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    • 7. 发明授权
    • Methods for the measurement of the frequency dependent complex
propagation matrix, impedance matrix and admittance matrix of coupled
transmission lines
    • 耦合传输线的频率相关复传播矩阵,阻抗矩阵和导纳矩阵的测量方法
    • US5502392A
    • 1996-03-26
    • US151595
    • 1993-11-12
    • Gnanalingam ArjavalingamAlina DeutschGerard V. KopcsayJames K. Tam
    • Gnanalingam ArjavalingamAlina DeutschGerard V. KopcsayJames K. Tam
    • G01R27/06G01R27/32G01R31/28G01R27/04
    • G01R27/32G01R27/06G01R31/2822
    • A method for completely characterizing coupled transmission lines by short-pulse propagation is described. The complex frequency-dependent propagation matrix, impedance matrix and admittance matrix for a set of n parallel transmission lines can be determined by comparing the properties of two sets of coupled transmission lines of different length. Each transmission line set has two conductors of unequal length and ground conductors to form a coupled transmission line system. Each transmission line set can have uncoupled ends. An input pulse is provided at at least one node of each transmission line set. The complex frequency dependent propagation matrix of each transmission line set is determined by a comparison of the output pulses at the remaining nodes of each transmission line set which involves ratioing to cancel out the effect of the pad-to-probe discontinuity and the uncoupled ends which make it unnecessary to do any embedding. For a transmission line wherein the dielectric loss is negligible, the complex frequency dependent characteristic admittance can be determined from the propagation matrix and the empirically determined capacitance matrix. For a transmission line wherein the resistive loss is negligible, the frequency dependent characteristic impedance matrix can be determined from the propagation matrix and the empirically determined inductance matrix. Specific structures are used with the measurement method to determine these coupled transmission line parameters. The method is particularly useful to determine these parameters for transmission lines in semiconductor chip packaging substrates.
    • 描述了通过短脉冲传播完全表征耦合传输线的方法。 可以通过比较两组不同长度的耦合传输线的性质来确定一组n条并行传输线的复频率相关传播矩阵,阻抗矩阵和导纳矩阵。 每个传输线组具有两个不等长度的导体和接地导体,以形成耦合传输线系统。 每个传输线组可以具有非耦合端。 在每个传输线组的至少一个节点处提供输入脉冲。 每个传输线组的复频率相关传播矩阵通过比较每个传输线组的剩余节点上的输出脉冲来确定,该比较涉及比例以抵消焊盘与探针不连续性的影响和非耦合端 无需做任何嵌入。 对于其中介电损耗可忽略的传输线,可以根据传播矩阵和经验确定的电容矩阵来确定复频率相关特性导纳。 对于其中电阻损耗可忽略的传输线,可以从传播矩阵和经验确定的电感矩阵确定频率相关特性阻抗矩阵。 与测量方法一起使用具体结构来确定这些耦合的传输线参数。 该方法对于确定半导体芯片封装衬底中的传输线的这些参数特别有用。