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111. 发明公开

EP2685242A4 VISION TESTING DEVICE WITH ENHANCED IMAGE CLARITY 有权
标题翻译：具有改进的图像清晰感知测试设备
公开(公告)号：EP2685242A4
公开(公告)日：2014-09-10
申请号：EP12755116
申请日：2012-03-08
申请人： MER SKILFUL FEAT CO LTD
发明人： PARK CHAN WHA , OH SANG MIN , KIM SUNG HYUN , KOO JA MYOUNG
IPC分类号： G01N21/88 , G01B11/25
CPC分类号： G06T7/0004 , G01B11/0608 , G01B11/2513 , G01N21/95684 , G01N2021/95638 , G06T2207/30141

112. 发明公开

EP2549435A1 Segmentation of a depth maps of printed circuit boards 有权
标题翻译： Segmentierung einer Tiefenkarte einer Platine
公开(公告)号：EP2549435A1
公开(公告)日：2013-01-23
申请号：EP12188510.7
申请日：2010-02-18
申请人： Omron Corporation
发明人： Hazeyama, Hiroyuki , Taniyasu, Yuki , Fujieda, Shiro
IPC分类号： G06T7/00
CPC分类号： G06T7/11 , G06T2200/24 , G06T2207/10021 , G06T2207/20092 , G06T2207/30141
摘要： An image processing apparatus (1), comprising a height input portion (18) for inputting height information; a setting portion for setting data for image processing in a setting mode; and a driving processing portion for receiving and processing an input image based on the data preliminarily set. The setting portion comprises a set-image display portion for displaying a first image of an object, a threshold-value reception portion (6) for receiving threshold-value data about a specified height range, and a first detection portion for detecting, from the first image, a first partial image having only height information specified by said threshold-value data. The driving processing portion comprises a driving-image display portion for receiving and displaying a second image of the object in the driving mode, and a second detection portion for detecting, from the second image, a second partial image having only height information specified by the threshold-value data, based on the height information input by the height input portion (18) in the driving mode.
摘要翻译：一种图像处理装置（1），包括用于输入高度信息的高度输入部分（18）用于在设定模式下设定用于图像处理的数据的设定部分; 以及驱动处理部分，用于基于预先设置的数据接收和处理输入图像。设置部分包括用于显示对象的第一图像的设置图像显示部分，用于接收关于指定高度范围的阈值数据的阈值接收部分（6），以及用于从第一图像，仅具有由所述阈值数据指定的高度信息的第一部分图像。驱动处理部分包括用于在驱动模式中接收和显示对象的第二图像的驱动图像显示部分和用于从第二图像检测仅具有由第二图像指定的高度信息的第二部分图像的第二检测部分基于由驾驶模式中的高度输入部（18）输入的高度信息，设定阈值数据。

113. 发明公开

EP2543483A1 Information processing apparatus and information processing method 有权
标题翻译：信息处理装置和信息处理方法
公开(公告)号：EP2543483A1
公开(公告)日：2013-01-09
申请号：EP12175355.2
申请日：2012-07-06
申请人： CANON KABUSHIKI KAISHA
发明人： Tateno, Keisuke , Uchiyama, Shinji
IPC分类号： B25J19/02 , G01B5/008 , G01B11/00 , G06T7/00
CPC分类号： G01B11/002 , B25J9/1697 , G05B2219/37425 , G05B2219/40548 , G06T7/75 , G06T2207/10028 , G06T2207/30141 , G06T2207/30148
摘要： An information processing apparatus (1) which estimates a three-dimensional position-and-orientation of a measuring object (50) using an imaging apparatus (20;30) capable of capturing a two-dimensional image and a range image, includes a data storing unit (110) configured to store verification data for estimating a position-and-orientation of a measuring object, a two-dimensional image input unit (120) configured to input a two-dimensional image captured by the imaging apparatus (20;30) in a first position-and-orientation, a range image input unit (130) configured to input a range image captured by the imaging apparatus (20;30) in a second position-and-orientation, a position-and-orientation information input unit (150) configured to acquire position-and-orientation difference information which is relative position-and-orientation information in the first position-and-orientation and the second position-and-orientation, and a calculation unit (160) configured to calculate, based on the position-and-orientation difference information, a position-and-orientation of the measuring object so that the verification data for estimating the position-and-orientation matches the two-dimensional image and the range image.
摘要翻译：一种使用能够拍摄二维图像和距离图像的成像设备（20; 30）来估计测量对象（50）的三维位置和姿势的信息处理设备（1）包括数据存储单元，被配置为存储用于估计测量对象的位置和姿势的验证数据;二维图像输入单元，被配置为输入由所述成像设备拍摄的二维图像; ）的位置和姿势;距离图像输入单元（130），其被配置为输入由成像设备（20; 30）以第二姿势和姿势拍摄的距离图像;位置和姿势信息输入单元（150），其被配置为获取作为第一姿势和第二姿势和姿势的相对姿势和姿势信息的姿势和姿势差异信息;以及计算单元（160），其被配置为：计算，基于位置和姿势差异信息，测量对象的位置和姿势，使得用于估计位置和姿势的验证数据与二维图像和距离图像匹配。

