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    • 1. 发明授权
    • Nonvolatile memory for logic circuits
    • 用于逻辑电路的非易失性存储器
    • US07336525B2
    • 2008-02-26
    • US11061951
    • 2005-02-17
    • Shinobu FujitaThomas H. Lee
    • Shinobu FujitaThomas H. Lee
    • G11C11/00
    • G11C11/005G11C5/02G11C14/0081
    • A memory circuit that retains stored data upon power down includes a volatile data storage circuit; and at least one nonvolatile memory coupled within the volatile data storage circuit, wherein the at least one nonvolatile memory includes a high resistive state and a low resistive state. The volatile data storage circuit can include cross-coupled inverters, cross-coupled NAND gates, or another volatile data storage circuit. The nonvolatile memories can include a spin-injection magnetic tunnel junction memory, a magnetic tunnel junction memory, a metal insulator phase change memory, an organic memory, or some other memory with two resistive states.
    • 在断电时保存存储的数据的存储电路包括易失性数据存储电路; 以及耦合在所述易失性数据存储电路内的至少一个非易失性存储器,其中所述至少一个非易失性存储器包括高电阻状态和低电阻状态。 易失性数据存储电路可以包括交叉耦合反相器,交叉耦合NAND门或另一易失性数据存储电路。 非易失性存储器可以包括自旋注入磁隧道结存储器,磁性隧道结存储器,金属绝缘体相变存储器,有机存储器或具有两个电阻状态的一些其它存储器。
    • 5. 发明授权
    • Frequency calibration for frequency synthesizers
    • 频率合成器的频率校准
    • US07474159B2
    • 2009-01-06
    • US11801218
    • 2007-05-08
    • Stanley WangThomas H. Lee
    • Stanley WangThomas H. Lee
    • H03L7/00
    • H03L7/113H03L7/099H03L7/18
    • A calibration circuit (17) for calibrating a frequency synthesizer (10) having a voltage-controlled oscillator (VCO) (15) with a plurality of switched-capacitor arrays (CA1-CAn). The calibration circuit (17) counts a predetermined number of periods of the reference-clock signal (ref_clk) and divide-clock signal (div_clk) of the frequency synthesizer using a fast clock signal (fastclk). The fast-clock signal (fastclk) has a frequency greater than either the reference-clock signal (ref_clk) or the divide-clock signal (div_clk), enabling significantly faster calibration of the frequency synthesizer (10) than would be possible using the reference-clock signal (ref_clk). The calibration circuit (17) compares the count of the periods of the reference-clock signal (ref_clk) and the divide-clock signal (div_clk) and varies the tank signal of the VCO (VCO_tank_setting) until the count of the periods is substantially equal.
    • 一种用于校准具有多个开关电容阵列(CA1-CAn)的具有压控振荡器(VCO)(15)的频率合成器(10)的校准电路(17)。 校准电路(17)使用快速时钟信号(fastclk)计数频率合成器的基准时钟信号(ref_clk)和分频时钟信号(div_clk)的预定数量的周期。 快速时钟信号(fastclk)的频率大于参考时钟信号(ref_clk)或分频时钟信号(div_clk),能够使频率合成器(10)的校准能够比使用参考时钟信号 时钟信号(ref_clk)。 校准电路(17)比较参考时钟信号(ref_clk)和分频时钟信号(div_clk)的周期的计数,并改变VCO的VCO信号(VCO_tank_setting),直到周期的计数基本相等 。