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1. 发明授权

EP2533055B1 Dual probing tip system 审中-公开
公开(公告)号：EP2533055B1
公开(公告)日：2018-12-26
申请号：EP12171512.2
申请日：2012-06-11
申请人： Tektronix, Inc.
发明人： Spinar, James E. , Lynn, Richard R.
IPC分类号： G01R1/067 , G01R1/073
CPC分类号： G01R1/06788 , G01R1/06705 , G01R1/07364 , G01R1/07392
摘要： A dual probing tip system uses a slot and rail system to provide variable spacing and lateral and axial compliance of the probing tips mounted on first and second support members. A movable base member is secured on a frame with the base member having a rack of linear teeth and a pair of rails angled toward the front. First and second intermediate carriers each have a slot that engages one of the angled rails. Each of the carriers has stanchions that receive a thumb wheel pinion gear mounted on a shaft. The pinion gear mates with the teeth on the base member for movement of the carriers. Each support member has an axial slot that mated with an axial slot on each one of the carriers. Each support member has a compression spring which allows axial compliance of the support members.

2. 发明公开

EP2463667A2 Flexible probe 审中-公开
标题翻译：灵活探头
公开(公告)号：EP2463667A2
公开(公告)日：2012-06-13
申请号：EP12154496.9
申请日：2005-06-21
申请人： Capres A/S
发明人： Nielsen, Folmer , Petersen, Peter R.E. , Hansen, Jesper Erdman
IPC分类号： G01R1/067 , G01R1/073 , G01R3/00 , G01R31/28 , G01C17/28
CPC分类号： G01R1/07392 , G01R1/06727 , G01R3/00 , G01R31/2887 , Y10T29/49204 , Y10T29/49222
摘要： A probe for testing electric properties on a specific location of a test sample, comprises a supporting body defining opposite first and second parts constituting a flexible cantilever part being flexible in one direction and a base part, respectively. The cantilever part defines an outer planar surface substantially perpendicular to the one direction, the base part being adapted for being fixated in a co-operating testing machine The probe further comprises at least one conductive probe arm in the cantilever part being positioned opposite the base part. The cantilever part defines opposite first and second regions, the second region being in contact with the base part, the first region defining first and second side surfaces, each of the first and second side surfaces defining a first angle with the outer planar surface, a first width defined between the first and the second side surfaces, the second region defining third and fourth side surfaces, each of the third and fourth side surfaces defining a second angle with the outer planar surface, a second width defined between the third and the fourth side surfaces, and the second width being equal to and/or smaller than the first width.
摘要翻译：用于测试在测试样品的特定位置上的电性能的探针包括支撑体，其分别形成相对的第一和第二部分，构成在一个方向上柔性的柔性悬臂部分和基部。所述悬臂部分限定基本上垂直于所述一个方向的外平面表面，所述基部适于固定在协同操作的测试机中。所述探针还包括所述悬臂部分中的与所述基部相对定位的至少一个导电探针臂。所述悬臂部分限定相对的第一和第二区域，所述第二区域与所述基部接触，所述第一区域限定第一和第二侧表面，所述第一和第二侧表面中的每一个与所述外平面表面形成第一角度，限定在所述第一和第二侧表面之间的第一宽度，所述第二区域限定第三和第四侧表面，所述第三和第四侧表面中的每一个与所述外平坦表面限定第二角度，第二宽度限定在所述第三和第四侧表面之间并且第二宽度等于和/或小于第一宽度。

