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    • 1. 发明授权
    • EUV multilayer mirror with phase shifting layer
    • 具有相移层的EUV多层反射镜
    • US07382527B2
    • 2008-06-03
    • US11401946
    • 2006-04-12
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • G02B5/26
    • G03F7/70316B82Y10/00G02B5/0891G03F7/70958G21K1/062
    • A multilayer mirror aims to reduce incidence angle dependence of reflectivity. A substrate is made of low thermal polished expansion glass with 0.2 nm RMS or less roughness of the surface. On the surface thereof formed is a Ru/Si multilayer having a wide full-width half maximum of peak reflectivity, and on the Ru/Si multilayer formed is a Mo/Si multilayer having a high peak reflectivity value. This enables higher reflectivity than when Ru/Si alone provided and a reflectivity peak having a wider full-width half maximum than when the Mo/Si multilayer alone provided. Since Ru absorbs EUV ray more than Mo does, higher reflectivity is obtainable than that of a structure having the Ru/Si multilayer formed on the Mo/Si multilayer. The multilayer with a wide full-width half maximum has small incidence angle dependence of reflectivity in spectral reflectivity, thereby achieving high imaging performance in projection optical system.
    • 多层反射镜旨在减少反射率的入射角依赖性。 衬底由具有0.2nm RMS或更少表面粗糙度的低热抛光膨胀玻璃制成。 在其形成的表面上是具有宽的全宽半峰值反射率的Ru / Si多层,并且形成的Ru / Si多层是具有高峰值反射率值的Mo / Si多层。 与仅提供Ru / Si相比,具有比单独提供的Mo / Si多层的全宽半宽的反射率峰值更高的反射率。 由于Ru吸收比Mo更多的EUV射线,因此可以获得比在Mo / Si多层上形成有Ru / Si多层的结构更高的反射率。 具有宽全宽半最大值的多层膜在光谱反射率方面具有小的入射角反射率依赖性,从而在投影光学系统中实现高成像性能。
    • 2. 发明授权
    • Multilayer mirror, method for manufacturing the same, and exposure equipment
    • 多层镜,其制造方法和曝光设备
    • US07706058B2
    • 2010-04-27
    • US12232241
    • 2008-09-12
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • G02B5/26
    • G03F7/70316B82Y10/00G02B5/0891G03F7/70958G21K1/062
    • A multilayer mirror aims to reduce incidence angle dependence of reflectivity. A substrate is made of low thermal polished expansion glass with 0.2 nm RMS or less roughness of the surface. On the surface thereof formed is a Ru/Si multilayer having a wide full-width half maximum of peak reflectivity, and on the Ru/Si multilayer formed is a Mo/Si multilayer having a high peak reflectivity value. This enables higher reflectivity than when Ru/Si alone provided and a reflectivity peak having a wider full-width half maximum than when the Mo/Si multilayer alone provided. Since Ru absorbs EUV ray more than Mo does, higher reflectivity is obtainable than that of a structure having the Ru/Si multilayer formed on the Mo/Si multilayer. The multilayer with a wide full-width half maximum has small incidence angle dependence of reflectivity in spectral reflectivity, thereby achieving high imaging performance in projection optical system.
    • 多层反射镜旨在减少反射率的入射角依赖性。 衬底由具有0.2nm RMS或更少表面粗糙度的低热抛光膨胀玻璃制成。 在其形成的表面上是具有宽的全宽半峰值反射率的Ru / Si多层,并且形成的Ru / Si多层是具有高峰值反射率值的Mo / Si多层。 与仅提供Ru / Si相比,具有比单独提供的Mo / Si多层的全宽半宽的反射率峰值更高的反射率。 由于Ru吸收比Mo更多的EUV射线,因此可以获得比在Mo / Si多层上形成有Ru / Si多层的结构更高的反射率。 具有宽全宽半最大值的多层膜在光谱反射率方面具有小的入射角反射率依赖性,从而在投影光学系统中实现高成像性能。
    • 3. 发明申请
    • Multilayer mirror, method for manufacturing the same, and exposure equipment
    • 多层镜,其制造方法和曝光设备
    • US20090097104A1
    • 2009-04-16
    • US12232241
    • 2008-09-12
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • G02B5/26
    • G03F7/70316B82Y10/00G02B5/0891G03F7/70958G21K1/062
    • A multilayer mirror aims to reduce incidence angle dependence of reflectivity. A substrate is made of low thermal polished expansion glass with 0.2 nm RMS or less roughness of the surface. On the surface thereof formed is a Ru/Si multilayer having a wide full-width half maximum of peak reflectivity, and on the Ru/Si multilayer formed is a Mo/Si multilayer having a high peak reflectivity value. This enables higher reflectivity than when Ru/Si alone provided and a reflectivity peak having a wider full-width half maximum than when the Mo/Si multilayer alone provided. Since Ru absorbs EUV ray more than Mo does, higher reflectivity is obtainable than that of a structure having the Ru/Si multilayer formed on the Mo/Si multilayer. The multilayer with a wide full-width half maximum has small incidence angle dependence of reflectivity in spectral reflectivity, thereby achieving high imaging performance in projection optical system.
