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1. 发明授权

EP3527998B1 TEST APPARATUS AND METHOD FOR TESTING A LIGHT-EMITTING DEVICE 有权
公开(公告)号：EP3527998B1
公开(公告)日：2024-06-05
申请号：EP17860592.9
申请日：2017-09-14
IPC分类号： G01R31/26 , G01J1/02 , G01J1/04
CPC分类号： G01R31/26 , G01J1/0214 , G01J1/0474 , G01J1/0252 , G01J1/0437 , G01J1/0418 , G01J1/0425 , G01J1/0271 , G01J2001/425220130101

2. 发明授权

EP3091658B1 SOLAR CELL TESTING APPARATUS AND SOLAR CELL TESTING METHOD 有权
公开(公告)号：EP3091658B1
公开(公告)日：2018-08-29
申请号：EP16167898.2
申请日：2016-05-02
申请人： Hioki Denki Kabushiki Kaisha
发明人： HIGUCHI, Masao , TOKUTAKE, Fumio
IPC分类号： H02S50/00
CPC分类号： H02S50/10 , G01N21/88 , G01R31/26 , G01R31/28 , H02S50/00
摘要： A solar cell testing apparatus tests bypass diodes in a solar cell string, which is constructed of solar cell modules including solar cells and the bypass diodes, for open-position failures and includes: a unidirectional element connected between positive and negative electrodes of the solar cell string so as to permit passage of the current outputted when the solar cells generate power; a voltage applier that applies a test voltage, which exceeds a sum of forward direction voltages of the bypass diodes and sets the negative electrode potential higher than the positive electrode potential, across the positive and negative electrodes; a current detector that detects a current flowing in the solar cell string; and a processor that tests for open-position failures by comparing currents detected before and after application of the test voltage with the unidirectional element connected between the electrodes of the solar cell string.

3. 发明公开

EP3206226A4 ANALYSIS DEVICE AND ANALYSIS METHOD 有权
公开(公告)号：EP3206226A4
公开(公告)日：2018-04-25
申请号：EP14903761
申请日：2014-10-09
申请人： HAMAMATSU PHOTONICS KK
发明人： NAKAMURA TOMONORI
IPC分类号： H01L21/66 , G01J5/00 , G01N21/88 , G01N25/72 , G01R31/26 , G01R31/311
CPC分类号： G01R31/311 , G01J5/0003 , G01J5/0007 , G01J5/0066 , G01K17/08 , G01K17/16 , G01N21/88 , G01N25/005 , G01N25/20 , G01N25/72 , G01R31/26
摘要： A system and a method capable of identifying a heat source position corresponding to a failure portion are provided. An analysis system according to the present invention is an analysis system that identifies a heat source position inside a semiconductor device, and includes a tester that applies an AC signal to the semiconductor device, an infrared camera that detects light from the semiconductor device according to the AC signal and outputs a detection signal, and a data analysis unit that identifies the heat source position based on the detection signal.

4. 发明公开

EP3153852A4 INSPECTION DEVICE AND METHOD FOR DISPOSING MAGNETO-OPTICAL CRYSTAL 有权
公开(公告)号：EP3153852A4
公开(公告)日：2018-01-03
申请号：EP15803950
申请日：2015-06-02
申请人： HAMAMATSU PHOTONICS KK
发明人： NAKAMURA TOMONORI
IPC分类号： G01N27/72 , G01R31/26 , G01R31/28 , G01R33/032 , H01L21/66
CPC分类号： G01N27/72 , G01R31/26 , G01R31/2601 , G01R31/28 , G01R31/308 , G01R33/032
摘要： An inspection device according to an aspect of the present invention includes a light source configured to output light, an MO crystal disposed to face a semiconductor device (D), an object lens configured to concentrate the light output from the light source onto the MO crystal, a holder configured to hold the MO crystal, a flexible member interposed between the MO crystal and the holder, and an object lens drive unit configured to cause the MO crystal to contact the semiconductor device (D) by causing the holder to be moved in the optical axis direction of the object lens, wherein, when the MO crystal contacts the semiconductor device (D), the flexible member is bent, so that an incident plane is inclined in a range in which an inclination angle of the incident plane of the light in the MO crystal with respect to a plane orthogonal to the optical axis is less than or equal to an aperture angle of the object lens.

