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    • 55. 发明公开
    • Semiconductor memory device and method of operation
    • 半导体存储器件和操作方法
    • EP1024498A3
    • 2002-05-08
    • EP00106044.1
    • 1991-08-02
    • Hitachi, Ltd.
    • Saito, RyuichiKobayashi, YutakaOnose, HidekatsuOhue, Michio
    • G11C11/22
    • H01L27/11502G11C8/14G11C11/22G11C11/5657G11C16/08H01L27/10805
    • A semiconductor memory device has a plurality of memory cells (351,352,353,354) in an array, into which the memory cells (351,352,353,354) data is writable, and which can subsequently be read. Each memory cell has a switching element (111) with one terminal connected to a bit line (120) of the array another terminal connected to at least one ferroelectric capacitor (112,113,114,115), and a control terminal connected to a word line (121). The cell may then be operated to detect the change in polarization of the ferroelectric capacitor when a voltage is applied which is not sufficient to cause a change of state of the ferroelectric capacitor. Alternatively, a ferroelectric capacitor (427) and a capacitor (428) other than a ferroelectric capacitor is connected to the switching element. In a further alternative, a plurality (112,113,114,115) of ferroelectric capacitors are connected to the switching element, so that different data are writable into each.
    • 半导体存储器件具有阵列中的多个存储器单元(351,352,353,354),存储器单元(351,352,353,354)中的数据是可写的,并且随后可被读取。 每个存储器单元具有开关元件(111),其一端连接到阵列的位线(120),另一端连接到至少一个铁电电容器(112,113,114,115),并且控制端连接到字线(121)。 然后可以操作该单元以检测当施加不足以引起铁电电容器的状态变化的电压时铁电电容器的极化变化。 或者,在开关元件上连接强电介质电容器(427)和铁电电容器以外的电容器(428)。 在进一步的替代方案中,多个(112,113,114,115)铁电电容器连接到开关元件,使得不同的数据可写入每个中。