    • 多层反射镜旨在减少反射率的入射角依赖性。 衬底由具有0.2nm RMS或更少表面粗糙度的低热抛光膨胀玻璃制成。 在其形成的表面上是具有宽的全宽半峰值反射率的Ru / Si多层,并且形成的Ru / Si多层是具有高峰值反射率值的Mo / Si多层。 与仅提供Ru / Si相比,具有比单独提供的Mo / Si多层的全宽半宽的反射率峰值更高的反射率。 由于Ru吸收比Mo更多的EUV射线,因此可以获得比在Mo / Si多层上形成有Ru / Si多层的结构更高的反射率。 具有宽全宽半最大值的多层膜在光谱反射率方面具有小的入射角反射率依赖性,从而在投影光学系统中实现高成像性能。
    • 5. 发明授权
    • Multilayer mirror, method for manufacturing the same, and exposure equipment
    • 多层镜,其制造方法和曝光设备
    • US07440182B2
    • 2008-10-21
    • US11907798
    • 2007-10-17
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • Noriaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • G02B5/26
    • G03F7/70316B82Y10/00G02B5/0891G03F7/70958G21K1/062
    • A multilayer mirror aims to reduce incidence angle dependence of reflectivity. A substrate is made of low thermal polished expansion glass with 0.2 nm RMS or less roughness of the surface. On the surface thereof formed is a Ru/Si multilayer having a wide full-width half maximum of peak reflectivity, and on the Ru/Si multilayer formed is a Mo/Si multilayer having a high peak reflectivity value. This enables higher reflectivity than when Ru/Si alone provided and a reflectivity peak having a wider full-width half maximum than when the Mo/Si multilayer alone provided. Since Ru absorbs EUV ray more than Mo does, higher reflectivity is obtainable than that of a structure having the Ru/Si multilayer formed on the Mo/Si multilayer. The multilayer with a wide full-width half maximum has small incidence angle dependence of reflectivity in spectral reflectivity, thereby achieving high imaging performance in projection optical system.
    • 多层反射镜旨在减少反射率的入射角依赖性。 衬底由具有0.2nm RMS或更少表面粗糙度的低热抛光膨胀玻璃制成。 在其形成的表面上是具有宽的全宽半峰值反射率的Ru / Si多层,并且形成的Ru / Si多层是具有高峰值反射率值的Mo / Si多层。 与仅提供Ru / Si相比,具有比单独提供的Mo / Si多层的全宽半宽的反射率峰值更高的反射率。 由于Ru吸收比Mo更多的EUV射线,因此可以获得比在Mo / Si多层上形成有Ru / Si多层的结构更高的反射率。 具有宽全宽半最大值的多层膜在光谱反射率方面具有小的入射角反射率依赖性,从而在投影光学系统中实现高成像性能。
    • 6. 发明申请
    • Multilayer reflective mirrors for EUV, wavefront-aberration-correction methods for same, and EUV optical systems comprising same
    • 用于EUV的多层反射镜,用于其的波前像差校正方法以及包含该反射镜的EUV光学系统
    • US20050157384A1
    • 2005-07-21
    • US11025002
    • 2004-12-28
    • Masayuki ShiraishiKatsuhiko MurakamiHiroyuki KondoNoriaki Kandaka
    • Masayuki ShiraishiKatsuhiko MurakamiHiroyuki KondoNoriaki Kandaka
    • G02B5/08G03F7/20
    • G03F7/706G02B5/08G03F7/70216G03F7/70258G03F7/70316
    • Multilayer mirrors are disclosed for use especially in “Extreme Ultraviolet” (“soft X-ray,” or “EUV”) optical systems. Each multilayer mirror includes a stack of alternating layers of a first material and a second material, respectively, to form an EUV-reflective surface. The first material has a refractive index substantially the same as a vacuum, and the second material has a refractive index that differs sufficiently from the refractive index of the first material to render the mirror reflective to EUV radiation. The wavefront profile of EUV light reflected from the surface is corrected by removing (“machining” away) at least one surficial layer of the stack in selected region(s) of the surface of the stack. Machining can be performed such that machined regions have smooth tapered edges rather than abrupt edges. The stack can include first and second layer groups that allow the unit of machining to be very small, thereby improving the accuracy with which wavefront-aberration correction can be conducted. Also disclosed are various at-wavelength techniques for measuring reflected-wavelength profiles of the mirror. The mirror surface can include a cover layer of a durable material having high transparency and that reduces variations in reflectivity of the surface caused by machining the selected regions.
