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    • 1. 发明申请
    • Multilayer reflective mirrors for EUV, wavefront-aberration-correction methods for same, and EUV optical systems comprising same
    • 用于EUV的多层反射镜,用于其的波前像差校正方法以及包含该反射镜的EUV光学系统
    • US20050157384A1
    • 2005-07-21
    • US11025002
    • 2004-12-28
    • Masayuki ShiraishiKatsuhiko MurakamiHiroyuki KondoNoriaki Kandaka
    • Masayuki ShiraishiKatsuhiko MurakamiHiroyuki KondoNoriaki Kandaka
    • G02B5/08G03F7/20
    • G03F7/706G02B5/08G03F7/70216G03F7/70258G03F7/70316
    • Multilayer mirrors are disclosed for use especially in “Extreme Ultraviolet” (“soft X-ray,” or “EUV”) optical systems. Each multilayer mirror includes a stack of alternating layers of a first material and a second material, respectively, to form an EUV-reflective surface. The first material has a refractive index substantially the same as a vacuum, and the second material has a refractive index that differs sufficiently from the refractive index of the first material to render the mirror reflective to EUV radiation. The wavefront profile of EUV light reflected from the surface is corrected by removing (“machining” away) at least one surficial layer of the stack in selected region(s) of the surface of the stack. Machining can be performed such that machined regions have smooth tapered edges rather than abrupt edges. The stack can include first and second layer groups that allow the unit of machining to be very small, thereby improving the accuracy with which wavefront-aberration correction can be conducted. Also disclosed are various at-wavelength techniques for measuring reflected-wavelength profiles of the mirror. The mirror surface can include a cover layer of a durable material having high transparency and that reduces variations in reflectivity of the surface caused by machining the selected regions.
    • 公开了多层反射镜用于特别是在“极光紫外线”(“软X射线”或“EUV”)光学系统中。 每个多层反射镜分别包括第一材料和第二材料的交替层叠,以形成EUV反射表面。 第一材料具有与真空基本相同的折射率,并且第二材料具有与第一材料的折射率充分不同的折射率,以使反射镜反射成EUV辐射。 通过在堆叠的表面的选定区域中移除(“加工”)去除堆叠的至少一个表面层来校正从表面反射的EUV光的波前轮廓。 可以进行加工,使得加工区域具有平滑的锥形边缘而不是突然的边缘。 堆叠可以包括允许加工单元非常小的第一和第二层组,从而提高可以进行波前像差校正的精度。 还公开了用于测量反射镜的反射波长分布的各种一般波长技术。 镜面可以包括具有高透明度的耐用材料的覆盖层,并且减少由加工所选择的区域引起的表面的反射率的变化。
    • 2. 发明授权
    • EUV multilayer mirror with phase shifting layer
    • 具有相移层的EUV多层反射镜
    • US07382527B2
    • 2008-06-03
    • US11401946
    • 2006-04-12
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • G02B5/26
    • G03F7/70316B82Y10/00G02B5/0891G03F7/70958G21K1/062
    • A multilayer mirror aims to reduce incidence angle dependence of reflectivity. A substrate is made of low thermal polished expansion glass with 0.2 nm RMS or less roughness of the surface. On the surface thereof formed is a Ru/Si multilayer having a wide full-width half maximum of peak reflectivity, and on the Ru/Si multilayer formed is a Mo/Si multilayer having a high peak reflectivity value. This enables higher reflectivity than when Ru/Si alone provided and a reflectivity peak having a wider full-width half maximum than when the Mo/Si multilayer alone provided. Since Ru absorbs EUV ray more than Mo does, higher reflectivity is obtainable than that of a structure having the Ru/Si multilayer formed on the Mo/Si multilayer. The multilayer with a wide full-width half maximum has small incidence angle dependence of reflectivity in spectral reflectivity, thereby achieving high imaging performance in projection optical system.
