基本信息:
- 专利标题： Dual probing tip system
- 申请号：EP12171512.2 申请日：2012-06-11
- 公开(公告)号：EP2533055B1 公开(公告)日：2018-12-26
- 发明人： Spinar, James E. , Lynn, Richard R.
- 申请人： Tektronix, Inc.
- 申请人地址： 14150 SW Karl Braun Drive P.O. Box 500, M/S 50-LAW Beaverton, Oregon 97077-0001 US
- 专利权人： Tektronix, Inc.
- 当前专利权人： Tektronix, Inc.
- 当前专利权人地址： 14150 SW Karl Braun Drive P.O. Box 500, M/S 50-LAW Beaverton, Oregon 97077-0001 US
- 代理机构： HGF Limited
- 优先权： US201161495647P 20110610; US201213487069 20120601
- 主分类号： G01R1/067
- IPC分类号： G01R1/067 ; G01R1/073
摘要：
A dual probing tip system uses a slot and rail system to provide variable spacing and lateral and axial compliance of the probing tips mounted on first and second support members. A movable base member is secured on a frame with the base member having a rack of linear teeth and a pair of rails angled toward the front. First and second intermediate carriers each have a slot that engages one of the angled rails. Each of the carriers has stanchions that receive a thumb wheel pinion gear mounted on a shaft. The pinion gear mates with the teeth on the base member for movement of the carriers. Each support member has an axial slot that mated with an axial slot on each one of the carriers. Each support member has a compression spring which allows axial compliance of the support members.
公开/授权文献:
- EP2533055A1 Dual probing tip system 公开/授权日：2012-12-12
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01R | 测量电变量；测量磁变量（通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
| ------G01R1/00 | 包含在G01R5/00至G01R13/00和G01R31/00组中的各类仪器或装置的零部件 |
| --------G01R1/02 | .一般结构零部件 |
| ----------G01R1/06 | ..测量引线；测量探针 |
| ------------G01R1/067 | ...测量探针 |