5. 发明公开

EP3240024A1 VERFAHREN ZUR ÜBERPRÜFUNG EINER MECHANISCHEN VERBINDUNG EINES KÜHLKÖRPERNIEDERHALTERS EINER KÜHLKÖRPERANORDNUNG, DIE EINEN KÜHLKÖRPER UND ZUMINDEST EINE ZU KÜHLENDE BAUTEILKOMPONENTE AUSWEIST, MIT EINER LEITERPLATTE 有权
标题翻译：过程审查的散热组件，具有散热片和至少一个部件冷却部件识别一低散热灯架的机械连接，与电路板
公开(公告)号：EP3240024A1
公开(公告)日：2017-11-01
申请号：EP17167991.3
申请日：2017-04-25
申请人： Pilz GmbH & Co. KG
发明人： Cech, Markus , Godau, Thorsten
IPC分类号： H01L23/40 , G01R31/26
CPC分类号： H01L23/40 , G01R31/26 , H01L23/4006 , H01L23/4093
摘要： Die Erfindung betrifft ein Verfahren zur Überprüfung einer mechanischen Verbindung eines Kühlkörperniederhalters (2) einer Kühlkörperanordnung (1), die einen Kühlkörper (3) und zumindest eine zu kühlende Bauteilkomponente (6) aufweist, mit einer Leiterplatte (4), umfassend die Schritte
a) Bereitstellen eines ersten elektrischen Kontakts (104) und eines zweiten elektrischen Kontakts (105) in oder an der Leiterplatte (4), mit denen der Kühlkörperniederhalter (2) verbindbar ist,
b) Bereitstellen einer Auswerteeinheit (100) mit einem Analog- oder Digitaleingang (101), der an eine Spannungsversorgungseinrichtung und an den ersten elektrischen Kontakt (104) angeschlossen wird,
c) Erzeugen einer elektrischen Spannung am Analog- oder Digitaleingang (101) der Auswerteeinheit (100),
d) Überprüfen, ob die elektrische Spannung am Analog- oder Digitaleingang (101) eine High-Pegel-Spannung oder eine Low-Pegel-Spannung ist.
摘要翻译：本发明涉及一种方法，用于检查散热器坯料夹持器的散热器组件（2）（1），包括散热器（3）和至少一个部件被冷却部件的机械连接（6），与电路板（4），包括以下步骤：a）提供第一电触点（104）和中或上与散热器上下装置（2）被连接在电路板（4）的第二电接触件（105），b）提供具有模拟或数字输入（评估单元（100） 101），其连接到电源设备和所述第一电接触（104），c）产生在所述评估单元（100），d的模拟或数字输入（101）的电电压）检查是否在模拟的电压或数字输入（101）是高电平电压或低电平电压。

