专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

2. 发明公开

EP2533055A1 Dual probing tip system 审中-公开
标题翻译： Duales Sondenspitzensystem
公开(公告)号：EP2533055A1
公开(公告)日：2012-12-12
申请号：EP12171512.2
申请日：2012-06-11
申请人： TEKTRONIX, INC.
发明人： Spinar, James E. , Lynn, Richard R.
IPC分类号： G01R1/067
CPC分类号： G01R1/06788 , G01R1/06705 , G01R1/07364 , G01R1/07392
摘要： A dual probing tip system uses a slot and rail system to provide variable spacing and lateral and axial compliance of the probing tips mounted on first and second support members. A movable base member is secured on a frame with the base member having a rack of linear teeth and a pair of rails angled toward the front. First and second intermediate carriers each have a slot that engages one of the angled rails. Each of the carriers has stanchions that receive a thumb wheel pinion gear mounted on a shaft. The pinion gear mates with the teeth on the base member for movement of the carriers. Each support member has an axial slot that mated with an axial slot on each one of the carriers. Each support member has a compression spring which allows axial compliance of the support members.
摘要翻译：双探测尖端系统使用槽和轨道系统来提供安装在第一和第二支撑构件上的探测头的可变间隔和横向和轴向顺应性。可移动基座部件固定在框架上，基座部件具有线状齿条和一对朝向前方成角度的导轨。第一和第二中间载体各自具有接合一个倾斜轨道的槽。每个载体具有接收安装在轴上的拇指轮小齿轮的支柱。小齿轮与基座部件上的齿匹配，用于支架的移动。每个支撑构件具有与每个载体上的轴向狭槽配合的轴向槽。每个支撑构件具有允许支撑构件的轴向顺应的压缩弹簧。

IPRDB

热门服务

关于我们

友情链接

联系方式