3. 发明公开

EP1686387A1 A method and an apparatus for testing electrical properties 审中-公开
标题翻译： Verfahren und Vorrichtung zurPrüfungvon elektrischen Eigenschaften。
公开(公告)号：EP1686387A1
公开(公告)日：2006-08-02
申请号：EP05388003.5
申请日：2005-01-27
申请人： Capres A/S
发明人： Nielsen, Peter Folmer
IPC分类号： G01R31/28 , G01R1/073
CPC分类号： G01R31/2887 , G01R1/07392
摘要： A method for testing electrical properties comprises providing a test sample defining a first surface, an area defined on the first surface, providing a first test probe comprising a first plurality of probe arms each including at least one electrode for contacting a respective location on the test sample and a second test probe comprising at least one probe arm including at least one electrode for contacting a location on the test sample. The method further comprises providing a test apparatus including a first and a second holder for receiving the first and the second test probes respectively, each of the holders comprising positioning devices for positioning and/or relocating each of the holders in three dimensions, the test apparatus being electrically connected to each of the electrodes of the first test probe and to the at least one electrode of the second test probe, the test apparatus further comprising a sample holder for receiving and holding the test sample in a specific orientation relative to the first and the second test probe. Still further the method comprises positioning the electrodes of the probe arms of the first test probe in contact with the area, positioning the at least one electrode of the at least one probe arm of the second test probe in contact with the area at a location remote from the first test probe, transmitting a test signal from at least one of the electrodes of the first test probe, or, in the alternative from the at least one electrode of the second test probe, and detecting the test signal transmission between the first and the second test probe.
摘要翻译：一种用于测试电气特性的方法包括提供限定第一表面的测试样品，在第一表面上限定的区域，提供包括第一多个探针臂的第一测试探针，每个探针臂包括用于接触测试中相应位置的至少一个电极样品和第二测试探针，其包括至少一个探针臂，所述探针臂包括用于接触测试样品上的位置的至少一个电极。该方法还包括提供一种测试装置，包括分别用于接收第一和第二测试探针的第一和第二保持器，每个保持器包括用于在三个维度上定位和/或重新定位每个保持器的定位装置，测试装置电连接到第一测试探针的每个电极和第二测试探针的至少一个电极，测试装置还包括用于相对于第一测试探针以特定取向接收和保持测试样本的样本保持器，第二个测试探针。此外，该方法包括将第一测试探针的探针臂的电极定位成与该区域接触，将第二测试探针的至少一个探针臂的至少一个电极定位在远程位置处的区域从所述第一测试探针传输来自所述第一测试探针的至少一个电极的测试信号，或者可选地，从所述第二测试探针的所述至少一个电极中检测所述第一和第二测试探针之间的测试信号传输，第二个测试探针。

4. 发明授权

EP1451594B1 PRÜFSONDE FÜR EINEN FINGERTESTER UND FINGERTESTER 有权
标题翻译：用探头指状测试和手指测试仪
公开(公告)号：EP1451594B1
公开(公告)日：2005-09-28
申请号：EP02792764.9
申请日：2002-11-14
申请人： atg test systems GmbH & Co. KG
发明人： ROMANOV, Viktor
IPC分类号： G01R1/067
CPC分类号： G01R1/06705 , G01R1/067 , G01R1/06711 , G01R1/06716 , G01R1/0675 , G01R1/07392 , G01R31/2805
摘要： The invention relates to a test probe (1) for a finger tester for testing bare printed circuit boards. Said test probe comprises a test needle (2) which can be brought into contact with a test point of a printed circuit board by means of a test tip (5), and is pivotally fixed to a holding element (10) by means of at least two holding arms (6, 7, 8, 9). The invention is characterised in that at least one of said holding arms consists of an electroconductive material and is electrically connected to the test needle. The inventive finger tester comprises an inventive test probe which is driven by a special linear motor.

5. 发明公开

EP1542023A2 Fingertester 有权
公开(公告)号：EP1542023A2
公开(公告)日：2005-06-15
申请号：EP05002153.4
申请日：2002-11-14
申请人： atg test systems GmbH & Co. KG
发明人： Romanov, Victor
IPC分类号： G01R1/067
CPC分类号： G01R1/06705 , G01R1/067 , G01R1/06711 , G01R1/06716 , G01R1/0675 , G01R1/07392 , G01R31/2805
摘要： Die Erfindung betrifft einen Fingertester zum Testen von unbestückten Leiterplatten. Der Fingertester umfasst einen Linearmotor und eine Prüfsonde. Das bewegliche Teil des Linearmotors ist eine Ankerplatte, die aus einem nicht-magnetischem Material ausgebildet ist und in regelmäßigen Abständen streifenförmige Ankerelemente ausweist, die aus einem magnetischen Material ausgebildet sind. Die Prüfsonde weist zumindestest zwei elastisch federnde Haltearme auf. Sowohl die Ankerplatte als auch die Prüfsonde können sehr leicht ausgebildet sein, wodurch ein schnelles Kontaktieren der Leiterplattenstestpunkte ermöglicht wird.
摘要翻译：用于测试电路板的手指测试仪的测试探针。手指测试仪没有驱动器，并且具有经由针尖（5）与电路板测试点接触的测试针（2）。测试针被安装成使得其可以绕轴线枢转，在支撑件（10）上具有至少两个弹簧支撑臂（6-9）。支撑臂中的至少一个由导电材料制成并且电连接到测试针。本发明还涉及具有由特殊线性电动机驱动的本发明的测试探针的相应手指测试器。