6. 发明公开

EP3180852A1 HUBSYSTEM, VERFAHREN ZUR ELEKTRISCHEN PRÜFUNG, SCHWINGUNGSDÄMPFER UND MASCHINENAGGREGAT 审中-公开
标题翻译： HUBSYSTEM，VERFAHREN ZUR ELEKTRISCHENPRÜFUNG，SCHWINGUNGSDÄMPFERUND MASCHINENAGGREGAT
公开(公告)号：EP3180852A1
公开(公告)日：2017-06-21
申请号：EP15766777.5
申请日：2015-09-11
申请人： Siemens Aktiengesellschaft
发明人： BACHMAIER, Georg , GÖDECKE, Andreas , VONTZ, Thomas , ZÖLS, Wolfgang , VON GARSSEN, Hans-Georg
IPC分类号： H02N2/04 , G01R31/26 , F16F15/00
CPC分类号： H02N2/043 , F16F15/02 , G01R31/26 , G01R31/2635 , G01R31/286
摘要： The invention relates to a lifting system comprising a piezoelectric actuator (5), a support (15), and a hydraulic stroke multiplier (10) having an input and an output side, wherein with the input side of the hydraulic stroke multiplier said hydraulic stroke multiplier is tied to the piezoelectric actuator (5), and with the output side of the hydraulic stroke multiplier said hydraulic stroke multiplier is tied to the support. In the method for electrically testing an electronic component, the component is placed on the support (15) of said type of lifting system, and is lifted for positioning relative to a test contact. The vibration damper comprises said type of lifting system. The machine assembly comprises a machine and a vibration damper of said type.
摘要翻译：本发明涉及一种包括压电致动器（5），支撑件（15）和具有输入侧和输出侧的液压冲程倍增器（10）的升降系统，其中在液压冲程倍增器的输入侧，所述液压冲程乘法器连接到压电致动器（5），并且在液压冲程倍增器的输出侧，所述液压冲程倍增器被连接到支撑件。在用于对电子部件进行电测试的方法中，将部件放置在所述类型的提升系统的支撑件（15）上，并且相对于测试触点提升以进行定位。减振器包括所述类型的提升系统。机器组件包括机器和所述类型的减振器。

7. 发明公开

EP3040802A2 ADJUSTING PROXIMITY THRESHOLDS FOR ACTIVATING A DEVICE USER INTERFACE 无效转让
标题翻译：调整接近度阈值以激活设备用户界面
公开(公告)号：EP3040802A2
公开(公告)日：2016-07-06
申请号：EP16153172.8
申请日：2012-09-30
申请人： Google Inc.
发明人： RUFF, Joseph Adam , Solnit, Jonathan , Satterthwaite, Edwin H.
IPC分类号： G05D23/19 , F24F11/00
CPC分类号： G06F3/04847 , F24F11/00 , F24F11/30 , F24F11/46 , F24F11/47 , F24F11/50 , F24F11/52 , F24F11/56 , F24F11/58 , F24F11/62 , F24F11/63 , F24F11/70 , F24F11/89 , F24F2110/00 , F24F2110/10 , F24F2120/10 , F24F2120/12 , F24F2120/14 , F24F2140/60 , G01J5/0025 , G01J5/041 , G01K1/02 , G01R31/26 , G05B15/02 , G05D23/19 , G05D23/1902 , G05D23/1919 , G05D23/1932 , G05D23/24 , G05D23/2454 , G05D23/27 , G05D23/275 , G06F1/3231 , G06F1/3265 , G06F3/011 , G06F3/02 , G06F3/0304 , G06F3/0362 , G06F3/042 , G06F3/0482 , G06F3/04842 , G06F3/0487 , G06F3/167 , G06N99/005 , H01H25/06 , H04L67/10 , Y02D70/00 , Y02T10/88
摘要： Asmart-home device comprises a user interface including an electronic display having a first display mode and a second display mode, the first display mode generally requiring more power than said second display mode. The device further comprises a processing system coupled to the user interface. The processing system is configured to be in operative communication with one or more environmental sensors for determining at least one environmental condition, and in operative communication with one or more input devices including said user interface. The device further comprises at least one sensor configured to detect a physical closeness of a user to the at least one sensor. The at least one sensor is in operative communication with the processing system. The processing system is configured to cause the electronic display to be in the first display mode when a closeness threshold has been exceeded. The processing system is further configured to automatically adjust said closeness threshold based at least in part on a historical plurality of physical closeness events as detected by the at least one sensor.
摘要翻译：智能家居设备包括用户界面，该用户界面包括具有第一显示模式和第二显示模式的电子显示器，第一显示模式通常需要比所述第二显示模式更多的电力。该设备还包括耦合到用户界面的处理系统。处理系统被配置为与一个或多个环境传感器可操作地通信以确定至少一个环境条件，并且与包括所述用户界面的一个或多个输入设备可操作地通信。该设备还包括至少一个传感器，其被配置为检测用户对至少一个传感器的物理接近度。该至少一个传感器与处理系统可操作地通信。处理系统被配置成当超过接近阈值时使电子显示器处于第一显示模式。处理系统进一步被配置为至少部分基于由至少一个传感器检测到的历史多个物理接近度事件来自动调整所述接近度阈值。

