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    • 4. 发明申请
    • GAS CONCENTRATION CALCULATION DEVICE, GAS CONCENTRATION MEASUREMENT MODULE, AND LIGHT DETECTOR
    • 气体浓度计算装置,气体浓度测量模块和光探测器
    • US20120330568A1
    • 2012-12-27
    • US13578895
    • 2011-02-14
    • Toshiyuki IzawaKoei Yamamoto
    • Toshiyuki IzawaKoei Yamamoto
    • G06F19/00G01J1/04
    • G01N21/3504G01N21/0303G01N21/61
    • A gas concentration measuring module (2X) includes a gas cell (10X) configured to form an introduction space (11X) into which a sample gas (50X) is introduced, an infrared light source (21X) disposed at one end of the gas cell (10X), a reference light receiving element (31X) and a signal light receiving element (32X) disposed at the other end of the gas cell (10X) and configured to receive infrared light emitted from the infrared light source (21X), and an inert gas chamber (40X) disposed on an optical path between the infrared light source (21X) and the reference light receiving element (31X) in the introduction space (11X) and in which an inert gas, inert with respect to the infrared light emitted from the infrared light source (21X) is hermetically enclosed. A calculation circuit (3X) calculates a concentration of carbon dioxide in the sample gas (50X) based on a ratio between an energy value of light received by the reference light receiving element (31X) and an energy value of infrared light received by the signal light receiving element (32X) of the gas concentration measuring module (2X).
    • 气体浓度测量模块(2X)包括:气体电池(10X),被配置为形成引入空气(11X),其中引入样品气体(50X);红外光源(21X),设置在所述气室的一端 (10X),参考光接收元件(31X)和设置在气室(10X)的另一端处的信号光接收元件(32X),并且被配置为接收从红外光源(21X)发射的红外光;以及 设置在导入空间(11X)中的红外线光源(21X)和基准光接收元件(31X)之间的光路上的惰性气体室(40X),其中相对于红外线为惰性的惰性气体 从红外光源(21X)发射的气密密封。 计算电路(3X)基于由参考光接收元件(31X)接收的光的能量值与由信号接收的红外线的能量值之间的比率,计算样品气体(50X)中的二氧化碳浓度 气体浓度测量模块(2X)的光接收元件(32X)。
    • 8. 发明授权
    • Digital X-ray imaging apparatus
    • 数字X射线成像装置
    • US5677940A
    • 1997-10-14
    • US618991
    • 1996-03-20
    • Masakazu SuzukiKeisuke MoriAkifumi TachibanaKazunari MatobaKoei YamamotoSeiichiro Mizuno
    • Masakazu SuzukiKeisuke MoriAkifumi TachibanaKazunari MatobaKoei YamamotoSeiichiro Mizuno
    • A61B6/00A61B6/06A61B6/14H04N5/32
    • H04N5/32A61B6/14
    • A digital X-ray imaging apparatus comprises an X-ray generator 6 for generating X-rays toward a subject, an X-ray imaging device 7 for detecting an image of X-rays having passed through the subject, a swivel member 4 and a horizontal movement means 8 provided with the X-ray generator 6 and the X-ray imaging device 7 opposed to each other to relatively move the X-ray generator 6 and the X-ray imaging device 7 with respect to the subject, a CPU 21 for producing a tomographic image in accordance with an imaging signal from the X-ray imaging device 7, frame memories and an image display unit 26 for displaying the tomographic image. The X-ray imaging device 7 includes a MOS image sensor having a plurality of two-dimensional light-receiving pixels. With this configuration, a tomographic image along a given tomographic plane can be produced by a signal X-ray imaging operation, and the imaging sensitivity of the digital X-ray imaging apparatus can be enhanced.