    • 公开了多层反射镜用于特别是在“极光紫外线”(“软X射线”或“EUV”)光学系统中。 每个多层反射镜分别包括第一材料和第二材料的交替层叠,以形成EUV反射表面。 第一材料具有与真空基本相同的折射率,并且第二材料具有与第一材料的折射率充分不同的折射率,以使反射镜反射成EUV辐射。 通过在堆叠的表面的选定区域中移除(“加工”)去除堆叠的至少一个表面层来校正从表面反射的EUV光的波前轮廓。 可以进行加工,使得加工区域具有平滑的锥形边缘而不是突然的边缘。 堆叠可以包括允许加工单元非常小的第一和第二层组,从而提高可以进行波前像差校正的精度。 还公开了用于测量反射镜的反射波长分布的各种一般波长技术。 镜面可以包括具有高透明度的耐用材料的覆盖层,并且减少由加工所选择的区域引起的表面的反射率的变化。
    • 7. 发明申请
    • Multilayer mirror, method for manufacturing the same, and exposure equipment
    • 多层镜,其制造方法和曝光设备
    • US20080049307A1
    • 2008-02-28
    • US11907798
    • 2007-10-17
    • Nariaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • Nariaki KandakaKatsuhiko MurakamiTakaharu KomiyaMasayuki Shiraishi
    • G02B5/09
    • G03F7/70316B82Y10/00G02B5/0891G03F7/70958G21K1/062
    • A multilayer mirror aims to reduce incidence angle dependence of reflectivity. A substrate is made of low thermal polished expansion glass with 0.2 nm RMS or less roughness of the surface. On the surface thereof formed is a Ru/Si multilayer having a wide full-width half maximum of peak reflectivity, and on the Ru/Si multilayer formed is a Mo/Si multilayer having a high peak reflectivity value. This enables higher reflectivity than when Ru/Si alone provided and a reflectivity peak having a wider full- width half maximum than when the Mo/Si multilayer alone provided. Since Ru absorbs EUV ray more than Mo does, higher reflectivity is obtainable than that of a structure having the Ru/Si multilayer formed on the Mo/Si multilayer. The multilayer with a wide full-width half maximum has small incidence angle dependence of reflectivity in spectral reflectivity, thereby achieving high imaging performance in projection optical system.
    • 多层反射镜旨在减少反射率的入射角依赖性。 衬底由具有0.2nm RMS或更少表面粗糙度的低热抛光膨胀玻璃制成。 在其形成的表面上是具有宽的全宽半峰值反射率的Ru / Si多层,并且形成的Ru / Si多层是具有高峰值反射率值的Mo / Si多层。 与单独提供的Ru / Si相比,具有比仅提供Mo / Si多层的全宽半宽的反射率峰值更高的反射率。 由于Ru吸收比Mo更多的EUV射线,因此可以获得比在Mo / Si多层上形成有Ru / Si多层的结构更高的反射率。 具有宽全宽半最大值的多层膜在光谱反射率方面具有小的入射角反射率依赖性,从而在投影光学系统中实现高成像性能。