    • 多层反射镜旨在减少反射率的入射角依赖性。 衬底由具有0.2nm RMS或更少表面粗糙度的低热抛光膨胀玻璃制成。 在其形成的表面上是具有宽的全宽半峰值反射率的Ru / Si多层,并且形成的Ru / Si多层是具有高峰值反射率值的Mo / Si多层。 与仅提供Ru / Si相比,具有比单独提供的Mo / Si多层的全宽半宽的反射率峰值更高的反射率。 由于Ru吸收比Mo更多的EUV射线,因此可以获得比在Mo / Si多层上形成有Ru / Si多层的结构更高的反射率。 具有宽全宽半最大值的多层膜在光谱反射率方面具有小的入射角反射率依赖性,从而在投影光学系统中实现高成像性能。
    • 3. 发明授权
    • Multilayer mirror, method for manufacturing the same, and exposure equipment
    • 多层镜,其制造方法和曝光设备
    • US07706058B2
    • 2010-04-27
    • US12232241
    • 2008-09-12
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • G02B5/26
    • G03F7/70316B82Y10/00G02B5/0891G03F7/70958G21K1/062
    • A multilayer mirror aims to reduce incidence angle dependence of reflectivity. A substrate is made of low thermal polished expansion glass with 0.2 nm RMS or less roughness of the surface. On the surface thereof formed is a Ru/Si multilayer having a wide full-width half maximum of peak reflectivity, and on the Ru/Si multilayer formed is a Mo/Si multilayer having a high peak reflectivity value. This enables higher reflectivity than when Ru/Si alone provided and a reflectivity peak having a wider full-width half maximum than when the Mo/Si multilayer alone provided. Since Ru absorbs EUV ray more than Mo does, higher reflectivity is obtainable than that of a structure having the Ru/Si multilayer formed on the Mo/Si multilayer. The multilayer with a wide full-width half maximum has small incidence angle dependence of reflectivity in spectral reflectivity, thereby achieving high imaging performance in projection optical system.
    • 多层反射镜旨在减少反射率的入射角依赖性。 衬底由具有0.2nm RMS或更少表面粗糙度的低热抛光膨胀玻璃制成。 在其形成的表面上是具有宽的全宽半峰值反射率的Ru / Si多层,并且形成的Ru / Si多层是具有高峰值反射率值的Mo / Si多层。 与仅提供Ru / Si相比,具有比单独提供的Mo / Si多层的全宽半宽的反射率峰值更高的反射率。 由于Ru吸收比Mo更多的EUV射线,因此可以获得比在Mo / Si多层上形成有Ru / Si多层的结构更高的反射率。 具有宽全宽半最大值的多层膜在光谱反射率方面具有小的入射角反射率依赖性,从而在投影光学系统中实现高成像性能。
    • 4. 发明申请
    • Multilayer mirror, method for manufacturing the same, and exposure equipment
    • 多层镜,其制造方法和曝光设备
    • US20090097104A1
    • 2009-04-16
    • US12232241
    • 2008-09-12
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • G02B5/26
    • G03F7/70316B82Y10/00G02B5/0891G03F7/70958G21K1/062
    • A multilayer mirror aims to reduce incidence angle dependence of reflectivity. A substrate is made of low thermal polished expansion glass with 0.2 nm RMS or less roughness of the surface. On the surface thereof formed is a Ru/Si multilayer having a wide full-width half maximum of peak reflectivity, and on the Ru/Si multilayer formed is a Mo/Si multilayer having a high peak reflectivity value. This enables higher reflectivity than when Ru/Si alone provided and a reflectivity peak having a wider full-width half maximum than when the Mo/Si multilayer alone provided. Since Ru absorbs EUV ray more than Mo does, higher reflectivity is obtainable than that of a structure having the Ru/Si multilayer formed on the Mo/Si multilayer. The multilayer with a wide full-width half maximum has small incidence angle dependence of reflectivity in spectral reflectivity, thereby achieving high imaging performance in projection optical system.
    • 多层反射镜旨在减少反射率的入射角依赖性。 衬底由具有0.2nm RMS或更少表面粗糙度的低热抛光膨胀玻璃制成。 在其形成的表面上是具有宽的全宽半峰值反射率的Ru / Si多层,并且形成的Ru / Si多层是具有高峰值反射率值的Mo / Si多层。 与仅提供Ru / Si相比,具有比单独提供的Mo / Si多层的全宽半宽的反射率峰值更高的反射率。 由于Ru吸收比Mo更多的EUV射线,因此可以获得比在Mo / Si多层上形成有Ru / Si多层的结构更高的反射率。 具有宽全宽半最大值的多层膜在光谱反射率方面具有小的入射角反射率依赖性,从而在投影光学系统中实现高成像性能。
    • 6. 发明授权
    • Multilayer mirror, method for manufacturing the same, and exposure equipment
    • 多层镜,其制造方法和曝光设备
    • US07440182B2
    • 2008-10-21
    • US11907798
    • 2007-10-17
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • G02B5/26
    • G03F7/70316B82Y10/00G02B5/0891G03F7/70958G21K1/062
    • A multilayer mirror aims to reduce incidence angle dependence of reflectivity. A substrate is made of low thermal polished expansion glass with 0.2 nm RMS or less roughness of the surface. On the surface thereof formed is a Ru/Si multilayer having a wide full-width half maximum of peak reflectivity, and on the Ru/Si multilayer formed is a Mo/Si multilayer having a high peak reflectivity value. This enables higher reflectivity than when Ru/Si alone provided and a reflectivity peak having a wider full-width half maximum than when the Mo/Si multilayer alone provided. Since Ru absorbs EUV ray more than Mo does, higher reflectivity is obtainable than that of a structure having the Ru/Si multilayer formed on the Mo/Si multilayer. The multilayer with a wide full-width half maximum has small incidence angle dependence of reflectivity in spectral reflectivity, thereby achieving high imaging performance in projection optical system.