    • 数字X射线成像装置包括用于向被检体产生X射线的X射线发生器6,用于检测穿过被检体的X射线的图像的X射线成像装置7,旋转构件4和 设置有彼此相对的X射线发生器6和X射线摄像装置7的相对于被摄体使X射线发生器6和X射线摄像装置7相对移动的水平移动机构8,CPU21 用于根据来自X射线成像装置7的成像信号,帧存储器和用于显示断层图像的图像显示单元26产生断层图像。 X射线成像装置7包括具有多个二维光接收像素的MOS图像传感器。 利用这种配置,可以通过信号X射线成像操作来产生沿着给定的断层摄影平面的断层图像,并且可以提高数字X射线成像装置的成像灵敏度。
    • 9. 发明申请
    • DISTANCE IMAGE SENSOR
    • 距离图像传感器
    • US20100078749A1
    • 2010-04-01
    • US12514898
    • 2007-11-13
    • Masanori SaharaMitsutaka TakemuraKoei Yamamoto
    • Masanori SaharaMitsutaka TakemuraKoei Yamamoto
    • H01L31/101
    • G01C3/085G01S17/36G01S17/89H01L27/1443H01L27/14618H01L27/1464H01L27/14665H01L2924/0002H01L2924/00
    • In a range image sensor 8, when a first reverse bias voltage applied between a semiconductor substrate 11 and first semiconductor regions 13 is an H bias, first depleted layers A1 and A1 expanding from the p-n junctions of the first semiconductor regions 13 adjacent to each other expand and link to each other so as to cover a second depleted layer B1 expanding from the p-n junction of a second semiconductor region 14. Accordingly, carriers C generated near the rear surface 11a of the semiconductor substrate 11 are reliably captured by the first depleted layers A1. Further, when a second reverse bias voltage applied between the semiconductor substrate 11 and the second semiconductor regions 14 is an H bias, the second depleted layers adjacent to each other expand and link to each other so as to cover the first depleted layer. Accordingly, carriers generated near the rear surface of the semiconductor substrate are reliably captured by the second depleted layers.
    • 在范围图像传感器8中,当施加在半导体基板11和第一半导体区域13之间的第一反向偏置电压为H偏压时,从彼此相邻的第一半导体区域13的pn结扩展的第一耗尽层A1和A1 相互连接,以覆盖从第二半导体区域14的pn结扩展的第二耗尽层B1。因此,由半导体衬底11的后表面11a附近产生的载流子C可靠地被第一贫化层 A1。 此外,当施加在半导体衬底11和第二半导体区域14之间的第二反向偏置电压是H偏压时,彼此相邻的第二耗尽层彼此膨胀并且彼此连接以覆盖第一耗尽层。 因此,由半导体衬底的后表面附近产生的载流子被第二耗尽层可靠地捕获。
    • 10. 发明授权
    • Photoelectric tube using electron beam irradiation diode as anode
    • 光电管采用电子束照射二极管作为阳极
    • US5780913A
    • 1998-07-14
    • US954616
    • 1997-10-27
    • Masaharu MuramatsuMotohiro SuyamaKoei Yamamoto
    • Masaharu MuramatsuMotohiro SuyamaKoei Yamamoto
    • H01J31/49H01L31/115
    • H01J31/49
    • When light is incident on the photoelectric surface of this electron tube, photoelectrons are emitted. These photoelectrons are accelerated and incident on an electron beam irradiation diode. A reverse voltage of about 100 V is applied to the electron beam irradiation diode to form a depletion region almost throughout an anode layer and near the p-n junction interface of a silicon substrate. The incident accelerated electrons release a kinetic energy in a heavily doped p-type layer having an electron incidence surface and the depleted anode layer to form electron-hole pairs. In this case, since the heavily doped p-type layer having the electron incidence surface is very thin, the energy is hardly released in this layer, and almost all energy is released in the depletion region. Signal charges extracted from the electron-hole pairs formed upon releasing the energy are output as a signal from two electrodes.
    • 当光入射到该电子管的光电表面上时,发射光电子。 这些光电子被加速并入射在电子束照射二极管上。 大约100V的反向电压被施加到电子束照射二极管,以在整个阳极层和硅衬底的p-n结界面附近形成耗尽区。 事件加速电子在具有电子入射表面和耗尽的阳极层的重掺杂p型层中释放动能以形成电子 - 空穴对。 在这种情况下,由于具有电子入射面的重掺杂p型层非常薄,所以在该层中几乎不释放能量,几乎所有能量在耗尽区中释放。 从释放能量时形成的电子 - 空穴对提取的信号电荷作为来自两个电极的信号被输出。