114. 发明公开

EP2415021A1 VERFAHREN UND VORRICHTUNG FÜR DIE AUSRICHTUNG VON SUBSTRATEN 有权
标题翻译：方法和装置基板的对齐
公开(公告)号：EP2415021A1
公开(公告)日：2012-02-08
申请号：EP10718508.4
申请日：2010-04-06
申请人： Singulus Technologies AG
发明人： RÜTH, Edgar , BECKER, Wolfgang , FILIPOVIC, Marjan , ROHRMANN, Reiner
IPC分类号： G06T7/00 , H05K13/04
CPC分类号： H05K13/0413 , G06T7/73 , G06T2207/30141 , G06T2207/30148 , H05K13/0061
摘要： The invention relates to a method and a device for aligning substrates (2) in an X-Y plane. A polygonal, flat substrate (2), the substrate plane of which is parallel to the X-Y plane or lies in the X-Y plane, is aligned with respect to reference coordinates and a reference angular position. A corner (12) of the substrate (2) is detected using an image recording device (9). In addition, the position coordinates of the substrate (2) are determined. Using an evaluating device (10), the angular position of the corner (12) of the substrate (2) in the X-Y plane is determined, and the position differences between the reference coordinates and the position coordinates and the angle difference between the reference angular position and the angular position of the substrate corner (12) are calculated. The substrate (2) is moved and/or rotated in the X-Y plane according to the determined position difference or the angle difference. By rotating the substrate (2) several times, each corner (12) and edge (13, 14) of the substrate (2) can be detected using the image recording device (9). This enables an edge inspection during the substrate transport so that additional process steps such as laying the substrate (2) down and picking the substrate back up can be omitted.

115. 发明公开

EP2387000A1 Image measuring apparatus, program, and teaching method of image measuring apparatus 有权转让
标题翻译：的图像测量装置的图像测量设备，程序和方法的教学
公开(公告)号：EP2387000A1
公开(公告)日：2011-11-16
申请号：EP11165287.1
申请日：2011-05-09
申请人： Mitutoyo Corporation
发明人： Kojima, Tsukasa , Ariga, Kozo , Miyakura, Jyota
IPC分类号： G06T7/00
CPC分类号： G06T7/13 , G06T2207/30141 , G06T2207/30164
摘要： A data memory 13 storing Gerber data containing closed area information of a work; a display 4 displaying a pattern image based on the closed area information of the Gerber data; a detection specification information display means 133 displaying on the display 4 a detection tool specifying a location of edge to be detected, a detection direction and detection length, by superimposing on the pattern image; an image capturing means 134 and an image capturer 3 capturing an image of an area corresponding to the detection tool of the work; an edge detection means 141 performing an edge detection of the location of the edge to be detected with respect to data of a captured image; and a condition determination means 140 determining a light-dark change condition indicating whether an image is changing from a light section to a dark section or from a dark section to a light section along a detection direction.

116. 发明公开

EP1638050A3 Substrate inspection method and apparatus 失效
标题翻译： Verfahren undGerätzur Substratkontrolle
公开(公告)号：EP1638050A3
公开(公告)日：2010-07-21
申请号：EP05019260.8
申请日：2005-09-05
申请人： OMRON CORPORATION
发明人： Murakami, Kiyoshi Omron Corp. , 801 , Asano, Yasunori Omron Corp. , 801 , Kinoshita, Takashi Omron Corp. , 801 , Yotsuya, Teruhisa 708, Cosmotoday
IPC分类号： G06T7/00
CPC分类号： G06T7/0008 , G06T7/001 , G06T7/74 , G06T2207/30141
摘要： Preparation steps are taken before a substrate with components is inspected and a whole image of a standard substrate is prepared preliminarily and inspection areas are determined for target portions to be inspected on this whole image. At the time of the inspection, a camera is positioned corresponding to a target portion to obtain a target image and an area corresponding to the target image is extracted from the whole image and displacement values of this area are calculated relative to the target image. The setting position of the inspection area is corrected by the calculated displacement values and an inspection area is set on the target image based on the corrected coordinates.
摘要翻译：在检查具有部件的基板之前进行准备步骤，并且准备准备标准基板的整体图像，并且在整个图像上确定要检查的目标部分的检查区域。在检查时，相机对应于目标部分定位以获得目标图像，并且从整个图像中提取与目标图像相对应的区域，并且相对于目标图像计算该区域的位移值。通过计算的位移值来校正检查区域的设置位置，并且基于校正的坐标在目标图像上设置检查区域。