8. 发明授权

EP2769278B1 ADJUSTING PROXIMITY THRESHOLDS FOR ACTIVATING DEVICE USER INTERFACE 有权转让
标题翻译：设置限制CLOSE用户界面的设备激活
公开(公告)号：EP2769278B1
公开(公告)日：2016-04-06
申请号：EP12841936.3
申请日：2012-09-30
申请人： Google Inc.
发明人： RUFF, Joseph Adam , SOLNIT, Jonathan , SATTERTHWAITE, JR., Edwin H.
IPC分类号： G05D23/19 , F24F11/00
CPC分类号： G06F3/04847 , F24F11/00 , F24F11/30 , F24F11/46 , F24F11/47 , F24F11/50 , F24F11/52 , F24F11/56 , F24F11/58 , F24F11/62 , F24F11/63 , F24F11/70 , F24F11/89 , F24F2110/00 , F24F2110/10 , F24F2120/10 , F24F2120/12 , F24F2120/14 , F24F2140/60 , G01J5/0025 , G01J5/041 , G01K1/02 , G01R31/26 , G05B15/02 , G05D23/19 , G05D23/1902 , G05D23/1919 , G05D23/1932 , G05D23/24 , G05D23/2454 , G05D23/27 , G05D23/275 , G06F1/3231 , G06F1/3265 , G06F3/011 , G06F3/02 , G06F3/0304 , G06F3/0362 , G06F3/042 , G06F3/0482 , G06F3/04842 , G06F3/0487 , G06F3/167 , G06N99/005 , H01H25/06 , H04L67/10 , Y02D70/00 , Y02T10/88
摘要： Asmart-home device comprises a user interface including an electronic display having a first display mode and a second display mode, the first display mode generally requiring more power than said second display mode. The device further comprises a processing system coupled to the user interface. The processing system is configured to be in operative communication with one or more environmental sensors for determining at least one environmental condition, and in operative communication with one or more input devices including said user interface. The device further comprises at least one sensor configured to detect a physical closeness of a user to the at least one sensor. The at least one sensor is in operative communication with the processing system. The processing system is configured to cause the electronic display to be in the first display mode when a closeness threshold has been exceeded. The processing system is further configured to automatically adjust said closeness threshold based at least in part on a historical plurality of physical closeness events as detected by the at least one sensor.