6. 发明公开

EP1353188A3 High resolution analytical probe station 审中-公开
标题翻译：在高分辨率的分析检测站
公开(公告)号：EP1353188A3
公开(公告)日：2004-01-14
申请号：EP03007929.7
申请日：2003-04-08
申请人： The Micromanipulator Group, Inc.
发明人： Hollmann, Kenneth F.
IPC分类号： G01R31/307 , G01R31/316
CPC分类号： G01R1/07392 , G01R1/025 , G01R31/2851 , G01R31/2887 , G01R31/2891 , G01R31/307
摘要： A method and system for probing with electrical test signals on an integrated circuit specimen (50) using a scanning electron microscope (SEM) positioned for observing a surface of the specimen exposing electrically conductive terminals on the specimen. A motorized manipulator (18-23) remotely controlled by a controller manipulates a plurality of probes (24) positionable on the surface of the specimen for conveying and acquiring electrical test signals inside a vacuum chamber. The controller communicates with the motorized manipulator for positioning the plurality of probes, and for applying electrical test signals to the terminals on the specimen using the image acquired by the controller to identify the electrically conductive terminals from the conductive path indicia of the surface of the specimen observed with the scanning electron microscope.

7. 发明公开

EP0458280A2 Printed circuit board inspection apparatus 失效
标题翻译： Inspektionsgerätfürgedruckte Leiterplatten。
公开(公告)号：EP0458280A2
公开(公告)日：1991-11-27
申请号：EP91108208.9
申请日：1991-05-21
申请人： TESCON CO., LTD.
发明人： Ikeda, Keiichi, c/o TESCON CO., LTD. , Yanagi, Kunio, c/o TESCON CO., LTD.
IPC分类号： G01R31/00 , H05K3/22 , G01R1/067 , G01R1/04
CPC分类号： G01R1/07392 , G01R31/2806
摘要： An improved printed circuit board inspection apparatus (1) in which its inspection probes are made to contact with a selected part or printed circuit section on a printed circuit board (P) for making an inspection on the selected part or printed circuit section in terms of their performances or functions. The printed circuit board inspection apparatus uses two guide sets (3,4) each having at least one pair of inspection probes (15) and driving means to drive said inspection probes in X- and Y-directions to selected coordinate positions in the printed circuit board. A central processing unit controls said driving means so that the inspection probes (15) of one guide set (3,4) are used to make an inspection at a selected coordinate position while the other inspection probes are traveling to another selected coordinate position for subsequent inspection according to a predetermined program.
摘要翻译：一种改进的印刷电路板检查装置（1），其中检查探针与印刷电路板（P）上的选定部分或印刷电路部分接触，用于对所选择的部分或印刷电路部分进行检查他们的表演或功能。印刷电路板检查装置使用两个导向组（3,4），每个导向组具有至少一对检查探针（15）和驱动装置，以将所述检查探针沿X和Y方向驱动到印刷电路中的选定的坐标位置板。中央处理单元控制所述驱动装置，使得一个导向组（3,4）的检测探针（15）用于在所选择的坐标位置进行检查，而其它检查探针行进到另一个选定的坐标位置以用于随后的根据预定程序进行检查。