117. 发明公开

EP2175234A1 Method of measuring a three-dimensional shape 有权
标题翻译：一种用于测量三维形状的方法
公开(公告)号：EP2175234A1
公开(公告)日：2010-04-14
申请号：EP09172740.4
申请日：2009-10-12
申请人： Koh Young Technology Inc.
发明人： Kim, Min-Young , Hwang, Bong-Ha
IPC分类号： G01B11/25 , G01N21/95 , H01L21/66
CPC分类号： G06K9/00 , G01B11/2513 , G01B11/254 , G01B11/28 , G01N21/95607 , G06T7/001 , G06T7/33 , G06T7/60 , G06T2207/10028 , G06T2207/30141 , H05K1/0269
摘要： In order to measure a three-dimensional shape, feature information is read from a database. A board is transferred to a measurement position. A measurement head is transferred to an inspection area of the board. Light of a first lighting device for three-dimensional measurement and light of a second lighting device for two-dimensional measurement is illuminated onto the inspection area to photograph a first reflection image and a second reflection image that are reflected from the inspection area. The inspection area is realigned by comparing the feature information with at least one of the photographed first and second reflection images to inspect distortion of the inspection area. The realigned inspection area is inspected. Thus, the three-dimensional shape may be precisely measured.

118. 发明授权

EP1736758B1 Board inspecting apparatus, its parameter setting method and parameter setting apparatus 失效
标题翻译：装置，用于检查印刷电路板，用于处理参数设定装置用于设定参数和
公开(公告)号：EP1736758B1
公开(公告)日：2010-01-13
申请号：EP06115773.1
申请日：2006-06-21
申请人： OMRON CORPORATION
发明人： Moriya, Toshihiro c/o OMRON Corporation , Nakajima, Akira c/o OMRON Corporation , Shimizu, Atsushi c/o OMRON Corporation , Onishi, Takako c/o OMRON Corporation , Wada, Hirotaka c/o OMRON Corporation
IPC分类号： G01N21/956 , G06T7/00
CPC分类号： G01N21/8851 , G01N21/95684 , G06T7/0004 , G06T2207/30141

119. 发明授权

EP1849136B1 PROCEDE DE DETECTION DE DEFAUTS DE MONTAGE D'UN COMPOSANT SUR UNE CARTE ELECTRONIQUE. 有权
标题翻译：检测方法的在组件的安装缺陷的一个电子板
公开(公告)号：EP1849136B1
公开(公告)日：2008-11-19
申请号：EP06709321.1
申请日：2006-02-15
申请人： VIT
发明人： STABILE, Marc , BOUCHEZ, Laetitia
IPC分类号： G06T7/00
CPC分类号： G06T7/001 , G06T2207/30141
摘要： The invention relates to a method for detecting defects in the mounting of a component on an electronic map, said method comprising the following steps: the component is illuminated and parts of the component to be controlled are visualised by means of a sensor providing a digital image by points in the form of a matrix of levels of luminosity of the points; component parts are established, according to a pre-determined direction, of the measuring profiles obtained by allocating reference values to successive points in the pre-determined direction; a reference profile is established by allocating reference values equal to an average of the measuring values of a series of component parts to be controlled to successive points in the pre-determined direction; a comparison is carried out between each measuring profile and the reference profile according to a characteristic in relation to the reference profile; and a defect assessment is carried out according to said comparison.

120. 发明公开

EP1653407A3 Method of filtering an image for high precision machine vision metrology 审中-公开
标题翻译：图像滤波的高精度机器视觉测量的方法
公开(公告)号：EP1653407A3
公开(公告)日：2008-09-03
申请号：EP05019425.7
申请日：2005-09-07
申请人： Mitutoyo Corporation
发明人： Venkatachalam, Vidya
IPC分类号： G06T5/30 , G06T7/00
CPC分类号： G06T5/30 , G06T5/005 , G06T2200/24 , G06T2207/30141 , G06T2207/30164
摘要： A structured morphology filtering method is disclosed for filtering an image for high precision machine vision metrology using specifically-determined structuring elements to precisely preserve the location of specific features in the filtered image. A selected structuring element shape generally exhibits geometric similarity with at least a portion of the feature to be preserved in the filtered image. The structuring element may be oriented to corresponds to the orientation of the feature to be inspected. For example, for a linear feature to be inspected, the optimal structuring element is a line or narrow rectangle at the same orientation, while for images of circles, it is a circle. The orientation of the structuring element may be determined or adjusted automatically during a set of automatic inspection operations, based on an automatic determination of the orientation of the feature to be inspected.

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