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    • 5. 发明授权
    • Semiconductor device, photoelectric conversion device and method of manufacturing same
    • 半导体器件,光电转换器件及其制造方法
    • US07247899B2
    • 2007-07-24
    • US10937382
    • 2004-09-10
    • Hideshi KuwabaraHiroshi YuzuriharaTakayuki KimuraMahito Shinohara
    • Hideshi KuwabaraHiroshi YuzuriharaTakayuki KimuraMahito Shinohara
    • H01L31/062H01L31/113
    • H01L27/14687H01L27/1463H01L27/14632
    • In a photoelectric conversion device having a buried layer in a part of an anode and a cathode of a photodiode, such as a CCD having a sensor structure and a CMOS sensor, well of the same conduction type as the conduction type of the buried layer can be disposed in a peripheral circuit and the potential of each well is independently controlled.In a photoelectric conversion device which is constructed in such a manner that on the whole area of a substrate of a specific conduction type there are disposed a buried layer of a conduction type opposite to the conduction type of the substrate and an epitaxial layer of the same conduction type as the conduction type of the substrate and that well of a conduction type opposite to the conduction type of the substrate are present in a part of the epitaxial layer, buried layer for well isolation of the same conduction type as the conduction type of the substrate which have a higher concentration than the epitaxial layer is disposed between the lower part of the well and the buried layer.
    • 在具有在阳极的一部分中的掩埋层和具有传感器结构的CCD的诸如CCD的CMOS光电二极管的光电转换装置中,与掩埋层的导电类型相同的导电类型 设置在外围电路中,并且每个阱的电位被独立地控制。 在以这样的方式构成的光电转换装置中,在特定导电类型的基板的整个区域上设置有与基板的导电类型相反的导电类型的掩埋层和与其相同的外延层 导电类型作为衬底的导电类型,并且与衬底的导电类型相反的导电类型的阱存在于外延层的一部分中,用于良好隔离导电类型的导电类型的掩埋层 具有比外延层更高的浓度的衬底设置在阱的下部和掩埋层之间。
    • 6. 发明申请
    • Semiconductor device, photoelectric conversion device and method of manufacturing same
    • 半导体器件,光电转换器件及其制造方法
    • US20050056905A1
    • 2005-03-17
    • US10937382
    • 2004-09-10
    • Hideshi KuwabaraHiroshi YuzuriharaTakayuki KimuraMahito Shinohara
    • Hideshi KuwabaraHiroshi YuzuriharaTakayuki KimuraMahito Shinohara
    • H01L27/146H01L29/732H01L31/10
    • H01L27/14687H01L27/1463H01L27/14632
    • In a photoelectric conversion device having a buried layer in a part of an anode and a cathode of a photodiode, such as a CCD having a sensor structure and a CMOS sensor, well of the same conduction type as the conduction type of the buried layer can be disposed in a peripheral circuit and the potential of each well is independently controlled. In a photoelectric conversion device which is constructed in such a manner that on the whole area of a substrate of a specific conduction type there are disposed a buried layer of a conduction type opposite to the conduction type of the substrate and an epitaxial layer of the same conduction type as the conduction type of the substrate and that well of a conduction type opposite to the conduction type of the substrate are present in a part of the epitaxial layer, buried layer for well isolation of the same conduction type as the conduction type of the substrate which have a higher concentration than the epitaxial layer is disposed between the lower part of the well and the buried layer.
    • 在具有在阳极的一部分中的掩埋层和具有传感器结构的CCD的诸如CCD的CMOS光电二极管的光电转换装置中,与掩埋层的导电类型相同的导电类型 设置在外围电路中,并且每个阱的电位被独立地控制。 在以这样的方式构成的光电转换装置中,在特定导电类型的基板的整个区域上设置有与基板的导电类型相反的导电类型的掩埋层和与其相同的外延层 导电类型作为衬底的导电类型,并且与衬底的导电类型相反的导电类型的阱存在于外延层的一部分中,用于良好隔离导电类型的导电类型的掩埋层 具有比外延层更高的浓度的衬底设置在阱的下部和掩埋层之间。
    • 9. 发明申请
    • Photoelectric Conversion Device and Camera Using Photoelectric Conversion Device
    • 光电转换装置及相机使用光电转换装置
    • US20080230685A1
    • 2008-09-25
    • US12111342
    • 2008-04-29
    • Shunsuke InoueHiroshi YuzuriharaTetsuya Itano
    • Shunsuke InoueHiroshi YuzuriharaTetsuya Itano
    • H01J40/14
    • H01L27/14609H01L27/14603H01L27/1462
    • A photoelectric conversion device is configured to include a light receiving region, for converting light to signal charges, and transistors. An insulation film is arranged on a surface of the light receiving region and under gate electrodes of the transistors. A first reflection prevention film of a refractive index higher than that of the insulation film is arranged at least above the light receiving region, to sandwich the insulation film between the first reflection prevention film and the light receiving region, and includes a silicon nitride film. An interlayer insulation film is arranged on the first reflection prevention film, and a second reflection prevention film is laminated between the first reflection prevention film and the interlayer insulation film. At least one of side walls of the gate electrodes of the transistors includes the silicon nitride film and a silicon oxide film arranged between the silicon nitride film and the gate electrodes. A transistor having a gate electrode with such a side wall includes a source or drain region of an LDD structure, in which a heavily doped region of the source or drain region of the LDD structure is self aligned to the side wall formed from the silicon nitride film and the silicon oxide film.
    • 光电转换装置被配置为包括用于将光转换为信号电荷的光接收区域和晶体管。 绝缘膜布置在光接收区域的表面和晶体管的栅电极下方。 折射率高于绝缘膜的第一防反射膜至少布置在光接收区域的上方,以将绝缘膜夹在第一防反射膜和受光区之间,并且包括氮化硅膜。 在第一反射防止膜上设置层间绝缘膜,在第一防反射膜与层间绝缘膜之间层叠第二防反射膜。 晶体管的栅电极的至少一个侧壁包括氮化硅膜和布置在氮化硅膜和栅电极之间的氧化硅膜。 具有具有这种侧壁的栅电极的晶体管包括LDD结构的源极或漏极区域,其中LDD结构的源极或漏极区域的重掺杂区域与由氮化硅形成的侧壁自对准 膜和氧化硅膜。