所述第一显示模式。当接近阈值已被超过。该处理系统被进一步配置成通过所述至少一个传感器检测到自动调节基于至少所述接近度阈值部分地基于物理靠近事件的历史的多元性。

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