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1. 发明公开

EP3346280A1 IC TEST SYSTEM 有权转让
公开(公告)号：EP3346280A1
公开(公告)日：2018-07-11
申请号：EP15902966.9
申请日：2015-08-31
申请人： Happyjapan, Inc.
发明人： MATSUMOTO, Shouhei , HASEBE, Shinichi , KOIZUMI, Mitsuo , ARAI, Yoshinori , YOKOO, Masayoshi , HARADA, Keitaro
IPC分类号： G01R31/26
CPC分类号： G01R31/2887 , G01R1/0433 , G01R31/26 , G01R31/2893
摘要： An IC device 4 of the present invention includes a robot arm 6 for conveying IC devices D to a test head 2 for testing the IC devices. The test head 2 includes sockets 3 having placement surfaces 3a onto which the IC devices D are placed and for attaching the IC devices placed on the placement surfaces to the test head. The robot arm 6 includes a contact head 61 for holding the IC devices while the IC devices are conveyed and for pressing the IC devices onto the test head during testing, and a non-contact displacement meter 71 that moves in association with the movement of the contact head 61. The non-contact displacement meter 71 is mounted on the robot arm 6 so as to measure a distance by emitting a beam in a direction perpendicular to the placement surfaces 3a.

2. 发明授权

EP3039438B1 DÉTECTION D'UN ARC ÉLECTRIQUE EN PARALLÈLE SUR LES BORNES PRINCIPALES D'UNE INSTALLATION PHOTOVOLTAÏQUE 有权
标题翻译：在光伏安装主端子上检测并联电弧
公开(公告)号：EP3039438B1
公开(公告)日：2018-05-16
申请号：EP14755692.2
申请日：2014-08-27
申请人： Commissariat à l'Énergie Atomique et aux Énergies Alternatives
发明人： CHAINTREUIL, Nicolas , PLISSONNIER, Alexandre
IPC分类号： G01R31/40
CPC分类号： H02S50/10 , G01R31/26 , H02S50/00

3. 发明公开

EP2778696A3 Direct injection phase change temperature control system 无效转让
标题翻译：直接注入相变温度控制系统
公开(公告)号：EP2778696A3
公开(公告)日：2017-05-10
申请号：EP14160006.4
申请日：2014-03-14
申请人： Sensata Technologies, Inc.
发明人： Lopez, Christopher A. , Lemczyk, Thomas F. , Davis, Rick A.
IPC分类号： G01R31/28 , F28D15/02 , H05K7/20 , H01L23/427
CPC分类号： G01R31/26 , F28D15/02 , G01R31/2874 , H01L2924/0002 , H01L2924/00
摘要： A thermal control unit (TCU) for controlling temperature of a device under test (DUT) includes a sealed evaporation chamber disposed therein, the evaporation chamber configured with a refrigerant inlet and a refrigerant outlet; and at least one surface for thermal engagement of the device under test and configured to conduct heat to the evaporation chamber. A test system and a computer program product are disclosed.
摘要翻译：用于控制被测器件（DUT）的温度的热控制单元（TCU）包括设置在其中的密封蒸发室，所述蒸发室配置有制冷剂入口和制冷剂出口; 以及至少一个表面，用于被测器件的热接合并被配置为将热量传导至蒸发室。公开了一种测试系统和一种计算机程序产品。

4. 发明公开

EP3153852A1 INSPECTION DEVICE AND METHOD FOR DISPOSING MAGNETO-OPTICAL CRYSTAL 有权
标题翻译： INSPEKTIONSVORRICHTUNG UND VERFAHREN ZUR ENTSORGUNG VON MAGNETO-OPTISCHEN KRISTALLEN
公开(公告)号：EP3153852A1
公开(公告)日：2017-04-12
申请号：EP15803950.3
申请日：2015-06-02
申请人： Hamamatsu Photonics K.K.
发明人： NAKAMURA Tomonori
IPC分类号： G01N27/72 , G01R31/26 , G01R31/28 , G01R33/032 , H01L21/66
CPC分类号： G01N27/72 , G01R31/26 , G01R31/2601 , G01R31/28 , G01R31/308 , G01R33/032
摘要： An inspection device according to an aspect of the present invention includes a light source configured to output light, an MO crystal disposed to face a semiconductor device (D), an object lens configured to concentrate the light output from the light source onto the MO crystal, a holder configured to hold the MO crystal, a flexible member interposed between the MO crystal and the holder, and an object lens drive unit configured to cause the MO crystal to contact the semiconductor device (D) by causing the holder to be moved in the optical axis direction of the object lens, wherein, when the MO crystal contacts the semiconductor device (D), the flexible member is bent, so that an incident plane is inclined in a range in which an inclination angle of the incident plane of the light in the MO crystal with respect to a plane orthogonal to the optical axis is less than or equal to an aperture angle of the object lens.
摘要翻译：根据本发明的一个方面的检查装置包括被配置为输出光的光源，设置成面向半导体器件（D）的MO晶体，被配置为将从光源输出的光集中到MO晶体上的物镜，配置成保持MO晶体的保持器，插入在MO晶体和保持器之间的柔性构件和被配置为通过使保持器移动而使MO晶体接触半导体器件（D）的物镜驱动单元物镜的光轴方向，其中，当MO晶体与半导体器件（D）接触时，柔性构件弯曲，使得入射面倾斜于入射面的入射面的倾斜角度 MO晶体相对于与光轴正交的平面的光小于或等于物镜的孔径角。