8. 发明公开

EP0293497A1 Kontaktsonden-Anordnung mit Feinpositionier-Vorrichtung 失效
标题翻译： Kontaktsonden-Anordnung mit Feinpositionier-Vorrichtung。
公开(公告)号：EP0293497A1
公开(公告)日：1988-12-07
申请号：EP87107669.1
申请日：1987-05-26
申请人： IBM DEUTSCHLAND GMBH , International Business Machines Corporation
发明人： Stoehr, Roland R.
IPC分类号： G01R31/28 , G01R1/067
CPC分类号： G01R1/07314 , G01R1/07392
摘要： Es wird eine Kontaktsonden-Anordnung (1) mit einer motorgetriebenen Feinpositionier-Vorrichtung beschrieben. Die Feinpositionier-Vorrichtung gestattet eine Bewegung der Kontaktsonden-Anordnung (1) in zwei zueinander senkrechten Richtungen, die als X- und Y-Richtung bezeichnet werden. Um mehrere mit Feinpositionier-Vorrichtungen versehene Kontaktsonden-Anordnungen (1) dicht benachbart anordnen zu können, erstreckt sich die Längsachse jeder Feinpositionier-Vorrichtung senkrecht zu der durch die X- und Y-Richtung bestimmten Ebene. Für jede Bewegungsrichtung ist ein Elektromotor (2, 3; 20, 21) vorgesehen. Bei einem ersten Ausführungsbeispiel erfolgt das Feinpositionieren in jeder Richtung über eine senkrecht angeordnete Hohlwelle (10, 11), die an ihrem unteren Ende exzentrisch ausgebildet ist und einen Mitnehmerschlitten (13, 14) hin- und herbewegt, der mit der Kontaktsonden-Anordnung (1) fest verbunden ist. Die Hohlwelle (11) für die Bewegung der Kontaktsonden-Anordnung (1) in Y-Richtung verläuft innerhalb der Hohlwelle (10) für die Bewegung in X-Richtung. Über Sensoren (16) wird die zurückgelegte Wegstrecke ermittelt.
Bei einem zweiten Ausführungsbeispiel erfolgt das Feinpositionieren der Kontaktsonden-Anordnung über Keile (30, 31, 33) von denen jeweils 2 (30, 33) über eine Wippe (32) miteinander verbunden sind und auf gegenüberliegenden Flächen eines vierseitigen Pyramidenstumpfes (34) aufliegen, der mit der Kontaktsonden-Anordnung (1) fest verbunden ist. Auf- und Abbewegen der Keile bewirkt das Feinpositionieren in der X- bzw. der Y-Richtung.
摘要翻译：精密定位驱动器用于通过一对同轴中空驱动轴（10,11）在两个正交方向上移动测试接触装置，相应的电动机（2,3）通过一对同轴中空驱动轴（10,11）控制每个方向上的运动，每个联接到支撑测试接触装置（1）的相应的坐标支架（13,14）。在许多测试接触装置在测试头内紧密堆积在一起的情况下，每个相应的定位驱动器的纵向轴线垂直于由两个坐标定位轴限定的平面延伸。可以经由附接到每个电动机轴的编码器来检测沿着每个坐标轴的位移。

9. 发明公开

EP2463667A3 Flexible probe 审中-公开
标题翻译：柔性探头
公开(公告)号：EP2463667A3
公开(公告)日：2015-07-29
申请号：EP12154496.9
申请日：2005-06-21
申请人： Capres A/S
发明人： Nielsen, Folmer , Petersen, Peter R.E. , Hansen, Jesper Erdman
IPC分类号： G01R1/067 , G01R1/073 , G01R3/00 , G01R31/28 , G01C17/28
CPC分类号： G01R1/07392 , G01R1/06727 , G01R3/00 , G01R31/2887 , Y10T29/49204 , Y10T29/49222
摘要： A probe for testing electric properties on a specific location of a test sample, comprises a supporting body defining opposite first and second parts constituting a flexible cantilever part being flexible in one direction and a base part, respectively. The cantilever part defines an outer planar surface substantially perpendicular to the one direction, the base part being adapted for being fixated in a co-operating testing machine The probe further comprises at least one conductive probe arm in the cantilever part being positioned opposite the base part. The cantilever part defines opposite first and second regions, the second region being in contact with the base part, the first region defining first and second side surfaces, each of the first and second side surfaces defining a first angle with the outer planar surface, a first width defined between the first and the second side surfaces, the second region defining third and fourth side surfaces, each of the third and fourth side surfaces defining a second angle with the outer planar surface, a second width defined between the third and the fourth side surfaces, and the second width being equal to and/or smaller than the first width.

10. 发明授权

EP1018030B1 A METHOD OF CONTROLLING TEST PROBES IN A TESTING APPARATUS FOR ELECTRONIC PRINTED CIRCUIT BOARDS, AND AN APPARATUS FOR PERFORMING THE METHOD 有权
标题翻译：一种用于在试验装置电子用于执行过程检测传感器的规则，印刷电路和试验装置
公开(公告)号：EP1018030B1
公开(公告)日：2002-11-20
申请号：EP98942515.2
申请日：1998-09-14
申请人： TELLABS DENMARK A/S
发明人： HAUSCHULTZ, Mikael
IPC分类号： G01R31/28 , G01R1/073
CPC分类号： G01R31/2808 , G01R1/07328 , G01R1/07392

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