9. 发明公开

EP2769275A4 USER-FRIENDLY, NETWORK CONNECTED LEARNING THERMOSTAT AND RELATED SYSTEMS AND METHODS 有权转让
标题翻译： BENUTZERFREUNDLICHE，NETZWERKVERBUNDENER LERNTHERMOSTAT SOWIE ENTSPRECHENDE SYSTEME UND VERFAHREN
公开(公告)号：EP2769275A4
公开(公告)日：2016-04-06
申请号：EP12842627
申请日：2012-03-22
申请人： NEST LABS INC
发明人： FADELL ANTHONY , ROGERS MATTHEW , SATTERTHWAITE EDWIN , SMITH IAN , WARREN DANIEL , PALMER JOSEPH , HONJO SHIGEFUMI , ERICKSON GRANT , DUTRA JONATHON , FIENNES HUGO
IPC分类号： G05D23/19 , F24F11/00
CPC分类号： G06F3/04847 , F24F11/00 , F24F11/0009 , F24F11/001 , F24F11/0012 , F24F11/0034 , F24F11/006 , F24F11/0076 , F24F11/0086 , F24F11/02 , F24F11/30 , F24F11/46 , F24F11/47 , F24F11/52 , F24F11/56 , F24F11/58 , F24F11/62 , F24F11/63 , F24F11/70 , F24F2011/0035 , F24F2011/0036 , F24F2011/0047 , F24F2011/0061 , F24F2011/0068 , F24F2011/0071 , F24F2011/0075 , F24F2011/0091 , F24F2011/0094 , F24F2110/00 , F24F2110/10 , F24F2120/10 , F24F2120/12 , F24F2120/14 , F24F2140/60 , G01J5/0025 , G01J5/041 , G01K1/02 , G01R31/26 , G05B15/02 , G05D23/19 , G05D23/1902 , G05D23/1919 , G05D23/1932 , G05D23/24 , G05D23/2454 , G05D23/27 , G05D23/275 , G06F1/3231 , G06F1/3265 , G06F3/011 , G06F3/02 , G06F3/0304 , G06F3/0362 , G06F3/042 , G06F3/0482 , G06F3/04842 , G06F3/0487 , G06F3/167 , G06N99/005 , H01H25/06 , H04L67/10 , Y02B60/50 , Y02T10/88
摘要： Asmart-home device comprises a user interface including an electronic display having a first display mode and a second display mode, the first display mode generally requiring more power than said second display mode. The device further comprises a processing system coupled to the user interface. The processing system is configured to be in operative communication with one or more environmental sensors for determining at least one environmental condition, and in operative communication with one or more input devices including said user interface. The device further comprises at least one sensor configured to detect a physical closeness of a user to the at least one sensor. The at least one sensor is in operative communication with the processing system. The processing system is configured to cause the electronic display to be in the first display mode when a closeness threshold has been exceeded. The processing system is further configured to automatically adjust said closeness threshold based at least in part on a historical plurality of physical closeness events as detected by the at least one sensor.
摘要翻译：智能家居设备包括包括具有第一显示模式和第二显示模式的电子显示器的用户界面，所述第一显示模式通常需要比所述第二显示模式更多的功率。该设备还包括耦合到用户界面的处理系统。处理系统被配置为与一个或多个环境传感器进行操作性通信，用于确定至少一个环境条件，并且与包括所述用户界面的一个或多个输入设备进行操作性通信。该装置还包括至少一个传感器，其配置成检测使用者与至少一个传感器的物理接近度。所述至少一个传感器与所述处理系统操作性地通信。处理系统被配置为当已经超过了接近阈值时使电子显示器处于第一显示模式。处理系统还被配置为至少部分地基于至少一个传感器检测的历史多个物理接近事件来自动调整所述接近阈值。

10. 发明公开

EP2980838A1 PROBE DEVICE 审中-公开
标题翻译：探针设备
公开(公告)号：EP2980838A1
公开(公告)日：2016-02-03
申请号：EP14774764.6
申请日：2014-03-18
申请人： Tokyo Electron Limited
发明人： SHINOHARA, Eiichi , NAGASAKA, Munetoshi , TAOKA, Ken , KATO, Yoshiyasu
IPC分类号： H01L21/66
CPC分类号： G01R31/26 , G01R1/07314 , G01R1/07342 , G01R1/07378 , G01R3/00 , G01R31/2886 , G01R31/2887
摘要： A probe device includes an electrode plate arranged above a mounting table for mounting thereon a semiconductor wafer and electrically connected to a tester, a contact probe arranged at a side of the mounting table and electrically connected to a mounting table electrode of the mounting table. The contact probe includes a contact portion, having a top surface formed unenven, to be in contact with the electrode plate, and a cable connection portion formed as one unit with the contact portion. The contact portion and the cable connection portion are vertically movable by a biasing member provided below the cable connection portion. When the probes are made contact with electrodes of a semiconductor device of the semiconductor wafer by moving up the mounting table, the contact portion and the electrode plate are made contact with each other and the backside electrode and the tester are electrically connected to each other.
摘要翻译：本发明提供一种探针装置，其包括：配置在载置台上的电极板，其用于载置半导体晶片并与测试器电连接;接触探针，其配置在载置台的一侧，与载置台的载置台电极电连接。接触探针包括接触部分和电缆连接部分，所述接触部分具有未形成的顶部表面，所述接触部分与所述电极板接触，所述电缆连接部分与所述接触部分形成为一个单元。接触部分和电缆连接部分通过设置在电缆连接部分下方的偏置构件可垂直移动。当通过向上移动安装台使探针与半导体晶片的半导体器件的电极接触时，接触部分和电极板彼此接触，并且背侧电极和测试器彼此电连接。

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