5. 发明公开

EP3091658A1 SOLAR CELL TESTING APPARATUS AND SOLAR CELL TESTING METHOD 有权
标题翻译： SOLARZELLENPRÜFVORRICHTUNGSOLARZELLENPRÜFVERFAHREN
公开(公告)号：EP3091658A1
公开(公告)日：2016-11-09
申请号：EP16167898.2
申请日：2016-05-02
申请人： Hioki Denki Kabushiki Kaisha
发明人： HIGUCHI, Masao , TOKUTAKE, Fumio
IPC分类号： H02S50/00
CPC分类号： H02S50/10 , G01N21/88 , G01R31/26 , G01R31/28 , H02S50/00
摘要： A solar cell testing apparatus tests bypass diodes in a solar cell string, which is constructed of solar cell modules including solar cells and the bypass diodes, for open-position failures and includes: a unidirectional element connected between positive and negative electrodes of the solar cell string so as to permit passage of the current outputted when the solar cells generate power; a voltage applier that applies a test voltage, which exceeds a sum of forward direction voltages of the bypass diodes and sets the negative electrode potential higher than the positive electrode potential, across the positive and negative electrodes; a current detector that detects a current flowing in the solar cell string; and a processor that tests for open-position failures by comparing currents detected before and after application of the test voltage with the unidirectional element connected between the electrodes of the solar cell string.
摘要翻译：太阳能电池测试装置测试太阳能电池串中的旁路二极管，太阳能电池串由包括太阳能电池和旁路二极管的太阳能电池模块构成，用于开放位置故障，包括：连接在太阳能电池的正极和负极之间的单向元件以便当太阳能电池发电时能够通过输出的电流; 电压施加器，其施加超过所述旁路二极管的正向电压之和并且将所述负极电位设定为高于所述正极电位的测试电压，跨越所述正极和负极; 电流检测器，其检测在太阳能电池串中流动的电流; 以及通过比较在施加测试电压之前和之后检测到的电流与连接在太阳能电池串的电极之间的单向元件来测试开放位置故障的处理器。

6. 发明公开

EP2920704A4 AUTOMATIC DETERMINATION OF DEVICE SPECIFIC INTEROPERABILITY 审中-公开
标题翻译：自动化设备BESTIMMUNG EINER VORRICHTUNGSSPEZIFISCHENINTEROPERABILITÄT
公开(公告)号：EP2920704A4
公开(公告)日：2016-07-27
申请号：EP13798496
申请日：2013-11-14
申请人： MICROSOFT TECHNOLOGY LICENSING LLC
发明人： PAI VASUDEVA N , LOVITT ANDREW W , FARMER JASON R , DINKLOCKER TED E
IPC分类号： G06F15/16 , G06F11/22 , G06F17/00
CPC分类号： G06F11/26 , G01R31/00 , G01R31/26 , G01R31/27 , G06F11/2289 , G06F11/2294 , G06F17/40 , G06F19/00
摘要： Device specific interoperability is provided automatically utilizing remote service and/or cloud computing. Functionality of devices like mobile phones is tested to ensure that the device is properly configured to work with infotainment systems by using the phone to connect with the cloud services.
摘要翻译：使用远程服务和/或云计算自动提供设备特定的互操作性。测试了手机等功能，确保设备正确配置，使用手机与信息娱乐系统连接云服务。

