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    • 3. 发明申请
    • SEMICONDUCTOR DEVICE, ACTIVE MATRIX SUBSTRATE AND DISPLAY DEVICE
    • 半导体器件,有源矩阵衬底和显示器件
    • US20120256184A1
    • 2012-10-11
    • US13515921
    • 2010-11-02
    • Seiji KanekoHidehito Kitakado
    • Seiji KanekoHidehito Kitakado
    • H01L29/786
    • H01L29/78633G02F1/1368H01L29/78621H01L29/78645H01L29/78648
    • A switching element (a semiconductor device) (18) having a top gate electrode (21) and a bottom gate electrode (23) is provided with a silicon layer (a semiconductor layer) (SL) that is arranged between the top gate electrode (21) and the bottom gate electrode (a light-shielding film) (23) and that has a source region (24), a drain region (28), a channel region (26), and low-concentration impurity regions (25, 27). Furthermore, the bottom gate electrode (23) is arranged so as to overlap the channel region (26), a part of the low-concentration impurity region (25), which is adjacent to the source region (24), and a part of the low-concentration impurity region (27), which is adjacent to the drain region (18). The bottom gate electrode (23) is controlled so as to have a prescribed potential.
    • 具有顶栅极(21)和底栅电极(23)的开关元件(半导体器件)(18)设置有硅层(半导体层)(SL),其设置在顶栅电极 21)和底栅极(遮光膜)(23),并且具有源极区(24),漏极区(28),沟道区(26)和低浓度杂质区(25, 27)。 此外,底栅电极(23)被布置成与沟道区(26)重叠,与源区(24)相邻的低浓度杂质区(25)的一部分,和 与漏极区(18)相邻的低浓度杂质区(27)。 底栅极(23)被控制为具有规定的电位。
    • 4. 发明申请
    • Disk array device, method for controlling the disk array device and storage system
    • 磁盘阵列设备,磁盘阵列设备和存储系统的控制方法
    • US20080016285A1
    • 2008-01-17
    • US11896657
    • 2007-09-05
    • Seiji KanekoHiroki Kanai
    • Seiji KanekoHiroki Kanai
    • G06F12/00
    • G06F12/0866G06F3/0611G06F3/0658G06F3/0659G06F3/067G06F3/0689G06F12/0815G06F12/0817Y10S707/99952
    • A disk array device is equipped with a plurality of input/output channels that receive data input/output requests from an external device, a plurality of cache memories provided for the corresponding respective input/output channels, each of the cache memories connected to each of the corresponding respective input/output channels, a disk drive device, a disk control module that performs data input/output to and from the disk drive device, and a communication module that communicatively connects the input/output channels with the disk control module. The disk array device also includes a consistency maintaining module that can perform a consistency maintaining processing to maintain consistency of data stored in each of the cache memories. According to the content of the data input/output request received from the external device, an execution order of a response processing to respond to the external device according to the data input/output request and the consistency maintaining processing is controlled.
    • 磁盘阵列装置配备有从外部设备接收数据输入/输出请求的多个输入/输出通道,为相应的相应输入/输出通道提供的多个高速缓存存储器,每个缓存存储器连接到 对应的各个输入/输出通道,磁盘驱动器装置,对磁盘驱动装置执行数据输入/输出的磁盘控制模块,以及将输入/输出通道与磁盘控制模块通信连接的通信模块。 磁盘阵列设备还包括一致性维护模块,该模块可以执行一致性维持处理以保持存储在每个高速缓冲存储器中的数据的一致性。 根据从外部设备接收的数据输入/输出请求的内容,控制根据数据输入/输出请求和一致性维护处理对外部设备进行响应的响应处理的执行顺序。
    • 5. 发明申请
    • Nonvolatile semiconductor memory device
    • 非易失性半导体存储器件
    • US20070140017A1
    • 2007-06-21
    • US11637026
    • 2006-12-12
    • Seiji KanekoNaoki Ueda
    • Seiji KanekoNaoki Ueda
    • G11C16/04G11C11/34
    • G11C16/3454G11C11/5628G11C11/5635G11C16/3404G11C16/3409G11C16/3413G11C16/344G11C16/3445G11C16/3459G11C2211/5621
    • There is provided a nonvolatile semiconductor memory device capable of accelerating writing time and avoiding readout errors of information by eliminating variation in threshold voltage of unselected memory cells. In a nonvolatile semiconductor memory device having a memory cell array with memory cells capable of erasing and programming information, the memory cells store one data value selected from the same number of data values as programming distribution ranges, associated with that the electrical attribute belongs to any one of the more than one programming distribution ranges. The device comprises an erasure means for erasing the selected memory cell to be erased so that its electrical attribute belongs to a erasure distribution range not overlapping any of the programming distribution ranges and a programming means for programming an erased memory cell to be programmed so that its electrical attribute belongs to any one of the programming distribution ranges.
