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    • 4. 发明授权
    • Alignment method usable in a step-and-repeat type exposure apparatus for
either global or dye-by-dye alignment
    • 可用于全球或逐个染料对齐的步进重复型曝光装置中的对准方法
    • US4918320A
    • 1990-04-17
    • US170359
    • 1988-03-18
    • Bunei HamasakiHajime IgarashiAkiya NakaiNaoki Ayata
    • Bunei HamasakiHajime IgarashiAkiya NakaiNaoki Ayata
    • G03F9/00
    • G03F9/7003
    • A method of aligning a semiconductor wafer, usable in a step-and-repeat type exposure apparatus for projecting, in a reduced scale, images of a pattern formed on a reticle upon different shot areas on the semiconductor wafer in a predetermined sequence. According to this alignment method, the wafer is moved stepwise before the initiation of step-and-repeat exposures of the shot areas on the wafer and in accordance with a predetermined layout grid concerning the sites of the shot areas on the wafer. While moving the wafer stepwise in this manner, any positional deviation of each of some of the shot areas with respect to the layout grid is measured by use of a reduction projection lens system and, from the results of measurement, a corrected grid is prepared according to which grid the amount of stepwise movement of the wafer to be made for the step-and-repeat exposures thereof is determined. By this, for the exposures, the wafer can be moved stepwise exactly in accordance with the actual layout of the shot areas. Sample shot areas which are the subject of measurement can be selected under predetermined conditions. Additionally, of the values obtained as a result of the measurement, any extraordinary one or ones may be determined on the basis of the variance and then are excluded at the time of calculations made to determine the corrected grid. Thus, the stepwise movement of the wafer for the step-and-repeat exposures thereof can be controlled with higher precision.
    • 一种可用于步进重复型曝光装置中的半导体晶片的对准方法,用于以预定的顺序,在半导体晶片上的不同照射区域上以缩小的尺度投影形成在掩模版上的图案的图像。 根据这种对准方法,晶片在晶片上的拍摄区域的重复曝光开始之前逐步移动,并且根据关于晶片上的照射区域的位置的预定布局网格。 当以这种方式逐步移动晶片时,通过使用还原投影透镜系统来测量相对于布局格栅的一些照射区域中的每一个的任何位置偏差,并且根据测量结果,根据 确定要进行步进重复曝光的晶圆的逐步移动量。 由此,对于曝光,晶片可以根据拍摄区域的实际布局精确地逐步移动。 作为测量对象的采样拍摄区域可以在预定条件下选择。 此外,作为测量结果获得的值,可以基于方差来确定任何非常一个或一个,然后在进行计算时排除以确定校正的网格。 因此,可以更高精度地控制用于步进重复曝光的晶片的逐步移动。
    • 5. 发明授权
    • Control system for a fine pattern printing apparatus
    • 精细图案印刷装置的控制系统
    • US5197118A
    • 1993-03-23
    • US752986
    • 1991-09-03
    • Ryuichi SatoMasanori NumataBunei HamasakiNaoki Ayata
    • Ryuichi SatoMasanori NumataBunei HamasakiNaoki Ayata
    • G03F7/20
    • G03F7/70525
    • A system for controlling operation of a fine pattern printing apparatus. The system including a command storing portion in which a plurality of unit-operation instructing commands capable of instructing execution of corresponding unit operations which are components of the pattern printing operation of the apparatus and at least one sequential operation instructing command including a combination of at least a predetermined portion of the unit-operation instructing commands are stored. A command selecting portion for allowing selection of the commands stored in the command storing portion; a sequence setting portion cooperative with the command selecting portion so as to set, in the command storing portion, a desired sequential operation instructing command formed by a plurality of unit-operation instructing commands each of which is stored in the command storing portion. The sequential operation instructing command set in the storing portion by the sequence setting portion is selectable by the command selecting portion and operation controlling portion cooperative with the command selecting portion so as to control the operation of the apparatus in accordance with such one of the commands stored in the storing portion that is selected by the selection portion.
    • 一种用于控制精细图案印刷装置的操作的系统。 该系统包括命令存储部分,其中能够指示作为装置的图案打印操作的组成部分的相应单元操作的多个单元操作指令命令以及包括至少一个组合的至少一个顺序操作指令命令 存储单位操作指示命令的预定部分。 命令选择部分,用于允许选择存储在命令存储部分中的命令; 与命令选择部分协作的序列设置部分,以便在命令存储部分中设置由存储在命令存储部分中的多个单元操作指令命令形成的期望的顺序操作指令命令。 由命令选择部分和操作控制部分与命令选择部分协调选择由序列设置部分在存储部分中设置的顺序操作指令命令,以便根据存储的命令之一来控制装置的操作 在由选择部分选择的存储部分中。