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    • 4. 发明申请
    • TOTAL REFLECTION TERAHERTZ WAVE MEASUREMENT DEVICE
    • 总反射TERAHERTZ波形测量装置
    • US20110249253A1
    • 2011-10-13
    • US12988158
    • 2009-04-27
    • Atsushi NakanishiYoichi KawadaTakashi YasudaHironori TakahashiMasatoshi FujimotoShinichiro AoshimaAtsuko Aoshima
    • Atsushi NakanishiYoichi KawadaTakashi YasudaHironori TakahashiMasatoshi FujimotoShinichiro AoshimaAtsuko Aoshima
    • G01J3/00
    • G01N21/552G01N21/3504G01N21/3586
    • A total reflection terahertz wave measuring apparatus 1 includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a beam splitter 17, a terahertz wave generating element 20, a filter 25, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53a, a photodetector 53b, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance surface 31a, an exit surface 31b, and a reflection surface 31c. The terahertz wave generating element 20 and the filter 25 are provided to be integrated with the entrance surface 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit surface 31b of the internal total reflection prism 31. The filter 25 allows a terahertz wave to be transmitted therethrough and blocks pump light. Accordingly, a total reflection terahertz wave measuring apparatus, which can be downsized, can be realized.
    • 全反射太赫波测量装置1包括光源11,分支部12,斩波器13,光程长度差调节部14,偏振器15,分束器17,太赫兹波发生元件20,滤光器 25,内部全反射棱镜31,太赫兹波检测元件40,1/4波片51,偏振分离元件52,光电检测器53a,光电检测器53b,差分放大器54和锁定放大器55。 内部全反射棱镜31是所谓的平行棱镜,具有入射面31a,出射面31b和反射面31c。 太赫兹波发生元件20和滤波器25设置成与内部全反射棱镜31的入射面31a一体化,太赫兹波检测元件40设置成与内部全反射棱镜31的出射面31b一体化 滤光器25允许太赫兹波被透过并阻止泵浦光。 因此,能够实现小型化的全反射太赫兹波测量装置。
    • 5. 发明授权
    • Total reflection terahertz wave measurement device
    • 全反射太赫兹波测量装置
    • US08415625B2
    • 2013-04-09
    • US12988158
    • 2009-04-27
    • Atsushi NakanishiYoichi KawadaTakashi YasudaHironori TakahashiMasatoshi FujimotoShinichiro AoshimaAtsuko Aoshima
    • Atsushi NakanishiYoichi KawadaTakashi YasudaHironori TakahashiMasatoshi FujimotoShinichiro Aoshima
    • G01J5/02
    • G01N21/552G01N21/3504G01N21/3586
    • A total reflection terahertz wave measuring apparatus 1 includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a beam splitter 17, a terahertz wave generating element 20, a filter 25, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53a, a photodetector 53b, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance surface 31a, an exit surface 31b, and a reflection surface 31c. The terahertz wave generating element 20 and the filter 25 are provided to be integrated with the entrance surface 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit surface 31b of the internal total reflection prism 31. The filter 25 allows a terahertz wave to be transmitted therethrough and blocks pump light. Accordingly, a total reflection terahertz wave measuring apparatus, which can be downsized, can be realized.
    • 全反射太赫波测量装置1包括光源11,分支部12,斩波器13,光程长度差调节部14,偏振器15,分束器17,太赫兹波发生元件20,滤光器 25,内部全反射棱镜31,太赫兹波检测元件40,1/4波片51,偏振分离元件52,光电检测器53a,光电检测器53b,差分放大器54和锁定放大器55。 内部全反射棱镜31是所谓的平行棱镜,具有入射面31a,出射面31b和反射面31c。 太赫兹波发生元件20和滤波器25设置成与内部全反射棱镜31的入射面31a一体化,太赫兹波检测元件40设置成与内部全反射棱镜31的出射面31b一体化 滤光器25允许太赫兹波被透过并阻止泵浦光。 因此,能够实现小型化的全反射太赫兹波测量装置。
    • 7. 发明授权
    • Single terahertz wave time-waveform measuring device
    • 单一太赫兹波时间波形测量装置
    • US08742353B2
    • 2014-06-03
    • US12444209
    • 2007-09-13
    • Yoichi KawadaTakashi YasudaHironori TakahashiShinichiro Aoshima
    • Yoichi KawadaTakashi YasudaHironori TakahashiShinichiro Aoshima
    • G01N21/35
    • G01N21/35G01N21/23G01N21/3581
    • A single terahertz wave time-waveform measuring device 1 acquires information on an object to be measured 9 by using a terahertz wave, and includes a light source 11, a beam diameter adjuster 12, a separator 13, a terahertz wave generator 21, a light path length difference adjuster 31, a pulse front tilting unit 32, a polarizer 33, a wave synthesizer 41, an electro-optic crystal 42, an analyzer 43, and a photodetector 44. The terahertz wave generator 21 generates a pulse terahertz wave in response to an input of pump light and outputs the pulse terahertz wave. The pulse front tilting unit 32 makes pulse fronts of the terahertz wave and the probe light when being input into the electro-optic crystal 42 nonparallel to each other by tilting the pulse front of the probe light.
