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    • 8. 发明申请
    • NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
    • 非易失性半导体存储器件
    • US20110096590A1
    • 2011-04-28
    • US12746866
    • 2008-09-09
    • Yoshihisa Iwata
    • Yoshihisa Iwata
    • G11C11/00
    • G11C11/5614G11C13/0009G11C13/0011G11C13/004G11C13/0064G11C13/0069G11C2013/0054G11C2013/0078G11C2013/009G11C2213/71G11C2213/72
    • A nonvolatile semiconductor memory device comprises a cell array having plural memory cells arranged in matrix, each memory cell including a variable resistor having a resistance reversibly variable to store data corresponding to the resistance of the variable resistor; a selection circuit operative to select a memory cell from the cell array; and a write circuit operative to execute certain voltage or current supply to the memory cell selected by the selection circuit to vary the resistance of a variable resistor in the selected memory cell to erase or write data. The write circuit terminates the voltage or current supply to the selected memory cell in accordance with resistance variation situation of the variable resistor in the selected memory cell when current flowing in the selected memory cell reaches a certain level appeared after the data erase or write.
    • 非易失性半导体存储器件包括具有以矩阵形式排列的多个存储单元的单元阵列,每个存储单元包括具有可逆可变电阻的可变电阻器,用于存储对应于可变电阻器的电阻的数据; 选择电路,用于从所述单元阵列中选择存储单元; 以及写入电路,用于对由选择电路选择的存储器单元执行一定的电压或电流供应,以改变所选择的存储器单元中的可变电阻器的电阻以擦除或写入数据。 当电流在所选存储单元中流动的电流达到数据擦除或写入之后出现的一定水平时,写入电路根据所选存储单元中的可变电阻器的电阻变化情况,终止对所选存储单元的电压或电流供应。