7. 发明公开

EP3017546A1 MONOLITHIC INTEGRATED CIRCUIT DIE HAVING MODULAR DIE REGIONS STITCHED TOGETHER 有权
标题翻译： IC-CHIP MIT MODULAREN，ZUSAMMENGEHEFTETEN CHIPREGIONEN
公开(公告)号：EP3017546A1
公开(公告)日：2016-05-11
申请号：EP14724269.7
申请日：2014-04-09
申请人： Xilinx, Inc.
发明人： CAMAROTA, Rafael, C.
IPC分类号： H03K19/177 , G01R31/3185 , G01R31/317
CPC分类号： G01R31/26 , G01R31/31721 , G01R31/31723 , G01R31/318505 , G01R31/318516 , H03K19/17728 , H03K19/1774 , H03K19/17772 , H03K19/17788
摘要： An apparatus for a monolithic integrated circuit die is disclosed. In this apparatus, the monolithic integrated circuit die has a plurality of modular die regions. The modular die regions respectively have a plurality of power distribution networks for independently powering each of the modular die regions. Each adjacent pair of the modular die regions is stitched together with a respective plurality of metal lines.
摘要翻译：公开了一种用于单片集成电路管芯的装置。在该装置中，单体集成电路管芯具有多个模块管芯区域。模块化管芯区域分别具有多个配电网络，用于独立为每个模块管芯区域供电。每个相邻的一对模块区域与相应的多个金属线缝合在一起。

8. 发明公开

EP2789060A4 EDGE-EMITTING ETCHED-FACET LASERS 有权转让
标题翻译： KANTENEMITTIERENDE蚀刻面激光器
公开(公告)号：EP2789060A4
公开(公告)日：2015-11-11
申请号：EP12855851
申请日：2012-12-03
申请人： BINOPTICS CORP
发明人： BEHFAR ALEX A , GREEN MALCOLM R , STAGARESCU CRISTIAN
IPC分类号： H01S5/00 , G01R31/26 , H01S5/02 , H01S5/028 , H01S5/22
CPC分类号： H01S5/0014 , G01R31/26 , G01R31/2635 , H01S5/0042 , H01S5/0201 , H01S5/0203 , H01S5/028 , H01S5/0287 , H01S5/1014 , H01S5/12 , H01S5/20 , H01S5/22 , H01S5/223 , H01S5/34306 , H01S5/34313 , H01S5/34333
摘要： A laser chip having a substrate, an epitaxial structure on the substrate, the epitaxial structure including an active region and the active region generating light, a waveguide formed in the epitaxial structure extending in a first direction, the waveguide having a front etched facet and a back etched facet that define an edge-emitting laser, and a first recessed region formed in said epitaxial structure, the first recessed region being arranged at a distance from the waveguide and having an opening adjacent to the back etched facet, the first recessed region facilitating testing of an adjacent laser chip prior to singulation of the laser chip.

9. 发明公开

EP2811536A4 SOLAR POWER GENERATION SYSTEM AND FAILURE DETECTION METHOD 审中-公开
标题翻译：太阳能发电系统和故障检测及其方法
公开(公告)号：EP2811536A4
公开(公告)日：2015-08-26
申请号：EP13744026
申请日：2013-01-30
申请人： JX NIPPON OIL & ENERGY CORP
发明人： YOSHIDOMI MASANOBU , ISHII TAKAFUMI
IPC分类号： H01L31/042 , H01L31/04
CPC分类号： H02S50/00 , G01R31/26 , H01L31/02021 , H01L31/044 , H02S50/10 , Y02B10/12 , Y02E10/50

10. 发明授权

EP2795353B1 VERFAHREN UND VORRICHTUNG ZUR INDUSTRIELLEN VERDRAHTUNG UND ENDPRÜFUNG VON PHOTOVOLTAISCHEN KONZENTRATORMODULEN 有权转让
标题翻译：方法和装置工业布线和聚光光伏测试
公开(公告)号：EP2795353B1
公开(公告)日：2015-08-12
申请号：EP12812824.6
申请日：2012-12-06
申请人： Grenzebach Maschinenbau GmbH , Soitec Solar GmbH
发明人： SCHMID, Markus , FEINEIS, Alexander
IPC分类号： G01R31/40
CPC分类号： H02S50/10 , F21S8/006 , G01R31/26 , H01L31/042 , H01L31/0504 , H01L31/0543 , H01L31/188 , H02S30/10 , H02S50/00 , Y02E10/52 , Y02P80/25

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