    • 多层反射镜旨在减少反射率的入射角依赖性。 衬底由具有0.2nm RMS或更少表面粗糙度的低热抛光膨胀玻璃制成。 在其形成的表面上是具有宽的全宽半峰值反射率的Ru / Si多层,并且形成的Ru / Si多层是具有高峰值反射率值的Mo / Si多层。 与仅提供Ru / Si相比,具有比单独提供的Mo / Si多层的全宽半宽的反射率峰值更高的反射率。 由于Ru吸收比Mo更多的EUV射线,因此可以获得比在Mo / Si多层上形成有Ru / Si多层的结构更高的反射率。 具有宽全宽半最大值的多层膜在光谱反射率方面具有小的入射角反射率依赖性,从而在投影光学系统中实现高成像性能。
    • 9. 发明授权
    • Soft x-ray light source device
    • 软X射线光源装置
    • US06339634B1
    • 2002-01-15
    • US09409063
    • 1999-09-30
    • Noriaki KandakaHiroyuki KondoSoichi OwaTomoko Ohtsuki
    • Noriaki KandakaHiroyuki KondoSoichi OwaTomoko Ohtsuki
    • H01J3526
    • H05G2/003B82Y10/00G03F7/70033G03F7/70233G21K1/06H05G2/008
    • A high-pressure krypton gas is supplied to the interior of a vessel from a gas introduction pipe. Light emitted from an optical fiber group formed by bundling together optical fibers constituting the output ends of fiber amplifiers or fiber lasers passes through a lens and exciting laser light introduction window, and is focused on the krypton gas jetting from the tip end of the nozzle. As a result, the krypton gas is excited as a plasma and soft X-rays are generated. The soft X-rays are reflected by a rotating multi-layer coat parabolic mirror and are emitted to the outside as a parallel beam of soft X-rays. Since light from fiber amplifiers is used as exciting light, and since numerous optical fibers are bundled together to form a light source, a large quantity of soft X-rays can easily be obtained.
    • 高压氪气从气体导入管供给到容器的内部。 通过将构成光纤放大器或光纤激光器的输出端的光纤捆扎在一起形成的光纤组发出的光通过透镜和激光激光引入窗口,并且聚焦在从喷嘴的尖端喷射的氪气。 结果,氪气被激发为等离子体并产生软X射线。 软X射线被旋转的多层外壳抛物面反射镜反射并作为平行的X射线照射到外部。 由于来自光纤放大器的光被用作激发光,并且由于许多光纤被捆绑在一起以形成光源,因此可以容易地获得大量的软X射线。
    • 10. 发明授权
    • Photoelectron spectroscopy apparatus
    • 光电子能谱仪
    • US06326617B1
    • 2001-12-04
    • US09145064
    • 1998-09-01
    • Toshihisa TomieHideaki ShimizuHiroyuki KondoNoriaki Kandaka
    • Toshihisa TomieHideaki ShimizuHiroyuki KondoNoriaki Kandaka
    • C01N2300
    • G01N23/04
    • Photoelectron spectroscopy apparatus are disclosed that comprise a photoelectron detector and that exhibit improved performance of the photoelectron detector and thus more reliable and accurate analysis of photoelectron energy. In performing energy analysis of photoelectrons, the photoelectron detector measures the time distribution at which photoelectrons emitted from a specimen surface traverse a flight tube when the specimen is irradiated with X-rays from a pulse X-ray source. A magnetic field generator is situated near the specimen to collect and collimate photoelectrons emitted from the specimen surface and form a photoelectron flux inside a flight tube. Any one of a deflection electrode, electrostatic lens, magnetic field lens, or electromagnetic lens, or a combination thereof, is placed at the distal end of the flight tube in front of the photoelectron detector to disperse the photoelectron flux and increase the surface area in which the photoelectron flux is incident to the photoelectron-detection surface.
    • 公开了包含光电子检测器并且显示出光电子检测器的改进性能并且因此更可靠和准确地分析光电子能量的光电子能谱仪。 在对光电子进行能量分析时,光电检测器测定从X射线源向X射线照射样本时,从试样表面射出的光电子横穿飞行管的时间分布。 磁场发生器位于样品附近,以收集和准直从样品表面发射的光电子,并在飞行管内形成光电子通量。 偏转电极,静电透镜,磁场透镜或电磁透镜中的任何一个或其组合放置在光电子检测器前面的飞行管的远端,以分散光电子通量并增加其中的表面积 光电子通量入射到光电子检测表面。