    • 提供一种非易失性半导体存储器件,其能够通过消除未选择的存储单元的阈值电压的变化来加速写入时间并避免信息的读出错误。 在具有具有能够擦除和编程信息的存储器单元的存储单元阵列的非易失性半导体存储器件中,存储器单元存储从与电属性属于任何相关联的编程分配范围相同数量的数据值中选择的一个数据值 多个编程分布范围之一。 该装置包括擦除装置,用于擦除被擦除的所选择的存储单元,使得其电属性属于不与任何编程分布范围重叠的擦除分布范围,以及编程装置,用于对要编程的擦除存储器单元进行编程, 电属性属于编程分布范围中的任何一个。
    • 7. 发明授权
    • Method of producing semiconductor device
    • 半导体器件的制造方法
    • US06221732B1
    • 2001-04-24
    • US09547903
    • 2000-04-11
    • Seiji Kaneko
    • Seiji Kaneko
    • H01L2176
    • H01L21/7624H01L21/76202H01L21/84H01L27/1203
    • A method of producing a semiconductor device comprising the steps of: (a) forming partially an SOI structure portion comprising an insulation layer and a semiconductor layer on a semiconductor substrate; (b) forming selectively a first oxidation-resistant film on a region other than device isolation region-forming portions of the SOI structure portion and of an exposed portion of the semiconductor substrate; (c) forming an oxide film in the device isolation region-forming portions of the semiconductor substrate and of the SOI structure portion under such condition that the semiconductor layer of the SOI structure portion is oxidized up to the bottom of the semiconductor layer; (d) depositing a second oxidation-resistant film over the entire surface of the resultant obtained by the above steps (a) to (c); (e) etching away selectively the second oxidation-resistant film on the exposed portion of the semiconductor substrate using a resist mask so patterned as to cover the SOI structure portion; (f1) implanting an impurity ion into the semiconductor substrate using the resist mask; and (g1) removing the resist mask, and conducting heat-treatment to activate the implanted impurity ion and increase the thickness of the oxide film in the device isolation region-forming portion of the exposed portion of the semiconductor substrate to a predetermined film thickness.
    • 一种制造半导体器件的方法,包括以下步骤:(a)在半导体衬底上部分地形成包括绝缘层和半导体层的SOI结构部分; (b)在SOI结构部分的器件隔离区域形成部分和半导体衬底的暴露部分之外的区域上选择性地形成第一抗氧化膜; (c)在SOI结构部分的半导体层被氧化到半导体层的底部的条件下,在半导体衬底和SOI结构部分的器件隔离区域形成部分中形成氧化物膜; (d)在通过上述步骤(a)至(c)获得的结果的整个表面上沉积第二抗氧化膜; (e)使用如图案化以覆盖SOI结构部分的抗蚀剂掩模来选择性地去除半导体衬底的暴露部分上的第二抗氧化膜; (f1)使用抗蚀剂掩模将杂质离子注入到半导体衬底中; 和(g1)去除抗蚀剂掩模,并进行热处理以激活注入的杂质离子,并将半导体衬底的暴露部分的器件隔离区域形成部分中的氧化物膜的厚度增加到预定的膜厚度。
    • 8. 发明授权
    • Field effect transistor and CMOS element having dopant exponentially
graded in channel
    • 场效应晶体管和CMOS元件具有在通道中指数级分的掺杂剂
    • US5841170A
    • 1998-11-24
    • US782251
    • 1997-01-14
    • Alberto Oscar AdanSeiji Kaneko
    • Alberto Oscar AdanSeiji Kaneko
    • H01L21/336H01L21/84H01L27/12H01L29/786H01L27/105
    • H01L29/78696H01L21/84H01L27/1203H01L29/66772H01L29/78612
    • A field effect transistor is fabricated on an SOI substrate. N-type source and drain regions are arranged apart from each other in a semiconductor thin film of the SOI substrate. A P-type channel region is formed between the source and drain regions. Moreover, a gate electrode is formed over the channel region to cover the channel region through a gate oxide film. Extreme portions of the channel region, adjacent to the source and drain regions, have higher doping concentrations than in a center portion thereof. Furthermore, the gradient of the doping profile in the channel region is adjusted so as to reduce the current gain of a parasitic transistor in the field effect transistor. This structure enables a reduction of the channel length of the field effect transistor to the sub-half-micron order without deteriorating the electrical characteristics of the field effect transistor.
    • 在SOI衬底上制造场效应晶体管。 N型源极和漏极区域在SOI衬底的半导体薄膜中彼此分开布置。 在源区和漏区之间形成P型沟道区。 此外,栅极电极形成在沟道区域上,以通过栅极氧化膜覆盖沟道区域。 与源区和漏区相邻的沟道区的极端部分的掺杂浓度高于其中心部分。 此外,调整沟道区域中的掺杂分布的梯度,以便减小场效应晶体管中寄生晶体管的电流增益。 该结构能够将场效应晶体管的沟道长度减小到亚半微米级,而不会使场效应晶体管的电特性恶化。