    • 单个太赫兹波时间波形测量装置1通过使用太赫兹波获取关于被测量物体9的信息,并且包括光源11,光束直径调节器12,隔膜13,太赫兹波发生器21,光 路径长度差调节器31,脉冲前倾斜单元32,偏振器33,波合成器41,电光晶体42,分析器43和光电检测器44.太赫兹波发生器21响应地产生脉冲太赫兹波 到泵浦光的输入并输出脉冲太赫兹波。 当脉冲前倾斜单元32通过倾斜探测光的脉冲前沿而彼此不平行地输入到电光晶体42中时,使太赫兹波和探测光的脉冲前沿。
    • 8. 发明授权
    • Total reflection tera hertz wave measuring apparatus
    • 全反射赫兹波测量仪
    • US08354644B2
    • 2013-01-15
    • US12530897
    • 2008-02-13
    • Takashi YasudaYoichi KawadaHironori TakahashiShinichiro AoshimaAtsuko Aoshima
    • Takashi YasudaYoichi KawadaHironori TakahashiShinichiro Aoshima
    • G01J5/02
    • G01N21/3581G01N21/552
    • A total reflection terahertz wave measuring apparatus 1 is configured to acquire information on a subject S by a total reflection measurement method by use of a terahertz wave, and includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a separator 17, a terahertz wave generating element 20, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53A, a photodetector 53B, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance plane 31a, an exit plane 31b, and a reflection plane 31c. The terahertz wave generating element 20 is provided to be integrated with the entrance plane 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit plane 31b of the internal total reflection prism 31.
    • 全反射太赫波测量装置1被配置为通过使用太赫兹波的全反射测量方法获取关于被摄体S的信息,并且包括光源11,分支部12,斩波器13,光程长度 差分调整部14,偏振片15,隔膜17,太赫波生成元件20,内部全反射棱镜31,太赫兹波检测元件40,1/4波片51,偏振分离元件52,光电检测器53A, 光检测器53B,差分放大器54和锁定放大器55.内部全反射棱镜31是所谓的平行棱镜,具有入射面31a,出射面31b和反射面31c。 太赫波发生元件20设置成与内部全反射棱镜31的入射面31a一体化,并且太赫兹波检测元件40设置成与内部全反射棱镜31的出射面31b一体化。
    • 9. 发明申请
    • TOTAL REFLECTION TERA HERTZ WAVE MEASURING APPARATUS
    • 总反射TERA HERTZ波形测量装置
    • US20100091266A1
    • 2010-04-15
    • US12530897
    • 2008-02-13
    • Takashi YasudaYoichi KawadaHironori TakahashiShinichiro Aoshima
    • Takashi YasudaYoichi KawadaHironori TakahashiShinichiro Aoshima
    • G01N21/35G01J5/00G01N21/55
    • G01N21/3581G01N21/552
    • A total reflection terahertz wave measuring apparatus 1 is configured to acquire information on a subject S by a total reflection measurement method by use of a terahertz wave, and includes a light source 11, a branching part 12, a chopper 13, an optical path length difference adjusting part 14, a polarizer 15, a separator 17, a terahertz wave generating element 20, an internal total reflection prism 31, a terahertz wave detecting element 40, a ¼ wavelength plate 51, a polarization split element 52, a photodetector 53A, a photodetector 53B, a differential amplifier 54, and a lock-in amplifier 55. The internal total reflection prism 31 is a so-called aplanatic prism, and has an entrance plane 31a, an exit plane 31b, and a reflection plane 31c. The terahertz wave generating element 20 is provided to be integrated with the entrance plane 31a of the internal total reflection prism 31, and the terahertz wave detecting element 40 is provided to be integrated with the exit plane 31b of the internal total reflection prism 31.
    • 全反射太赫波测量装置1被配置为通过使用太赫兹波的全反射测量方法获取关于被摄体S的信息,并且包括光源11,分支部12,斩波器13,光程长度 差分调整部14,偏振片15,隔膜17,太赫波生成元件20,内部全反射棱镜31,太赫兹波检测元件40,1/4波片51,偏振分离元件52,光电检测器53A, 光检测器53B,差分放大器54和锁定放大器55.内部全反射棱镜31是所谓的平行棱镜,具有入射面31a,出射面31b和反射面31c。 太赫波发生元件20设置成与内部全反射棱镜31的入射面31a一体化,并且太赫兹波检测元件40设置成与内部全反射棱镜31的出射面31b一体化。