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    • 1. 发明授权
    • Process for producing an image using a first minimum bottom antireflective coating composition
    • 使用第一最小底部抗反射涂料组合物制造图像的方法
    • US07070914B2
    • 2006-07-04
    • US10042878
    • 2002-01-09
    • Mark O. NeisserJoseph E. OberlanderMedhat A. ToukhyRaj SakamuriShuji Ding-Lee
    • Mark O. NeisserJoseph E. OberlanderMedhat A. ToukhyRaj SakamuriShuji Ding-Lee
    • G03F7/00
    • G03F7/091G03F7/095Y10S430/151
    • Disclosed is a process for forming an image on a substrate, comprising the steps of: (a) coating on the substrate a first layer of a radiation sensitive, antireflective composition; (b) coating a second layer of a photoresist composition onto the first layer of the antireflective composition; (c) selectively exposing the coated substrate from step (b) to actinic radiation; and (d) developing the exposed coated substrate from step (c) to form an image; wherein both the photoresist composition and the antireflective composition are exposed in step (c); both are developed in step (d) using a single developer; wherein the antireflective composition of step (a) is a first minimum bottom antireflective coating (B.A.R.C.) composition, having a solids content of up to about 8% solids, and a maximum coating thickness of the coated substrate of λ 2 ⁢ n wherein λ is the wavelength of the actinic radiation of step (c) and n is the refractive index of the B.A.R.C. composition.
    • 公开了一种在衬底上形成图像的方法,包括以下步骤:(a)在衬底上涂覆第一层辐射敏感的抗反射组合物; (b)将第二层光致抗蚀剂组合物涂覆到抗反射组合物的第一层上; (c)将涂覆的基材从步骤(b)选择性暴露于光化辐射; 和(d)将来自步骤(c)的曝光的涂覆的基底显影以形成图像; 其中在步骤(c)中曝光光致抗蚀剂组合物和抗反射组合物; 在步骤(d)中使用单个显影剂开发两者; 其中步骤(a)的抗反射组合物是具有固体含量高达约8%固体的第一最小底部抗反射涂层(BARC)组合物,并且涂覆的基材的最大涂层厚度为 λ 2 n 其中λ是步骤(c)的光化辐射的波长,n是BARC的折射率 组成。
        • 2. 发明授权
        • Positive-working photoimageable bottom antireflective coating
        • 正面工作的可光成像底部抗反射涂层
        • US06844131B2
        • 2005-01-18
        • US10042532
        • 2002-01-09
        • Joseph E. OberlanderRalph R. DammelShuji Ding-LeeMark O. NeisserMedhat A. Toukhy
        • Joseph E. OberlanderRalph R. DammelShuji Ding-LeeMark O. NeisserMedhat A. Toukhy
        • G03F7/11A61P29/00G03F7/004G03F7/039G03F7/09
        • G03F7/09G03F7/0392G03F7/091Y10S430/106
        • The present invention relates to a novel absorbing, photoimageable and aqueous developable positive-working antireflective coating composition comprising a photoacid generator and a polymer comprising at least one unit with an acid labile group and at least one unit with an absorbing chromophore. The invention further relates to a process for using such a composition. The present invention also relates to a novel absorbing, photoimageable and aqueous alkali developable positive-working antireflective coating composition comprising a polymer comprising at least one unit with an acid labile group, a dye and a photoacid generator. The invention further relates to a process for using such a composition. The invention also relates to a novel process for forming a positive image with a positive photoresist and a novel photoimageable and aqueous developable positive-working antireflective coating composition, where the antireflective coating comprises a polymer comprising an acid labile group. The invention further relates to such a composition. The invention also relates to a process for imaging a photoimageable antireflective coating composition.
        • 本发明涉及一种新颖的吸收光可成像和水性显影正性抗反射涂料组合物,其包含光酸产生剂和包含至少一个具有酸不稳定基团的单元和至少一个具有吸收发色团的单元的聚合物。 本发明还涉及一种使用这种组合物的方法。 本发明还涉及一种新型的吸收,可光成像和水性碱显影正性抗反射涂料组合物,其包含含有至少一个具有酸不稳定基团的单元,染料和光致酸产生剂的聚合物。 本发明还涉及使用这种组合物的方法。 本发明还涉及一种用正性光致抗蚀剂形成正像的新方法,以及一种新型可光成像和水性可显影正性抗反射涂料组合物,其中抗反射涂层包含含酸不稳定基团的聚合物。 本发明还涉及这种组合物。 本发明还涉及一种用于对可光成象抗反射涂层组合物进行成像的方法。
        • 4. 发明申请
        • Process for producing an image using a first minimum bottom antireflective coating composition
        • 使用第一最小底部抗反射涂料组合物制造图像的方法
        • US20060199103A1
        • 2006-09-07
        • US11416240
        • 2006-05-02
        • Mark NeisserJoseph OberlanderMedhat ToukhyRaj SakamuriShuji Ding-Lee
        • Mark NeisserJoseph OberlanderMedhat ToukhyRaj SakamuriShuji Ding-Lee
        • G03F7/004
        • G03F7/091G03F7/095Y10S430/151
        • Disclosed is a process for forming an image on a substrate, comprising the steps of: (a) coating on the substrate a first layer of a radiation sensitive, antireflective composition; (b) coating a second layer of a photoresist composition onto the first layer of the antireflective composition; (c) selectively exposing the coated substrate from step (b) to actinic radiation; and (d) developing the exposed coated substrate from step (c) to form an image; wherein both the photoresist composition and the antireflective composition are exposed in step (c); both are developed in step (d) using a single developer; wherein the antireflective composition of step (a) is a first minimum bottom antireflective coating (B.A.R.C.) composition, having a solids content of up to about 8% solids, and a maximum coating thickness of the coated substrate of λ/2n wherein λ is the wavelength of the actinic radiation of step (c) and n is the refractive index of the B.A.R.C. composition.
        • 公开了一种在衬底上形成图像的方法,包括以下步骤:(a)在衬底上涂覆第一层辐射敏感的抗反射组合物; (b)将第二层光致抗蚀剂组合物涂覆到抗反射组合物的第一层上; (c)将涂覆的基材从步骤(b)选择性暴露于光化辐射; 和(d)将来自步骤(c)的曝光的涂覆的基底显影以形成图像; 其中在步骤(c)中曝光光致抗蚀剂组合物和抗反射组合物; 在步骤(d)中使用单个显影剂开发两者; 其中步骤(a)的抗反射组合物是第一最小底部抗反射涂层(BARC)组合物,其固体含量高达约8%固体,并且涂覆的基底的最大涂层厚度为λ/ 2n,其中λ为 步骤(c)的光化辐射的波长,n是BARC的折射率 组成。